JPS6189429A - Cold shock testing device - Google Patents
Cold shock testing deviceInfo
- Publication number
- JPS6189429A JPS6189429A JP20828184A JP20828184A JPS6189429A JP S6189429 A JPS6189429 A JP S6189429A JP 20828184 A JP20828184 A JP 20828184A JP 20828184 A JP20828184 A JP 20828184A JP S6189429 A JPS6189429 A JP S6189429A
- Authority
- JP
- Japan
- Prior art keywords
- heater
- refrigerating cycle
- low temperature
- heat exchanger
- chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25B—REFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
- F25B7/00—Compression machines, plants or systems, with cascade operation, i.e. with two or more circuits, the heat from the condenser of one circuit being absorbed by the evaporator of the next circuit
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Thermal Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Other Air-Conditioning Systems (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の利用分野〕
不発明は半纏体等の冷却、加熱くり返し試験を行う冷熱
gJ撃試験装置に係シ、特に低温室側のランニングコス
トを安くする構造に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a cold/hot gJ impact testing device for repeatedly testing cooling and heating of half-wrapped bodies, etc., and particularly to a structure that reduces running costs on the side of a cold room.
従来の冷熱Wネ試S装置の構成を第2図、第3図により
説明する。図にお−て、1は試験室、2は低温室、3は
高温室を示し、これら各室ri独立している。また、低
温室2内には蒸発器4および調温用電気加熱器5が配設
され、高温室3内には電気加熱器6およびその加熱器6
の熱量を蓄熱する蓄熱体7が配設されてりる。The configuration of a conventional cooling/heating W/S test device will be explained with reference to FIGS. 2 and 3. In the figure, 1 is a test room, 2 is a low temperature room, and 3 is a high temperature room, and each of these rooms is independent. Further, an evaporator 4 and an electric heater 5 for temperature control are provided in the low temperature room 2, and an electric heater 6 and its heater 6 are provided in the high temperature room 3.
A heat storage body 7 is provided to store the amount of heat.
そして、低温室2の蒸発器4および電気加熱器5によジ
所定、温度に保たれた冷風は、電動機8に直結された送
風機9によりダンパー1OA、10Bを開いて試験室1
へ供給される。また高温室3の電気加熱器6、蓄熱体7
により所定温度に保たれた熱風は、電動機11に直結さ
れた送風機12によりダンバ−13A、13Bを開いて
試験室1へ供給される。The cold air kept at a predetermined temperature by the evaporator 4 and electric heater 5 in the low temperature chamber 2 is delivered to the test chamber by opening dampers 1OA and 10B by a blower 9 directly connected to an electric motor 8.
supplied to Also, electric heater 6 and heat storage body 7 in high temperature room 3
The hot air maintained at a predetermined temperature is supplied to the test chamber 1 by opening the dampers 13A and 13B by the blower 12 directly connected to the electric motor 11.
しかし、前述の冷熱衝撃試験装置におりては、低温室2
の冷風の調温を電気加熱器5により行っているため、そ
の分だけ゛電力量が多くなり、装置のランニングコスト
が高くなる問題がある。また、電気力U熱器の使用dJ
3frか多くなジ、安全性の面でも好ましくない。However, in the above-mentioned thermal shock test device, the cold room 2
Since the temperature of the cold air is controlled by the electric heater 5, the amount of electric power increases accordingly, resulting in a problem that the running cost of the device increases. In addition, use of electric power U heater dJ
It's 3fr or more, which is not good from a safety standpoint.
不発明の目的は、低温室の調温を電気加熱器を用いるこ
となく行え0ようにして、装置のランニングコストの低
減を図れ、かつ安全性の高い冷熱衝撃試験装置を提供す
ることにある。An object of the present invention is to provide a thermal shock testing device that can control the temperature of a cold room without using an electric heater, thereby reducing the running cost of the device and having high safety.
〔発明の概−要)
この目的を達成するために、本発明は、カスヶードニ元
冷凍サイクルと、調温用加熱器とを備え、前記冷凍サイ
クルの蒸発器および前記加熱器を低温基円に配設し、該
加熱器に冷凍サイクルのホットガスを流通させるように
したことで特徴とする。[Summary of the Invention] In order to achieve this object, the present invention includes a cascade double refrigeration cycle and a temperature control heater, and the evaporator and the heater of the refrigeration cycle are arranged in a low-temperature base circle. It is characterized in that the hot gas of the refrigeration cycle is circulated through the heater.
以下、本発明の一実施例を第1図にょシ説明する。第1
図は本発明の冷熱衝撃試験装置における低温室および冷
凍サイクル系統図金示している。An embodiment of the present invention will be described below with reference to FIG. 1st
The figure shows a cold room and refrigeration cycle system diagram in the thermal shock test apparatus of the present invention.
この冷熱衝撃試験装置は、第1圧!I慨21、凝縮器2
2、第1膨戯弁23、カスケード熱交換器24により構
成さ九る第1冷凍サイクルAおよび第2圧縮飲zb、前
記カスケード熱交換器24、第2膨脹弁26、蒸発器2
7vこより傳成さz’Lる第2冷凍サイクルBと、調温
用脚pA器としての熱交換ぢ1r2Bと金備凡てぃ◇。This thermal shock test device is the first pressure! 21, condenser 2
2. The first refrigeration cycle A and the second compression drinker ZB, which are composed of the first expansion valve 23, the cascade heat exchanger 24, the cascade heat exchanger 24, the second expansion valve 26, and the evaporator 2.
The second refrigeration cycle B is constructed from 7V, the heat exchanger 1r2B is used as a temperature control leg pA device, and Kinbibonti◇.
そして、前6己第2市凍サイクルJ髪のA光益27お・
よび前記熱交換器28は低温≧2内に並着状j順で配設
でγムる。また熱交換器28にlよ、第1冷凍サイクル
人の第1圧縮俵21から吐出される冷媒ガス(ホットガ
ス)がvt通すめようlこなっている。そのホットガス
往路系29Aには、第1電騒弁30、第1訛i調縛弁3
12よび第2磁磁升3−2、第2流量調節弁33か設け
らIしている。累2電磁弁32、M2流童調節弁33r
−t、第1電鍼弁301第2流を調節弁31に対して並
列に汲続さnていり。またホットガス復路系29 Bに
ぼ、逆止弁34が設けられている。尚、9は低温室2内
の送ノ式機を示す。And, the former 6th person second city freezing cycle J hair A Mitsumasu 27 o.
The heat exchangers 28 are arranged in j order in a juxtaposed manner within the range of low temperature≧2. Further, refrigerant gas (hot gas) discharged from the first compression bale 21 of the first refrigeration cycle is passed through the heat exchanger 28. The hot gas outward path system 29A includes a first electric noise valve 30 and a first control valve 3.
12, a second magnetic square 3-2, and a second flow control valve 33 are provided. Cumulative 2 solenoid valve 32, M2 flow control valve 33r
-t, the second flow of the first electroacupuncture valve 301 is continued in parallel to the control valve 31; A check valve 34 is also provided in the hot gas return path system 29B. Note that 9 indicates a blower type machine inside the cold room 2.
次に不発明の作用についてa明する。Next, I will explain the effects of non-invention.
第1冷凍サイクル人の第1圧縮磯21より吐出された冷
媒ガスは凝縮器22で外気または冷却水に放熱して凝縮
する。この凝縮液は第1膨脹弁23で減圧さル、カスケ
ード熱交換器24に流入し、ここで第2冷凍サイクルB
との熱交換によ)蒸発して第1圧縮機21に戻る。第2
冷凍サイクルBの第2圧縮機25よシ吐出された冷媒ガ
スはカスケード熱交換器24にて前述の17g1冷凍サ
イクルAに放熱して冷却さ3XM縮する。この凝縮液は
第2膨脹弁26にて減圧された後、蒸発627に流入し
、ここで送風機9による低−室循環空気を冷却して蒸発
し、第2圧縮機25に戻る。このとき低温室2内を冷却
しすきないようにするため、例えば低温室2内に設けた
製置センサー(図示せず)の信号によりホットガス往路
系29Aの第1成磁弁30または第2亀磁弁32t−O
N−OFFさせ、第1圧m機21よりの冷媒ガスを熱交
換器28へ流入させて空気を加熱し調温する。また、要
求さnる低温室2の温度変化に対しては、第1、第2流
量調節弁31.330開度を調整することで対応できる
。The refrigerant gas discharged from the first compression port 21 of the first refrigeration cycle is condensed by radiating heat to the outside air or cooling water in the condenser 22. This condensate is depressurized by the first expansion valve 23 and flows into the cascade heat exchanger 24, where it is transferred to the second refrigeration cycle B.
(by heat exchange with) and returns to the first compressor 21. Second
The refrigerant gas discharged from the second compressor 25 of the refrigeration cycle B radiates heat to the aforementioned 17g1 refrigeration cycle A in the cascade heat exchanger 24 and is cooled and compressed by 3XM. After the condensate is depressurized by the second expansion valve 26, it flows into the evaporator 627, where it cools the low-chamber circulating air by the blower 9, evaporates, and returns to the second compressor 25. At this time, in order to cool the inside of the cold room 2 and prevent it from becoming empty, a signal from a sensor (not shown) installed in the cold room 2 is used to control the first magnetization valve 30 or the second magnetization valve of the hot gas outward path system 29A. Tortoise valve 32t-O
The air is turned off and the refrigerant gas from the first pressure m machine 21 flows into the heat exchanger 28 to heat the air and adjust the temperature. Further, the required temperature change in the low temperature room 2 can be dealt with by adjusting the opening degrees of the first and second flow control valves 31 and 330.
このように、本実施例によれば、低温室2内の冷風を電
気加熱器を用いずに調温できるので、ランニングコスト
を安くできろ。また電気加熱器の使用−所が少なくなる
ので、安全性が向上する。As described above, according to this embodiment, the temperature of the cold air in the cold room 2 can be controlled without using an electric heater, so that running costs can be reduced. Furthermore, safety is improved because the number of places where electric heaters are used is reduced.
さらに、本実施例によれば、第1、第2を磁弁3U、3
2および第1、第・2流量調節弁31.33により熱交
換器28の加熱ttl−制呻できる、即ち冷風の温度を
広範囲に制両できる。Furthermore, according to this embodiment, the first and second magnetic valves 3U, 3
2, and the first and second flow control valves 31 and 33 can control the heating TTL of the heat exchanger 28, that is, the temperature of the cold air can be controlled over a wide range.
以上の如く、本発明によれば、低温室の調温を電気加熱
器を用いることなく行えるので、装置のランニングコス
)f低減でさ、かつ′成気厘熱器の使用調所も少なくな
ゐので、安全性が高くなる。As described above, according to the present invention, since the temperature of a cold room can be controlled without using an electric heater, the running cost of the equipment can be reduced, and the number of places where a heating device is used can be reduced. Therefore, safety is increased.
第1図は本発明の一実施例を示したもので、冷熱衝撃試
験装置の低温室および冷αサイクル系統を示f図、第2
図は従来の冷熱衝撃試験装置の断面平面図、第3図は同
じくd面上面図である。
2・・・低温室 27・・・蒸発器 28・・・熱
交換器(調温用加熱器) 29A・・・ホットガス往
路系 A・・・第1冷凍サイクル B・・・第2冷
凍サイクル。Fig. 1 shows an embodiment of the present invention, and Fig. f shows the cold room and cold α cycle system of the thermal shock test device.
The figure is a cross-sectional plan view of a conventional thermal shock testing apparatus, and FIG. 3 is a top view of the d-plane. 2... Low temperature room 27... Evaporator 28... Heat exchanger (temperature control heater) 29A... Hot gas outward path system A... First refrigeration cycle B... Second refrigeration cycle .
Claims (1)
換えにより低温室の冷風または高温室の熱風を試験室に
循環させるようにして成る冷熱衝撃試験装置において、
第1圧縮機、凝縮器、第1膨脹弁、カスケード熱交換器
により構成される第1冷凍サイクルおよび第2圧縮機、
前記カスケード熱交換器、第2膨脹弁、蒸発器により構
成される第2冷凍サイクルと、加熱器とを備え、前記第
2冷凍サイクルの蒸発器および前記加熱器を低温室内に
配設し、その加熱器に前記第1冷凍サイクルのホットガ
スを流通させるように構成したことを特徴とする冷熱衝
撃試験装置。In a thermal shock test device, a test chamber, a low temperature chamber, and a high temperature chamber are arranged independently, and cold air from the low temperature chamber or hot air from the high temperature chamber is circulated through the test chamber by switching dampers.
A first refrigeration cycle and a second compressor, which are composed of a first compressor, a condenser, a first expansion valve, and a cascade heat exchanger;
A second refrigeration cycle comprising the cascade heat exchanger, a second expansion valve, and an evaporator, and a heater; the evaporator and the heater of the second refrigeration cycle are disposed in a low temperature chamber; A thermal shock test apparatus characterized in that the apparatus is configured to allow hot gas from the first refrigeration cycle to flow through the heater.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20828184A JPS6189429A (en) | 1984-10-05 | 1984-10-05 | Cold shock testing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20828184A JPS6189429A (en) | 1984-10-05 | 1984-10-05 | Cold shock testing device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6189429A true JPS6189429A (en) | 1986-05-07 |
Family
ID=16553641
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20828184A Pending JPS6189429A (en) | 1984-10-05 | 1984-10-05 | Cold shock testing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6189429A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04147067A (en) * | 1990-10-09 | 1992-05-20 | Mitsubishi Electric Corp | Burn-in apparatus |
JPH06331226A (en) * | 1993-05-24 | 1994-11-29 | Nissin Kogyo Kk | Temperature control method and device thereof for binary refrigerating system |
KR100955902B1 (en) | 2008-08-25 | 2010-05-03 | 최영수 | Heat pump system |
JP2014020733A (en) * | 2012-07-23 | 2014-02-03 | Hitachi Appliances Inc | Two-cycle refrigerator |
JP2015102541A (en) * | 2013-11-28 | 2015-06-04 | エスペック株式会社 | Environmental test device and cooling system |
JP2019219164A (en) * | 2018-06-19 | 2019-12-26 | バイス ウンベルトテヒニク ゲゼルシャフト ミット ベシュレンクテル ハフツング | Fluid adjustment method and test chamber |
CN113368910A (en) * | 2021-07-08 | 2021-09-10 | 新沂凯瑞克制冷科技有限公司 | High-low temperature environment simulation test device adopting single-compressor multi-stage self-cascade refrigeration system |
-
1984
- 1984-10-05 JP JP20828184A patent/JPS6189429A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04147067A (en) * | 1990-10-09 | 1992-05-20 | Mitsubishi Electric Corp | Burn-in apparatus |
JPH06331226A (en) * | 1993-05-24 | 1994-11-29 | Nissin Kogyo Kk | Temperature control method and device thereof for binary refrigerating system |
KR100955902B1 (en) | 2008-08-25 | 2010-05-03 | 최영수 | Heat pump system |
JP2014020733A (en) * | 2012-07-23 | 2014-02-03 | Hitachi Appliances Inc | Two-cycle refrigerator |
JP2015102541A (en) * | 2013-11-28 | 2015-06-04 | エスペック株式会社 | Environmental test device and cooling system |
JP2019219164A (en) * | 2018-06-19 | 2019-12-26 | バイス ウンベルトテヒニク ゲゼルシャフト ミット ベシュレンクテル ハフツング | Fluid adjustment method and test chamber |
CN113368910A (en) * | 2021-07-08 | 2021-09-10 | 新沂凯瑞克制冷科技有限公司 | High-low temperature environment simulation test device adopting single-compressor multi-stage self-cascade refrigeration system |
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