JPS6323669U - - Google Patents

Info

Publication number
JPS6323669U
JPS6323669U JP11715686U JP11715686U JPS6323669U JP S6323669 U JPS6323669 U JP S6323669U JP 11715686 U JP11715686 U JP 11715686U JP 11715686 U JP11715686 U JP 11715686U JP S6323669 U JPS6323669 U JP S6323669U
Authority
JP
Japan
Prior art keywords
board
circuit networks
defective
reference values
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11715686U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11715686U priority Critical patent/JPS6323669U/ja
Publication of JPS6323669U publication Critical patent/JPS6323669U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP11715686U 1986-07-30 1986-07-30 Pending JPS6323669U (OSRAM)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11715686U JPS6323669U (OSRAM) 1986-07-30 1986-07-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11715686U JPS6323669U (OSRAM) 1986-07-30 1986-07-30

Publications (1)

Publication Number Publication Date
JPS6323669U true JPS6323669U (OSRAM) 1988-02-16

Family

ID=31002411

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11715686U Pending JPS6323669U (OSRAM) 1986-07-30 1986-07-30

Country Status (1)

Country Link
JP (1) JPS6323669U (OSRAM)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001264398A (ja) * 1999-11-22 2001-09-26 Fujitsu Ten Ltd 電子部品検査装置及び検査方法
JP2005189115A (ja) * 2003-12-25 2005-07-14 Ricoh Co Ltd 基板解析装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5853774A (ja) * 1981-09-25 1983-03-30 Toshiba Corp Ｌｓｉの試験方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5853774A (ja) * 1981-09-25 1983-03-30 Toshiba Corp Ｌｓｉの試験方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001264398A (ja) * 1999-11-22 2001-09-26 Fujitsu Ten Ltd 電子部品検査装置及び検査方法
JP2005189115A (ja) * 2003-12-25 2005-07-14 Ricoh Co Ltd 基板解析装置

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