JPS632174U - - Google Patents
Info
- Publication number
- JPS632174U JPS632174U JP9616986U JP9616986U JPS632174U JP S632174 U JPS632174 U JP S632174U JP 9616986 U JP9616986 U JP 9616986U JP 9616986 U JP9616986 U JP 9616986U JP S632174 U JPS632174 U JP S632174U
- Authority
- JP
- Japan
- Prior art keywords
- insulating substrate
- clip
- dual
- semiconductor device
- line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 claims 6
- 239000004065 semiconductor Substances 0.000 claims 3
- 230000009977 dual effect Effects 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 8
- 239000000523 sample Substances 0.000 description 2
- 239000004020 conductor Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9616986U JPS632174U (ro) | 1986-06-24 | 1986-06-24 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9616986U JPS632174U (ro) | 1986-06-24 | 1986-06-24 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS632174U true JPS632174U (ro) | 1988-01-08 |
Family
ID=30961612
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9616986U Pending JPS632174U (ro) | 1986-06-24 | 1986-06-24 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS632174U (ro) |
-
1986
- 1986-06-24 JP JP9616986U patent/JPS632174U/ja active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS59185834U (ja) | 試験システム用接続装置 | |
EP1136827A3 (en) | Contactor having LSI-circuit-side contact piece and test-board-side contact piece for testing semiconductor device and manufacturing method thereof | |
JPS60123666U (ja) | 回路基板等の検査装置 | |
JPH061703B2 (ja) | 電導リード線 | |
TW345712B (en) | Semiconductor device | |
JPS632174U (ro) | ||
JPS6082271U (ja) | 同軸プロ−ブコンタクト | |
JPS632173U (ro) | ||
JPS6225877U (ro) | ||
JPH0534685U (ja) | 多芯l型同軸コネクタ | |
JPH0313688U (ro) | ||
US3240864A (en) | Spring contact | |
JPS6217728Y2 (ro) | ||
JPS63109658U (ro) | ||
JPH0141237Y2 (ro) | ||
JPS61115981U (ro) | ||
JPS63157952U (ro) | ||
JPS5826182U (ja) | プリント基板のコネクタ構造 | |
JPS6088480U (ja) | 超高周波用icソケツト | |
JPS636360U (ro) | ||
JPH0160382U (ro) | ||
JPS61203364U (ro) | ||
JPH0457768U (ro) | ||
JPS59280U (ja) | コネクタ | |
JPH01144875U (ro) |