JPS63191080A - Electronic circuit measuring apparatus - Google Patents

Abstract

PURPOSE:To simultaneously measure a plurality of electronic circuits each having a small number of pins without adding hardware, by respectively providing a plurality of comparators and a plurality of memory parts and arbitrarily combining them by software. CONSTITUTION:The pattern from a pattern generating part 1 is supplied to an electronic circuit through a pattern driver 3 and inputted to a level comparator 7 through a buffer circuit 6. This output pattern is compared with the expectation value pattern from the pattern generating part 1 by a pattern comparator 8 and the result thereof is transmitted to a judge result recording part 9. At this time, when 10 judge circuits are used with respect to one electronic circuit to be measured, the remaining 38 judge circuits are allotted to the other electronic circuit to be measured. The result at every judge circuit is collected at every circuit to be measured to perform the judgement of quality in a controller 10A and a judge result is displayed on a display part 11A corresponding at each electronic circuit to be measured.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a measuring device for electronic circuits, such as logic circuit functions, which can uniquely define input (output versus turn) turns.

[Conventional technology]

FIG. 2 is a general configuration diagram showing a conventional electronic circuit measuring device of this type, in which (1) is a pattern generation section that generates an input pattern for logic testing, and (2) is the generated pattern 78.
The pattern control section (3) is the pattern generation section [1
a pattern driver that supplies the human cover turn from 1 to an electronic circuit under test (not shown) via a switch (4a);
(5) is a reference voltage generator used for setting 7 bells of the pattern driver (3) and the level comparator (described later); (6)
is a buffer circuit that takes in the output obtained from the electronic circuit under test via the switch (4b), and (7) is a buffer circuit (
(6) is a level comparator that compares the output pattern with the reference level from the reference voltage generator [5); (8) is a pattern comparator that compares the output pattern with the expected pattern;
(9) is a judgment result recording unit that stores the judgment results obtained by these comparisons, and αq is a controller that controls the entire device.

(b) is a display section that displays measurement results.

Next, the operation will be explained. The pattern required as the input of the circuit under test and the expected value pattern of the output are stored in the pattern generation unit (1), and then
21 as a predetermined continuous pattern.

Supplied to pattern driver (3). On the other hand, the reference voltage generation section 15) supplies the reference level necessary for setting the human power level to the pattern driver (3), and the pattern driver (3) outputs a signal that satisfies the required pattern and level of the electronic circuit under test. is supplied.

Next, the output from the electronic circuit under test passes through a buffer circuit (6) and is then connected to a novel computer/computer (7). The level comparator (1) compares the force S which is a prescribed output level with the comparative determination level from the reference voltage generator (5), and normalizes the output pattern.

Next (this pattern is stored in the pattern generation section (11f) and the expected value pattern is stored in the butter 7 comparator (
8) and transfers the results to the judgment result recording section (9), which judges whether the electronic circuit under test is good or not.
to be displayed.

FIG. 3 is a block diagram showing the configuration necessary for recording and displaying judgment results when evaluating multiple circuits under test using a conventional measuring device.
In order to evaluate the same type of circuit under test, 48 judgment circuits are required, and accordingly, 48 judgment result recording sections (9a) to (9n) are provided to record these output results. The results were synthesized by hardware, transmitted to the controller αQ1, and displayed as measurement results on the display unit q.

[Problem that the invention seeks to solve]

Since this type of conventional electronic circuit measuring device is constructed as described above, for example, when a plurality of electronic circuits of the same type are to be simultaneously measured in parallel.

Compatible with individual circuits under test. It is necessary to prepare an output determination section, that is, a comparator section and a recording section as hardware, and the number of parallel measurements must be determined at the time of manufacturing the measuring device, resulting in a lack of redundancy. There were problems such as complicated hardware.

This invention was made to solve the above-mentioned problems, and it is an electronic circuit measuring device that can simultaneously measure multiple items using software and has a large number of input/output bins.
By adding hardware and controlling with software, simultaneous measurement of multiple electronic circuits with a small number of bins can be easily realized, making effective use of hardware and reducing costs.
The purpose is to obtain a device whose performance can be improved.

[Means for solving problems]

In the case of simultaneous measurement of a plurality of electronic circuits, the electronic circuit measuring device according to the present invention divides the output determination section using software,
It is possible to allocate it to each circuit under test, record the results for each circuit under test, and display the final result for each circuit under test from the recording section.

[Effect]

In the electronic circuit measuring device according to the third aspect of the present invention, the output a-leg circuit is assigned to six electronic circuits to be measured according to the description of the strike program, the pass/fail determination is performed for each of the assigned output determination sections, and the measurement result is determined. The pass/fail judgment is identified and displayed for each electronic circuit under test.

〔Example〕

An embodiment of the present invention will be described below with reference to the drawings.

First, since the basic form of the electronic circuit measuring device to which the present invention is applied is exactly the same as the conventional device shown in FIG. 2, repeated explanation will be omitted.

FIG. 1 is a block diagram conceptually showing the configuration of only the main parts of an embodiment of the present invention, and is shown corresponding to FIG. 3 of the conventional device. In this example.

The results of 48 determination result recording sections (Ki) to (9n) are independently transmitted to the controller (IOA). The controller (IOA) synthesizes the measurement results according to the description of the measurement program. That is, when all 48 output determination circuits are used to determine one electronic circuit under test, the determination results are combined into one circuit.

However, when 10 judgment circuits are used for one electronic circuit under test, the remaining 38 judgment circuits are allocated to other electronic circuits under test. Then, the results for each assigned judgment circuit are summarized for each electronic circuit under test, and a pass/fail judgment is made by the controller' (IOA), and the pass/fail judgment is displayed for each electronic circuit under test. !
This is carried out on the display unit (ILA). Of course 1 display section (IIA)
has a display function corresponding to the number of electronic circuits to be measured written by the test program.

In the above embodiment, a case was described in which the number of judgment circuits determined on the hardware fair is divided and used for multiple child circuits to be measured. 1. For example, a device having 48 output determination circuits can be used as a device having a large number of output determination circuits such as 48×2.48×3.48×4 by using several devices in parallel.

〔Effect of the invention〕

As described above, according to the present invention, the 1 determination circuit can be knotted.
Since it is possible to combine them using hardware, it is possible to easily realize parallel measurements when using a measurement device for an electronic circuit under test that has a large number of input/output terminals as an electronic circuit under test that has a small number of input/output terminals. This has the effect of providing an electronic circuit measuring device with high cost performance.

[Brief explanation of the drawing]

@ Figure 1 is a box diagram conceptually showing the configuration of only the main parts of an embodiment of the present invention, Figure 2 is a general configuration diagram showing a conventional electronic circuit measuring device, and Figure 3 is a diagram of a conventional electronic circuit measuring device. FIG. 2 is a block diagram showing the configuration of only the main parts when evaluating a plurality of component circuits to be measured using the measuring device of FIG. Figure (C1) shows the pattern generation section, (7) shows the novel comparator, (8) shows the pattern comparator, (
9). (9a) to (9n) are determination result recording units, M, Cl
0A) is a controller, 01) and (IIA) are display units. The same reference numerals in Figure 21 indicate the same or equivalent parts.

Claims (1)

[Claims] (1) A comparator that compares the output pattern of the electronic circuit under test with an expected pattern when a predetermined input pattern is input to the electronic circuit under test having a logic function, and a record that stores the comparison results and makes a pass/fail judgment. An electronic circuit measuring device having a plurality of comparators and a plurality of recording sections, each of which can be arbitrarily combined using software to simultaneously measure a plurality of the electronic circuits to be measured in parallel. .