JPS63190975U - - Google Patents

Info

Publication number
JPS63190975U
JPS63190975U JP8259787U JP8259787U JPS63190975U JP S63190975 U JPS63190975 U JP S63190975U JP 8259787 U JP8259787 U JP 8259787U JP 8259787 U JP8259787 U JP 8259787U JP S63190975 U JPS63190975 U JP S63190975U
Authority
JP
Japan
Prior art keywords
voltage
terminal
series circuit
operational amplifier
under test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8259787U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8259787U priority Critical patent/JPS63190975U/ja
Publication of JPS63190975U publication Critical patent/JPS63190975U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】
第１図はこの考案の一実施例を示す接続図、第
２図及び第３図は従来技術の１及び２を説明する
ための接続図である。 １：被試験ＩＣ、２：演算増幅器、３：直流電
圧源、ＮＦ：帰還回路、４Ａ，４Ｂ，４Ｃ：電流
検出用抵抗器、６：電流測定回路、６Ａ：引き算
回路、６Ｂ：ＡＤ変換器、６Ｃ：演算手段、６Ｄ
：バツフア増幅器、７：レンジ切替回路、Ｓ５，
Ｓ６，Ｓ７：レンジ切替スイツチ。

Claims (1)

  1. 【実用新案登録請求の範囲】 Ａ 一方の入力端子に直流電圧源から直流電圧が
    与えられた演算増幅器と、 Ｂ この演算増幅器の出力端子と被試験ＩＣの端
    子との間に接続した少なくとも小電流検出用抵抗
    器と大電流検出用抵抗器から成る直列回路と、 Ｃ 上記被試験ＩＣの端子に与えられる電圧を上
    記演算増幅器の他方の入力端子に帰還し被試験Ｉ
    Ｃの端子の電圧を上記直流電圧源から与えられる
    電圧値に合致させる帰還回路と、 Ｄ 上記直列回路に発生する電圧を選択的に取出
    すレンジ切替用スイツチと、 Ｅ このレンジ切替用スイツチで取出した電圧値
    から上記被試験ＩＣの端子に流れる電流を測定す
    る電流測定回路と、 から成るＩＣ試験装置。
JP8259787U 1987-05-29 1987-05-29 Pending JPS63190975U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8259787U JPS63190975U (ja) 1987-05-29 1987-05-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8259787U JPS63190975U (ja) 1987-05-29 1987-05-29

Publications (1)

Publication Number Publication Date
JPS63190975U true JPS63190975U (ja) 1988-12-08

Family

ID=30935387

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8259787U Pending JPS63190975U (ja) 1987-05-29 1987-05-29

Country Status (1)

Country Link
JP (1) JPS63190975U (ja)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999027376A1 (fr) * 1997-11-20 1999-06-03 Advantest Corporation Procede de test de circuits integres et appareil de test de circuits integres utilisant ce procede
WO1999028756A1 (fr) * 1997-12-02 1999-06-10 Advantest Corporation Procede permettant de mesurer une intensite en appliquant une tension, et dispositif a cet effet
JP2020165772A (ja) * 2019-03-29 2020-10-08 株式会社デンソーテン 電流測定装置及び電流測定方法
US11852244B2 (en) 2019-02-04 2023-12-26 Eagle Industry Co., Ltd. Sliding component and method of manufacturing sliding member
US11852241B2 (en) 2019-02-04 2023-12-26 Eagle Industry Co., Ltd. Sliding component
US12007027B2 (en) 2019-04-24 2024-06-11 Eagle Industry Co., Ltd. Sliding component
US12013040B2 (en) 2019-02-21 2024-06-18 Eagle Industry Co., Ltd. Sliding components
US12018757B2 (en) 2019-02-04 2024-06-25 Eagle Industry Co., Ltd. Sliding components

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50110576A (ja) * 1974-02-08 1975-08-30
JPS5194278A (ja) * 1975-02-17 1976-08-18
JPS54105975A (en) * 1978-02-08 1979-08-20 Toshiba Corp Measurement circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50110576A (ja) * 1974-02-08 1975-08-30
JPS5194278A (ja) * 1975-02-17 1976-08-18
JPS54105975A (en) * 1978-02-08 1979-08-20 Toshiba Corp Measurement circuit

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999027376A1 (fr) * 1997-11-20 1999-06-03 Advantest Corporation Procede de test de circuits integres et appareil de test de circuits integres utilisant ce procede
WO1999028756A1 (fr) * 1997-12-02 1999-06-10 Advantest Corporation Procede permettant de mesurer une intensite en appliquant une tension, et dispositif a cet effet
US11852244B2 (en) 2019-02-04 2023-12-26 Eagle Industry Co., Ltd. Sliding component and method of manufacturing sliding member
US11852241B2 (en) 2019-02-04 2023-12-26 Eagle Industry Co., Ltd. Sliding component
US12018757B2 (en) 2019-02-04 2024-06-25 Eagle Industry Co., Ltd. Sliding components
US12013040B2 (en) 2019-02-21 2024-06-18 Eagle Industry Co., Ltd. Sliding components
JP2020165772A (ja) * 2019-03-29 2020-10-08 株式会社デンソーテン 電流測定装置及び電流測定方法
US12007027B2 (en) 2019-04-24 2024-06-11 Eagle Industry Co., Ltd. Sliding component

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