JPS63186725A - Epoxy resin composition for semiconductor device - Google Patents

Epoxy resin composition for semiconductor device

Info

Publication number
JPS63186725A
JPS63186725A JP1793287A JP1793287A JPS63186725A JP S63186725 A JPS63186725 A JP S63186725A JP 1793287 A JP1793287 A JP 1793287A JP 1793287 A JP1793287 A JP 1793287A JP S63186725 A JPS63186725 A JP S63186725A
Authority
JP
Japan
Prior art keywords
epoxy resin
resin
resin composition
weight
moisture resistance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1793287A
Other languages
Japanese (ja)
Inventor
Kimihide Fujita
藤田 公英
Manabu Yamane
学 山根
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Resonac Corp
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Priority to JP1793287A priority Critical patent/JPS63186725A/en
Publication of JPS63186725A publication Critical patent/JPS63186725A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain a resin composition suitable for sealing semiconductor devices, which can provide thin semiconductor devices with high-reliability and excellent moisture resistance, by mixing two specified epoxy resins with a specified curing agent, a cure accelerator and an organic solvent. CONSTITUTION:The title compound containing an epi-bis epoxy resin (A) (e.g., an epoxy resin derived from bisphenol A and epichlorohydrin), a cresol novolak epoxy resin (B) (e.g., o-cresol novolak resin), a phenolic resin curing agent (C) (e.g., a phenol resin derived from bisphenol A, phenol and formaldehyde), a cure accelerator (D) (e.g., 1-cyanoethyl-2-ethyl-4-methylimidazole) and an organic solvent (E) (e.g., toluene). By mixing the above components, an epoxy resin composition improved in heat cycle resistance in which resin (B) is lacking and improved also in moisture resistance in which resin A is lacking can be obtained, and it can provide high-reliability thin semiconductor devices excellent in moisture resistance when used in sealing semiconductor devices.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は半導体装置用エポキシ樹脂組成物に関し、さら
に詳しくは薄型で、耐湿性に優れた、信頼性の高い半導
体装置用エポキシ樹脂組成物に関する。
Detailed Description of the Invention (Field of Industrial Application) The present invention relates to an epoxy resin composition for semiconductor devices, and more particularly to an epoxy resin composition for semiconductor devices that is thin, has excellent moisture resistance, and is highly reliable. .

(従来の技術) エポキシ樹脂は接着性および耐湿性に優れ、しかも良好
な電気特性と機械特性とを有するため、電気および電子
部品の絶縁封止用材料として広く利用されている。
(Prior Art) Epoxy resins have excellent adhesiveness and moisture resistance, as well as good electrical and mechanical properties, and are therefore widely used as insulation sealing materials for electrical and electronic components.

電子産業分野においては近年、一層の小型軽量化や高密
度化が進み、これに対応してハイブリッドICの採用が
増加して半導体素子またはチップ部品の基板への直接実
装が広く行なわれている。
BACKGROUND ART In recent years, in the field of electronic industry, there has been progress toward further reduction in size and weight and density, and in response to this, the adoption of hybrid ICs has increased, and direct mounting of semiconductor elements or chip components on substrates has become widespread.

このパイプリフトICを外部からの湿気および塵から保
護するいわゆるパッケージ方法としては、従来気密封止
法と樹脂封止法とが知られている。
As so-called packaging methods for protecting the pipe lift IC from external moisture and dust, the hermetic sealing method and the resin sealing method are conventionally known.

気密封止法は耐湿性および耐冷熱サイクル性に優れてお
り、信頼性の高いハイブリッドICが得られる反面、コ
ストが高いという欠点があった。一方樹脂封止法はコス
トが安いものの、樹脂封止法に用いられる樹脂はエピ−
ビス型エポキシ樹脂とノボラック型および/またはレゾ
ール型フェノール樹脂硬化剤とを配合してなる樹脂組成
物が主流であり、この樹脂組成物は、耐ヒートサイクル
性が優れているものの耐湿性に劣るという欠点があり、
通用範囲が限られていた。そこで信頼性、特に耐湿性に
優れた封止用樹脂の開発が要望されている現状である。
Although the hermetic sealing method has excellent moisture resistance and cold/heat cycle resistance and can provide a highly reliable hybrid IC, it has the drawback of high cost. On the other hand, although the cost of the resin encapsulation method is low, the resin used in the resin encapsulation method is epitaxial.
The mainstream is a resin composition made by blending a bis-type epoxy resin with a novolac-type and/or resol-type phenolic resin curing agent, and although this resin composition has excellent heat cycle resistance, it is said that it has poor moisture resistance. There are drawbacks,
The range of application was limited. Therefore, there is a current demand for the development of a sealing resin that has excellent reliability, especially moisture resistance.

また樹脂封止法の信頼性を向上させるためICチップを
スポットシールした後、冷熱衝撃時の応力を軽減するた
めに可とう性のある樹脂をモールドし、その後エポキシ
樹脂系粉体塗料で外装する方法も提案されている(電子
材料編集部用「ハイブリッドIC技術」)。しかしなが
らこの方法にも耐湿性および耐冷熱衝撃性を著しく向上
させることはできるが、製造工程が複雑であり、しかも
部品の薄型化のためには不向きであるという欠点があっ
た。
In addition, to improve the reliability of the resin sealing method, after spot-sealing the IC chip, a flexible resin is molded to reduce stress during thermal shock, and then the exterior is coated with an epoxy resin powder coating. A method has also been proposed ("Hybrid IC Technology" for the Electronic Materials Editorial Department). However, although this method can significantly improve moisture resistance and cold shock resistance, it has the disadvantage that the manufacturing process is complicated and it is not suitable for thinning parts.

(発明が解決しようとする問題点) 本発明の目的は、前記従来技術の欠点を除去し、薄型で
、耐湿性に優れた信頼性の高い半導体装置を提供するこ
とができる半導体装置用エポキシ樹脂組成物を提供する
ことにある。
(Problems to be Solved by the Invention) An object of the present invention is to provide an epoxy resin for semiconductor devices that can eliminate the drawbacks of the prior art and provide a thin, highly reliable semiconductor device with excellent moisture resistance. An object of the present invention is to provide a composition.

(問題点を解決するための手段) 本発明はエピ−ビス型エポキシ樹脂、クレゾール・ノボ
ラック型エポキシ樹脂、フェノール樹脂硬化剤、硬化促
進剤および有機溶剤を含有してなる半導体装置用エポキ
シ樹脂組成物に関する。
(Means for Solving the Problems) The present invention provides an epoxy resin composition for semiconductor devices containing an epi-bis type epoxy resin, a cresol novolac type epoxy resin, a phenolic resin curing agent, a curing accelerator, and an organic solvent. Regarding.

本発明に使用されるエピ−ビス型エポキシ樹脂としては
、例えばビスフェノールAまたはビスフェノールFとエ
ピクロルヒドリンとから誘導されるエホー1−シ4AJ
JIL 1. 1−ビス(4−ヒドロキシフェニル)エ
タンとエピクロルヒドリンとかう誘導されるエポキシ樹
脂等が挙げられ、そのエポキシ当量には特に制限はない
が、耐湿性の点から450以上であることが好ましい。
The epi-bis type epoxy resin used in the present invention includes, for example, epi-bis 4AJ derived from bisphenol A or bisphenol F and epichlorohydrin.
JIL 1. Examples include epoxy resins derived from 1-bis(4-hydroxyphenyl)ethane and epichlorohydrin, and the epoxy equivalent thereof is not particularly limited, but is preferably 450 or more from the viewpoint of moisture resistance.

本発明に使用されるクレゾール・ノボラック型エポキシ
樹脂としては、例えば0−クレゾール・ノボラック樹脂
、p−クレゾール・ノボラック樹脂等が挙げられ、その
分子量やエポキシ当量には特に制限はない。
Examples of the cresol/novolac type epoxy resin used in the present invention include 0-cresol/novolac resin, p-cresol/novolac resin, etc., and there are no particular limitations on the molecular weight or epoxy equivalent.

本発明に使用されるエピ−ビス型エポキシ樹脂とクレゾ
ール・ノボラック型エポキシ樹脂との配合割合は、耐湿
性、成膜性、耐冷熱衝撃性の点からエピ−ビス型エポキ
シ樹脂/クレゾール・ノボラック型エポキシ樹脂の重量
比が、7/3〜2/8の範囲が好ましい。
The mixing ratio of the Epi-Bis type epoxy resin and the Cresol/Novolac type epoxy resin used in the present invention is determined from the viewpoints of moisture resistance, film forming properties, and cold/thermal shock resistance. The weight ratio of the epoxy resin is preferably in the range of 7/3 to 2/8.

本発明に使用されるフェノール樹脂硬化剤としては、例
えばビスフェノールA1フエノールとホルムアルデヒド
とから誘導されるフェノール樹脂等が挙げられる。成膜
性や耐湿性の点から、フェノール樹脂硬化剤の水酸基当
量は105〜110g / e q %軟化点は65℃
以上であることが好ましい。またこのフェノール樹脂に
含有される塩素イオンとナトリウムイオンとの量が5p
pm以下の場合にはさらに耐湿性の向上が図られる。
Examples of the phenolic resin curing agent used in the present invention include phenolic resins derived from bisphenol A1 phenol and formaldehyde. From the point of view of film forming properties and moisture resistance, the hydroxyl equivalent of the phenolic resin curing agent is 105 to 110 g/eq%, and the softening point is 65°C.
It is preferable that it is above. In addition, the amount of chlorine ions and sodium ions contained in this phenolic resin is 5p.
When it is below pm, the moisture resistance is further improved.

フェノール樹脂硬化剤は耐湿性の点からエポキシ基1個
に対し水酸基0.8〜1.2個の割合で配合することが
好ましい。
From the viewpoint of moisture resistance, the phenol resin curing agent is preferably blended in a ratio of 0.8 to 1.2 hydroxyl groups to one epoxy group.

本発明に使用される硬化促進剤としては、例えば1−シ
アノエチル−2−エチル−4−メチルイミダゾール等の
イミダゾール化合物、ベンジルジメチルアミン等の第三
級アミン類などの塩基性化合物が挙げられる。これらの
硬化促進剤の配合割合は、硬化性と貯蔵安定性とのバラ
ンスの点からフェノール樹脂硬化剤100重量部に対し
て0.1〜3重量部が好ましい。
Examples of the curing accelerator used in the present invention include basic compounds such as imidazole compounds such as 1-cyanoethyl-2-ethyl-4-methylimidazole and tertiary amines such as benzyldimethylamine. The blending ratio of these curing accelerators is preferably 0.1 to 3 parts by weight based on 100 parts by weight of the phenolic resin curing agent from the viewpoint of the balance between curability and storage stability.

本発明に使用される有機溶剤としては、例えばベンゼン
、トルエン、キシレン等の芳香族系炭化水素、アセトン
、メチルエチルケトン、メチルイソブチルケトン等のケ
トン類、メタノール、エタノール、n−ブタノール、イ
ソブタノール等のアルコール類、エチレングリコールモ
ノメチルエーテル、エチレングリコールモノエチルエー
テル、エチレングリコールモノブチルエーテル等のエー
テル類、酢酸エチル、酢酸ブチル等のエステル類などが
挙げられる。これらの化合物は単独でまたは2種以上混
合して使用される。トルエン/メタノール/エチレング
リコールモノブチルエーテルの混合系は、硬化時に溶媒
が一度に飛散して塗膜が発泡することがな(、特に好ま
しい。
Examples of organic solvents used in the present invention include aromatic hydrocarbons such as benzene, toluene, and xylene, ketones such as acetone, methyl ethyl ketone, and methyl isobutyl ketone, and alcohols such as methanol, ethanol, n-butanol, and isobutanol. Examples include ethers such as ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, and ethylene glycol monobutyl ether, and esters such as ethyl acetate and butyl acetate. These compounds may be used alone or in combination of two or more. A mixed system of toluene/methanol/ethylene glycol monobutyl ether is particularly preferred because the solvent does not scatter all at once and the coating film does not foam during curing.

有機溶剤は所望の膜厚が得られるように適宜その配合割
合が決められる。
The blending ratio of the organic solvent is determined as appropriate so that a desired film thickness can be obtained.

本発明のエポキシ樹脂組成物は、前記のエピ−ビス型エ
ポキシ樹脂、クレゾール・ノボラック型エポキシ樹脂、
フェノール樹脂硬化剤、硬化促進剤および有機溶剤を、
配合することにより得られる。
The epoxy resin composition of the present invention includes the above-mentioned epi-bis type epoxy resin, cresol novolac type epoxy resin,
Phenolic resin curing agent, curing accelerator and organic solvent,
Obtained by blending.

本発明のエポキシ樹脂組成物には、所望によりカップリ
ング剤、着色剤、消泡剤、充虜剤とじてに制限はない。
The epoxy resin composition of the present invention may optionally include a coupling agent, a coloring agent, an antifoaming agent, a filler, etc. without any limitation.

(発明の効果) 本発明のエポキシ樹脂組成物は、その硬化物がクレゾー
ル・ノボラック型エポキシ樹脂の欠点であるヒートサイ
クル性を向上させ、しかもエピ−ビス型エポキシ樹脂の
欠点である耐湿性をも著しく向上させた優れたものであ
る。
(Effects of the Invention) The cured product of the epoxy resin composition of the present invention improves the heat cycle property, which is a drawback of cresol novolac type epoxy resins, and also has moisture resistance, which is a drawback of epi-bis type epoxy resins. This is an excellent product that has been significantly improved.

本発明のエポキシ樹脂組成物は、半導体装置の対土用樹
脂として使用することにより薄型(例えば膜厚約100
μm)で、耐湿性に優れた、信頼性の高い半導体装置を
提供することができる。
The epoxy resin composition of the present invention can be used as a soil-retaining resin for semiconductor devices to achieve a thin structure (for example, a film thickness of about 100 mm).
μm), it is possible to provide a highly reliable semiconductor device with excellent moisture resistance.

(実施例) 実施例1 。(Example) Example 1.

エポキシ当ff12000のエピコート1007  (
エピ−ビス型エポキシ樹脂、油化シェルエポキシ(株)
m商品名)50重量部、エポキシ当量的200のYDC
N−702(クレゾール・ノボラック型エポキシ樹脂、
東部化成(株)製部品名)50重量部、フェノール樹脂
硬化剤H−1(明相化成(株)製)28重量部、硬化促
進剤として1−シアノエチル−2−エチル−4−メチル
イミダゾール(四国化成(株)製、2E4MZ−CN)
0゜2重量部、トルエン60i量部、メタノール30重
量部およびエチレングリコールモツプチルエーテル30
重量部を配合してフラスコ内で80℃に加温、攪拌して
完全に溶解させ、本発明のエポキシ樹脂組成物を得た。
Epoxy ff12000 Epicoat 1007 (
Epi-bis type epoxy resin, Yuka Shell Epoxy Co., Ltd.
m trade name) 50 parts by weight, epoxy equivalent 200 YDC
N-702 (cresol novolac type epoxy resin,
50 parts by weight of phenolic resin curing agent H-1 (manufactured by Meiso Kasei Co., Ltd.), 1-cyanoethyl-2-ethyl-4-methylimidazole (as a curing accelerator) Manufactured by Shikoku Kasei Co., Ltd., 2E4MZ-CN)
0.2 parts by weight, 60 parts by weight of toluene, 30 parts by weight of methanol, and 30 parts by weight of ethylene glycol motubutyl ether.
Parts by weight were blended, heated to 80°C in a flask, stirred, and completely dissolved to obtain an epoxy resin composition of the present invention.

実施例2 エポキシ当量900のエビコー)1004  (エピ−
ビス型エポキシ樹脂、油化シェルエポキシ(株)製)4
0!ffi部、エポキシ当量的200のYDCN−70
2(クレゾール・ノボラック型エポキシ樹脂、東部化成
(株)製)60重量部、フェノール樹脂硬化剤H−1(
明相化成(株)製)34ffi1部、硬化促進剤として
ベンジルジメチルアミン(正正(株)製)0.5重量部
、カップリング剤Al100 (日本ユニカー(株)製
)2M量部、トルエン30重量部、メタノール50重量
部およびエチレングリコールモノエチルエーテル30重
量部を配合してフラスコ内で80℃に加温、攪拌して完
全に溶解させ、本発明のエポキシ樹脂組成物を得た。
Example 2 Epoxy equivalent weight 900 Ebico) 1004 (Epi-
Screw-type epoxy resin, manufactured by Yuka Shell Epoxy Co., Ltd.) 4
0! ffi part, epoxy equivalent 200 YDCN-70
2 (cresol novolak type epoxy resin, manufactured by Tobu Kasei Co., Ltd.) 60 parts by weight, phenolic resin curing agent H-1 (
1 part of 34ffi (manufactured by Meiso Kasei Co., Ltd.), 0.5 parts by weight of benzyldimethylamine (manufactured by Seisei Co., Ltd.) as a curing accelerator, 2M parts of coupling agent Al100 (manufactured by Nippon Unicar Co., Ltd.), 30 parts of toluene. parts by weight, 50 parts by weight of methanol, and 30 parts by weight of ethylene glycol monoethyl ether were blended, heated to 80°C in a flask, stirred, and completely dissolved to obtain an epoxy resin composition of the present invention.

実施例3 エポキシ当量2000のエピコート1007 (エピ−
ビス型エポキシ樹脂、油化シェルエポキシ(株)11)
30重量部、エポキシ当量的220のEOCN−102
(クレゾール・ノボラック型エポキシ樹脂、日本化薬(
株)製部品名)70重量部、フェノール樹脂硬化剤HP
−607N (日立化成工業(株)製)40M量部、硬
化促進剤としてポリキャット5ANO102(サンアボ
ット(株)製部品名)1重量部、カップリング剤KBM
403 (信越化学(株)製部品名)2重量部、トルエ
ン30重量部、メタノール50重量部およびエチレング
リコールモノエチルエーテル30重量部を配合してフラ
スコ内で80℃に加温、攪拌して完全に溶解させ、本発
明のエポキシ樹脂組成物を得た。
Example 3 Epikote 1007 (Epi-
Screw-type epoxy resin, Yuka Shell Epoxy Co., Ltd. 11)
30 parts by weight, epoxy equivalent 220 EOCN-102
(Cresol novolac type epoxy resin, Nippon Kayaku (
Co., Ltd. part name) 70 parts by weight, phenolic resin curing agent HP
-607N (manufactured by Hitachi Chemical Co., Ltd.) 40M parts, as a curing accelerator Polycat 5ANO102 (part name manufactured by Sun Abbott Co., Ltd.) 1 part by weight, coupling agent KBM
403 (part name manufactured by Shin-Etsu Chemical Co., Ltd.) 2 parts by weight, 30 parts by weight of toluene, 50 parts by weight of methanol, and 30 parts by weight of ethylene glycol monoethyl ether were mixed together, heated to 80°C in a flask, and stirred to complete the mixture. The epoxy resin composition of the present invention was obtained.

比較例1 エポキシ当、ff2000のエピコート1007  (
エピ−ビス型エポキシ樹脂、油化シェルエポキシ(株)
製)100重量部、フェノール樹脂硬化剤H−1(明相
化成(株)製)5重量部、硬化促進剤として1−シアノ
エチル−2−エチル−4−メチルイミダゾール(四国化
成(株)f1!!、2E4MZ−CN)0.2重量部、
トルエン60重量部、メタノール30重量部およびエチ
レングリコールモノブチルエーテル30重量部を配合し
てフラスコ内で80℃に加温、攪拌して完全に熔解させ
、エポキシ樹脂組成物を得た。
Comparative Example 1 Epoxy, ff2000 Epikote 1007 (
Epi-bis type epoxy resin, Yuka Shell Epoxy Co., Ltd.
100 parts by weight of phenolic resin curing agent H-1 (manufactured by Meiso Kasei Co., Ltd.), 5 parts by weight of phenolic resin curing agent H-1 (manufactured by Meiso Kasei Co., Ltd.), and 1-cyanoethyl-2-ethyl-4-methylimidazole (manufactured by Shikoku Kasei Co., Ltd. f1!) as a curing accelerator. !, 2E4MZ-CN) 0.2 parts by weight,
60 parts by weight of toluene, 30 parts by weight of methanol, and 30 parts by weight of ethylene glycol monobutyl ether were blended, heated to 80°C in a flask, stirred, and completely melted to obtain an epoxy resin composition.

比較例2 エポキシ当量200のYDCN−702(クレゾール・
ノボラック型エポキシ樹脂、東部化成(株)製部品名)
100!量部、フェノール樹脂硬化剤H−1(明相化成
(株)製部品名)52正量部、硬化促進剤として1−シ
アンエチル−2−エチル−4−メチルイミダゾール(四
国化成(株)製、284MZ−CN)0.2重量部、ト
ルエン60重量部、メタノール30M量部およびエチレ
ングリコールモノブチルエーテル30重量部を配合して
フラスコ内で80°Cに加温、攪拌して完全に熔解させ
、エポキシ樹脂組成物を得た。
Comparative Example 2 YDCN-702 (cresol) with an epoxy equivalent of 200
Novolac type epoxy resin, manufactured by Tobu Kasei Co., Ltd. Part name)
100! 52 parts by weight of phenolic resin curing agent H-1 (part name manufactured by Meiso Kasei Co., Ltd.), 1-cyanethyl-2-ethyl-4-methylimidazole (manufactured by Shikoku Kasei Co., Ltd.) as a curing accelerator . An epoxy resin composition was obtained.

試験例 実施例1〜3および比較例1〜2で得られたエポキシ樹
脂組成物を、第1図に外観および第2図に断面図を示す
IC封止用セラミックキャップ1(15X25X2鳳園
、厚さ1璽1のハイフ゛リッドrc用セラミック基板3
との接着面に塗布後、80℃で1時間予備乾燥した。次
いで第3図に示すように500gの荷M4をかけて18
0℃で2時間硬化させ、セラミックキャップ1をイボキ
シ樹脂組成物2で接着したハイブリッドIC用セラミッ
ク基板3を試料として用い、MIL規格MIL−3TD
−883Bのグロスリーク試験(フロロカーボンにより
)で気密性を評価した。その結果を第1表に示す。
Test Examples The epoxy resin compositions obtained in Examples 1 to 3 and Comparative Examples 1 to 2 were used in a ceramic cap 1 for IC sealing (15 x 25 Ceramic substrate 3 for hybrid RC of size 1
After coating on the adhesive surface, it was pre-dried at 80° C. for 1 hour. Next, as shown in Figure 3, a 500g load M4 was applied to the 18
A ceramic substrate 3 for hybrid IC, which was cured at 0° C. for 2 hours and a ceramic cap 1 was bonded with an ivoxy resin composition 2, was used as a sample, and the MIL standard MIL-3TD was used.
-883B gross leak test (using fluorocarbon) to evaluate airtightness. The results are shown in Table 1.

(1)半田耐熱性:260℃の半田浴に10秒間浸漬す
る。
(1) Solder heat resistance: Immerse in a 260°C solder bath for 10 seconds.

(2)耐ヒートザイクル性ニー45℃−c 1 時f?
Ff、次いで125℃で1 時間の処理を1サイ クルとして100サ イクル行なう。
(2) Heat cycle resistance knee 45℃-c 1 hour f?
Ff and then 100 cycles, each cycle consisting of treatment at 125° C. for 1 hour.

(3)耐湿性:水を入れた120℃、2気圧のオートク
レーブ中で100時間放置 する。
(3) Moisture resistance: Leave in an autoclave filled with water at 120°C and 2 atm for 100 hours.

第   1   表 (8も表中の分子はリーク不良(10−8mml(gで
リークしたもの)の数、分母は全試料数を示す。
In Table 1 (also referred to as 8), the numerator indicates the number of leak failures (10-8 mml (leaked in g)), and the denominator indicates the total number of samples.

第1表の結果から、本発明により、ノボラック型エポキ
シ用脂の欠点である脆弱さを改善でき、そのためヒート
サイクル性が向上され、しかもエピ−ビス型エポキシ樹
脂の欠点である耐湿性をも向上されることが示される。
From the results shown in Table 1, the present invention can improve the fragility, which is a drawback of novolak type epoxy resins, improve heat cycle performance, and also improve moisture resistance, which is a drawback of epi-bis type epoxy resins. It is shown that

【図面の簡単な説明】[Brief explanation of the drawing]

第1図および第2図は、本発明の試験例で用いたIC封
止用セラミックキャップの形状を示す図、ならびに第3
図は、試験例で行なったエポキシ樹脂組成物を塗布した
ハイブリッドIC用セラミックキャップを、ハイブリッ
ドIC用セラミック基板に接着する方法を示す図である
。 1・・・セラミックキャップ、2・・・エポキシ樹脂組
成物、3・・・ハイブリッドIC用セラミック基板、4
・・・荷重(500g)。 、f12  図 第 3 図
1 and 2 are diagrams showing the shape of the ceramic cap for IC sealing used in test examples of the present invention, and
The figure is a diagram showing a method of bonding a hybrid IC ceramic cap coated with an epoxy resin composition to a hybrid IC ceramic substrate in a test example. DESCRIPTION OF SYMBOLS 1... Ceramic cap, 2... Epoxy resin composition, 3... Ceramic substrate for hybrid IC, 4
...Load (500g). , f12 Figure 3

Claims (1)

【特許請求の範囲】[Claims] 1、エピ−ビス型エポキシ樹脂、クレゾール・ノボラッ
ク型エポキシ樹脂、フェノール樹脂硬化剤、硬化促進剤
および有機溶剤を含有してなる半導体装置用エポキシ樹
脂組成物。
1. An epoxy resin composition for semiconductor devices containing an epi-bis type epoxy resin, a cresol novolak type epoxy resin, a phenolic resin curing agent, a curing accelerator, and an organic solvent.
JP1793287A 1987-01-28 1987-01-28 Epoxy resin composition for semiconductor device Pending JPS63186725A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1793287A JPS63186725A (en) 1987-01-28 1987-01-28 Epoxy resin composition for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1793287A JPS63186725A (en) 1987-01-28 1987-01-28 Epoxy resin composition for semiconductor device

Publications (1)

Publication Number Publication Date
JPS63186725A true JPS63186725A (en) 1988-08-02

Family

ID=11957546

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1793287A Pending JPS63186725A (en) 1987-01-28 1987-01-28 Epoxy resin composition for semiconductor device

Country Status (1)

Country Link
JP (1) JPS63186725A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02173057A (en) * 1988-12-27 1990-07-04 Sumitomo Bakelite Co Ltd Resin composition for semiconductor sealing
KR100398315B1 (en) * 2001-02-12 2003-09-19 한국과학기술원 Method of manufacturing conductive adhesive for high frequency flip chip package applications

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02173057A (en) * 1988-12-27 1990-07-04 Sumitomo Bakelite Co Ltd Resin composition for semiconductor sealing
KR100398315B1 (en) * 2001-02-12 2003-09-19 한국과학기술원 Method of manufacturing conductive adhesive for high frequency flip chip package applications

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