JPS63162535U - - Google Patents

Info

Publication number
JPS63162535U
JPS63162535U JP5435687U JP5435687U JPS63162535U JP S63162535 U JPS63162535 U JP S63162535U JP 5435687 U JP5435687 U JP 5435687U JP 5435687 U JP5435687 U JP 5435687U JP S63162535 U JPS63162535 U JP S63162535U
Authority
JP
Japan
Prior art keywords
probe needles
probe
bent tips
needles
handles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5435687U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5435687U priority Critical patent/JPS63162535U/ja
Publication of JPS63162535U publication Critical patent/JPS63162535U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例に係るプローブ針が
半導体素子の電極パツドに接触している状態を示
す部分斜視図、第2図は従来のプローブカードの
プローブ針が半導体素子の電極パツドに接触して
いる状態を示す部分斜視図である。 1a……針先を短く曲げたプローブ針、1b…
…針先を長く曲げたプローブ針、2……半導体素
子、3……電極パツド。
Fig. 1 is a partial perspective view showing a state in which a probe needle according to an embodiment of the present invention is in contact with an electrode pad of a semiconductor element, and Fig. 2 is a partial perspective view showing a state in which a probe needle of a conventional probe card is in contact with an electrode pad of a semiconductor element. FIG. 3 is a partial perspective view showing a state in which they are in contact. 1a... Probe needle with a short bent tip, 1b...
...Probe needle with long bent tip, 2...Semiconductor element, 3...Electrode pad.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 針先を短く曲げたプローブ針と針先を長く曲げ
たプローブ針とを交互に並べ、プローブ針の柄が
隣と段違いになるように配置したことを特徴とす
るプローブカード。
A probe card characterized in that probe needles with short bent tips and probe needles with long bent tips are arranged alternately, and the handles of the probe needles are arranged at different levels from the adjacent probe needles.
JP5435687U 1987-04-09 1987-04-09 Pending JPS63162535U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5435687U JPS63162535U (en) 1987-04-09 1987-04-09

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5435687U JPS63162535U (en) 1987-04-09 1987-04-09

Publications (1)

Publication Number Publication Date
JPS63162535U true JPS63162535U (en) 1988-10-24

Family

ID=30881274

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5435687U Pending JPS63162535U (en) 1987-04-09 1987-04-09

Country Status (1)

Country Link
JP (1) JPS63162535U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001108708A (en) * 1999-10-07 2001-04-20 Micronics Japan Co Ltd Probe card

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001108708A (en) * 1999-10-07 2001-04-20 Micronics Japan Co Ltd Probe card

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