JPS63153109U - - Google Patents

Info

Publication number
JPS63153109U
JPS63153109U JP4429287U JP4429287U JPS63153109U JP S63153109 U JPS63153109 U JP S63153109U JP 4429287 U JP4429287 U JP 4429287U JP 4429287 U JP4429287 U JP 4429287U JP S63153109 U JPS63153109 U JP S63153109U
Authority
JP
Japan
Prior art keywords
screen
sealed container
image sensor
vacuum level
lid surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4429287U
Other languages
Japanese (ja)
Other versions
JPH0613444Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987044292U priority Critical patent/JPH0613444Y2/en
Priority to US07/171,083 priority patent/US4850696A/en
Priority to DE8888302503T priority patent/DE3872906T2/en
Priority to EP88302503A priority patent/EP0284347B1/en
Priority to AU13782/88A priority patent/AU606927B2/en
Publication of JPS63153109U publication Critical patent/JPS63153109U/ja
Application granted granted Critical
Publication of JPH0613444Y2 publication Critical patent/JPH0613444Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Measuring Fluid Pressure (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例の簡略構成図、第2
図は容器が良品の場合の反射態様図、第3図は不
良品の場合の反射態様図、第4図はスクリーン上
の結像状態を示し、Aは良品の場合、Bは不良品
の場合である。第5図は電気的構成のブロツク図
、第6図はそのタイミングチヤート、第7図は光
源の変形例の簡略構成図である。 1……光源、2……スクリーン、3……位置調
整手段、4……イメージセンサ、10……容器、
19……比較回路。
Figure 1 is a simplified configuration diagram of one embodiment of the present invention;
Figure 3 shows the reflection mode when the container is good, Figure 3 shows the reflection mode when it is defective, and Figure 4 shows the image formation on the screen. A is for a good product, B is for a defective product. It is. FIG. 5 is a block diagram of the electrical configuration, FIG. 6 is a timing chart thereof, and FIG. 7 is a simplified configuration diagram of a modified example of the light source. DESCRIPTION OF SYMBOLS 1... Light source, 2... Screen, 3... Position adjustment means, 4... Image sensor, 10... Container,
19... Comparison circuit.

補正 昭62.7.27 考案の名称を次のように補正する。 考案の名称 密封容器の真空度検査装置 実用新案登録請求の範囲、図面の簡単な説明を
次のように補正する。
Amendment July 27, 1982 The name of the invention is amended as follows. Title of the invention Vacuum testing device for sealed containers The claims for utility model registration and the brief description of the drawings are amended as follows.

【実用新案登録請求の範囲】 1 密封容器の蓋面に光線を照射する光源と、そ
の蓋面からの反射光線を投影されるスクリーンと
、このスクリーン上の像を検知するイメージセン
サと、該イメージセンサの出力を繰り返し任意の
回数走査する走査回路と、その走査された出力を
基準値と比較して良否判定信号を出力する比較回
路とを備えたことを特徴とする密封容器の真空度
検査装置。 2 前記スクリーンの位置を位置調整手段によつ
て調整可能にしたことを特徴とする実用新案登録
請求の範囲第1項に記載の密封容器の真空度検査
装置。3 前記光源が大口径レンズを含み、前記密封容
器の蓋面を含む領域を平行光線によつて照射する
ことを特徴とする実用新案登録請求の範囲第1項
に記載の密封容器の真空度検査装置。
[Claims for Utility Model Registration] 1. A light source that irradiates a light beam onto the lid surface of a sealed container, a screen onto which the reflected light beam from the lid surface is projected, an image sensor that detects an image on the screen, and the image A vacuum level inspection device for a sealed container, comprising a scanning circuit that repeatedly scans the sensor output an arbitrary number of times, and a comparison circuit that compares the scanned output with a reference value and outputs a pass/fail determination signal. . 2. The vacuum level inspection device for a sealed container according to claim 1, wherein the position of the screen is adjustable by a position adjusting means. 3. Vacuum level inspection of a sealed container according to claim 1, wherein the light source includes a large-diameter lens and irradiates a region including the lid surface of the sealed container with parallel light. Device.

【図面の簡単な説明】 第1図は本考案の一実施例の簡略構成図、第2
図は容器が良品の場合の反射態様図、第3図は不
良品の場合の反射態様図、第4図はスクリーン上
の結像状態を示し、Aは良品の場合、Bは不良品
の場合である。第5図は電気的構成のブロツク図
、第6図はそのタイミングチヤート、第7図は光
源の変形例の簡略構成図である。 1……光源、2……スクリーン、3……位置調
整手段、4……イメージセンサ、10……容器、
19……比較回路、21……白熱電球、24……
凸レンズ。
[Brief Description of the Drawings] Figure 1 is a simplified configuration diagram of one embodiment of the present invention;
Figure 3 shows the reflection mode when the container is good, Figure 3 shows the reflection mode when it is defective, and Figure 4 shows the image formation on the screen. A is for a good product, B is for a defective product. It is. FIG. 5 is a block diagram of the electrical configuration, FIG. 6 is a timing chart thereof, and FIG. 7 is a simplified configuration diagram of a modified example of the light source. DESCRIPTION OF SYMBOLS 1... Light source, 2... Screen, 3... Position adjustment means, 4... Image sensor, 10... Container,
19... Comparison circuit, 21... Incandescent light bulb, 24...
convex lens.

Claims (1)

【実用新案登録請求の範囲】 1 密封容器の蓋面に平行光線を照射する光源と
、その蓋面からの反射光線を投影されるスクリー
ンと、このスクリーン上の像を検知するイメージ
センサと、該イメージセンサの出力を繰り返し任
意の回数走査する走査回路と、その走査された出
力を基準値と比較して良否判定信号を出力する比
較回路とを備えたことを特徴とする密封容器の真
空度検査装置。 2 前記スクリーンの位置を位置調整手段によつ
て調整可能にしたことを特徴とする実用新案登録
請求の範囲第1項に記載の密封容器の真空度検査
装置。
[Claims for Utility Model Registration] 1. A light source that irradiates the lid surface of a sealed container with parallel rays, a screen on which the reflected rays from the lid surface are projected, an image sensor that detects the image on the screen, and A vacuum level inspection of a sealed container, characterized by comprising a scanning circuit that repeatedly scans the output of an image sensor an arbitrary number of times, and a comparison circuit that compares the scanned output with a reference value and outputs a pass/fail determination signal. Device. 2. The vacuum level inspection device for a sealed container according to claim 1, wherein the position of the screen is adjustable by a position adjusting means.
JP1987044292U 1987-03-27 1987-03-27 Vacuum container inspection system Expired - Lifetime JPH0613444Y2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP1987044292U JPH0613444Y2 (en) 1987-03-27 1987-03-27 Vacuum container inspection system
US07/171,083 US4850696A (en) 1987-03-27 1988-03-21 Vacuum degree inspecting device for sealed up vessel
DE8888302503T DE3872906T2 (en) 1987-03-27 1988-03-22 DEVICE FOR CHECKING THE SIZE OF THE VACUUM IN A CLOSED CONTAINER.
EP88302503A EP0284347B1 (en) 1987-03-27 1988-03-22 A device for inspecting the degree of vacuum in a sealed vessel
AU13782/88A AU606927B2 (en) 1987-03-27 1988-03-28 Vacuum degree inspecting device for sealed up vessel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987044292U JPH0613444Y2 (en) 1987-03-27 1987-03-27 Vacuum container inspection system

Publications (2)

Publication Number Publication Date
JPS63153109U true JPS63153109U (en) 1988-10-07
JPH0613444Y2 JPH0613444Y2 (en) 1994-04-06

Family

ID=30861963

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987044292U Expired - Lifetime JPH0613444Y2 (en) 1987-03-27 1987-03-27 Vacuum container inspection system

Country Status (1)

Country Link
JP (1) JPH0613444Y2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050285025A1 (en) * 2004-06-29 2005-12-29 Mikhail Boukhny Optical noninvasive pressure sensor

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS517063A (en) * 1974-07-09 1976-01-21 Japan Steel Works Ltd Purasuchitsukudaino hennikujidoshuseisochi
JPS5862506A (en) * 1981-10-12 1983-04-14 Matsushita Electric Ind Co Ltd Inspecting device for micro-unevenness on surface

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS517063A (en) * 1974-07-09 1976-01-21 Japan Steel Works Ltd Purasuchitsukudaino hennikujidoshuseisochi
JPS5862506A (en) * 1981-10-12 1983-04-14 Matsushita Electric Ind Co Ltd Inspecting device for micro-unevenness on surface

Also Published As

Publication number Publication date
JPH0613444Y2 (en) 1994-04-06

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