JPS6315143A - Method for detecting flaw of planar body - Google Patents
Method for detecting flaw of planar bodyInfo
- Publication number
- JPS6315143A JPS6315143A JP15918286A JP15918286A JPS6315143A JP S6315143 A JPS6315143 A JP S6315143A JP 15918286 A JP15918286 A JP 15918286A JP 15918286 A JP15918286 A JP 15918286A JP S6315143 A JPS6315143 A JP S6315143A
- Authority
- JP
- Japan
- Prior art keywords
- light
- planar body
- receiving element
- transmitted
- guided
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims description 16
- 239000013307 optical fiber Substances 0.000 claims abstract description 28
- 230000007547 defect Effects 0.000 claims description 20
- 230000035945 sensitivity Effects 0.000 abstract description 15
- 238000001514 detection method Methods 0.000 abstract description 14
- 230000001678 irradiating effect Effects 0.000 abstract 1
- 238000007689 inspection Methods 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 230000002950 deficient Effects 0.000 description 2
- 229920003002 synthetic resin Polymers 0.000 description 2
- 239000000057 synthetic resin Substances 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は7−ト状、フィルム状、板状等各種面状体の欠
陥を光学的に検出するための方法に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for optically detecting defects in various planar objects such as sheet-like, film-like, and plate-like objects.
合成樹脂シート(フィルムも含む)、金属板、ガラス板
等、これらの面状体を光学的に検査する手段として、フ
ライング・スポット法が広く採用されている。The flying spot method is widely used as a means for optically inspecting planar objects such as synthetic resin sheets (including films), metal plates, glass plates, and the like.
この方法では、第5図に示すように光照射系1のレーザ
光源2から出射された平行光をレンズ3で絞り、光走査
手段ヰを介してその光ビームを矢印方向に走行する面状
体(被検体)5の表面に照射しながら走査し、この際の
反射光または透過光を受光素子6にて検出し、その光信
号を光→電気変換して電気的に処理している。In this method, as shown in FIG. 5, parallel light emitted from a laser light source 2 of a light irradiation system 1 is condensed by a lens 3, and the light beam is passed through a light scanning means to a planar object that travels in the direction of the arrow. The surface of (subject) 5 is irradiated and scanned, the reflected light or transmitted light at this time is detected by the light receiving element 6, and the optical signal is converted from light to electricity and processed electrically.
このような方法によるとき、面状体5からの反射光また
は透過光は、その面状体5の正常部と欠陥部とで異なり
、受光素子6へ入射される光量も異なるので、この受光
素子6において受光量の変化を検出することによ、シ、
面状体5の欠陥の有無、その欠陥部位等が判明する。When such a method is used, the reflected light or transmitted light from the planar body 5 is different between the normal part and the defective part of the planar body 5, and the amount of light incident on the light receiving element 6 is also different, so this light receiving element By detecting the change in the amount of received light in step 6,
The presence or absence of a defect in the planar body 5, the defective location, etc. can be determined.
ところで上記フライング・スポット法の受光手段として
光フアイバ受光法がある。この方法は同じく第5図に示
すように、面状体5が例えば透過性を有する場合、面状
体5の上方から走査光を照射することにより、下方に透
過した透過光を、面状体5の下部に走査幅相当分だけ並
べられた光ファイバ7の一端から入射して光フアイバ7
内に案内し、1つに結束された光ファイバ7の他端から
出射して直接受光素子6に導く方法である。By the way, there is an optical fiber light receiving method as a light receiving means for the flying spot method. Similarly, as shown in FIG. 5, in this method, when the planar body 5 has transparency, scanning light is irradiated from above the planar body 5, and the transmitted light transmitted downward is transmitted through the planar body. The light enters the optical fiber 7 from one end of the optical fiber 7 which is arranged at the bottom of the optical fiber 5 in an amount corresponding to the scanning width.
In this method, the light is guided into the optical fiber 7, and the light is emitted from the other end of the optical fiber 7, which is bundled into one, and is guided directly to the light receiving element 6.
しかしながら、上記光フアイバ受光法では、前記光ファ
イバ7がレーザ光以外の他の波長光も伝送案内するため
、検査装置周辺の光も外乱光として光フアイバ内に入射
し、検出感度(S/N比)が低下する間項があシ、この
ため、外乱光の入射を防止する特別な遮光装置を設けな
ければならず、検査に要する費用が高くつく欠点があっ
た。However, in the optical fiber reception method, since the optical fiber 7 also transmits and guides light of wavelengths other than laser light, light around the inspection device also enters the optical fiber as disturbance light, and the detection sensitivity (S/N Therefore, a special light-shielding device must be provided to prevent the incidence of disturbance light, which has the drawback of increasing the cost of inspection.
また、前記受光素子6の受光面積が大きいので、受光す
る位置により感度にバラツキが生じやすく、即ち、光フ
ァイバ7に入射した前記透過光(反射光の場合も含む)
の位置により、受光素子6に感度むらが生じ、面状体5
の欠陥に応じた電気信号が得られず、走査光の走査方向
での検出感度差が生じる不都合があった。Furthermore, since the light receiving area of the light receiving element 6 is large, the sensitivity tends to vary depending on the position where the light is received.
Due to the position of the light receiving element 6, sensitivity unevenness occurs, and the
An electric signal corresponding to the defect cannot be obtained, and there is a problem that a difference in detection sensitivity occurs in the scanning direction of the scanning light.
本発明は上記の問題点を解決し、受光素子に外乱光が入
らないようにし、また受光素子での検出感度が均一にな
るようにして、面状体の欠陥を精度よく検出できるよう
にしたもので、光走査手段を備えた光照射系により面状
体の表面を光走査して、その走査光を面状体よシ反射ま
たは透過させ、その反射光または透過光を光ファイバで
案内して受光素子に導き、その受光素子で面状体の欠陥
の有無による前記反射光まだは透過光の変化を検出する
面状体の欠陥検出方法において、前記光ファイバで案内
された前記反射光または透過光を干渉フィルタとコンデ
ンサレンズを通して前記受光素子に導くことを特徴とす
るものである。The present invention solves the above-mentioned problems, prevents disturbance light from entering the light-receiving element, and makes the detection sensitivity of the light-receiving element uniform, making it possible to accurately detect defects in planar objects. A method in which the surface of a planar object is scanned with light using a light irradiation system equipped with a light scanning means, the scanning light is reflected or transmitted through the planar object, and the reflected or transmitted light is guided through an optical fiber. In the method for detecting a defect in a planar object, the reflected light or the transmitted light guided by the optical fiber is detected by the light receiving device to detect a change in the reflected light or transmitted light depending on the presence or absence of a defect in the planar object. It is characterized in that transmitted light is guided to the light receiving element through an interference filter and a condenser lens.
本発明方法の場合、上記のように、光ファイバで案内さ
れた面状体からの反射光または透過光が、干渉フィルタ
に入射する際、フィルタの面に垂直な方向から入射した
光即ち面状体からの欠陥有無を検出する光のみが干渉フ
ィルタを通過し、それ以外の光即ち外乱光は通過を阻止
される。また干渉フィルタを通過した光がコンデンサレ
ンズを通過後、受光素子の受光面で一点に集中するよう
に受光素子に導かれることになシ、前記受光素子での感
度むらが減少する。In the case of the method of the present invention, as described above, when reflected light or transmitted light from a planar body guided by an optical fiber is incident on an interference filter, light that is incident from a direction perpendicular to the surface of the filter, that is, a planar object Only light from the body for detecting the presence or absence of a defect passes through the interference filter, and other light, that is, disturbance light, is blocked from passing through. Further, since the light that has passed through the interference filter is guided to the light receiving element so as to be concentrated at one point on the light receiving surface of the light receiving element after passing through the condenser lens, sensitivity unevenness in the light receiving element is reduced.
次に本発明の一実施例を第1図及び第2図により詳細に
説明する。なお説明の都合上、従来と同一構成のものに
は、同一符号をつけるものとする。Next, one embodiment of the present invention will be described in detail with reference to FIGS. 1 and 2. For convenience of explanation, the same reference numerals are used to denote the same components as in the prior art.
まず第1図に示すように、欠陥を検出すべき例えば透明
な合成樹脂ノートからなる面状体5が矢印方向に走行し
、この面状体5の表面には、光照射系1のレーザ光源2
から出射された平行光をレンズ5で絞った光ビームが上
方から照射され、かつこの光ビームは、回転ミラー等の
光走査手段4により面状体5の幅方向に走査される。First, as shown in FIG. 1, a planar body 5 made of, for example, a transparent synthetic resin notebook whose defects are to be detected runs in the direction of the arrow. 2
A light beam is emitted from above and focused by a lens 5, and this light beam is scanned in the width direction of the planar body 5 by a light scanning means 4 such as a rotating mirror.
次にこの面状体5を通過した透過光は、面状体5の下部
に走査幅相当分だけ並べられた光ファイバ7の一端から
入射して光フアイバ7内に案内され、1つに結束された
光ファイバ7の他端から出射される。Next, the transmitted light that has passed through the planar body 5 enters from one end of the optical fibers 7 arranged at the bottom of the planar body 5 by an amount corresponding to the scanning width, is guided into the optical fibers 7, and is bundled into one. The light is emitted from the other end of the optical fiber 7.
次に前記透過光は第2図に示すように、干渉フィルタ8
とコンデンサレンズ(集光レンズ)9を通過する。干渉
フィルタ8は例えばAuからなる金属製のフィルタで、
干渉現象を利用した透過光のバントパスフィルタである
。Next, the transmitted light is filtered through an interference filter 8 as shown in FIG.
and passes through a condenser lens (condensing lens) 9. The interference filter 8 is a metal filter made of Au, for example.
This is a bandpass filter for transmitted light that utilizes interference phenomena.
上記干渉フィルタ8は、周知の次式により通過波長をあ
られすことができる。The wavelength of the interference filter 8 to be passed can be determined by the following well-known formula.
2t・cosθ=mλ
t:フィルタ金属の厚さ
λ:透過波長
m:整数
θ:フィルタの法線に対する入射光の傾きここで、レー
ザ光を用いると仮定した場合、λは一定であり、レーザ
光のみ透過させる干渉フィルタを使用すると、tも決定
される。2t・cosθ=mλ t: Thickness of filter metal λ: Transmission wavelength m: Integer θ: Inclination of incident light with respect to the normal line of the filter Here, assuming that a laser beam is used, λ is constant, and the laser beam Using an interference filter that only transmits t, t is also determined.
即ち、θ=00(干渉フィルタに対して垂直)な光取外
は、同じλであっても通過しない。That is, when the light is removed at θ=00 (perpendicular to the interference filter), the light does not pass even if the light is the same λ.
従って、第2図のように、光ファイバ7の内部を全反射
して干渉フィルタ8へ入射しようとする光5を通過した
透過光の如きレーザ光は、θ=00であるので、干渉フ
ィルタ8内を通過することになり、検出感度が高められ
る。Therefore, as shown in FIG. 2, the laser beam, such as the transmitted light that has passed through the light 5 that is totally reflected inside the optical fiber 7 and is about to enter the interference filter 8, has θ=00, so the interference filter 8 This increases the detection sensitivity.
次に前記干渉フィルタ8を通過したレーザ光である透過
光は平行になってコンデンサレンズ9に入り、そこを通
過後、受光素子6の受光面で一点に集中するように位置
決めされた受光素子6に入射される。受光素子6として
は、フォトダイオード(PD)やアバランシェフォトダ
イオード責APD)等の光検出器からなり、電気的、電
子的な信号処理回路、記録計等を備えた検出装置に接続
されている。Next, the transmitted light, which is the laser light that has passed through the interference filter 8, becomes parallel and enters the condenser lens 9, and after passing there, the light receiving element 6 is positioned so that it is concentrated at one point on the light receiving surface of the light receiving element 6. is incident on the The light receiving element 6 is composed of a photodetector such as a photodiode (PD) or an avalanche photodiode (APD), and is connected to a detection device equipped with an electrical and electronic signal processing circuit, a recorder, and the like.
受光素子6では面状体5の欠陥の有無による前記透過光
の光量の変化を検出する。The light receiving element 6 detects a change in the amount of transmitted light depending on the presence or absence of a defect in the planar body 5.
即ち、面状体5の正常部に走査光が照射されているとき
、その透過光が定常状態で受光素子6に入射されるので
、受光レベルに変化がなく、検出装置は面状体に欠陥が
ないことを認識する。ところが面状体5に傷、異物混入
、汚れ等の欠陥部があり、これに走査光が照射されると
、面状体5を透過する透過光の光量が変化し、その透過
光が定常状態と異なる状態で受光素子6に入射されるこ
とになる。これにより、受光レベルが変化し、検出装置
は面状体5に欠陥があることを認識する。このようにし
て面状体の欠陥有無を検出する。That is, when the normal part of the planar body 5 is irradiated with scanning light, the transmitted light enters the light receiving element 6 in a steady state, so there is no change in the level of light reception, and the detection device detects a defect in the planar body. Recognize that there is no. However, when the planar body 5 has defects such as scratches, foreign matter, dirt, etc. and is irradiated with scanning light, the amount of transmitted light that passes through the planar body 5 changes, and the transmitted light changes to a steady state. The light will be incident on the light receiving element 6 in a different state. As a result, the light reception level changes, and the detection device recognizes that the planar body 5 has a defect. In this way, the presence or absence of defects in the planar body is detected.
本発明では、受光素子6に入射される透過光が、コンデ
ンサレンズ9の作用により受光素子6の一点に集中する
ので、受光素子6の受光する位置の違いによる感度のバ
ラツキの影響を受けなくなり、感度むらが生じなくなる
。In the present invention, since the transmitted light incident on the light receiving element 6 is concentrated at one point on the light receiving element 6 by the action of the condenser lens 9, it is not affected by variations in sensitivity due to differences in the light receiving position of the light receiving element 6. Sensitivity unevenness will no longer occur.
なお前記干渉フィルタ8を通過する光は、フィルタに対
する垂直成分即ちθ==00 の分だけであるので、
受光素子6に導かれる光量が少ない場合がある。例えば
面状体5に照射される走査光は光学走査されている関係
で、この走査光が特に幅広の面状体の幅方向側に照射さ
れたとき、ここを通過した透過光が光ファイバ7の軸線
方向に入射せず、この軸線に対して角度を持った方向か
ら入射され、かつ出射される場合であシ、このような光
は干渉フィルタでカットされるからである。Note that the light that passes through the interference filter 8 is only a component perpendicular to the filter, that is, θ==00, so
The amount of light guided to the light receiving element 6 may be small. For example, since the scanning light irradiated onto the planar body 5 is optically scanned, when this scanning light is irradiated on the widthwise side of a particularly wide planar body, the transmitted light that has passed through this is transmitted through the optical fiber 7. This is because such light is not incident in the axial direction, but is incident and exited from a direction at an angle to this axis, and such light is cut by the interference filter.
このような場合、光ファイバ7の出口側端面と干渉フィ
ルタ8との間に拡散板を入れ光ファイバのNA(開口数
)で規定されるすべての出射光を拡散して均一化させる
と、受光素子への光量不足による検出精度の低下、誤作
動を防止でき検出装置の性能が向上する。In such a case, if a diffusion plate is inserted between the exit side end face of the optical fiber 7 and the interference filter 8 and all the emitted light defined by the NA (numerical aperture) of the optical fiber is diffused and made uniform, the received light can be improved. This improves the performance of the detection device by preventing a decrease in detection accuracy and malfunction due to insufficient light to the element.
なお面状体5が金属板のような不透明体の場合には、走
査光が面状体を通過せず反射することになるが、この反
射光を光ファイバで案内して前記干渉フィルタとコンデ
ンサレンズを通し受光素子に導くようにしても、同様に
面状体の欠陥の有無を精度よく検出できるものである。Note that if the planar body 5 is an opaque body such as a metal plate, the scanning light will not pass through the planar body but will be reflected, but this reflected light will be guided by an optical fiber and connected to the interference filter and the condenser. Even if the light is guided to the light-receiving element through a lens, the presence or absence of defects in the planar body can be detected with high accuracy.
以上説明したように、本発明に係る面状体の欠陥検出方
法によれば、前記光ファイバで案内された面状体からの
反射光または透過光を干渉フィルタとコンデンサレンズ
を通して受光素子に導くことにより、面状体の欠陥有無
を検出するのに必要な光だけを選択して受光素子に導く
ことができ、検出感度(S/N比)を向上させることが
できる。As explained above, according to the method for detecting defects in a planar object according to the present invention, reflected light or transmitted light from the planar object guided by the optical fiber is guided to a light receiving element through an interference filter and a condenser lens. Therefore, only the light necessary for detecting the presence or absence of a defect in the planar body can be selected and guided to the light receiving element, and the detection sensitivity (S/N ratio) can be improved.
従って、外乱光のような検出に不要な光をカットする特
別な遮光装置を設ける必要がなく、検査装置が安価とな
り検査コストを低減させることができる。Therefore, there is no need to provide a special light shielding device that cuts off light unnecessary for detection, such as disturbance light, and the inspection device becomes inexpensive, allowing the inspection cost to be reduced.
また干渉フィルタを通過した反射光または透過光はコン
デンサレンズで絞られて受光素子に入射するので、受光
素子の受光位置の違いによる感度のバラツキの影響を受
けなくなり、感度むらが生じなくなる。従って、前記検
出感度の向上とあいまって、面状体の微小な欠陥の有無
や部位を精度よく検出することができる。In addition, the reflected light or transmitted light that has passed through the interference filter is condensed by a condenser lens and enters the light-receiving element, so that it is not affected by variations in sensitivity due to differences in the light-receiving position of the light-receiving element, and no sensitivity unevenness occurs. Therefore, in combination with the improvement in detection sensitivity, it is possible to accurately detect the presence or absence and location of minute defects in the planar object.
第1図は本発明の一実施例を示す説明図、第2図は本発
明の要部を拡大して示す説明図、第5図は従来方法を示
す説明図である。
1・・・・・・光照射系、4・・・・・・光走査手段、
・5・・・・・・面状体、6・・・・・・受光素子、7
・・・・・・光ファイバ、8・・・・・・干渉フィルタ
、9・・・・・・コンデンサレンズ。FIG. 1 is an explanatory diagram showing an embodiment of the present invention, FIG. 2 is an explanatory diagram showing an enlarged main part of the present invention, and FIG. 5 is an explanatory diagram showing a conventional method. 1... Light irradiation system, 4... Light scanning means,
・5... Planar body, 6... Light receiving element, 7
...Optical fiber, 8...Interference filter, 9...Condenser lens.
Claims (1)
査して、その走査光を面状体より反射または透過させ、
その反射光または透過光を光ファイバで案内して受光素
子に導き、その受光素子で面状体の欠陥の有無による前
記反射光または透過光の変化を検出する面状体の欠陥検
出方法において、前記光ファイバで案内された前記反射
光または透過光を干渉フィルタとコンデンサレンズを通
して前記受光素子に導くことを特徴とする面状体の欠陥
検出方法。Scanning the surface of the planar body with light using a light irradiation system equipped with a light scanning means, and reflecting or transmitting the scanning light from the planar body,
In a method for detecting a defect in a planar object, the reflected light or transmitted light is guided through an optical fiber to a light receiving element, and the light receiving element detects a change in the reflected light or transmitted light depending on the presence or absence of a defect in the planar object. A method for detecting defects in a planar body, comprising guiding the reflected light or transmitted light guided by the optical fiber to the light receiving element through an interference filter and a condenser lens.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15918286A JPH0776758B2 (en) | 1986-07-07 | 1986-07-07 | Defect detection method for sheet |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15918286A JPH0776758B2 (en) | 1986-07-07 | 1986-07-07 | Defect detection method for sheet |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6315143A true JPS6315143A (en) | 1988-01-22 |
JPH0776758B2 JPH0776758B2 (en) | 1995-08-16 |
Family
ID=15688098
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15918286A Expired - Fee Related JPH0776758B2 (en) | 1986-07-07 | 1986-07-07 | Defect detection method for sheet |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0776758B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01314955A (en) * | 1988-06-16 | 1989-12-20 | Matsushita Electric Works Ltd | Method for inspection of light previous container |
JPH02154138A (en) * | 1988-10-15 | 1990-06-13 | Matsushita Electric Works Ltd | Inspecting method for light transmissive container |
-
1986
- 1986-07-07 JP JP15918286A patent/JPH0776758B2/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01314955A (en) * | 1988-06-16 | 1989-12-20 | Matsushita Electric Works Ltd | Method for inspection of light previous container |
JPH02154138A (en) * | 1988-10-15 | 1990-06-13 | Matsushita Electric Works Ltd | Inspecting method for light transmissive container |
Also Published As
Publication number | Publication date |
---|---|
JPH0776758B2 (en) | 1995-08-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US3814946A (en) | Method of detecting defects in transparent and semitransparent bodies | |
KR100228026B1 (en) | Method and apparatus for inspecting foreign substance | |
US3748047A (en) | Method of detecting surface defects of material surfaces | |
US4522497A (en) | Web scanning apparatus | |
US4330205A (en) | Optical apparatus for measuring the size and location of optical in an article | |
JPS6315143A (en) | Method for detecting flaw of planar body | |
US5157266A (en) | Method and device for testing transparent sheets | |
US5084628A (en) | Sheet inspection method and apparatus having retroreflecting means | |
JPH11304724A (en) | Device and method for inspecting hole of light-transmission sheet | |
US4705957A (en) | Wire surface monitor | |
US5706081A (en) | Apparatus for inspecting surface defects with regularly reflected light and peripherally scattered light | |
JP3256383B2 (en) | Surface inspection equipment | |
JPH05188004A (en) | Foreign matter detecting device | |
JPH03115844A (en) | Detection of surface defect | |
RU2035721C1 (en) | Method of checking transparency of flat light-translucent materials | |
JPH0431748A (en) | Defect inspecting method for transparent plate-shaped body | |
JPH0795038B2 (en) | Object defect inspection device | |
JPS63208747A (en) | Optical inspecting device | |
JPH0643969B2 (en) | Defect detection method for sheet | |
JPS5842933Y2 (en) | Defect detection device | |
JPH0579996A (en) | Stuck object judging device | |
JPS62105038A (en) | Photodetection system for inspecting instrument for glass substrate surface | |
JPS62280643A (en) | Defect defecting method for planar body | |
JPS61207951A (en) | Defect inspecting device for transparent object | |
JPH0460547B2 (en) |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |