JPS63137416A - Vacuum heat insulating furnace - Google Patents
Vacuum heat insulating furnaceInfo
- Publication number
- JPS63137416A JPS63137416A JP28309286A JP28309286A JPS63137416A JP S63137416 A JPS63137416 A JP S63137416A JP 28309286 A JP28309286 A JP 28309286A JP 28309286 A JP28309286 A JP 28309286A JP S63137416 A JPS63137416 A JP S63137416A
- Authority
- JP
- Japan
- Prior art keywords
- vacuum
- heat insulating
- vacuum chamber
- heating furnace
- insulating material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract description 6
- 230000000694 effects Effects 0.000 claims abstract description 4
- 238000010438 heat treatment Methods 0.000 claims description 35
- 238000006243 chemical reaction Methods 0.000 claims description 14
- 238000009413 insulation Methods 0.000 claims description 4
- 238000001816 cooling Methods 0.000 claims description 3
- 239000007789 gas Substances 0.000 claims description 3
- 229910001873 dinitrogen Inorganic materials 0.000 claims description 2
- 239000011810 insulating material Substances 0.000 abstract description 15
- 239000004065 semiconductor Substances 0.000 abstract description 13
- 239000000758 substrate Substances 0.000 abstract description 7
- 239000000356 contaminant Substances 0.000 abstract description 5
- 229910052757 nitrogen Inorganic materials 0.000 abstract description 2
- 230000003247 decreasing effect Effects 0.000 abstract 4
- 239000000463 material Substances 0.000 abstract 1
- 238000011109 contamination Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000010425 asbestos Substances 0.000 description 2
- 239000012774 insulation material Substances 0.000 description 2
- 239000012495 reaction gas Substances 0.000 description 2
- 229910052895 riebeckite Inorganic materials 0.000 description 2
- 239000011449 brick Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
Landscapes
- Chemical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は半導体製造装置における加熱炉の改良に関する
ものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to improvement of a heating furnace in semiconductor manufacturing equipment.
[従来の技術]
半導体の製造工程において化学気相成長、酸化及び不純
物拡散などの分野で加熱炉は広範囲に利用されているが
、このような加熱炉で要求される一般的な特性は、熱効
率の良好なこと、すなわち保温性が良く低電力、低エネ
ルギーであることと、加熱炉の急速な昇降温度特性、耐
高温性、加熱炉内の温度分布の均一なこと、加熱炉自身
からの汚染の防止、加熱炉外への断熱性、その他取扱い
の容易性などが挙げられる。従来、半導体製造装置に使
用する加熱炉は金属性の内管に、発熱体が絶縁碍子によ
り固定支持され、加熱炉の外管と発熱体との中間に炉内
温度の保温のため断熱材を使用してあり、この断熱材に
は耐火レンガや石綿などが用いられている。断熱材とし
て特に耐火レンガを使用した場合、加熱炉全体の熱容量
が増大し、加熱炉の温度を昇降する時間も大きく、加熱
に要する電力も大きくなるという欠点がある。[Prior Art] Heating furnaces are widely used in fields such as chemical vapor deposition, oxidation, and impurity diffusion in the semiconductor manufacturing process, but the general characteristics required for such heating furnaces are thermal efficiency. Good heat retention, low power consumption, low energy consumption, rapid temperature rise and fall characteristics of the heating furnace, high temperature resistance, uniform temperature distribution within the heating furnace, and contamination from the heating furnace itself. Examples include prevention of heat generation, insulation to the outside of the heating furnace, and ease of handling. Conventionally, in heating furnaces used in semiconductor manufacturing equipment, a heating element is fixedly supported by a metal inner tube with an insulator, and a heat insulating material is placed between the outer tube and the heating element to maintain the temperature inside the furnace. Firebrick and asbestos are used as insulation materials. Particularly when refractory bricks are used as the heat insulating material, there are disadvantages in that the heat capacity of the entire heating furnace increases, it takes a long time to raise and lower the temperature of the heating furnace, and the electric power required for heating increases.
また近年ますます超LSI化が進み、半導体への汚染防
止対策が問題となるが、加熱炉自体特にその中の断熱材
から発生する汚染物質が反応管を透過して半導体基板を
汚染させるとか、断熱材としての石綿などが半導体装置
の周辺、特にウェハーの出入りする反応管の開放部周辺
に堆積して汚染を与える原因をもたらす。In addition, as the use of ultra-large scale integrated circuits (VLSI) continues to increase in recent years, measures to prevent contamination of semiconductors have become a problem, but contaminants generated from the heating furnace itself, especially the heat insulating material within it, can pass through the reaction tube and contaminate the semiconductor substrate. Asbestos, etc. used as a heat insulating material accumulates around semiconductor devices, especially around the openings of reaction tubes where wafers enter and exit, causing contamination.
−央す、かつ断熱材を使用しないことにより従来の断熱
材からの汚染物質が発生し、半導体基板へ汚染を与える
ということもなくなる。- By not using a heat insulating material, contaminants from conventional heat insulating materials are no longer generated and contaminate the semiconductor substrate.
[問題点を解決するための手段]
このような目的を達成するなめに本発明による加熱炉は
反応ガスの供給口及び排出口を備えた反応管とその反応
管の外側に真空密閉容器を配設しその間に真空室を形成
し、該真空室内に発熱体を設けることにより、加熱炉を
構成するものである。本発明による加熱炉においては従
来、使用されていた断熱材を使用しないで真空室を設け
、真空による断熱を利用しているので、これまでの断熱
材自身からの汚染物質の発生という問題が生ぜずクリー
ンな加熱炉を構成しうる。[Means for Solving the Problems] In order to achieve the above object, the heating furnace according to the present invention includes a reaction tube equipped with a reaction gas supply port and a discharge port, and a vacuum-sealed container disposed outside the reaction tube. A heating furnace is constructed by forming a vacuum chamber between the heating elements and providing a heating element within the vacuum chamber. In the heating furnace according to the present invention, a vacuum chamber is provided without using the heat insulating material used in the past, and the vacuum insulation is utilized, which eliminates the problem of contaminants being generated from the heat insulating material itself. A clean heating furnace can be constructed.
また、温度の昇降時間についても断熱材が無いため加熱
炉全体の熱容量が小さく、温度昇降特性が優れ、また特
に降温時には真空室内に窒素ガスを導入し、発熱体を直
接に強制空冷ができるため降温特性は更に良好となる。In addition, regarding temperature rise and fall times, since there is no insulation material, the heat capacity of the entire heating furnace is small, and the temperature rise and fall characteristics are excellent. In addition, especially when the temperature falls, nitrogen gas is introduced into the vacuum chamber and the heating element can be directly forced air cooled. The temperature drop characteristics become even better.
[実施例]
以下、本発明の実施例を図面を参照して詳細に説明する
。[Example] Hereinafter, an example of the present invention will be described in detail with reference to the drawings.
第1図に本発明による真空断熱炉の縦断面図を縦型炉に
適用した例を示す。同図の1は反応ガスの導入口17と
排出口18を有する反応管であり、2は反応管1の外部
に配設された真空密閉容器で反応管1と真空密閉容器2
の間隙が真空室6を構成する。この真空室6は排気管1
2を介して図示しない真空排気装置により真空引を行い
、この真空室6により断熱効果を確保させるものである
。従って従来の加熱炉と異なり断熱材を全く使用してい
ないので加熱炉の熱容量が小さくでき、温度の昇降特性
が良好となる。真空室6に発熱体5を、発熱体5を支持
する円筒4と共に設ける。加熱炉の降温時にはり−ク弁
19を開放し、リーク管7より窒素を導入して発熱体を
直接空冷するので降温特性もより優れたものとなる。3
は加熱炉を冷却する水冷パイプである。また従来のよう
に断熱材を使用しないので断熱材から発生する汚染物質
により半導体基板への汚染という問題も解消される。FIG. 1 shows an example in which a vertical cross-sectional view of the vacuum insulation furnace according to the present invention is applied to a vertical furnace. In the same figure, 1 is a reaction tube having a reaction gas inlet 17 and an outlet 18, and 2 is a vacuum sealed container disposed outside the reaction tube 1. The reaction tube 1 and the vacuum sealed container 2 are
The gap constitutes a vacuum chamber 6. This vacuum chamber 6 is an exhaust pipe 1
A vacuum evacuation device (not shown) performs evacuation through the chamber 2, and the vacuum chamber 6 ensures a heat insulating effect. Therefore, unlike conventional heating furnaces, no heat insulating material is used, so the heat capacity of the heating furnace can be reduced, and the temperature rise and fall characteristics are improved. A heating element 5 is provided in a vacuum chamber 6 together with a cylinder 4 that supports the heating element 5. When the temperature of the heating furnace is lowered, the leak valve 19 is opened, nitrogen is introduced from the leak pipe 7, and the heating element is directly air cooled, so that the temperature lowering characteristics are also improved. 3
is a water-cooled pipe that cools the heating furnace. Furthermore, since no heat insulating material is used as in the conventional method, the problem of contamination of the semiconductor substrate by contaminants generated from the heat insulating material is also eliminated.
第1図でボート8内に半導体基板9が保持され、これが
ボート支持台lOに載置され支持軸11を介して駆動源
16によりボート8を自転させボート8内の半導体基板
9に均一な処理を施すものである。反応管1及び真空密
閉容器2は○リングORにより真空の気密性が保持され
ている。In FIG. 1, a semiconductor substrate 9 is held in a boat 8, and this is placed on a boat support stand lO, and the boat 8 is rotated by a drive source 16 via a support shaft 11 to uniformly process the semiconductor substrate 9 in the boat 8. It is intended to provide The reaction tube 1 and the vacuum sealed container 2 are kept vacuum airtight by an O-ring OR.
第1図は本発明にかかる真空断熱加熱炉を用いた半導体
製造装置の一実施例の概要を示す縦断面図である。
i −−−−一 反応管 11−〜−
一 支持軸2−−一 真空密閉容器 12−
−一真空排気管3−−−− 冷却パイプ
13−−−−ベース板4−一一一 ヒーター支持部材
14−−−−−一真空シールフランジ5−−−−
ヒーター 15−一 冷却水通路6−
−真空室 16−−−駆動源7−−−
− リーク管 17−− 反応ガス導入
孔8−−−−− ボート 18=−排
気孔9−−一半導体基板 19−− リー
ク弁lθ−−−− ボート支持台
1図面の浄書
第1目
特許庁長官 小 川 邦 夫 殿
1.事件の表示
3、補正をする者
事件との関係 特許出題式
住 所 郵便番号 214
神奈川県川崎市多摩区長尾6丁目20番3号5、補正の
対象
図面
6、補正の内容
別紙の通りFIG. 1 is a longitudinal sectional view showing an outline of an embodiment of a semiconductor manufacturing apparatus using a vacuum adiabatic heating furnace according to the present invention. i ------1 reaction tube 11---
- Support shaft 2 - - Vacuum sealed container 12 -
-1 Vacuum exhaust pipe 3--- Cooling pipe
13---Base plate 4-111 Heater support member
14-----1 Vacuum seal flange 5----
Heater 15-1 Cooling water passage 6-
-Vacuum chamber 16---Drive source 7---
- Leak pipe 17-- Reactive gas introduction hole 8--Boat 18=-Exhaust hole 9--Semiconductor substrate 19--Leak valve lθ-- Boat support 1 Engraving of drawing No. 1 Patent Office Director Kunio Ogawa 1. Indication of the case 3, Relationship with the case of the person making the amendment Patent question address Postal code 214 6-20-3-5 Nagao, Tama-ku, Kawasaki City, Kanagawa Prefecture Drawings to be amended 6, Contents of the amendment as per attached sheet
Claims (1)
管よりも大口径で、一端側が閉鎖された真空密閉容器を
前記反応管の外側に配設し、前記反応管と該真空密閉容
器の間にヒーターを設けて前記反応管と前記真空密閉容
器の間の真空部により断熱効果をもたせたことを特徴と
する真空断熱加熱炉。 2)加熱炉の冷却時に前記真空部に窒素ガス又は空気を
導入して冷却効果を向上させることを特徴とする特許請
求の範囲第1項記載の真空断熱加熱炉。 3)前記ヒーターを熱伝導性の良好なヒーター支持部材
に取付けて加熱炉内の熱均一性を向上させたことを特徴
とする特許請求の範囲第1項記載の真空断熱加熱炉。[Scope of Claims] 1) A reaction tube equipped with a gas supply port and a gas discharge port, and a vacuum sealed container having a diameter larger than the reaction tube and closed at one end are disposed outside the reaction tube, A vacuum adiabatic heating furnace characterized in that a heater is provided between the reaction tube and the vacuum sealed container to provide a heat insulation effect by a vacuum section between the reaction tube and the vacuum sealed container. 2) The vacuum adiabatic heating furnace according to claim 1, wherein nitrogen gas or air is introduced into the vacuum section during cooling of the heating furnace to improve the cooling effect. 3) The vacuum adiabatic heating furnace according to claim 1, wherein the heater is attached to a heater support member having good thermal conductivity to improve thermal uniformity within the heating furnace.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28309286A JPS63137416A (en) | 1986-11-29 | 1986-11-29 | Vacuum heat insulating furnace |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28309286A JPS63137416A (en) | 1986-11-29 | 1986-11-29 | Vacuum heat insulating furnace |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63137416A true JPS63137416A (en) | 1988-06-09 |
Family
ID=17661112
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP28309286A Pending JPS63137416A (en) | 1986-11-29 | 1986-11-29 | Vacuum heat insulating furnace |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63137416A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010090422A (en) * | 2008-10-07 | 2010-04-22 | Soken Kogyo Kk | Fluid-heating device and semiconductor treatment apparatus using the same |
JP2012234981A (en) * | 2011-05-02 | 2012-11-29 | Mirapuro:Kk | Decompression processing container |
JP2014146815A (en) * | 2008-07-16 | 2014-08-14 | Tera Semicon Corp | Batch-type heat treatment device and heater applied for the same |
WO2018051463A1 (en) * | 2016-09-15 | 2018-03-22 | 堺ディスプレイプロダクト株式会社 | Substrate processing device |
-
1986
- 1986-11-29 JP JP28309286A patent/JPS63137416A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014146815A (en) * | 2008-07-16 | 2014-08-14 | Tera Semicon Corp | Batch-type heat treatment device and heater applied for the same |
JP2010090422A (en) * | 2008-10-07 | 2010-04-22 | Soken Kogyo Kk | Fluid-heating device and semiconductor treatment apparatus using the same |
JP2012234981A (en) * | 2011-05-02 | 2012-11-29 | Mirapuro:Kk | Decompression processing container |
WO2018051463A1 (en) * | 2016-09-15 | 2018-03-22 | 堺ディスプレイプロダクト株式会社 | Substrate processing device |
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