JPS63131451A - 材料検査装置 - Google Patents
材料検査装置Info
- Publication number
- JPS63131451A JPS63131451A JP27634086A JP27634086A JPS63131451A JP S63131451 A JPS63131451 A JP S63131451A JP 27634086 A JP27634086 A JP 27634086A JP 27634086 A JP27634086 A JP 27634086A JP S63131451 A JPS63131451 A JP S63131451A
- Authority
- JP
- Japan
- Prior art keywords
- scanning
- pattern
- deflection
- pitch
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP27634086A JPS63131451A (ja) | 1986-11-19 | 1986-11-19 | 材料検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP27634086A JPS63131451A (ja) | 1986-11-19 | 1986-11-19 | 材料検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63131451A true JPS63131451A (ja) | 1988-06-03 |
JPH0467740B2 JPH0467740B2 (enrdf_load_stackoverflow) | 1992-10-29 |
Family
ID=17568072
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP27634086A Granted JPS63131451A (ja) | 1986-11-19 | 1986-11-19 | 材料検査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63131451A (enrdf_load_stackoverflow) |
-
1986
- 1986-11-19 JP JP27634086A patent/JPS63131451A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPH0467740B2 (enrdf_load_stackoverflow) | 1992-10-29 |
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