JPS63118541U - - Google Patents

Info

Publication number
JPS63118541U
JPS63118541U JP867087U JP867087U JPS63118541U JP S63118541 U JPS63118541 U JP S63118541U JP 867087 U JP867087 U JP 867087U JP 867087 U JP867087 U JP 867087U JP S63118541 U JPS63118541 U JP S63118541U
Authority
JP
Japan
Prior art keywords
atmosphere
specimen
chambers
test chamber
divided
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP867087U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP867087U priority Critical patent/JPS63118541U/ja
Publication of JPS63118541U publication Critical patent/JPS63118541U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図はこの考案に係る部品耐久試験装置の一
実施例を示す概略的説明図、第２図は同じく試験
室内の温度分布状態を示す説明図である。 １……試験室、２……第１の雰囲気室、３……
第２の雰囲気室、６……第１の温度調整制御機構
、９……第２の温度調整制御機構、１０……搬送
機構、Ａ……高温域、Ｂ……低温域、Ｗ……供試
物。 FIG. 1 is a schematic explanatory diagram showing an embodiment of the component durability testing apparatus according to this invention, and FIG. 2 is an explanatory diagram showing the temperature distribution state in the test chamber. 1... Test chamber, 2... First atmosphere chamber, 3...
Second atmosphere chamber, 6... First temperature adjustment control mechanism, 9... Second temperature adjustment control mechanism, 10... Transport mechanism, A... High temperature area, B... Low temperature area, W... Supply Sample.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 供試物が収納配置される試験室内を、互いに異
なる設定雰囲気にそれぞれ調整制御された複数の
雰囲気室に区画し、これら各々の雰囲気室内に跨
つて前記供試物を搬送自在にしたことを特徴とす
る部品耐久試験装置。 The test chamber in which the specimen is stored is divided into a plurality of atmosphere chambers, each of which is controlled to have a different atmosphere setting, and the specimen can be freely transported across each of these atmosphere chambers. Parts durability testing equipment.
JP867087U 1987-01-26 1987-01-26 Pending JPS63118541U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP867087U JPS63118541U (en) 1987-01-26 1987-01-26

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP867087U JPS63118541U (en) 1987-01-26 1987-01-26

Publications (1)

Publication Number Publication Date
JPS63118541U true JPS63118541U (en) 1988-08-01

Family

ID=30793266

Family Applications (1)

Application Number Title Priority Date Filing Date
JP867087U Pending JPS63118541U (en) 1987-01-26 1987-01-26

Country Status (1)

Country Link
JP (1) JPS63118541U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012032157A (en) * 2010-07-28 2012-02-16 Risoh Kesoku Kk Ltd Thermal shock test device
JP2014139586A (en) * 2014-04-23 2014-07-31 Risoh Kesoku Kk Ltd Thermal shock test device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5619000U (en) * 1979-07-23 1981-02-19

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5619000U (en) * 1979-07-23 1981-02-19

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012032157A (en) * 2010-07-28 2012-02-16 Risoh Kesoku Kk Ltd Thermal shock test device
JP2014139586A (en) * 2014-04-23 2014-07-31 Risoh Kesoku Kk Ltd Thermal shock test device

Similar Documents

Publication Publication Date Title
IT8023014A0 (en) NEGATIVE CONTROL MEANS FOR MICROBIOLOGICAL BIOCHEMICAL TESTS.
JPS63118541U (en)
JPS6291244U (en)
JPS6410559A (en) Sample image pattern measuring device
JPS632142U (en)
JPH0241162U (en)
JPH02143602U (en)
JPH036551U (en)
JPH0257956U (en)
JPH0385435U (en)
JPH02148482U (en)
JPS6415102U (en)
JPH0220162U (en)
JPS6338181U (en)
JPH0260853U (en)
JPS62167159U (en)
JPS6226035U (en)
JPS62188134U (en)
JPS62143248U (en)
DE2162584A1 (en) Apparatus for measuring the heat extraction coefficient
JPH02131620U (en)
JPS61199601U (en)
JPS62109212U (en)
SMITH Dynamic simulators for test of space vehicle attitude control systems(Air bearing platform simulators for testing space vehicle attitude control systems)
JPH0225573U (en)