JPS63114031U - - Google Patents
Info
- Publication number
- JPS63114031U JPS63114031U JP551087U JP551087U JPS63114031U JP S63114031 U JPS63114031 U JP S63114031U JP 551087 U JP551087 U JP 551087U JP 551087 U JP551087 U JP 551087U JP S63114031 U JPS63114031 U JP S63114031U
- Authority
- JP
- Japan
- Prior art keywords
- integrated circuit
- scale integrated
- circuit
- output
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
Description
第１図は本考案の一実施例のＬＳＩの回路基板
の概要を示すブロツク図、第２図は従来のＬＳＩ
の回路基板の概要を示すブロツク図である。
１１……セレクタ、１２……テスト端子、２１
……基板、２２……入力端子、２３……論理回路
、２４……出力端子。
Fig. 1 is a block diagram showing an outline of an LSI circuit board according to an embodiment of the present invention, and Fig. 2 is a block diagram of a conventional LSI.
FIG. 2 is a block diagram showing an outline of the circuit board of FIG. 11...Selector, 12...Test terminal, 21
... Board, 22 ... Input terminal, 23 ... Logic circuit, 24 ... Output terminal.
Claims (1)
積回路を通さずの入力信号と前記大規模集積回路
からの出力信号とを選択して出力端子に供給する
選択回路を設け、前記大規模集積回路の回路基板
の配線検査時には前記選択回路により入力信号は
直接出力端子に供給されることを特徴とする大規
模集積回路。[Claims for Utility Model Registration] In a large-scale integrated circuit, an input signal that does not pass through the large-scale integrated circuit and an output signal from the large-scale integrated circuit are selected and output from an input terminal of the large-scale integrated circuit. A large-scale integrated circuit comprising a selection circuit for supplying a signal to a terminal, and the selection circuit supplies an input signal directly to an output terminal during wiring inspection of a circuit board of the large-scale integrated circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP551087U JPS63114031U (en) | 1987-01-20 | 1987-01-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP551087U JPS63114031U (en) | 1987-01-20 | 1987-01-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63114031U true JPS63114031U (en) | 1988-07-22 |
Family
ID=30787160
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP551087U Pending JPS63114031U (en) | 1987-01-20 | 1987-01-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63114031U (en) |
-
1987
- 1987-01-20 JP JP551087U patent/JPS63114031U/ja active Pending
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