JPS63111656U - - Google Patents
Info
- Publication number
- JPS63111656U JPS63111656U JP301587U JP301587U JPS63111656U JP S63111656 U JPS63111656 U JP S63111656U JP 301587 U JP301587 U JP 301587U JP 301587 U JP301587 U JP 301587U JP S63111656 U JPS63111656 U JP S63111656U
- Authority
- JP
- Japan
- Prior art keywords
- gas
- concentration
- absorbed
- passed
- infrared rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000011088 calibration curve Methods 0.000 description 1
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987003015U JPH0429399Y2 (OSRAM) | 1987-01-13 | 1987-01-13 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987003015U JPH0429399Y2 (OSRAM) | 1987-01-13 | 1987-01-13 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63111656U true JPS63111656U (OSRAM) | 1988-07-18 |
| JPH0429399Y2 JPH0429399Y2 (OSRAM) | 1992-07-16 |
Family
ID=30782388
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987003015U Expired JPH0429399Y2 (OSRAM) | 1987-01-13 | 1987-01-13 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0429399Y2 (OSRAM) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002168772A (ja) * | 2000-12-05 | 2002-06-14 | Kubota Corp | 分光分析装置 |
| JP2017198631A (ja) * | 2016-04-28 | 2017-11-02 | アズビル株式会社 | 乾き度測定装置及び乾き度測定装置の測定誤差評価方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5330378A (en) * | 1976-08-31 | 1978-03-22 | Siemens Ag | Infrared gas analyzer |
| JPS5453579A (en) * | 1977-10-05 | 1979-04-26 | Fujitsu Ltd | Infrared ray multicomponent gas analysis apparatus |
| JPS6138601U (ja) * | 1984-08-10 | 1986-03-11 | 日本電産コパル株式会社 | ニユ−トラルデンシテイ−フイルタ |
-
1987
- 1987-01-13 JP JP1987003015U patent/JPH0429399Y2/ja not_active Expired
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5330378A (en) * | 1976-08-31 | 1978-03-22 | Siemens Ag | Infrared gas analyzer |
| JPS5453579A (en) * | 1977-10-05 | 1979-04-26 | Fujitsu Ltd | Infrared ray multicomponent gas analysis apparatus |
| JPS6138601U (ja) * | 1984-08-10 | 1986-03-11 | 日本電産コパル株式会社 | ニユ−トラルデンシテイ−フイルタ |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002168772A (ja) * | 2000-12-05 | 2002-06-14 | Kubota Corp | 分光分析装置 |
| JP2017198631A (ja) * | 2016-04-28 | 2017-11-02 | アズビル株式会社 | 乾き度測定装置及び乾き度測定装置の測定誤差評価方法 |
| WO2017187784A1 (ja) * | 2016-04-28 | 2017-11-02 | アズビル株式会社 | 乾き度測定装置及び乾き度測定装置の測定誤差評価方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0429399Y2 (OSRAM) | 1992-07-16 |
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