JPS63107872U - - Google Patents

Info

Publication number
JPS63107872U
JPS63107872U JP19956986U JP19956986U JPS63107872U JP S63107872 U JPS63107872 U JP S63107872U JP 19956986 U JP19956986 U JP 19956986U JP 19956986 U JP19956986 U JP 19956986U JP S63107872 U JPS63107872 U JP S63107872U
Authority
JP
Japan
Prior art keywords
flat
frame
probing unit
pin
members disposed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19956986U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19956986U priority Critical patent/JPS63107872U/ja
Publication of JPS63107872U publication Critical patent/JPS63107872U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例を示す一部省略した
正面図、第2図は従来例を示す正面図である。 1……ピン接触子、2……真空吸着手段、4…
…枠体、4A……スペーサ部材、8……フラツト
IC、9……ピン、10……プリント配線板。
FIG. 1 is a partially omitted front view showing an embodiment of the present invention, and FIG. 2 is a front view showing a conventional example. 1...Pin contactor, 2...Vacuum suction means, 4...
...Frame, 4A...Spacer member, 8...Flat IC, 9...Pin, 10...Printed wiring board.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] プリント配線板に半田付けされたフラツトIC
の複数のピンに対応して配設された導電性ばね部
材により形成された複数のピン接触子と、このピ
ン接触子を前記フラツトICの各ピンに対応して
配設し支持する枠体と、この枠体の中央部に装備
された真空吸着手段と、前記枠体とフラツトIC
との間に配設された複数のスペーサ部材とにより
構成したことを特徴とするフラツトIC用プロー
ビングユニツト。
Flat IC soldered to printed wiring board
a plurality of pin contacts formed by conductive spring members disposed corresponding to the plurality of pins of the flat IC; a frame body disposed and supporting the pin contacts corresponding to each pin of the flat IC; , a vacuum suction means installed in the center of the frame, and a flat IC connected to the frame.
1. A probing unit for a flat IC, comprising a plurality of spacer members disposed between the probing unit and the probing unit.
JP19956986U 1986-12-30 1986-12-30 Pending JPS63107872U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19956986U JPS63107872U (en) 1986-12-30 1986-12-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19956986U JPS63107872U (en) 1986-12-30 1986-12-30

Publications (1)

Publication Number Publication Date
JPS63107872U true JPS63107872U (en) 1988-07-12

Family

ID=31161317

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19956986U Pending JPS63107872U (en) 1986-12-30 1986-12-30

Country Status (1)

Country Link
JP (1) JPS63107872U (en)

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