JPS6310380B2 - - Google Patents
Info
- Publication number
- JPS6310380B2 JPS6310380B2 JP10469582A JP10469582A JPS6310380B2 JP S6310380 B2 JPS6310380 B2 JP S6310380B2 JP 10469582 A JP10469582 A JP 10469582A JP 10469582 A JP10469582 A JP 10469582A JP S6310380 B2 JPS6310380 B2 JP S6310380B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- connecting rod
- axis
- sample holder
- optical axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57104695A JPS58223042A (ja) | 1982-06-19 | 1982-06-19 | 反射率分布測定用試料駆動装置及び駆動方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57104695A JPS58223042A (ja) | 1982-06-19 | 1982-06-19 | 反射率分布測定用試料駆動装置及び駆動方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58223042A JPS58223042A (ja) | 1983-12-24 |
| JPS6310380B2 true JPS6310380B2 (OSRAM) | 1988-03-07 |
Family
ID=14387606
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57104695A Granted JPS58223042A (ja) | 1982-06-19 | 1982-06-19 | 反射率分布測定用試料駆動装置及び駆動方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58223042A (OSRAM) |
-
1982
- 1982-06-19 JP JP57104695A patent/JPS58223042A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58223042A (ja) | 1983-12-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4651283A (en) | Installation for determining the spatial coordinates of a point on a piece, in particular for controlling a plant such as a welding plant for the car bodies of motor vehicles | |
| US7173691B2 (en) | Method for calibrating the geometry of a multi-axis metrology system | |
| US5446545A (en) | Method of and apparatus for calibrating machines including a measuring probe and a measuring apparatus | |
| JP2012118071A (ja) | 光学系の光学面の間隔を測定する方法及び装置 | |
| JPH0140290B2 (OSRAM) | ||
| CN113324514B (zh) | 转轴调试方法与调试组件 | |
| Greenleaf | Self-calibrating surface measuring machine | |
| CN114739323B (zh) | 光学元件光轴与机械轴偏差测试系统、测试方法以及偏差修正方法 | |
| JPH01277731A (ja) | 円筒状コネクタピン内に埋込まれた導波路の偏心度を測定する方法および装置 | |
| JPS6310380B2 (OSRAM) | ||
| CN109373906B (zh) | 一种同时测量距离、仰俯和偏摆的方法 | |
| CN112082514A (zh) | 便携式角度测量仪及其使用方法 | |
| CN115391742B (zh) | 齿距量值标定方法、齿距模拟标准器及其设计与制备方法 | |
| Gassner et al. | Laser tracker calibration-testing the angle measurement system | |
| Shi et al. | Research on measurement accuracy of laser tracking system based on spherical mirror with rotation errors of gimbal mount axes | |
| TW202323768A (zh) | 雙旋轉軸的幾何誤差的獲取方法與獲取設備 | |
| US10788634B1 (en) | Evolute tester for optical surfaces | |
| JP3282229B2 (ja) | 干渉計装置 | |
| CN111043990B (zh) | 一种自准直仪及其使用方法 | |
| Greenleaf | Self-calibrating surface measuring machine | |
| SU1744453A1 (ru) | Устройство дл поверки двухкоординатных автоколлиматоров | |
| CN120891651A (zh) | 一种激光智能准直调节设备 | |
| CN120445275A (zh) | 设置光斑旋转编码器的方法及其装置 | |
| Rees et al. | KMOS pick-off arm optical alignment, calibration, and testing | |
| AI-Marzouk et al. | New absolute reflectometer |