JPS63101877U - - Google Patents
Info
- Publication number
- JPS63101877U JPS63101877U JP19646786U JP19646786U JPS63101877U JP S63101877 U JPS63101877 U JP S63101877U JP 19646786 U JP19646786 U JP 19646786U JP 19646786 U JP19646786 U JP 19646786U JP S63101877 U JPS63101877 U JP S63101877U
- Authority
- JP
- Japan
- Prior art keywords
- test object
- voltage
- discharge
- voltage power
- generates
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 3
- 238000007599 discharging Methods 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Description
第1図は本考案の一実施例、第2図は従来の静
電気放電試験器のブロツク図である。
図面に於て、1,4,11は、高圧電源(擬似
静電気発生部)、2,12は、プローブチツプ、
3は、トリガギヤツプ、5は、高圧発生器、6は
、充電抵抗、7は、放電用コンデンサ、8は、放
電抵抗、10は、被試験体、20は、電圧検出部
、21は、スイツチをそれぞれ示す。
FIG. 1 is an embodiment of the present invention, and FIG. 2 is a block diagram of a conventional electrostatic discharge tester. In the drawing, 1, 4, and 11 are high-voltage power supplies (pseudo static electricity generators), 2, 12 are probe chips,
3 is a trigger gap, 5 is a high voltage generator, 6 is a charging resistor, 7 is a discharging capacitor, 8 is a discharging resistor, 10 is a test object, 20 is a voltage detection section, 21 is a switch Each is shown below.
Claims (1)
状態を試験する静電気放電試験器であつて、 該被試験体に放電すべく高電圧を発生せしむる
第1の高圧電源並びに該被試験体との放電電極で
あるプローブチツプを具備するとともに、 上記プローブチツプにて該被試験体との火花放
電を起生すべく放電を行うトリガギヤツプと、 上記第1の高圧電源の発する電圧に従い特定の
電圧に達するとともに上記トリガギヤツプにて放
電すべく高電圧を発生せしめる第2の高圧電源と
から成ることを特徴とする静電気放電試験器。[Scope of Claim for Utility Model Registration] An electrostatic discharge tester that tests the operational state of a test object by applying a spark discharge to the test object, which generates a high voltage to be discharged to the test object. a trigger gap that is equipped with a first high-voltage power supply and a probe chip that is a discharge electrode with the test object, and that discharges at the probe tip to cause a spark discharge with the test object; and a second high-voltage power source that generates a high voltage so as to reach a specific voltage according to the voltage generated by the high-voltage power source and discharge at the trigger gap.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19646786U JPS63101877U (en) | 1986-12-20 | 1986-12-20 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19646786U JPS63101877U (en) | 1986-12-20 | 1986-12-20 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63101877U true JPS63101877U (en) | 1988-07-02 |
Family
ID=31155315
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19646786U Pending JPS63101877U (en) | 1986-12-20 | 1986-12-20 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63101877U (en) |
-
1986
- 1986-12-20 JP JP19646786U patent/JPS63101877U/ja active Pending
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