JPS63100514A - Abnormality diagnosing device - Google Patents
Abnormality diagnosing deviceInfo
- Publication number
- JPS63100514A JPS63100514A JP61245280A JP24528086A JPS63100514A JP S63100514 A JPS63100514 A JP S63100514A JP 61245280 A JP61245280 A JP 61245280A JP 24528086 A JP24528086 A JP 24528086A JP S63100514 A JPS63100514 A JP S63100514A
- Authority
- JP
- Japan
- Prior art keywords
- input signal
- signal
- deviation
- section
- threshold
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005856 abnormality Effects 0.000 title claims description 14
- 238000003745 diagnosis Methods 0.000 claims abstract description 17
- 230000009977 dual effect Effects 0.000 abstract 2
- 238000004458 analytical method Methods 0.000 description 21
- 238000010586 diagram Methods 0.000 description 5
- 238000004364 calculation method Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 230000002159 abnormal effect Effects 0.000 description 3
- 230000007257 malfunction Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 235000009508 confectionery Nutrition 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000007619 statistical method Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、入力した信号の異常を診断する機能を有する
装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a device having a function of diagnosing an abnormality in an input signal.
従来の異常診断装置は、第2図に記載のように入力信号
の異常を診断する機能、診断結果を記録したり、表示し
たりする機能から構成されていた。A conventional abnormality diagnosis device has a function of diagnosing an abnormality in an input signal, and a function of recording and displaying the diagnosis results, as shown in FIG.
このうち、入力した信号の診断には、一般に代表的なも
のとして次のような手法が用いられている。Among these, the following methods are generally used as representative methods for diagnosing input signals.
(1)レンジオーバーチエツク
発信器などの信号出力側のトラブルにより、信号が通常
使用範囲を外した(振り切れた)ことを検出し異常と判
定する。(1) Range over check It is detected that the signal is out of the normal use range (out of range) due to trouble on the signal output side, such as the transmitter, and determined to be abnormal.
(2)変化率チエツク(突変チエツク)入力した信号が
、プラント特性や検出器特性で決まる通常の動特性以上
の変化率で動いたことを検出し異常と判定する。(2) Change rate check (sudden change check) It is detected that the input signal moves at a change rate higher than the normal dynamic characteristics determined by the plant characteristics and detector characteristics, and is determined to be abnormal.
(3)二重化信号偏差チエツク
発信器などを二重化した場合の2つの入力信号の偏差を
監視し、偏差が大きくなったことを以て異常と判定する
。(3) Duplicated signal deviation check When a transmitter or the like is duplicated, the deviation between two input signals is monitored, and when the deviation becomes large, it is determined that there is an abnormality.
(4)相関チエツク
プラントの状態を代表する指標値と相関関係をもつ入力
信号について、信号が相関関係を逸脱したことを検出し
て異常と判定する。(4) For an input signal that has a correlation with an index value representing the state of the correlation check plant, it is detected that the signal deviates from the correlation and is determined to be abnormal.
これらの方法を実際のプラントに適用するには合理的に
設定することが重要であり、設定が厳しいと誤動作が多
くなり、設定が甘いと異常時に検出できないということ
になる。In order to apply these methods to an actual plant, it is important to set them rationally; if the settings are too strict, there will be many malfunctions, and if the settings are too loose, abnormalities will not be detected.
上記従来技術は、異常を発見し処理するという根本的機
能は有しているが、異常と判定するしきい値の設定につ
いては、従来実績や経験値から決定している。信号の特
性は、検出配管の位置2発信器の特性、信号のレンジな
どにより、プラント毎、信号毎に変わり同一ではない。Although the above-mentioned conventional technology has the fundamental function of discovering and processing an abnormality, the setting of a threshold value for determining an abnormality is determined based on conventional results and experience values. The signal characteristics vary from plant to plant and from signal to signal and are not the same, depending on the characteristics of the transmitter at position 2 of the detection pipe, the signal range, etc.
このため、経験のない者には最適な設定が困難であるこ
と、従来診断を適用したことがない信号については、設
定が難しいという問題があった。Therefore, there are problems in that it is difficult for an inexperienced person to make optimal settings, and it is difficult to make settings for signals to which conventional diagnosis has not been applied.
本発明の目的は、経験がなくてもしきい値の設定を容易
に行なえるようにすることにある。An object of the present invention is to enable threshold settings to be easily performed even without experience.
上記目的は、入力信号の特性を、分析2把握することに
より達成される。すなわち、第3図に示す如く、入力信
号の特性を統計的に分析する機能を設けることにより、
その信号の持つ特性が簡単に把握できるようになり、変
化率の最大値や変化率の標準偏差などから、誤動作の確
率を定量的に評価して設定できるようになる。The above objective is achieved by understanding the characteristics of the input signal through analysis 2. That is, as shown in Figure 3, by providing a function to statistically analyze the characteristics of the input signal,
The characteristics of the signal can be easily understood, and the probability of malfunction can be quantitatively evaluated and set based on the maximum value of the rate of change, the standard deviation of the rate of change, etc.
まず、変化率チエツクについては、しきい値の設定を行
なうため、装置内の入力した信号を規定の間隔でサンプ
リングし、サンプリング毎に変化率を求め、これと過去
の変化率とから変化率の最大値と標準偏差を求める機能
を設ける。First, regarding the rate of change check, in order to set the threshold, the input signal in the device is sampled at specified intervals, the rate of change is determined for each sampling, and the rate of change is determined from this and the past rate of change. Provide a function to calculate the maximum value and standard deviation.
又、二重化B号の偏差チエツクについては、しきい値の
設定を行なうため、装置内に入力した信号を規定の間隔
でサンプリングし、サンプリング毎に偏差を求め、これ
と過去の偏差から、偏差の平均値、最大値、標準偏差を
求める機能を設ける。In addition, regarding the deviation check of duplex B, in order to set the threshold, the signal input into the device is sampled at specified intervals, the deviation is obtained for each sampling, and from this and the past deviation, the deviation is calculated. Provide functions to calculate average value, maximum value, and standard deviation.
これより、信号特性を統計的に評価できるようになる。This makes it possible to statistically evaluate signal characteristics.
(作用〕
、 分析して得た特性は、入力信号の統計的特性で1゛
1
11塵る。標準偏差を例にすると、3では99.7%以
上の確率で正常範囲に入ることは周知の通りで、これら
の統計手法を使って、求めた入力信号の特性から合理的
な設定を行なうことが可能となる。(Effect) The characteristics obtained through analysis are 1.111 times the statistical characteristics of the input signal. Taking the standard deviation as an example, it is well known that 3 falls within the normal range with a probability of 99.7% or more. By using these statistical methods, it is possible to make reasonable settings based on the characteristics of the input signal.
したがって入力信号の特性を分析する機能により、有効
でかつ、誤動作しない設定を行なうためのデータを得る
ことができる。Therefore, the function of analyzing the characteristics of the input signal makes it possible to obtain data for making settings that are effective and do not cause malfunctions.
以下、本発明の一実施例を第1図によって説明する。 An embodiment of the present invention will be described below with reference to FIG.
代表的な入力信号として発信器1.二重化発信器2から
の信号を考える。入力した信号は診断部3にて診断し、
処理部4にて、警報や表示などの処理を行なう。As a typical input signal, transmitter 1. Consider the signal from duplex oscillator 2. The input signal is diagnosed by the diagnosis section 3,
The processing unit 4 performs processing such as alarms and displays.
一方、同じ入力信号を、変化率の分析部5.二重化信号
の偏差の分析部7にも入力する。ここでは、平均値、最
大値1vA準偏差を算出し、出力部6にてCRT又はプ
リンタなどに結果を出力する。On the other hand, the same input signal is analyzed by the change rate analysis section 5. It is also input to the deviation analysis section 7 of the duplicated signal. Here, the average value and the maximum value 1vA standard deviation are calculated, and the output unit 6 outputs the results to a CRT or printer.
ここで、第3図中の分析部5,7のフローチャートを第
4図、第5図に示す。Here, flowcharts of the analysis sections 5 and 7 in FIG. 3 are shown in FIGS. 4 and 5.
第4図は、変化率の分析部のフローチャートである。ス
テップ1は変化率R(+)を求め、ステップ2で変化率
の最大値RM^Xを求め、ステップ3で標準偏差Sを求
め、ステップ4で定期的にプリンタやCRTに結果を出
力する。FIG. 4 is a flowchart of the rate of change analysis section. In step 1, the rate of change R(+) is determined, in step 2, the maximum value RM^X of the rate of change is determined, in step 3, the standard deviation S is determined, and in step 4, the results are periodically output to a printer or CRT.
第5図は、二重化信号の偏差の分析部のフローチャート
で、第4図と同じ考え方で構成している。FIG. 5 is a flowchart of the duplex signal deviation analysis section, which is constructed based on the same concept as FIG. 4.
第6図には、本実施例のハードウェア構成を示す、異常
診断装置は、従来、入力信号を伝達する外部ケーブル2
7を、外部端子部23で中継し、装置の入力部21を経
由し、診断/処理演算部20で診断、処理を行ない、ラ
ンプ表示部29で表示していた0本実施例では、診断/
処理演算部20に、分析演算を組み込み、分析結果をC
RT25、プリンタ26に表示するようにしている。FIG. 6 shows the hardware configuration of this embodiment. Conventionally, an abnormality diagnosis device has an external cable 2 for transmitting an input signal.
7 is relayed by the external terminal section 23, passed through the input section 21 of the device, diagnosed and processed by the diagnosis/processing calculation section 20, and displayed on the lamp display section 29.
The processing calculation section 20 incorporates analysis calculations, and the analysis results are converted to C.
It is displayed on the RT 25 and printer 26.
本実施例によれば、診断/処理演算部20を使って分析
を行うため、ハードウェアの増加が少ないという効果が
ある。According to this embodiment, since the analysis is performed using the diagnosis/processing calculation section 20, there is an effect that the increase in hardware is small.
第7図に本発明の他の実施例のハードウェア構一一一ブ
ル28で結合している。A hardware configuration 28 of another embodiment of the present invention is shown in FIG.
本実施例によれば、分析部を独立したハードウェアで構
成しているので、分析部のみを可搬式に出来、診断のし
きい値設定までの間だけ分析部を用いるという使い方が
できるので、1台の分析部で、複数のプラントの信号分
析が可能となるという効果がある。According to this embodiment, since the analysis section is configured with independent hardware, only the analysis section can be made portable, and the analysis section can be used only until the diagnostic threshold is set. This has the effect of making it possible to analyze signals from multiple plants using one analysis unit.
上記の構成は、いずれも独立した装置としての異常診断
装置を例にとっているが、例えば火力プラントにおける
ボイラ自動制御装置のように、制御装置内部に診断/処
理機能を有する場合もある。・この場合にも、第6図、
第7図と同様に、分析機能を付加することができる。Although the above configurations are all taken as an example of an abnormality diagnosis device as an independent device, the control device may have a diagnosis/processing function inside the control device, for example, like a boiler automatic control device in a thermal power plant.・In this case as well, Figure 6,
Similar to FIG. 7, an analysis function can be added.
本発明によれば、診断を行う入力信号の特性を経験的、
感π的ではなく、定量的、統計的に把握できるので、経
験がなくても有効で正確な診断のしきい値設定を容易に
行うことができるという効果がある。According to the present invention, the characteristics of the input signal to be diagnosed are determined empirically,
Since it can be grasped quantitatively and statistically rather than intuitively, it has the advantage that effective and accurate threshold settings for diagnosis can be easily set even without experience.
第1図は本発明の一実施例の機能構成図、第2図は従来
の異常診断装置の概念説明図、第3図は本発明の概念説
明図、第4図は本発明の一実施例のうち、変化率分析の
フローチャート、第5図は同じく二重化信号偏差分析の
フローチャート、第6図は、本発明の一実施例のハード
ウェア構成図、第7図は本発明の他の実施例のハードウ
ェア構成図である6
1・・・発信器、2・・・二重化発信器、3・・・診断
部、4・・・処理部、5・・・変化率分析部、6・・・
出力部、7・・・二重化信号偏差分析部、8・・・分析
部、10・・・異常診断装置、11・・・入力信号、2
0・・・診断/処理部、21・・・入力部、23・・・
外部端子部、24・・・分析部、25・・・CRT、2
6・・・プリンタ、27・・・外部ケーブル、28・・
・接続ケーブル、29・・・ランプ表示部。
菓し+口
高60
n
佑″″1図Fig. 1 is a functional configuration diagram of an embodiment of the present invention, Fig. 2 is a conceptual explanatory diagram of a conventional abnormality diagnosis device, Fig. 3 is a conceptual explanatory diagram of the present invention, and Fig. 4 is an embodiment of the present invention. Of these, FIG. 5 is a flowchart of change rate analysis, FIG. 5 is a flowchart of duplicated signal deviation analysis, FIG. 6 is a hardware configuration diagram of one embodiment of the present invention, and FIG. 7 is a flowchart of another embodiment of the present invention. 6 which is a hardware configuration diagram 1... Transmitter, 2... Duplex transmitter, 3... Diagnosis section, 4... Processing section, 5... Rate of change analysis section, 6...
Output section, 7... Duplicated signal deviation analysis section, 8... Analysis section, 10... Abnormality diagnosis device, 11... Input signal, 2
0...Diagnosis/processing section, 21...Input section, 23...
External terminal section, 24... Analysis section, 25... CRT, 2
6...Printer, 27...External cable, 28...
・Connection cable, 29... Lamp display section. Confectionery + Mouth height 60 n Yu''''1 figure
Claims (1)
おいて、診断の対象となる信号の特性を分析する機能を
設けたことを特徴とする異常診断装置。1. An abnormality diagnosis device having a function of diagnosing an abnormality in an input signal, characterized in that the device is provided with a function of analyzing characteristics of the signal to be diagnosed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61245280A JPS63100514A (en) | 1986-10-17 | 1986-10-17 | Abnormality diagnosing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61245280A JPS63100514A (en) | 1986-10-17 | 1986-10-17 | Abnormality diagnosing device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63100514A true JPS63100514A (en) | 1988-05-02 |
Family
ID=17131320
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61245280A Pending JPS63100514A (en) | 1986-10-17 | 1986-10-17 | Abnormality diagnosing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63100514A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01300397A (en) * | 1988-05-30 | 1989-12-04 | Nippon Atom Ind Group Co Ltd | Process signal multiplex monitor |
JPH05189027A (en) * | 1992-01-08 | 1993-07-30 | Hitachi Ltd | Signal abnormality diagnostic device and its use method |
JP2003216238A (en) * | 2002-01-23 | 2003-07-31 | Toshiba Corp | System and method for supporting cause analysis |
JP2004184390A (en) * | 2002-05-13 | 2004-07-02 | Mitsubishi Heavy Ind Ltd | Apparatus and method for detecting state of radioactive substance vessel |
JP2007079683A (en) * | 2005-09-12 | 2007-03-29 | Chugoku Electric Power Co Inc:The | Input signal decision support system |
JP2009169645A (en) * | 2008-01-16 | 2009-07-30 | Toshiba Corp | Monitoring control device |
JP2018180703A (en) * | 2017-04-06 | 2018-11-15 | 三菱電機株式会社 | Monitoring and controlling device |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57141715A (en) * | 1981-02-26 | 1982-09-02 | Toshiba Corp | Monitor for deviation of efficiency |
JPS5851311A (en) * | 1981-09-22 | 1983-03-26 | Toshiba Corp | Diagnosing device for fault of plant |
-
1986
- 1986-10-17 JP JP61245280A patent/JPS63100514A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57141715A (en) * | 1981-02-26 | 1982-09-02 | Toshiba Corp | Monitor for deviation of efficiency |
JPS5851311A (en) * | 1981-09-22 | 1983-03-26 | Toshiba Corp | Diagnosing device for fault of plant |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01300397A (en) * | 1988-05-30 | 1989-12-04 | Nippon Atom Ind Group Co Ltd | Process signal multiplex monitor |
JPH05189027A (en) * | 1992-01-08 | 1993-07-30 | Hitachi Ltd | Signal abnormality diagnostic device and its use method |
JP2003216238A (en) * | 2002-01-23 | 2003-07-31 | Toshiba Corp | System and method for supporting cause analysis |
JP2004184390A (en) * | 2002-05-13 | 2004-07-02 | Mitsubishi Heavy Ind Ltd | Apparatus and method for detecting state of radioactive substance vessel |
JP2007079683A (en) * | 2005-09-12 | 2007-03-29 | Chugoku Electric Power Co Inc:The | Input signal decision support system |
JP2009169645A (en) * | 2008-01-16 | 2009-07-30 | Toshiba Corp | Monitoring control device |
JP2018180703A (en) * | 2017-04-06 | 2018-11-15 | 三菱電機株式会社 | Monitoring and controlling device |
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