JPS6288348A - Ic mounting structure - Google Patents
Ic mounting structureInfo
- Publication number
- JPS6288348A JPS6288348A JP60229281A JP22928185A JPS6288348A JP S6288348 A JPS6288348 A JP S6288348A JP 60229281 A JP60229281 A JP 60229281A JP 22928185 A JP22928185 A JP 22928185A JP S6288348 A JPS6288348 A JP S6288348A
- Authority
- JP
- Japan
- Prior art keywords
- molding material
- mounting structure
- large opening
- substrate
- printing method
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
Landscapes
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Wire Bonding (AREA)
Abstract
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体装置の実装構造に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a mounting structure for a semiconductor device.
本発明は半導体装置のFD方式における実装構造におい
てrcに対応する基板の開口部を大きく取り、モールド
作業を行ない易くしたものである。The present invention provides a mounting structure for a semiconductor device using the FD method, in which the opening of the substrate corresponding to the rc is made large to facilitate the molding operation.
従来の半導体装置のFD方式における実装構造は、第3
図、第4図の様であり、ICに対応する基板のモールド
材供給穴は小さく、特開昭53−139468の様にモ
ールド材の供給時間が多く必要であり又圧力を加えない
とrcと基板の間にうまく入って行かない。The mounting structure in the conventional FD method of semiconductor devices is
As shown in Fig. 4, the molding material supply hole of the board corresponding to the IC is small, and as in JP-A-53-139468, it takes a long time to supply the molding material, and unless pressure is applied, the rc It doesn't fit well between the boards.
〔発明が解決しようとする問題点及び目的〕しかし前述
の従来技術では、ICに対応する基板の穴が小さく、モ
ールド材の供給時間が多く必要であり又、圧力を加えな
いとICと基板の間にうまく入って行かないと言う欠点
があった。[Problems and objects to be solved by the invention] However, in the above-mentioned conventional technology, the hole in the substrate corresponding to the IC is small, it takes a long time to supply the molding material, and the IC and the substrate do not come together unless pressure is applied. The problem was that it didn't fit in well.
そこで本発明はこの様な問題点を解決するもので、モー
ルドの供給を少ない時間で容易な方法でスムースに行な
うことを目的とする。The present invention is intended to solve these problems, and aims to smoothly supply molds in a short time and in an easy manner.
本発明の半導体装置は、FD方式においてICに対応す
る基本の開口部を第1図の様に大きく取り、モールド材
の供給を容易とし、更に印刷方式によることを可能とし
た事を特徴とする特〔実施例〕
第1・図(平面図)、第2図(第1図の断面図)は、本
発明の実施例におけるFD方式のICと対応する基板開
口部の関係を示した図である。フィンガーのある方向は
出来るだけ大きく又、直角方向はICよりや\大きくす
る。The semiconductor device of the present invention is characterized in that in the FD method, the basic opening corresponding to the IC is made large as shown in FIG. 1, making it easy to supply molding material, and further making it possible to use the printing method. Particular [Embodiment] Figure 1 (plan view) and Figure 2 (cross-sectional view of Figure 1) are diagrams showing the relationship between the FD type IC and the corresponding substrate opening in the embodiment of the present invention. be. The direction of the finger should be as large as possible, and the direction at right angles should be slightly larger than the IC.
以上述べた様に発明によれば、第1図、第2図の様1c
FD方式におけるrcと対応する基板の開口部を大きく
することで、モールド材の供給をスピーディにかつ確実
に行ない又、印刷方式によるモールド材供給を可能とし
た。As described above, according to the invention, as shown in FIGS. 1 and 2, 1c
By enlarging the opening of the substrate corresponding to rc in the FD method, molding material can be supplied quickly and reliably, and molding material can be supplied by printing method.
第1図は、本発明によるIC実装構造平面図第2図は、
本発明による第1図主要部の断面図第3図は、従来技術
によるrc実装構造平面図第4図は、従来技術による第
6図の断面図1:IC
2;ICのパッド
6;基板のパターン
4;基板の開口部
5;基板
6;モールド
7;半田バンブ
8;従来技術によるモールド供給穴。
以上
図面の浄書(内容に変更なし)
第1図
第2図
第3図
第4図
昭和 61年 2 B 26 B
昭和60年 特許願 第229281 号2発明の
名称
工、C実装構造
3、補正をする者
事件との関係
1441東京都新宿区西新宿2丁目4番1号(256)
セイコーエプソン株式会社
4イ、□ 2、 懺頴役服部一部〒104 東
京都中央区京橋2丁目6番21号図面(第1〜4図)(
内容に変更なし)7、/ 補正の内容FIG. 1 is a plan view of an IC mounting structure according to the present invention.
FIG. 3 is a plan view of the RC mounting structure according to the present invention. FIG. 4 is a cross-sectional view of FIG. 6 according to the prior art. 1: IC 2; IC pad 6; Pattern 4; substrate opening 5; substrate 6; mold 7; solder bump 8; mold supply hole according to prior art. Engraving of the above drawings (no changes to the contents) Figure 1 Figure 2 Figure 3 Figure 4 1986 2 B 26 B 1985 Patent Application No. 229281 2 Title of invention, C mounting structure 3, amendments Relationship with the incident 1441 2-4-1 Nishi-Shinjuku, Shinjuku-ku, Tokyo (256)
Seiko Epson Co., Ltd. 4 I, □ 2, Part of the Hattori Department of Kakko Epson, 2-6-21 Kyobashi, Chuo-ku, Tokyo 104 Drawings (Figures 1 to 4) (
No change in content) 7. / Content of amendment
Claims (1)
いて、IC保護の為のモールド用の基板開口部の形状を
ICのパッド方向はパッド内端に近くまで広げ、又その
クロス方向はICの外形よりやゝ大きく形成し、又、こ
の大きな開口部を利用し印刷方式によつてIC表面にモ
ールドレジンを供給することを特徴とするIC実装構造
。In the face-down bonding method (hereinafter referred to as FD), the shape of the substrate opening for the mold for IC protection is widened in the direction of the IC pad to near the inner edge of the pad, and in the cross direction, it is widened closer to the outer edge of the IC. An IC mounting structure characterized by forming a large opening and supplying mold resin to the IC surface by a printing method using this large opening.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60229281A JPS6288348A (en) | 1985-10-15 | 1985-10-15 | Ic mounting structure |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60229281A JPS6288348A (en) | 1985-10-15 | 1985-10-15 | Ic mounting structure |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6288348A true JPS6288348A (en) | 1987-04-22 |
Family
ID=16889655
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60229281A Pending JPS6288348A (en) | 1985-10-15 | 1985-10-15 | Ic mounting structure |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6288348A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5518957A (en) * | 1991-10-10 | 1996-05-21 | Samsung Electronics Co., Ltd. | Method for making a thin profile semiconductor package |
US6124629A (en) * | 1988-09-20 | 2000-09-26 | Hitachi, Ltd. | Semiconductor device including a resin sealing member which exposes the rear surface of the sealed semiconductor chip |
US6326681B1 (en) | 1988-09-20 | 2001-12-04 | Hitachi, Ltd | Semiconductor device |
-
1985
- 1985-10-15 JP JP60229281A patent/JPS6288348A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6124629A (en) * | 1988-09-20 | 2000-09-26 | Hitachi, Ltd. | Semiconductor device including a resin sealing member which exposes the rear surface of the sealed semiconductor chip |
US6326681B1 (en) | 1988-09-20 | 2001-12-04 | Hitachi, Ltd | Semiconductor device |
US5518957A (en) * | 1991-10-10 | 1996-05-21 | Samsung Electronics Co., Ltd. | Method for making a thin profile semiconductor package |
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