JPS6282634A - 元素分析装置 - Google Patents
元素分析装置Info
- Publication number
- JPS6282634A JPS6282634A JP60221249A JP22124985A JPS6282634A JP S6282634 A JPS6282634 A JP S6282634A JP 60221249 A JP60221249 A JP 60221249A JP 22124985 A JP22124985 A JP 22124985A JP S6282634 A JPS6282634 A JP S6282634A
- Authority
- JP
- Japan
- Prior art keywords
- energy
- ion
- ion beam
- ions
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60221249A JPS6282634A (ja) | 1985-10-04 | 1985-10-04 | 元素分析装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60221249A JPS6282634A (ja) | 1985-10-04 | 1985-10-04 | 元素分析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6282634A true JPS6282634A (ja) | 1987-04-16 |
| JPH0361983B2 JPH0361983B2 (cg-RX-API-DMAC10.html) | 1991-09-24 |
Family
ID=16763807
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60221249A Granted JPS6282634A (ja) | 1985-10-04 | 1985-10-04 | 元素分析装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6282634A (cg-RX-API-DMAC10.html) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0374037A (ja) * | 1989-05-17 | 1991-03-28 | Kobe Steel Ltd | 集束イオンビーム装置 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59157943A (ja) * | 1983-02-25 | 1984-09-07 | Hitachi Ltd | 分子二次イオン質量分析計 |
-
1985
- 1985-10-04 JP JP60221249A patent/JPS6282634A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59157943A (ja) * | 1983-02-25 | 1984-09-07 | Hitachi Ltd | 分子二次イオン質量分析計 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0374037A (ja) * | 1989-05-17 | 1991-03-28 | Kobe Steel Ltd | 集束イオンビーム装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0361983B2 (cg-RX-API-DMAC10.html) | 1991-09-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4315153A (en) | Focusing ExB mass separator for space-charge dominated ion beams | |
| GB1145107A (en) | Ion beam microanalyser | |
| CN103560070B (zh) | 离子光学装置、离子源及利用离子源产生目标离子的方法 | |
| GB1325551A (en) | Ion beam microprobes | |
| US7875857B2 (en) | X-ray photoelectron spectroscopy analysis system for surface analysis and method therefor | |
| JPS5958749A (ja) | 複合対物および放射レンズ | |
| EP0084850B1 (en) | Apparatus for irradiation with charged particle beams | |
| US20170011900A1 (en) | Double bend ion guides and devices using them | |
| JPH0450699B2 (cg-RX-API-DMAC10.html) | ||
| JPS6282634A (ja) | 元素分析装置 | |
| EP3417474A1 (en) | Extraction system for charged secondary particles for use in a mass spectrometer or other charged particle device | |
| JPS61116742A (ja) | Snms法を実施する装置 | |
| JP3752259B2 (ja) | クラスターイオンビームスパッター方法 | |
| JPS6244936A (ja) | イオンビ−ム発生方法および装置 | |
| JPS60121663A (ja) | レ−ザ−励起イオン源 | |
| US3766396A (en) | Ion source | |
| JPH11176372A (ja) | イオン照射装置 | |
| WO2015085577A1 (zh) | 使用二次离子质谱仪分析气体样品的系统和方法 | |
| JP2583419B2 (ja) | 電子ビ−ム照射装置 | |
| JPH0197365A (ja) | エネルギー分析器 | |
| JPH0233848A (ja) | 二次イオン質量分析装置 | |
| JPS59157943A (ja) | 分子二次イオン質量分析計 | |
| JPS60177543A (ja) | 質量分析装置 | |
| JPH06103625B2 (ja) | イオンマイクロアナライザ | |
| JPH03257181A (ja) | スパッター用中性粒子源 |