JPS6280333U - - Google Patents
Info
- Publication number
- JPS6280333U JPS6280333U JP17255885U JP17255885U JPS6280333U JP S6280333 U JPS6280333 U JP S6280333U JP 17255885 U JP17255885 U JP 17255885U JP 17255885 U JP17255885 U JP 17255885U JP S6280333 U JPS6280333 U JP S6280333U
- Authority
- JP
- Japan
- Prior art keywords
- socket
- probe pin
- test object
- wafer
- integrated circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 5
- 239000004020 conductor Substances 0.000 claims description 3
- 238000012360 testing method Methods 0.000 claims 5
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17255885U JPS6280333U (no) | 1985-11-09 | 1985-11-09 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17255885U JPS6280333U (no) | 1985-11-09 | 1985-11-09 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6280333U true JPS6280333U (no) | 1987-05-22 |
Family
ID=31109206
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17255885U Pending JPS6280333U (no) | 1985-11-09 | 1985-11-09 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6280333U (no) |
-
1985
- 1985-11-09 JP JP17255885U patent/JPS6280333U/ja active Pending
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