JPS6270295A - Production of n-type semiconductive diamond film - Google Patents
Production of n-type semiconductive diamond filmInfo
- Publication number
- JPS6270295A JPS6270295A JP21184985A JP21184985A JPS6270295A JP S6270295 A JPS6270295 A JP S6270295A JP 21184985 A JP21184985 A JP 21184985A JP 21184985 A JP21184985 A JP 21184985A JP S6270295 A JPS6270295 A JP S6270295A
- Authority
- JP
- Japan
- Prior art keywords
- gas
- dopant
- film
- hydrocarbon
- diamond film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は電子機器等に利用されるn型半導体特性を示す
ダイヤモンド膜の製造法に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for producing a diamond film exhibiting n-type semiconductor characteristics used in electronic devices and the like.
炭素(C)は周期律表でlVb族に属しており、同族の
Siと同様に半導体材料として使用できる可能性がある
と考えられている。しかしながらグラファイトでは導電
性が高く半導体としては用いることはできない、これに
対しダイヤモンドは絶縁性であるので不純物添加等の方
法によって半導体としての使用が理論的には考えられる
。Carbon (C) belongs to the lVb group in the periodic table, and is thought to have the potential to be used as a semiconductor material like Si, which is in the same group. However, graphite is highly conductive and cannot be used as a semiconductor, whereas diamond is insulating, so it is theoretically possible to use it as a semiconductor by adding impurities or other methods.
天然に産する大部分のダイヤモンドは電気的に10■Ω
値以上の絶縁体であるが、ご(一部に10°〜104Ω
備と低い抵抗値のものがありnb型と呼ばれている。1
そしてこのnb型・はその詳しい調査によってp型半導
体であることが明らかになっており、超高圧高温合成に
よって人工的に製造することができるものである。しか
しながらn型半導体のダイヤモンドは天然に存在しない
ばかりでなく超高圧合成でも製造例は現在のところない
。Most naturally occurring diamonds have an electrical resistance of 10 Ω.
Although it is an insulator with a value exceeding the
There is a type with a low resistance value, which is called the nb type. 1
Detailed investigation has revealed that this nb-type semiconductor is a p-type semiconductor, which can be artificially produced by ultra-high pressure and high temperature synthesis. However, diamond, which is an n-type semiconductor, not only does not exist naturally, but also there is no example of its production by ultra-high pressure synthesis.
ダイヤモンド半導体素子の作製の為にはp、 n両型
の半導体が不可欠であり、これを可能にする為9・9オ
ンを主入法によ−てn型半導体のイ乍製カベ試みられて
きた。その結果、Sb、^r、C等のイオン注入層とB
注入層との接合が整流作用゛に近いV−■特性を持つこ
とが報告されている。しかしn型半導体の確認までは至
ってない。Both p- and n-type semiconductors are essential for the production of diamond semiconductor devices, and to make this possible, attempts have been made to manufacture n-type semiconductors using the 9.9-on method. Ta. As a result, an ion-implanted layer of Sb, ^r, C, etc. and B
It has been reported that the junction with the injection layer has V-■ characteristics close to rectifying action. However, it has not yet been confirmed that it is an n-type semiconductor.
本発明は、上述の課題を解決する為に薄膜法を用いたn
型半導体層の製造法を提供するものである。In order to solve the above-mentioned problems, the present invention provides an n-type film using a thin film method.
The present invention provides a method for manufacturing a type semiconductor layer.
本発明の特徴は、炭化水素と水素との混合ガスからダイ
ヤモンド膜の気相合成時にP、^S等の不純物(ドーパ
ント)を分解放出し易いガスを導入することにある。こ
のような気相合成に不純物を入れると高圧合成に比べて
はるかに均一に含有されると共にイオン注入法に比べて
無理のない位置に不純物原子が入り込み、ドーパントと
しての効果を出し易いと考えた0本発明はこの考えによ
り実現したもので従来の高圧合成法やイオン注入法によ
って合成されなかったn型半導体を合成することに成功
した。A feature of the present invention is that a gas that easily decomposes and releases impurities (dopants) such as P and ^S is introduced during vapor phase synthesis of a diamond film from a mixed gas of hydrocarbons and hydrogen. We believe that when impurities are introduced in this type of vapor phase synthesis, they are contained much more uniformly than in high-pressure synthesis, and the impurity atoms can enter into more reasonable positions than in ion implantation, making it easier to produce the effect as a dopant. The present invention was realized based on this idea, and succeeded in synthesizing an n-type semiconductor that could not be synthesized by conventional high-pressure synthesis methods or ion implantation methods.
本発明を実施するには薄膜ダイヤの合成手法を利用する
必要があるが、炭素が残留せず結晶質の良い膜の形成に
は、プラズマCVDもしくはCVD法が望ましい。In order to carry out the present invention, it is necessary to use a thin film diamond synthesis method, and plasma CVD or CVD is preferable for forming a film with good crystallinity without residual carbon.
この場合の反応ガスは炭化水素のCとHアとのモル比が
0.001以上0.02以下が適当である。In this case, it is appropriate that the reaction gas has a molar ratio of hydrocarbon C to H a of 0.001 or more and 0.02 or less.
0.001以下では膜の成長速度は極めて遅く経済的で
なく、又0.02以上では膜の結晶性が悪く半導体層と
して十分な性能を付加すること−ができない。If it is less than 0.001, the growth rate of the film will be extremely slow and uneconomical, and if it is more than 0.02, the crystallinity of the film will be poor and it will not be possible to add sufficient performance as a semiconductor layer.
又、ドーパント元素としてはP、^s、Sbが通常のS
tをn型にする場合と同じく効果があった。In addition, as dopant elements, P, ^s, and Sb are ordinary S.
This had the same effect as when t was made n-type.
ドーパント元素とCとのモル比は0.0001以上0.
002とすべきである。 0.0001以下では半導体
として十分な導電率を出せない。又0.002以上では
膜中に歪が生し、欠陥の多い膜となり半導体素子への適
用が困難になる。The molar ratio between the dopant element and C is 0.0001 or more and 0.0001 or more.
It should be 002. If it is less than 0.0001, sufficient conductivity as a semiconductor cannot be achieved. Moreover, if it is more than 0.002, strain will occur in the film, resulting in a film with many defects, making it difficult to apply to semiconductor devices.
このようにして作製した膜はダイヤモンド単結晶上に形
成させればエピタキシャル成長して単結晶膜が得られる
ため半導体素子としての利用が可能となる。If the film produced in this way is formed on a diamond single crystal, it can be epitaxially grown to obtain a single crystal film, so that it can be used as a semiconductor element.
又薄膜形成法としてはプラズマCVD、CVDのいずれ
においても可能である。ガスの励起手段としては高周波
、マイクロ波、電子線、レーザー等いずれの手段でも効
果に変わりはなく、磁場により励起をさらに強くするこ
とも本発明の範囲である。Further, as a thin film forming method, either plasma CVD or CVD can be used. As a gas excitation means, any means such as high frequency, microwave, electron beam, laser, etc. will have the same effect, and it is also within the scope of the present invention to further strengthen the excitation using a magnetic field.
次に実施例によって詳しく説明をする
実施例1
公知プラズマCVD (マイクロ波で2.45Gbを用
いてプラズマを点火する。)法にて、CHオニ0.5%
、 Plh: 0.05%残H2からなる反応ガスよ
りダイヤモンド単結晶基板上の(111)面に0.5μ
mの厚さのダイヤモンド膜を形成した。この膜の電気抵
抗はlXl0’Ω備と計測され、ホール効果を測定した
結果n型半導体であることを確認した。Next, a detailed explanation will be given with reference to Examples.Example 1 Using a known plasma CVD method (in which plasma is ignited using 2.45 Gb of microwave), CH 0.5%
, Plh: A 0.5 μ
A diamond film with a thickness of m was formed. The electrical resistance of this film was measured to be 1X10'Ω, and as a result of measuring the Hall effect, it was confirmed that it was an n-type semiconductor.
実施例2
実施例1と同し方法にて第1表に示す組成の反応ガスよ
り、各0.3μmのダイヤモンド膜を作成して電気抵抗
と電子の移動度を測定した。その結果を表に示す。Example 2 Diamond films each having a thickness of 0.3 μm were prepared using the same method as in Example 1 using the reaction gas having the composition shown in Table 1, and the electrical resistance and electron mobility were measured. The results are shown in the table.
第1表
実施例3
公知CVD (約210(lに加熱したタングステンフ
ィラメントにより熱分解)により、C/Hz =0.0
05. A s / C= 0.001 となるようニ
CJa+ASHt+H!ガスを混合し、0.3μmの膜
を人工ダイヤ単結晶上に形成して電気抵抗値とボール効
果を測定したところ、抵抗が1.5X10−Ωlでn型
と同定され、電子の移動度は720CII+ /ν、s
ecであった。Table 1 Example 3 C/Hz = 0.0 by known CVD (pyrolysis with a tungsten filament heated to about 210 l)
05. CJa+ASHt+H so that A s / C = 0.001! When the gas was mixed and a 0.3 μm film was formed on an artificial diamond single crystal and the electrical resistance and ball effect were measured, the resistance was 1.5 x 10-Ωl and it was identified as n-type, and the electron mobility was 720CII+ /ν,s
It was ec.
手続補正書 昭和61年6月す日Procedural amendment June 1986
Claims (3)
素から成る反応ガスを熱分解、もしくはプラズマ分解し
て基板上に蒸着することを特徴とするn型半導体ダイヤ
モンド膜の製造法。(1) A method for producing an n-type semiconductor diamond film, characterized in that a reaction gas consisting of a gas containing a dopant element, a hydrocarbon gas, and hydrogen is thermally decomposed or plasma decomposed and deposited on a substrate.
る群から選ばれた1種以上であることを特徴とする特許
請求の範囲第1項記載のn型半導体ダイヤモンド膜の製
造法。(2) The method for producing an n-type semiconductor diamond film according to claim 1, wherein the dopant element is one or more selected from the group consisting of P, As, or Sb.
.001〜0.02であり、ドーパント原子と炭素原子
とのモル比が0.0001〜0.002であることを特
徴とする特許請求の範囲第1項記載のn型半導体ダイヤ
モンド膜の製造法。(3) The molar ratio of carbon atoms to hydrogen molecules in the reaction gas is 0
.. 001 to 0.02, and the molar ratio of dopant atoms to carbon atoms is 0.0001 to 0.002.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21184985A JPS6270295A (en) | 1985-09-24 | 1985-09-24 | Production of n-type semiconductive diamond film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21184985A JPS6270295A (en) | 1985-09-24 | 1985-09-24 | Production of n-type semiconductive diamond film |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6270295A true JPS6270295A (en) | 1987-03-31 |
JPH0371397B2 JPH0371397B2 (en) | 1991-11-13 |
Family
ID=16612606
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP21184985A Granted JPS6270295A (en) | 1985-09-24 | 1985-09-24 | Production of n-type semiconductive diamond film |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6270295A (en) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0196094A (en) * | 1987-10-07 | 1989-04-14 | Tokai Univ | Process for introducing impurity in low pressure synthesis of diamond |
JPH02239193A (en) * | 1989-03-13 | 1990-09-21 | Idemitsu Petrochem Co Ltd | Diamond semiconductor and its production |
EP0458466A2 (en) * | 1990-05-21 | 1991-11-27 | Sumitomo Electric Industries, Limited | Hall device |
WO1992001314A1 (en) * | 1990-07-06 | 1992-01-23 | Advanced Technology Materials, Inc. | N-type semiconducting diamond, and method of making the same |
US5274268A (en) * | 1987-04-01 | 1993-12-28 | Semiconductor Energy Laboratory Co., Ltd. | Electric circuit having superconducting layered structure |
US5304461A (en) * | 1989-01-10 | 1994-04-19 | Kabushiki Kaisha Kobe Seiko Sho | Process for the selective deposition of thin diamond film by gas phase synthesis |
US5400738A (en) * | 1989-03-07 | 1995-03-28 | Sumitomo Electric Industries, Ltd. | Method for producing single crystal diamond film |
WO2000001867A1 (en) * | 1998-07-07 | 2000-01-13 | Japan Science And Technology Corporation | Method for synthesizing n-type diamond having low resistance |
US6162412A (en) * | 1990-08-03 | 2000-12-19 | Sumitomo Electric Industries, Ltd. | Chemical vapor deposition method of high quality diamond |
JP2011168441A (en) * | 2010-02-18 | 2011-09-01 | Nippon Telegr & Teleph Corp <Ntt> | N-type semiconductor diamond and method for producing the same |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58135117A (en) * | 1982-01-29 | 1983-08-11 | Natl Inst For Res In Inorg Mater | Preparation of diamond |
JPS5930709A (en) * | 1982-08-13 | 1984-02-18 | Toa Nenryo Kogyo Kk | Method for synthesizing carbon film and carbon granule in vapor phase |
-
1985
- 1985-09-24 JP JP21184985A patent/JPS6270295A/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58135117A (en) * | 1982-01-29 | 1983-08-11 | Natl Inst For Res In Inorg Mater | Preparation of diamond |
JPS5930709A (en) * | 1982-08-13 | 1984-02-18 | Toa Nenryo Kogyo Kk | Method for synthesizing carbon film and carbon granule in vapor phase |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5274268A (en) * | 1987-04-01 | 1993-12-28 | Semiconductor Energy Laboratory Co., Ltd. | Electric circuit having superconducting layered structure |
JPH0196094A (en) * | 1987-10-07 | 1989-04-14 | Tokai Univ | Process for introducing impurity in low pressure synthesis of diamond |
JPH0372600B2 (en) * | 1987-10-07 | 1991-11-19 | Univ Tokai | |
US5304461A (en) * | 1989-01-10 | 1994-04-19 | Kabushiki Kaisha Kobe Seiko Sho | Process for the selective deposition of thin diamond film by gas phase synthesis |
US5400738A (en) * | 1989-03-07 | 1995-03-28 | Sumitomo Electric Industries, Ltd. | Method for producing single crystal diamond film |
JPH02239193A (en) * | 1989-03-13 | 1990-09-21 | Idemitsu Petrochem Co Ltd | Diamond semiconductor and its production |
EP0458466A2 (en) * | 1990-05-21 | 1991-11-27 | Sumitomo Electric Industries, Limited | Hall device |
WO1992001314A1 (en) * | 1990-07-06 | 1992-01-23 | Advanced Technology Materials, Inc. | N-type semiconducting diamond, and method of making the same |
US6162412A (en) * | 1990-08-03 | 2000-12-19 | Sumitomo Electric Industries, Ltd. | Chemical vapor deposition method of high quality diamond |
WO2000001867A1 (en) * | 1998-07-07 | 2000-01-13 | Japan Science And Technology Corporation | Method for synthesizing n-type diamond having low resistance |
US6340393B1 (en) | 1998-07-07 | 2002-01-22 | Japan Science And Technology Corporation | Method for synthesizing n-type diamond having low resistance |
JP2011168441A (en) * | 2010-02-18 | 2011-09-01 | Nippon Telegr & Teleph Corp <Ntt> | N-type semiconductor diamond and method for producing the same |
Also Published As
Publication number | Publication date |
---|---|
JPH0371397B2 (en) | 1991-11-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |