JPS6265825A - Sorting and conveying device for ic handler - Google Patents

Abstract

PURPOSE:To make possible to carry out the testing, sorting and conveying of ICs with a high degree of efficiency, by arranging testing IC sockets in a number of MXN, by providing delivery lanes for delivering the ICs in a number of N in M-rows, and by providing a plurality of sorting and conveying lanes in parallel with the above-mentioned lanes. CONSTITUTION:IC sockets 2 in a number of MXN, for example, 8X7=56, are arranged, and delivery lines 5a through 5h in eight rows are arranged corresponding to the IC sockets 2 in eight rows. Further, sorting and conveying lines 6a through 6e i five rows are arranged in parallel with the eight rows of the delivery lines 5a through 5h. Further, five IC magazines 4a through 4e are set corresponding to the sorting and conveying lines 6a through 6e, respectively. Further, seven vacuum sucker pads 7-1 through 7-7 which are movable in the direction Y-Y are arranged corresponding to seven IC 1-1 through 1-7 which are fed from the first IC socket 2 row onto the delivery line 5a to shift the IC onto either one of the sorting and conveying lines 6a through 6e in accordance with the result of testing.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a sorting and conveying device used in an IC handler.

[Background of the invention]

The IC handler is a device that supplies a large number of IC4-Js to an IC socket, measures the electrical characteristics of the ICs mounted in the IC sockets, and then sorts and transports the ICs based on the measurement results.

In order for the IC handler to perform the above functions, the IC handler is constructed by combining various types of transport equipment. Among them, I was removed from the classification transport device H1 IC socket.
C is sorted by quality class according to the test results and delivered to the carry-out lane, or sorted by quality class and sent to an IC storage device (for example, an IC magazine).

FIG. 2 is a schematic diagram showing an example of a conventionally used sorting and conveying device.

The ICI is attached to the IC socket 2, and its electrical characteristics are tested.

The tested ICI' is sent onto the classification shuttle 3 as shown in phantom.

The above-mentioned classification shuttle 3 is reciprocated as shown by arrows A and B, and the loaded ICI/ is transferred to the magazine 4a according to the test results.
It is fed into any one of the magazines 4e to 4e.

A known sorting and conveying device configured as described above (Fig. 2)
serves to sequentially receive a large number of ICs from the IC socket 2 and distribute them to a plurality of magazines 48 to 4e.

However, with the above known configuration, it is difficult to dramatically increase processing efficiency.

[Purpose of the invention]

The present invention has been made in view of the above-mentioned circumstances, and it is an object of the present invention to provide a sorting and transporting device that can test, sort, and transport ICs with efficiency several times higher than that of the prior art.

[Summary of the invention]

In order to achieve the above object, the classification and conveyance device of the present invention arranges test IC sockets in MXN (1a), provides M rows of unloading lanes for unloading N ICs, and has M rows of unloading lanes for unloading N ICs. M number of suction pads are provided for suctioning and transporting the M number of ICs sent out, respectively, and a plurality of classification transport lanes are provided in parallel with the above N rows of carry-out lanes, and each of the classification lanes of the plurality of rows is connected to a suction pad. It is characterized in that it is configured to send the received IC into an IC storage device (for example, an IC magazine).

[Embodiments of the invention]

Next, one embodiment of the present invention will be described with reference to FIG.

The present invention provides MXN rows of IC sockets. In this example, M=8. This is an example configured with N=7. That is, regarding two horizontal orthogonal axes X and Y, IC sockets 2 are arranged in i columns in the Y-axis direction and seven rows in the X-axis direction.

The solid line l drawn above the MXN IC sockets 2, that is, 8×7=56 IC sockets 2, indicates the ICs installed in the IC sockets.

I' drawn with a virtual line represents the position where the IC is to be mounted.

For convenience of explanation, the seven columns lined up at the bottom of the figure are referred to as the first column.
Name the column, the second column above it, and so on.

Eight rows of carry-out lines 5a to 5h are provided corresponding to eight rows of IC sockets 2 from the first row to the eighth row.

Five classification transport lines 6a to 6e are provided in parallel with the eight rows of carry-out lines 5a to 5h, and five IC magazines 43 to 43 are arranged corresponding to each of the five classification transport lines 6a to 6e. Set 4e.

Lll 12 to 1-7 indicate seven ICs sent out from the first row of IC sockets 2 to the carry-out line 5a.

Seven vacuum suction pads 7-□ to 7-7 are provided corresponding to the seven ICLs 1 to 1-7.

The seven vacuum suction pads 7-2 to 7-7 have a structure in which they are each driven reciprocally in the Y-axis direction (the driving means is not shown), and when the ICs on the carry-out line are held by suction, they are released from suction. It is configured so that it can be done.

The seven vacuum suction pads 7-□ to 7-7 suck and hold the corresponding tested ICl-□ to 1-7, transport them in the direction of the arrow y, and transfer them to the five classification transport lanes 63 to 63 according to the test results. The IC is mounted on one of the 6e.

The ICs mounted on the classification transport lanes 63 to 6e are sent in the directions of arrows ae and stored in the magazines 4a to 4e, respectively. Similarly, the ICIs in the second, third to eighth columns are also sorted and stored in the magazines 53 to 5h.

According to the device of this embodiment, MXN=8X7=56 I
After testing the CIs, they are sent out to the unloading line at a time of N=7, allowing the seven CIs to be classified at the same time. This process is turned over eight times to complete the sorting and unloading of 56 ICs. Therefore, it is possible to carry out sorting and conveyance much more efficiently (approximately 7 times as much in this embodiment) as compared to the conventional apparatus.

[Effect of the invention] As detailed above, when the device of the present invention is applied, the IC
Testing, sorting, and unloading of ICs can be carried out several times more efficiently than conventional equipment, making a significant contribution to improving IC productivity.

[Brief explanation of drawings]

FIG. 1 is a schematic plan view showing one embodiment of the present invention, and FIG.
The figure is a plan view of a conventional sorting and conveying device. 1.1', l'...I Cs 1-1.1-2 +
~l,...IC. 2...IC socket, 3...Classification shuttle, 4a~
4e... Magazine, 5a-5h... Unloading line, 6
a~6e...Classification conveyance lane, 7-0~7-7...
Vacuum suction nokurado. Patent applicant: Hitachi Electronic Engineering Co., Ltd. Agent Patent attorney Tadashi Akimoto Younger brother 2 Figure

Claims (1)

[Claims] In the sorting and conveying device for an IC handler, which takes down an IC mounted in an IC socket from the IC socket, sorts the taken down IC according to a test result on the IC socket, and sends it to a plurality of IC storage devices. M×N IC sockets are arranged, and M rows of unloading lanes for unloading N ICs are provided, and M suction units are provided for suctioning and transporting the M ICs sent out onto the unloading lanes. A pad is provided, and a plurality of classification transport lanes are provided in parallel with the N rows of carry-out lanes, and each of the plurality of classification lanes is configured to send the ICs received from the suction pad to the IC storage device. I characterized by
Sorting and conveying device for C handlers.