JPS6262979U - - Google Patents

Info

Publication number
JPS6262979U
JPS6262979U JP15461485U JP15461485U JPS6262979U JP S6262979 U JPS6262979 U JP S6262979U JP 15461485 U JP15461485 U JP 15461485U JP 15461485 U JP15461485 U JP 15461485U JP S6262979 U JPS6262979 U JP S6262979U
Authority
JP
Japan
Prior art keywords
signal
circuit
diode
setting circuit
sets
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15461485U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15461485U priority Critical patent/JPS6262979U/ja
Publication of JPS6262979U publication Critical patent/JPS6262979U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP15461485U 1985-10-09 1985-10-09 Pending JPS6262979U (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15461485U JPS6262979U (zh) 1985-10-09 1985-10-09

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15461485U JPS6262979U (zh) 1985-10-09 1985-10-09

Publications (1)

Publication Number Publication Date
JPS6262979U true JPS6262979U (zh) 1987-04-18

Family

ID=31074566

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15461485U Pending JPS6262979U (zh) 1985-10-09 1985-10-09

Country Status (1)

Country Link
JP (1) JPS6262979U (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08240639A (ja) * 1995-01-23 1996-09-17 Fluke Corp 電子テスト計器において半導体ダイオードを自動的にテストする方法およびポータブルテスト計器

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08240639A (ja) * 1995-01-23 1996-09-17 Fluke Corp 電子テスト計器において半導体ダイオードを自動的にテストする方法およびポータブルテスト計器

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