JPS6259255B2 - - Google Patents
Info
- Publication number
- JPS6259255B2 JPS6259255B2 JP54077250A JP7725079A JPS6259255B2 JP S6259255 B2 JPS6259255 B2 JP S6259255B2 JP 54077250 A JP54077250 A JP 54077250A JP 7725079 A JP7725079 A JP 7725079A JP S6259255 B2 JPS6259255 B2 JP S6259255B2
- Authority
- JP
- Japan
- Prior art keywords
- rays
- diffraction
- metal plate
- ray
- rolled metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000013078 crystal Substances 0.000 claims description 38
- 238000000034 method Methods 0.000 claims description 28
- 229910052751 metal Inorganic materials 0.000 claims description 15
- 239000002184 metal Substances 0.000 claims description 15
- 238000009826 distribution Methods 0.000 claims description 10
- 238000004519 manufacturing process Methods 0.000 claims description 7
- 230000005855 radiation Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 20
- PZNPLUBHRSSFHT-RRHRGVEJSA-N 1-hexadecanoyl-2-octadecanoyl-sn-glycero-3-phosphocholine Chemical compound CCCCCCCCCCCCCCCCCC(=O)O[C@@H](COP([O-])(=O)OCC[N+](C)(C)C)COC(=O)CCCCCCCCCCCCCCC PZNPLUBHRSSFHT-RRHRGVEJSA-N 0.000 description 17
- 229910000831 Steel Inorganic materials 0.000 description 12
- 239000010959 steel Substances 0.000 description 12
- 229910001566 austenite Inorganic materials 0.000 description 11
- 239000000463 material Substances 0.000 description 8
- 230000003287 optical effect Effects 0.000 description 8
- 238000001514 detection method Methods 0.000 description 7
- 229910000859 α-Fe Inorganic materials 0.000 description 7
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 239000006185 dispersion Substances 0.000 description 5
- 230000010354 integration Effects 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 238000002441 X-ray diffraction Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 3
- 229910052742 iron Inorganic materials 0.000 description 3
- 238000004220 aggregation Methods 0.000 description 2
- 230000002776 aggregation Effects 0.000 description 2
- 239000011888 foil Substances 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 238000003908 quality control method Methods 0.000 description 2
- 238000005096 rolling process Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 229910000976 Electrical steel Inorganic materials 0.000 description 1
- -1 FCC metals Chemical class 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910002065 alloy metal Inorganic materials 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 238000002050 diffraction method Methods 0.000 description 1
- 238000005315 distribution function Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000000275 quality assurance Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Control Of Metal Rolling (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7725079A JPS561341A (en) | 1979-06-19 | 1979-06-19 | On-line measurement of collective texture |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7725079A JPS561341A (en) | 1979-06-19 | 1979-06-19 | On-line measurement of collective texture |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS561341A JPS561341A (en) | 1981-01-09 |
JPS6259255B2 true JPS6259255B2 (zh) | 1987-12-10 |
Family
ID=13628603
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7725079A Granted JPS561341A (en) | 1979-06-19 | 1979-06-19 | On-line measurement of collective texture |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS561341A (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102642254B (zh) * | 2012-05-14 | 2014-04-23 | 云南蓝晶科技股份有限公司 | 晶面定向检测粘接台 |
EP2862640B1 (de) | 2013-10-18 | 2016-11-30 | Primetals Technologies Germany GmbH | Verfahren und Vorrichtung zur Bearbeitung von Walzgut in einer Walzstraße |
DE102017208576A1 (de) | 2016-05-25 | 2017-11-30 | Sms Group Gmbh | Vorrichtung und Verfahren zum Ermitteln einer Mikrostruktur eines Metallprodukts sowie metallurgische Anlage |
EP3987279B1 (de) | 2019-06-24 | 2023-11-08 | SMS Group GmbH | Vorrichtung und verfahren zum bestimmen der werkstoffeigenschaften eines polykristallinen produkts |
-
1979
- 1979-06-19 JP JP7725079A patent/JPS561341A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS561341A (en) | 1981-01-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Allen et al. | Measurement of internal stress within bulk materials using neutron diffraction | |
US6882739B2 (en) | Method and apparatus for rapid grain size analysis of polycrystalline materials | |
CN106164618A (zh) | 使用多角度x射线反射散射测量(XRS)用于测量周期结构的方法和系统 | |
EP1653226A1 (en) | Scanning line detector for two-dimensional x-ray diffractometer | |
EP3771904A2 (en) | Measurement of crystallite size distribution in polycrystalline materials using two-dimensional x-ray diffraction | |
CN109374659A (zh) | 一种短波长x射线衍射测试样品的定位方法 | |
US12099025B2 (en) | Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection | |
US6678347B1 (en) | Method and apparatus for quantitative phase analysis of textured polycrystalline materials | |
Boyce et al. | Detecting rare, abnormally large grains by x-ray diffraction | |
JPS6259255B2 (zh) | ||
JPS649575B2 (zh) | ||
JPS6110749A (ja) | 走行板材の表面及び内部特性測定装置 | |
Black et al. | Three dimensional strain measurements with x-ray energy dispersive spectroscopy | |
JPH0288952A (ja) | 組織を分析する方法および装置 | |
JPH0237539B2 (zh) | ||
JPS6259256B2 (zh) | ||
JPH02145948A (ja) | エネルギ分散法による集合組織の測定方法 | |
US11275039B2 (en) | Divergent beam two dimensional diffraction | |
JPH06249803A (ja) | X線装置と該装置を用いた評価解析方法 | |
JPH09178675A (ja) | 深さ方向集合組織の測定方法 | |
JPH09113468A (ja) | 正極点図測定方法 | |
JPS642895B2 (zh) | ||
Henschel et al. | Application of Focal Curves for X-Ray Microdiffraction Methods | |
He | Accuracy and Stability of 2D-XRD for Residual Stress Measurement | |
Suwas et al. | Experimental Determination of Texture |