JPS6253349U - - Google Patents

Info

Publication number
JPS6253349U
JPS6253349U JP14513085U JP14513085U JPS6253349U JP S6253349 U JPS6253349 U JP S6253349U JP 14513085 U JP14513085 U JP 14513085U JP 14513085 U JP14513085 U JP 14513085U JP S6253349 U JPS6253349 U JP S6253349U
Authority
JP
Japan
Prior art keywords
light
measured
optical system
irradiates
receiving section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14513085U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14513085U priority Critical patent/JPS6253349U/ja
Publication of JPS6253349U publication Critical patent/JPS6253349U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例全体構成図、第2図
は第1図の異物による反射作用を示す図、第3図
は第1図の作動ブロツク図、第4図、第5図は第
1図の作動時の出力電圧と走査方向を示すグラフ
、第6図は従来装置の全体構成図、第7図、第8
図は第6図の作動時の出力電圧と走査方向を示す
グラフである。 20……第1光学系、21,31……レーザー
光源、22,32……振動ミラー、23……被計
測物、24,33……走査レンズ、25……集光
レンズ、26,36……受光素子、27……信号
処理部、34……異物。
Fig. 1 is an overall configuration diagram of an embodiment of the present invention, Fig. 2 is a diagram showing the reflection action by a foreign object shown in Fig. 1, Fig. 3 is an operation block diagram of Fig. 1, and Figs. 4 and 5 are Figure 1 is a graph showing the output voltage and scanning direction during operation, Figure 6 is an overall configuration diagram of the conventional device, Figures 7 and 8.
The figure is a graph showing the output voltage and scanning direction during the operation of FIG. 6. 20... First optical system, 21, 31... Laser light source, 22, 32... Vibrating mirror, 23... Measured object, 24, 33... Scanning lens, 25... Condensing lens, 26, 36... . . . Light receiving element, 27 . . . Signal processing section, 34 . . . Foreign matter.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 被計測物の表面にレーザー光を斜上方より照射
する投光部と、該被計測物表面からの反射光を受
ける受光部とからなる第1光学系と、被計測物の
表面に対して水平方向から光を照射する投光部と
該被計測物表面に付着した異物からの反射光をオ
プチカルフアイバーにより受光部に伝達する如く
なした第2光学系とからなるレーザー光による表
面欠陥検知装置。
A first optical system includes a light projecting section that irradiates the surface of the object to be measured with laser light from obliquely above, a light receiving section that receives the reflected light from the surface of the object to be measured, and a first optical system that is horizontal to the surface of the object to be measured. A surface defect detection device using a laser beam, comprising a light projecting section that irradiates light from a direction, and a second optical system that transmits reflected light from foreign matter attached to the surface of the object to be measured to a light receiving section using an optical fiber.
JP14513085U 1985-09-25 1985-09-25 Pending JPS6253349U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14513085U JPS6253349U (en) 1985-09-25 1985-09-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14513085U JPS6253349U (en) 1985-09-25 1985-09-25

Publications (1)

Publication Number Publication Date
JPS6253349U true JPS6253349U (en) 1987-04-02

Family

ID=31056383

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14513085U Pending JPS6253349U (en) 1985-09-25 1985-09-25

Country Status (1)

Country Link
JP (1) JPS6253349U (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS498292A (en) * 1972-05-10 1974-01-24
JPS5357087A (en) * 1976-11-04 1978-05-24 Oki Electric Ind Co Ltd Flaw detecting system
JPS57182149A (en) * 1981-05-01 1982-11-09 Matsushita Electric Works Ltd Surface defect detector

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS498292A (en) * 1972-05-10 1974-01-24
JPS5357087A (en) * 1976-11-04 1978-05-24 Oki Electric Ind Co Ltd Flaw detecting system
JPS57182149A (en) * 1981-05-01 1982-11-09 Matsushita Electric Works Ltd Surface defect detector

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