JPS6252255B2 - - Google Patents

Info

Publication number
JPS6252255B2
JPS6252255B2 JP53151213A JP15121378A JPS6252255B2 JP S6252255 B2 JPS6252255 B2 JP S6252255B2 JP 53151213 A JP53151213 A JP 53151213A JP 15121378 A JP15121378 A JP 15121378A JP S6252255 B2 JPS6252255 B2 JP S6252255B2
Authority
JP
Japan
Prior art keywords
aperture
measuring
measurement
gonioreflectometer
irradiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP53151213A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5489789A (en
Inventor
Ratsudosutetsutaa Erumaa
Getsusunaa Uerunaa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Allnex Austria GmbH
Original Assignee
Vianova Resins AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vianova Resins AG filed Critical Vianova Resins AG
Publication of JPS5489789A publication Critical patent/JPS5489789A/ja
Publication of JPS6252255B2 publication Critical patent/JPS6252255B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP15121378A 1977-12-09 1978-12-08 Device for measuring optical characteristics of surface* especially* luster of organic coating Granted JPS5489789A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AT879477A AT351295B (de) 1977-12-09 1977-12-09 Anordnung zur messung des glanzvermoegens von oberflaechen, insbesondere organischer ueberzuege

Publications (2)

Publication Number Publication Date
JPS5489789A JPS5489789A (en) 1979-07-17
JPS6252255B2 true JPS6252255B2 (OSRAM) 1987-11-04

Family

ID=3608589

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15121378A Granted JPS5489789A (en) 1977-12-09 1978-12-08 Device for measuring optical characteristics of surface* especially* luster of organic coating

Country Status (7)

Country Link
JP (1) JPS5489789A (OSRAM)
AT (1) AT351295B (OSRAM)
CH (1) CH638047A5 (OSRAM)
DD (1) DD140290A5 (OSRAM)
DE (1) DE2851455C3 (OSRAM)
FR (1) FR2411405A1 (OSRAM)
GB (1) GB2009922A (OSRAM)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63174551U (OSRAM) * 1987-04-27 1988-11-11
JP2012252023A (ja) * 2006-10-14 2012-12-20 Byk-Gardner Gmbh エフェクトピグメントを含む表面を検査する方法および装置

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3138879A1 (de) * 1981-09-30 1983-04-14 Boehringer Mannheim Gmbh, 6800 Mannheim Verfahren zur erfassung photometrischer signale und anordnung zur durchfuehrung des verfahrens
DE3212190A1 (de) * 1982-04-01 1983-10-06 Siemens Ag Opto-elektronische unterscheidung von strukturen auf oberflaechen
JPS5942317U (ja) * 1982-09-13 1984-03-19 株式会社東芝 動圧気体軸受装置
US4677298A (en) * 1983-12-13 1987-06-30 Kollmorgen Technologies Corporation Method of monitoring ink-water balance on a lithographic printing press
US4902131A (en) * 1985-03-28 1990-02-20 Kabushiki Kaisha Toshiba Surface inspection method and apparatus therefor
FR2579884B1 (OSRAM) * 1985-04-09 1988-12-02 Sanofi Sa
FI78563C (fi) * 1985-11-27 1989-08-10 Aimo Heinonen Reflektometriskt maetningsfoerfarande och maetningsanordning foer genomfoerande av foerfarandet.
US5182618A (en) * 1985-11-27 1993-01-26 Aimo Heinonen Reflectometric method of measurement and apparatus for realizing the method
FI78355C (fi) * 1986-05-27 1989-07-10 Puumalaisen Tutkimuslaitos Oy Metod foer maetning av glans och apparatur foer tillaempning av metoden.
DE8704679U1 (de) * 1987-03-30 1987-05-27 Fa. Carl Zeiss, 7920 Heidenheim Meßgerät für Oberflächen mit bunten Glanzeffekten
JP2996300B2 (ja) * 1988-05-27 1999-12-27 株式会社堀場製作所 携帯用光沢測定装置
JPH0257949A (ja) * 1988-08-24 1990-02-27 Suga Shikenki Kk 携帯形多角光沢計
JPH0248852U (OSRAM) * 1988-09-30 1990-04-04
JP3027161B2 (ja) * 1989-07-14 2000-03-27 株式会社リコー 画像形成装置における画像濃度検知装置
DE4344095C2 (de) * 1993-12-20 1999-10-14 Lange Gmbh Dr Bruno Verfahren und Vorrichtung zur Messung des Glanzgrades
US6570662B1 (en) 1999-05-24 2003-05-27 Luxtron Corporation Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers
WO2000071971A1 (en) * 1999-05-24 2000-11-30 Luxtron Corporation Optical techniques for measuring layer thicknesses
DE19930688A1 (de) * 1999-07-02 2001-01-04 Byk Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung der Qualität von Oberflächen
DE102010032600A1 (de) * 2010-07-28 2012-02-02 Byk-Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung von Oberflächeneigenschaften mit Mehrfachmessung

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1761827U (de) * 1957-11-04 1958-02-20 Geraete Fuer Licht Und Strahlu Lichtelektrischer glanzmesser.
US3245306A (en) * 1961-10-05 1966-04-12 Aluminum Co Of America Photometer and method
DE1944088U (de) * 1966-06-16 1966-08-11 Bayer Ag Vorrichtung zur beurteilung der glanzeigenschaften von oberflaechen.
AT334657B (de) * 1975-01-24 1976-01-25 Vianova Kunstharz Ag Verbesserung zur messung des glanzvermogens von ebenen oberflachen
US3999864A (en) * 1975-11-17 1976-12-28 International Business Machines Corporation Gloss measuring instrument

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63174551U (OSRAM) * 1987-04-27 1988-11-11
JP2012252023A (ja) * 2006-10-14 2012-12-20 Byk-Gardner Gmbh エフェクトピグメントを含む表面を検査する方法および装置

Also Published As

Publication number Publication date
FR2411405A1 (fr) 1979-07-06
DE2851455B2 (de) 1980-07-24
JPS5489789A (en) 1979-07-17
DD140290A5 (de) 1980-02-20
CH638047A5 (de) 1983-08-31
GB2009922A (en) 1979-06-20
ATA879477A (de) 1978-12-15
DE2851455C3 (de) 1981-08-13
AT351295B (de) 1979-07-10
DE2851455A1 (de) 1979-06-13

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