JPS5489789A - Device for measuring optical characteristics of surface* especially* luster of organic coating - Google Patents
Device for measuring optical characteristics of surface* especially* luster of organic coatingInfo
- Publication number
- JPS5489789A JPS5489789A JP15121378A JP15121378A JPS5489789A JP S5489789 A JPS5489789 A JP S5489789A JP 15121378 A JP15121378 A JP 15121378A JP 15121378 A JP15121378 A JP 15121378A JP S5489789 A JPS5489789 A JP S5489789A
- Authority
- JP
- Japan
- Prior art keywords
- luster
- optical characteristics
- organic coating
- measuring optical
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/57—Measuring gloss
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AT879477A AT351295B (de) | 1977-12-09 | 1977-12-09 | Anordnung zur messung des glanzvermoegens von oberflaechen, insbesondere organischer ueberzuege |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5489789A true JPS5489789A (en) | 1979-07-17 |
JPS6252255B2 JPS6252255B2 (ja) | 1987-11-04 |
Family
ID=3608589
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15121378A Granted JPS5489789A (en) | 1977-12-09 | 1978-12-08 | Device for measuring optical characteristics of surface* especially* luster of organic coating |
Country Status (7)
Country | Link |
---|---|
JP (1) | JPS5489789A (ja) |
AT (1) | AT351295B (ja) |
CH (1) | CH638047A5 (ja) |
DD (1) | DD140290A5 (ja) |
DE (1) | DE2851455C3 (ja) |
FR (1) | FR2411405A1 (ja) |
GB (1) | GB2009922A (ja) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5942317U (ja) * | 1982-09-13 | 1984-03-19 | 株式会社東芝 | 動圧気体軸受装置 |
JPS63159754U (ja) * | 1987-03-30 | 1988-10-19 | ||
JPH0257949A (ja) * | 1988-08-24 | 1990-02-27 | Suga Shikenki Kk | 携帯形多角光沢計 |
JPH0248852U (ja) * | 1988-09-30 | 1990-04-04 | ||
JP2008096444A (ja) * | 2006-10-14 | 2008-04-24 | Byk-Gardner Gmbh | エフェクトピグメントを含む表面を検査する方法および装置 |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3138879A1 (de) * | 1981-09-30 | 1983-04-14 | Boehringer Mannheim Gmbh, 6800 Mannheim | Verfahren zur erfassung photometrischer signale und anordnung zur durchfuehrung des verfahrens |
DE3212190A1 (de) * | 1982-04-01 | 1983-10-06 | Siemens Ag | Opto-elektronische unterscheidung von strukturen auf oberflaechen |
US4677298A (en) * | 1983-12-13 | 1987-06-30 | Kollmorgen Technologies Corporation | Method of monitoring ink-water balance on a lithographic printing press |
KR910000794B1 (ko) * | 1985-03-28 | 1991-02-08 | 가부시끼가이샤 도오시바 | 기판의 표면검사방법 및 장치 |
FR2579884B1 (ja) * | 1985-04-09 | 1988-12-02 | Sanofi Sa | |
FI78563C (fi) * | 1985-11-27 | 1989-08-10 | Aimo Heinonen | Reflektometriskt maetningsfoerfarande och maetningsanordning foer genomfoerande av foerfarandet. |
US5182618A (en) * | 1985-11-27 | 1993-01-26 | Aimo Heinonen | Reflectometric method of measurement and apparatus for realizing the method |
FI78355C (fi) * | 1986-05-27 | 1989-07-10 | Puumalaisen Tutkimuslaitos Oy | Metod foer maetning av glans och apparatur foer tillaempning av metoden. |
JPS63174551U (ja) * | 1987-04-27 | 1988-11-11 | ||
JP2996300B2 (ja) * | 1988-05-27 | 1999-12-27 | 株式会社堀場製作所 | 携帯用光沢測定装置 |
JP3027161B2 (ja) * | 1989-07-14 | 2000-03-27 | 株式会社リコー | 画像形成装置における画像濃度検知装置 |
DE4344095C2 (de) * | 1993-12-20 | 1999-10-14 | Lange Gmbh Dr Bruno | Verfahren und Vorrichtung zur Messung des Glanzgrades |
WO2000071971A1 (en) * | 1999-05-24 | 2000-11-30 | Luxtron Corporation | Optical techniques for measuring layer thicknesses |
US6570662B1 (en) | 1999-05-24 | 2003-05-27 | Luxtron Corporation | Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers |
DE102010032600A1 (de) * | 2010-07-28 | 2012-02-02 | Byk-Gardner Gmbh | Vorrichtung und Verfahren zur Bestimmung von Oberflächeneigenschaften mit Mehrfachmessung |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1761827U (de) * | 1957-11-04 | 1958-02-20 | Geraete Fuer Licht Und Strahlu | Lichtelektrischer glanzmesser. |
US3245306A (en) * | 1961-10-05 | 1966-04-12 | Aluminum Co Of America | Photometer and method |
DE1944088U (de) * | 1966-06-16 | 1966-08-11 | Bayer Ag | Vorrichtung zur beurteilung der glanzeigenschaften von oberflaechen. |
AT334657B (de) * | 1975-01-24 | 1976-01-25 | Vianova Kunstharz Ag | Verbesserung zur messung des glanzvermogens von ebenen oberflachen |
US3999864A (en) * | 1975-11-17 | 1976-12-28 | International Business Machines Corporation | Gloss measuring instrument |
-
1977
- 1977-12-09 AT AT879477A patent/AT351295B/de not_active IP Right Cessation
-
1978
- 1978-11-22 CH CH1199478A patent/CH638047A5/de not_active IP Right Cessation
- 1978-11-23 DD DD20927878A patent/DD140290A5/de unknown
- 1978-11-28 DE DE19782851455 patent/DE2851455C3/de not_active Expired
- 1978-12-06 GB GB7847326A patent/GB2009922A/en not_active Withdrawn
- 1978-12-08 FR FR7834672A patent/FR2411405A1/fr not_active Withdrawn
- 1978-12-08 JP JP15121378A patent/JPS5489789A/ja active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5942317U (ja) * | 1982-09-13 | 1984-03-19 | 株式会社東芝 | 動圧気体軸受装置 |
JPS63159754U (ja) * | 1987-03-30 | 1988-10-19 | ||
JPH0257949A (ja) * | 1988-08-24 | 1990-02-27 | Suga Shikenki Kk | 携帯形多角光沢計 |
JPH0248852U (ja) * | 1988-09-30 | 1990-04-04 | ||
JP2008096444A (ja) * | 2006-10-14 | 2008-04-24 | Byk-Gardner Gmbh | エフェクトピグメントを含む表面を検査する方法および装置 |
Also Published As
Publication number | Publication date |
---|---|
DD140290A5 (de) | 1980-02-20 |
DE2851455B2 (de) | 1980-07-24 |
GB2009922A (en) | 1979-06-20 |
DE2851455C3 (de) | 1981-08-13 |
DE2851455A1 (de) | 1979-06-13 |
CH638047A5 (de) | 1983-08-31 |
JPS6252255B2 (ja) | 1987-11-04 |
ATA879477A (de) | 1978-12-15 |
FR2411405A1 (fr) | 1979-07-06 |
AT351295B (de) | 1979-07-10 |
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