JPS6245829B2 - - Google Patents
Info
- Publication number
- JPS6245829B2 JPS6245829B2 JP7339979A JP7339979A JPS6245829B2 JP S6245829 B2 JPS6245829 B2 JP S6245829B2 JP 7339979 A JP7339979 A JP 7339979A JP 7339979 A JP7339979 A JP 7339979A JP S6245829 B2 JPS6245829 B2 JP S6245829B2
- Authority
- JP
- Japan
- Prior art keywords
- plating
- common electrode
- thermal head
- electrode
- manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000007747 plating Methods 0.000 claims description 62
- 239000002184 metal Substances 0.000 claims description 19
- 229910052751 metal Inorganic materials 0.000 claims description 19
- 238000009713 electroplating Methods 0.000 claims description 18
- 238000004519 manufacturing process Methods 0.000 claims description 17
- 238000000034 method Methods 0.000 claims description 12
- 229920002379 silicone rubber Polymers 0.000 claims description 10
- 239000004945 silicone rubber Substances 0.000 claims description 10
- 229910001111 Fine metal Inorganic materials 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 18
- 239000010408 film Substances 0.000 description 13
- 238000010438 heat treatment Methods 0.000 description 12
- 238000005530 etching Methods 0.000 description 10
- 239000004020 conductor Substances 0.000 description 9
- 239000010931 gold Substances 0.000 description 8
- 229910052737 gold Inorganic materials 0.000 description 6
- 238000005299 abrasion Methods 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000000206 photolithography Methods 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- 230000005856 abnormality Effects 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 239000012790 adhesive layer Substances 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 229920001971 elastomer Polymers 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- BZHJMEDXRYGGRV-UHFFFAOYSA-N Vinyl chloride Chemical compound ClC=C BZHJMEDXRYGGRV-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000866 electrolytic etching Methods 0.000 description 1
- 230000005496 eutectics Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/315—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material
- B41J2/32—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material using thermal heads
- B41J2/345—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material using thermal heads characterised by the arrangement of resistors or conductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Electronic Switches (AREA)
Description
【発明の詳細な説明】
本発明はサーマルヘツドの製造方法に関し、特
に薄膜型サーマルヘツドにおいて、電極抵抗が低
く、かつボンデイング性に優れた電極を設けるこ
とを目的とするものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for manufacturing a thermal head, and in particular, an object of the present invention is to provide an electrode having low electrode resistance and excellent bonding properties in a thin film type thermal head.
一般に薄膜型サーマルヘツドは、電極抵抗が高
くなるという欠点を有している。この電極抵抗を
下げるためには、電気メツキにより電極の厚みを
厚くすればよいのであるが、従来は全電極を短絡
させるためのメツキ用導体を用い、このメツキ用
導体を電気メツキ装置の陰極と接続してヘツドの
各電極を電気メツキした後、メツキ用導体をエツ
チオフする製造法を用いていたため、メツキの結
果厚くなつたメツキ用電極をメツキ後にエツチオ
フする工程が必要となるという問題があつた。ま
た、メツキ後の耐摩耗層形成時の高温のため、メ
ツキ膜の熱歪により電極が剥離するという問題が
あつた。 Generally, thin film type thermal heads have the disadvantage of high electrode resistance. In order to reduce this electrode resistance, it is possible to increase the thickness of the electrode by electroplating, but conventionally, a plating conductor is used to short-circuit all electrodes, and this plating conductor is used as the cathode of the electroplating device. Since the manufacturing method used was to etch off the plating conductor after connecting and electroplating each electrode of the head, there was a problem in that it was necessary to etch off the plating electrode, which had become thick as a result of plating, after plating. . Furthermore, due to the high temperature during the formation of the wear-resistant layer after plating, there was a problem in that the electrodes peeled off due to thermal distortion of the plating film.
そこで、この問題を解決するために、電気メツ
キを耐摩耗層形成後に行なうことを試みたが、メ
ツキ用電極のエツチオフが非常に困難となり、実
用的でないことが判つた。このようにメツキ用電
極のエツチオフが困難となる原因は、サーマルヘ
ツドの電極が一般にCr等の付着層とAu、Cu等の
導電層の2層からなり、耐摩耗層形成時の高温で
この2層が相互拡散反応により合金層を形成し、
この合金層のエツチオフが非常に困難であるから
である。 Therefore, in order to solve this problem, an attempt was made to perform electroplating after forming the wear-resistant layer, but it was found that it was not practical because it became extremely difficult to etch off the plating electrode. The reason why it is difficult to etch off plating electrodes is that thermal head electrodes generally consist of two layers: an adhesive layer of Cr, etc., and a conductive layer of Au, Cu, etc. The layers form an alloy layer by interdiffusion reaction,
This is because it is very difficult to etch off this alloy layer.
すなわちメツキ膜をエツチオフした後、薄膜薄
電層のAu、Cu等をエツチングする途中よりCrと
の相互拡散反応層に達するとエツチング速度が低
下しエツチング時間が長くなる欠点があつた。 That is, after etching off the plating film, if the interdiffusion reaction layer with Cr is reached during etching of Au, Cu, etc. of the thin film thin conductive layer, the etching rate decreases and the etching time becomes longer.
本発明はこのような従来の問題点を解決するも
のであり、メツキ用電極のエツチオフを必要とし
ない製造方法を提供するものである。以下、本発
明の一実施例によるサーマルヘツドの製造方法に
ついて、第1図〜第7図の図面を用いて説明す
る。 The present invention solves these conventional problems and provides a manufacturing method that does not require etching off the plating electrode. Hereinafter, a method of manufacturing a thermal head according to an embodiment of the present invention will be explained using the drawings of FIGS. 1 to 7.
第1図は耐摩耗層形成後のサーマルヘツドを示
す図であり、図において1はグレーズドセラミツ
ク基板、2はSi―Ta系の抵抗値が300Ω/ドツト
の発熱素子、3はこの発熱素子2の一端に接続さ
れた共通電極、4は発熱素子2の他端に接続され
た個別電極で、これらの電極は付着層として
Cr、導電層としてAuの2層構造である。5は前
記発熱素子2および共通電極3、個別電極4の一
部を被覆するようにスパツタ技術により形成した
SiCの耐摩耗層である。 Figure 1 shows the thermal head after the wear-resistant layer has been formed. In the figure, 1 is a glazed ceramic substrate, 2 is a Si--Ta based heating element with a resistance value of 300Ω/dot, and 3 is the heating element 2. A common electrode is connected to one end, and 4 is an individual electrode connected to the other end of the heating element 2. These electrodes are attached as an adhesive layer.
It has a two-layer structure with Cr and Au as the conductive layer. 5 was formed by sputtering technique so as to cover part of the heating element 2, the common electrode 3, and the individual electrodes 4.
It is a wear-resistant layer of SiC.
従来の電気メツキ法を説明するためB4版
8dot/mmのサーマルヘツドを例にとると、1個の
共通電極に32個の発熱素子および個別電極が125
μmのピツチで配列された64個の共通電極から成
る。電気メツキを必要とするのは、これら64個の
共通電極および2048個の個別電極である。第1図
からわかるように共通電極3とその個別電極4と
は発熱素子2を介して電気的に接続されている
が、各共通電極間は電気的に絶縁状態にある。64
個の共通電極のすべてにメツキ治具を接触させる
ことはきわめて困難である。このため従来は次の
順序で電気メツキを行つていた。(1)電極をフオト
エツチングする時に各共通電極間を完全には分離
せず、隣接共通電極間の一部にメツキ用導体を残
すことにより、共通電極間を相互に接続された状
態とするフオトエツチング工程、(2)耐摩耗膜形成
工程、(3)耐摩耗膜幅よりも少し幅の広い領域(非
メツキ部)に印刷またはフオトリソによるメツキ
用絶縁膜形成工程、(4)共通電極10個につき1本程
度の割合でメツキ治具を接触させ、メツキ装置の
陰極に接続し、上記メツキ用絶縁膜に被覆されて
いない共通電極および個別電極上に電気メツキす
る工程、(5)上記メツキ用絶縁膜を剥離する工程、
(6)上記メツキ用導体以外を耐エツチング用レジス
トで印刷する工程、(7)メツキ用導体をエツチオフ
する工程、(8)耐エツチング用レジストを剥離する
工程。以上のように複雑な工程を必要とするが、
本発明の方法によればエラスチツクコネクタの絶
縁性と導電性とを同時に利用することにより、上
記工程中の(3)、(5)、(6)、(7)、(8)の各工程を廃止す
ることができる。 B4 version to explain the conventional electroplating method
Taking an 8dot/mm thermal head as an example, one common electrode has 32 heating elements and 125 individual electrodes.
It consists of 64 common electrodes arranged with a pitch of μm. It is these 64 common electrodes and 2048 individual electrodes that require electroplating. As can be seen from FIG. 1, the common electrode 3 and its individual electrodes 4 are electrically connected via the heating element 2, but the common electrodes are electrically insulated. 64
It is extremely difficult to bring the plating jig into contact with all of the common electrodes. For this reason, conventionally electroplating was performed in the following order. (1) When photo-etching the electrodes, each common electrode is not completely separated, but a conductor for plating is left in a part between adjacent common electrodes, so that the common electrodes are connected to each other. Etching process, (2) Abrasion resistant film formation process, (3) Plating insulating film formation process by printing or photolithography on an area slightly wider than the abrasion resistant film width (non-plated area), (4) 10 common electrodes (5) a step of electrically plating the common electrode and individual electrodes that are not covered with the insulating film for plating by contacting the plating jig at a rate of about one per plating device and connecting it to the cathode of the plating device; The process of peeling off the insulating film,
(6) a step of printing other parts than the plating conductor with an etching-resistant resist; (7) a step of etching off the plating conductor; and (8) a step of peeling off the etching-resistant resist. Although it requires a complicated process as described above,
According to the method of the present invention, each of the steps (3), (5), (6), (7), and (8) in the above steps is achieved by simultaneously utilizing the insulation and conductivity of the elastic connector. can be abolished.
次に第2図〜第7図を使つて本発明の詳細につ
いて述べる。 Next, details of the present invention will be described using FIGS. 2 to 7.
第2図および第3図は電気メツキ用治具の部品
として使用する東レ株式会社製のエラスチツクコ
ネクタ(商品名)を示す図であり、図において6
はシリコーンゴム、7は金属細線である。このエ
ラスチツクコネクタ8は多数の金属細線7をシリ
コーンゴム6中に厚み方向に貫通させて埋め込ん
だ柔軟性を有するコネクタである。また、金属細
線7には金メツキが施こされており、そしてこの
金属細線7の両端は、シリコンゴム6の両表面か
ら突出し、シリコーンゴム6の両表面の間に電気
的導通路を形成しており、これによつてエラスチ
ツクコネクタ8は、両面に配置される導体を電気
的に接続する役目を行なう。また、シリコーンゴ
ム6中への金属細線7の埋め込みピツチは、前記
第1図に示すヘツドの共通電極3のピツチより小
さくななつている。 Figures 2 and 3 are diagrams showing an elastic connector (product name) manufactured by Toray Industries, Inc. used as a part of an electroplating jig.
is silicone rubber, and 7 is a thin metal wire. This elastic connector 8 is a flexible connector in which a large number of thin metal wires 7 are embedded in silicone rubber 6 by penetrating it in the thickness direction. Further, the thin metal wire 7 is plated with gold, and both ends of the thin metal wire 7 protrude from both surfaces of the silicone rubber 6 to form an electrically conductive path between both surfaces of the silicone rubber 6. Thus, the elastic connector 8 serves to electrically connect the conductors arranged on both sides. Furthermore, the pitch at which the thin metal wires 7 are embedded in the silicone rubber 6 is smaller than the pitch at which the common electrode 3 of the head shown in FIG. 1 is embedded.
第4図は第2図および第3図に示すエラスチツ
クコネクタを使つたメツキ治具を示す図であり、
図において9はAuメツキしたCu板等の金属板
で、接着剤10によりエラスチツクコネクタ8に
接着され、そしてエラスチツクコネクタ8の金属
細線7は金属板9に電気的に接続されている。1
1は塩化ビニール等の絶縁物からなる基台で、接
着剤12を介して金属板9に接着されている。 FIG. 4 is a diagram showing a plating jig using the elastic connector shown in FIGS. 2 and 3;
In the figure, reference numeral 9 denotes a metal plate such as an Au-plated Cu plate, which is bonded to the elastic connector 8 with an adhesive 10, and the thin metal wire 7 of the elastic connector 8 is electrically connected to the metal plate 9. 1
Reference numeral 1 denotes a base made of an insulating material such as vinyl chloride, which is adhered to a metal plate 9 via an adhesive 12.
次に、第4図に示すメツキ治具13を用いてメ
ツキを行なう場合の本発明の製造方法について、
第5図〜第7図の図面を用いて説明する。 Next, regarding the manufacturing method of the present invention when plating is performed using the plating jig 13 shown in FIG.
This will be explained using the drawings of FIGS. 5 to 7.
まず、メツキ治具13の金属細線7が第1図に
示す耐摩耗層形成後のサーマルヘツドの共通電極
3に接するように、ヘツドとメツキ治具13とを
位置合せする。この時、第5図に示すようにメツ
キ治具13の金属細線7は共通電極3のみに接
し、個別電極4には接しない。第6図は第5図の
金属細線7部分の断面図で、矢印14の方向に
1.5Kg/cm2の力で押圧した状態を示している。そ
して、メツキ治具13の金属細線7は、共通電極
3に接し、第6図に示すように曲るので良好な接
触が得られ、サーマルヘツドの共通電極3とメツ
キ治具13の金属板9とが電気的に接続される。 First, the head and the plating jig 13 are aligned so that the thin metal wire 7 of the plating jig 13 comes into contact with the common electrode 3 of the thermal head after the wear-resistant layer is formed as shown in FIG. At this time, as shown in FIG. 5, the thin metal wire 7 of the plating jig 13 contacts only the common electrode 3 and does not contact the individual electrodes 4. FIG. 6 is a cross-sectional view of part 7 of the thin metal wire in FIG.
The state shown is when pressed with a force of 1.5Kg/cm 2 . The thin metal wire 7 of the plating jig 13 contacts the common electrode 3 and bends as shown in FIG. are electrically connected.
この状態で金属板9を電気メツキ装置の陰極に
接続してメツキ液中で電気メツキを行なうと、第
5図においてメツキ治具13のシリコーンゴム6
に被覆されない領域の共通電極3および個別電極
4にメツキ膜が形成される。なお、メツキ治具1
3により電気メツキ装置の陰極に直接接続される
のは、共通電極3のみであり、個別電極4には発
熱素子2を経由してメツキ電流が流れる。 In this state, when the metal plate 9 is connected to the cathode of the electroplating device and electroplated in a plating solution, the silicone rubber 6 of the plating jig 13 is shown in FIG.
A plating film is formed on the common electrode 3 and the individual electrodes 4 in areas that are not covered. In addition, plating jig 1
3, only the common electrode 3 is directly connected to the cathode of the electroplating device, and the plating current flows through the individual electrodes 4 via the heating elements 2.
第7図は電気メツキした後のサーマルヘツドを
示す図であり、図において31は共通電極3のう
ちで電気メツキされた部分、32はメツキされな
い部分、41は個別電極4のうちで電気メツキさ
れた部分、42はメツキされない部分である。す
なわち、メツキ治具13のサーマルヘツドに接す
る面は柔軟なシリコンゴム6であり、1.5Kg/cm2
の押圧で押し付けているので、メツキ液はシリコ
ーンゴム6とサーマルヘツドとの界面からは全く
侵入せず、電気メツキされた部分31,41とメ
ツキされない部分32,42との境界はシヤープ
な輪郭を示す。 FIG. 7 is a diagram showing the thermal head after electroplating. In the figure, 31 is the electroplated part of the common electrode 3, 32 is the unplated part, and 41 is the part of the individual electrode 4 that is electroplated. The portion 42 is not plated. That is, the surface of the plating jig 13 in contact with the thermal head is made of flexible silicone rubber 6, and the plating jig 13 has a plating density of 1.5 kg/cm 2 .
Since the plating liquid is pressed with the pressure of show.
以上の説明から明らかなように本発明の製造方
法では、耐摩耗層形成後のサーマルヘツドの共通
電極3のみをエラスチツクコネクタ8を介して電
気メツキ装置の陰極に接続して電気メツキを行な
うので、従来のように非メツキ部に印刷またはフ
オトリソによるメツキマスク用絶縁膜を形成する
必要がなく、またメツキ用導体およびそのエツチ
オフを必要としなく、また耐摩耗層形成後のメツ
キであるため、従来のようにメツキ後に高温にさ
らされることがなく、メツキ膜の熱歪による電極
剥離の問題が生じなく、しかも付着層としての
Crと導電層としてのAuとの相互拡散反応が生じ
ないので表面は純金となり、ボンデイング性が良
好となる。 As is clear from the above description, in the manufacturing method of the present invention, electroplating is performed by connecting only the common electrode 3 of the thermal head after forming the wear-resistant layer to the cathode of the electroplating device via the elastic connector 8. , it is not necessary to form an insulating film for a plating mask by printing or photolithography on the non-plated areas as in the past, and there is no need for conductors for plating and their etch-off, and since plating is performed after forming a wear-resistant layer, it is possible to As such, there is no exposure to high temperatures after plating, and there is no problem of electrode peeling due to thermal distortion of the plating film.
Since no interdiffusion reaction occurs between Cr and Au as the conductive layer, the surface becomes pure gold, resulting in good bonding properties.
さらに、本発明においては、個別電極4にはエ
ラスチツクコネクタの金属細線は接触しないが、
個別電極4のメツキ厚が共通電極3のメツキ厚よ
りも厚くなる。例えば、共通電極3のメツキ厚が
4μの時、個別電極4のメツキ厚は約5μとな
る。この原因は、個別電極4は発熱素子2を介し
て共通電極3に接続されており、この結果、個別
電極4はメツキ装置の陰極と電気的に接続され
る。しかも個別電極4は半導体素子との接続のた
め先端部ピツチは発熱素子ピツチより細かくなり
電極幅が狭いので電流集中が起こるためメツキ厚
が厚くなる。しかもメツキ治具は第4図の構造の
ためサーマルヘツド面に垂直に設置されて、メツ
キ液の領域を共通電極領域と個別電極領域とに2
分する効果があり、サーマルヘツドに対向する陽
極板を共通電極用と個別電極用とに別々として、
サーマルヘツドとの距離を独立に調節することが
できるので、個別電極のメツキ厚を共通電極のメ
ツキ厚より厚くすることは容易である。すなわ
ち、これによつて共通電極3はリード線を半田付
けするため薄くてもよいが、個別電極4はAu―
Sn共晶反応を利用したボンデイングを行なうの
で厚い方が好都合であることから考えても、本発
明の製造方法はボンデイング性を優れたものとす
る上で大なる効果を発揮する方法である。 Furthermore, in the present invention, although the thin metal wire of the elastic connector does not come into contact with the individual electrodes 4,
The plating thickness of the individual electrodes 4 is thicker than that of the common electrode 3. For example, when the plating thickness of the common electrode 3 is 4μ, the plating thickness of the individual electrodes 4 is about 5μ. The reason for this is that the individual electrodes 4 are connected to the common electrode 3 via the heating element 2, and as a result, the individual electrodes 4 are electrically connected to the cathode of the plating device. Moreover, since the individual electrodes 4 are connected to the semiconductor element, the pitch at the tip end is finer than the pitch at the heating element, and the electrode width is narrower, so current concentration occurs and the plating thickness becomes thicker. Moreover, because of the structure shown in Figure 4, the plating jig is installed perpendicularly to the thermal head surface, dividing the plating solution into two areas: the common electrode area and the individual electrode areas.
This has the effect of separating the anode plates facing the thermal head into separate ones for the common electrode and for the individual electrodes.
Since the distance to the thermal head can be adjusted independently, it is easy to make the plating thickness of the individual electrodes thicker than that of the common electrode. That is, as a result, the common electrode 3 may be thin because the lead wires are soldered, but the individual electrodes 4 are made of Au-
Since bonding is performed using the Sn eutectic reaction, the thicker the film is, the better. Considering this, the manufacturing method of the present invention is a method that is highly effective in improving bonding properties.
また、本発明の製造方法において、メツキ治具
としてエラスチツクコネクタ8の代りに導電性ゴ
ムを用いたところ、メツキされた部分とメツキさ
れない部分との境界において電解エツチが発生
し、下層電極膜のCrが露出する現象が見られた
のみならず、導電性ゴムにAuメツキ液が付着し
たままヘツドに押圧してメツキすると、メツキし
たくない面にAuが析出してしみが生じる現象が
発生したが、上記実施例のようにエラスチツクコ
ネクタ8を用いた場合には、このようなことが全
く発生しなかつた。 Further, in the manufacturing method of the present invention, when conductive rubber is used as a plating jig instead of the elastic connector 8, electrolytic etching occurs at the boundary between the plated part and the unplated part, and the lower electrode film is damaged. Not only was there a phenomenon where Cr was exposed, but when the conductive rubber was pressed against the head with the Au plating solution attached to it and plated, Au was deposited on the surface where it was not desired to be plated, causing stains. However, when the elastic connector 8 was used as in the above embodiment, such a problem did not occur at all.
さらに、本発明の製造方法は、発熱素子2の抵
抗値分布に異常があると、その発熱素子2に接続
した個別電極4に流れるメツキ時の電流がその近
傍に比較して異なるため、メツキ厚さがその近傍
の厚さと比較して一見してその差異が判り、抵抗
値を実測することなく目視検査で抵抗値分布の異
常を検出することができる。 Furthermore, in the manufacturing method of the present invention, if there is an abnormality in the resistance value distribution of the heating element 2, the current flowing through the individual electrode 4 connected to the heating element 2 during plating will be different compared to that in the vicinity. By comparing the thickness with the thickness in the vicinity, the difference can be seen at a glance, and an abnormality in the resistance value distribution can be detected by visual inspection without actually measuring the resistance value.
また、メツキ治具13のエラスチツクコネクタ
8の金属細線7の埋め込みピツチは、サーマルヘ
ツドの共通電極3のピツチよりも充分に小さくし
ておけば、仮りに接触不良の金属細線7があつて
も、少なくとも1本の金属細線7が各共通電極3
に接触することとなり、全電極にメツキすること
が可能となる。 In addition, if the embedded pitch of the thin metal wires 7 of the elastic connector 8 of the plating jig 13 is made sufficiently smaller than the pitch of the common electrode 3 of the thermal head, even if there is a thin metal wire 7 with poor contact, , at least one thin metal wire 7 connects each common electrode 3
This makes it possible to plate all electrodes.
以上のように本発明のサーマルヘツドの製造方
法によれば、従来のように非メツキ部に印刷また
はフオトリソによるメツキマスク用絶縁膜を形成
する必要がなく、またメツキ用導体やエツチオフ
を必要としないで電極抵抗が低くボンデイング性
に優れた電極を有するサーマルヘツドを容易に得
ることができるのである。 As described above, according to the method for manufacturing a thermal head of the present invention, there is no need to form an insulating film for a plating mask by printing or photolithography on the non-plated parts as in the conventional method, and there is no need for conductors for plating or etching. A thermal head having electrodes with low electrode resistance and excellent bonding properties can be easily obtained.
第1図は本発明のサーマルヘツドの製造方法に
より電気メツキする前のサーマルヘツドの状態を
示す平面図、第2図は本発明の製造方法で用いる
エラスチツクコネクタを示す平面図、第3図は第
2図のA―A′線で切断した断面図、第4図は第
2図および第3図に示すエラスチツクコネクタを
用いたメツキ治具を示す断面図、第5図および第
6図はそれぞれそのメツキ治具を第1図に示すサ
ーマルヘツドに押圧した状態を示す平面図および
断面図、第7図は本発明の製造方法によりメツキ
した後のサーマルヘツドを示す平面図である。
2……発熱素子、3……共通電極、4……個別
電極、5……耐摩耗層、6……シリコーンゴム、
7……金属細線、13……メツキ治具、31,4
1……電気メツキされた部分、32,42……メ
ツキされない部分。
FIG. 1 is a plan view showing the state of a thermal head before electroplating according to the method of manufacturing a thermal head of the present invention, FIG. 2 is a plan view showing an elastic connector used in the method of manufacturing a thermal head of the present invention, and FIG. 2 is a sectional view taken along the line A-A', FIG. 4 is a sectional view showing a plating jig using the elastic connector shown in FIGS. 2 and 3, and FIGS. 5 and 6 are FIG. 7 is a plan view and a sectional view showing the plating jig pressed against the thermal head shown in FIG. 1, respectively, and FIG. 7 is a plan view showing the thermal head after being plated by the manufacturing method of the present invention. 2...Heating element, 3...Common electrode, 4...Individual electrode, 5...Abrasion resistant layer, 6...Silicone rubber,
7... Fine metal wire, 13... Plating jig, 31, 4
1... Electroplated part, 32, 42... Unplated part.
Claims (1)
続した複数個の発熱素子上にこの発熱素子を被覆
する耐摩耗層を形成した後、前記共通電極および
個別電極上に電気メツキするサーマルヘツドの製
造方法において、電気メツキ時に前記共通電極の
みをメツキ治具を介して電気メツキ装置の陰極に
接続し、前記共通電極および個別電極上に電気メ
ツキすることを特徴とするサーマルヘツドの製造
方法。 2 メツキ治具として、シリコンゴム中に多数の
金属細線を両表面から両端が突出するように厚み
方向に貫通させて埋め込んだものを用いたことを
特徴とする特許請求の範囲第1項に記載のサーマ
ルヘツドの製造方法。 3 シリコーンゴム中の金属細線の埋め込みピツ
チを共通電極のピツチより小さくしたことを特徴
とする特許請求の範囲第2項に記載のサーマルヘ
ツドの製造方法。[Scope of Claims] 1. After forming a wear-resistant layer covering a plurality of heat generating elements having one end connected to a common electrode and the other end connected to an individual electrode, and then forming a wear-resistant layer covering the heat generating elements, A method for manufacturing a thermal head for electroplating, characterized in that during electroplating, only the common electrode is connected to the cathode of an electroplating device via a plating jig, and electroplating is performed on the common electrode and the individual electrodes. A method of manufacturing a thermal head. 2. Claim 1, characterized in that the plating jig is a silicone rubber in which a large number of fine metal wires are embedded in the thickness direction so that both ends protrude from both surfaces. A method of manufacturing a thermal head. 3. The method of manufacturing a thermal head according to claim 2, wherein the pitch of embedding the thin metal wires in the silicone rubber is smaller than the pitch of the common electrode.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7339979A JPS55166268A (en) | 1979-06-11 | 1979-06-11 | Manufacture of thermal head |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7339979A JPS55166268A (en) | 1979-06-11 | 1979-06-11 | Manufacture of thermal head |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55166268A JPS55166268A (en) | 1980-12-25 |
JPS6245829B2 true JPS6245829B2 (en) | 1987-09-29 |
Family
ID=13517073
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7339979A Granted JPS55166268A (en) | 1979-06-11 | 1979-06-11 | Manufacture of thermal head |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55166268A (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61112661A (en) * | 1985-11-09 | 1986-05-30 | Ricoh Co Ltd | Conductive path-wired base plate for thermal head and its manufacture |
US12097715B2 (en) * | 2020-03-31 | 2024-09-24 | Kyocera Corporation | Thermal head and thermal printer |
-
1979
- 1979-06-11 JP JP7339979A patent/JPS55166268A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS55166268A (en) | 1980-12-25 |
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