JPS6245800U - - Google Patents

Info

Publication number
JPS6245800U
JPS6245800U JP13578685U JP13578685U JPS6245800U JP S6245800 U JPS6245800 U JP S6245800U JP 13578685 U JP13578685 U JP 13578685U JP 13578685 U JP13578685 U JP 13578685U JP S6245800 U JPS6245800 U JP S6245800U
Authority
JP
Japan
Prior art keywords
semiconductor memory
readout circuit
memory element
nonvolatile semiconductor
differential amplifier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13578685U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13578685U priority Critical patent/JPS6245800U/ja
Publication of JPS6245800U publication Critical patent/JPS6245800U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
JP13578685U 1985-09-03 1985-09-03 Pending JPS6245800U (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13578685U JPS6245800U (ko) 1985-09-03 1985-09-03

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13578685U JPS6245800U (ko) 1985-09-03 1985-09-03

Publications (1)

Publication Number Publication Date
JPS6245800U true JPS6245800U (ko) 1987-03-19

Family

ID=31038302

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13578685U Pending JPS6245800U (ko) 1985-09-03 1985-09-03

Country Status (1)

Country Link
JP (1) JPS6245800U (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08335400A (ja) * 1995-03-21 1996-12-17 Hyundai Electron Ind Co Ltd 不揮発性メモリセルの限界電圧自動検証回路及びこれを利用した不揮発性メモリセルのプログラム及び消去状態の確認方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08335400A (ja) * 1995-03-21 1996-12-17 Hyundai Electron Ind Co Ltd 不揮発性メモリセルの限界電圧自動検証回路及びこれを利用した不揮発性メモリセルのプログラム及び消去状態の確認方法

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