JPS6245800U - - Google Patents
Info
- Publication number
- JPS6245800U JPS6245800U JP13578685U JP13578685U JPS6245800U JP S6245800 U JPS6245800 U JP S6245800U JP 13578685 U JP13578685 U JP 13578685U JP 13578685 U JP13578685 U JP 13578685U JP S6245800 U JPS6245800 U JP S6245800U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor memory
- readout circuit
- memory element
- nonvolatile semiconductor
- differential amplifier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 11
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13578685U JPS6245800U (enrdf_load_stackoverflow) | 1985-09-03 | 1985-09-03 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13578685U JPS6245800U (enrdf_load_stackoverflow) | 1985-09-03 | 1985-09-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6245800U true JPS6245800U (enrdf_load_stackoverflow) | 1987-03-19 |
Family
ID=31038302
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13578685U Pending JPS6245800U (enrdf_load_stackoverflow) | 1985-09-03 | 1985-09-03 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6245800U (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08335400A (ja) * | 1995-03-21 | 1996-12-17 | Hyundai Electron Ind Co Ltd | 不揮発性メモリセルの限界電圧自動検証回路及びこれを利用した不揮発性メモリセルのプログラム及び消去状態の確認方法 |
-
1985
- 1985-09-03 JP JP13578685U patent/JPS6245800U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08335400A (ja) * | 1995-03-21 | 1996-12-17 | Hyundai Electron Ind Co Ltd | 不揮発性メモリセルの限界電圧自動検証回路及びこれを利用した不揮発性メモリセルのプログラム及び消去状態の確認方法 |
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