JPS6244365Y2 - - Google Patents

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Publication number
JPS6244365Y2
JPS6244365Y2 JP1980089030U JP8903080U JPS6244365Y2 JP S6244365 Y2 JPS6244365 Y2 JP S6244365Y2 JP 1980089030 U JP1980089030 U JP 1980089030U JP 8903080 U JP8903080 U JP 8903080U JP S6244365 Y2 JPS6244365 Y2 JP S6244365Y2
Authority
JP
Japan
Prior art keywords
contact
holder
insulating plate
probers
insulating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1980089030U
Other languages
Japanese (ja)
Other versions
JPS5717447U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1980089030U priority Critical patent/JPS6244365Y2/ja
Publication of JPS5717447U publication Critical patent/JPS5717447U/ja
Application granted granted Critical
Publication of JPS6244365Y2 publication Critical patent/JPS6244365Y2/ja
Expired legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)

Description

【考案の詳細な説明】 本考案は、試験器に接続されるホルダにプロー
ブを退避可能に突出させて支持してなる複数個の
コンタクトプローバの各ホルダを絶縁板に所定の
ピツチで平行に保持させて構成し、絶縁板を加圧
することによりプローブの先端を被試験物に押圧
して導通試験を行う導通試験装置の改良に関する
ものである。
[Detailed description of the invention] This invention consists of a plurality of contact probers, each of which is supported by a holder connected to a tester with the probe retractably protruding from the holder, which is held parallel to an insulating plate at a predetermined pitch. The present invention relates to an improvement of a continuity test device configured to perform a continuity test by pressing the tip of a probe against a test object by applying pressure to an insulating plate.

この種の従来の導通試験装置を第1図に示す。
図中1は絶縁板、2は絶縁板1に所定の配置で平
行に保持される複数個のコンタクトプローバであ
る。コンタクトプローバ2は、図示しない試験器
と接続されるホルダ3と、該ホルダ3に退避可能
に突出させて支持されるプローブ4とよりなり、
絶縁板1に設けられた孔にホルダ3を圧入して固
定されている。ホルダ3にはフランジ5が形成さ
れており、このフランジ5が絶縁板1に係止して
ホルダ3は位置決めされている。ホルダ3圧入部
の隙間は第1図では便宜上実際より大きくとつて
示している。この隙間は、小さすぎるとホルダ3
の圧入時の収縮によりプローブ4が円滑に進退し
なくなるので、或程度の大きさが必要である。
A conventional continuity test device of this type is shown in FIG.
In the figure, 1 is an insulating plate, and 2 is a plurality of contact probers held parallel to the insulating plate 1 in a predetermined arrangement. The contact prober 2 includes a holder 3 that is connected to a tester (not shown), and a probe 4 that is retractably projected and supported by the holder 3.
The holder 3 is press-fitted into a hole provided in the insulating plate 1 and fixed. A flange 5 is formed on the holder 3, and the flange 5 is engaged with the insulating plate 1 to position the holder 3. In FIG. 1, the gap between the press-fitting portions of the holder 3 is shown to be larger than the actual size for convenience. If this gap is too small, the holder 3
A certain amount of size is required because the probe 4 will not move smoothly back and forth due to contraction during press-fitting.

この導通試験装置により被試験物の導通試験を
行うときは、プローブ4の先端の接触部6を被試
験物の測定箇所に対向させ、絶縁板1を加圧し接
触部6を測定箇所に押圧して試験を行うが、この
場合被試験物に凹凸、反り等の変形等がある場
合、接触部6に横方向の力がかかり、ホルダ3が
絶縁板1に嵌合する部分に多少の隙間があるた
め、コンタクトプローバ2に傾斜、片寄りを生じ
る。ところで、近時プリント板等の被試験物は高
密度化が進んでおり、これに伴ないコンタクトプ
ローバ2の配列ピツチも小さくなり、隣接するコ
ンタクトプローバ2のフランジ5間の間隙aも微
少なものとなつている。そこに上述のような傾斜
等の変形が起ると、第2図に示すように隣接する
フランジ5のシヨルダ7がシヨートしてしまう。
When performing a continuity test on a test object using this continuity test device, the contact part 6 at the tip of the probe 4 is faced to the measurement point on the test object, the insulating plate 1 is pressurized, and the contact part 6 is pressed against the measurement point. In this case, if the test object has deformation such as unevenness or warping, a lateral force will be applied to the contact part 6, and there will be some gap where the holder 3 fits into the insulating plate 1. This causes the contact prober 2 to be tilted and shifted. By the way, in recent years, the density of test objects such as printed circuit boards has been increasing, and as a result, the arrangement pitch of the contact probers 2 has become smaller, and the gap a between the flanges 5 of adjacent contact probers 2 has also become smaller. It is becoming. If deformation such as inclination as described above occurs there, the shoulder 7 of the adjacent flange 5 will be shot as shown in FIG.

これを解決するため、上記隙間に接着剤を充填
してホルダ3を固定する手段も用いられている
が、保守等の際にホルダ3を取外すのが困難で得
策ではない。
In order to solve this problem, a method of fixing the holder 3 by filling the gap with adhesive has been used, but this is not a good idea because it is difficult to remove the holder 3 during maintenance or the like.

本考案はこれらの問題を解決するためのもの
で、隣接するコンタクトプローバ間でシヨートを
起すことなく確実な導通試験を行うことができ、
しかも保守の容易な導通試験装置を提供すること
を目的としている。
This invention is intended to solve these problems, and allows reliable continuity testing to be performed without causing shoots between adjacent contact probers.
Moreover, it is an object of the present invention to provide a continuity test device that is easy to maintain.

次に第3図乃至第5図に関連して本考案の実施
例を説明する。
Next, an embodiment of the present invention will be described with reference to FIGS. 3 to 5.

第3図は本考案に係る導通試験装置の実施例を
示す要部正面図で、図中、11は絶縁板、12は
コンタクトプローバである。
FIG. 3 is a front view of main parts showing an embodiment of the continuity testing apparatus according to the present invention, in which numeral 11 is an insulating plate and 12 is a contact prober.

コンタクトプローバ12は、絶縁板11より所
定量突出するホルダ13と該ホルダ13に支持さ
れるプローブ14とよりなり、ホルダ13の突出
部にはフランジ15が形成され、プローブ14の
先端部には接触部16が形成されている。また、
ホルダ13の突出部には絶縁材カラー17が嵌
合、固定されている。絶縁材カラー17の外径は
フランジ15の外径より大きくなつている。
The contact prober 12 consists of a holder 13 that protrudes a predetermined amount from the insulating plate 11 and a probe 14 supported by the holder 13. A flange 15 is formed on the protrusion of the holder 13, and a contact probe 14 is formed on the tip of the probe 14. A portion 16 is formed. Also,
An insulating collar 17 is fitted and fixed to the protrusion of the holder 13. The outer diameter of the insulating collar 17 is larger than the outer diameter of the flange 15.

このコンタクトプローバ12は、絶縁材カラー
17を絶縁材11に係止させて絶縁板11に圧入
されて導通試験装置を構成する。
This contact prober 12 is press-fitted into the insulating plate 11 with the insulating material collar 17 locked to the insulating material 11 to constitute a continuity test device.

このようなコンタクトプローバ12を備えた導
通試験装置により被試験物の導通試験を行う場
合、従来と同様にコンタクトプローバ12に傾斜
等の変形を生じることがあるが、本考案ではホル
ダ13の突出部にフランジ15の外径より大きな
外径の絶縁材カラー17が嵌合、固定されている
ため、隣接する絶縁材カラー17同士が接触し、
シヨートを防止することが可能である。
When performing a continuity test on a test object using a continuity test device equipped with such a contact prober 12, the contact prober 12 may be deformed, such as tilting, as in the conventional case. Since the insulating collars 17 having an outer diameter larger than the outer diameter of the flange 15 are fitted and fixed, adjacent insulating collars 17 come into contact with each other.
It is possible to prevent shoots.

なお、上述の説明で絶縁材カラー17を設けた
コンタクトプローバ12は、第4図に示すように
千鳥状に配置してある。そして絶縁材カラー17
を設けたコンタクトプローバ12の間のコンタク
トプローバ12′は第5図に示すようにフランジ
15を絶縁板11に係止させて圧入、固定され、
変形したコンタクトプローバと隣接するコンタク
トプローバとは絶縁材カラー17とフランジ15
とで接触するのでシヨートが防止される。
The contact probers 12 provided with the insulating collars 17 in the above description are arranged in a staggered manner as shown in FIG. and insulation color 17
The contact prober 12' between the contact probers 12 provided with a
The deformed contact prober and the adjacent contact prober have an insulating collar 17 and a flange 15.
Since contact is made between the two sides, shooting is prevented.

以上述べたように、本考案によれば、千鳥状に
絶縁材カラーを設けてあり、隣接するコンタクト
プローバの少なくとも何れか一方のホルダの絶縁
板よりの突出部に該突出部の最大径より大きな外
径の絶縁材カラーが嵌合、固定されるから、コン
タクトプローバ変形時にこの絶縁材カラーが隣接
するコンタクトプローバのホルダを接触する。従
つて、コンタクトプローバ同士のシヨート発生を
防止して確実な導通試験を行うことが可能であ
る。
As described above, according to the present invention, insulating material collars are provided in a staggered manner, and the protrusion from the insulating plate of at least one of the holders of adjacent contact probers has a diameter larger than the maximum diameter of the protrusion. Since the insulating collar of the outer diameter is fitted and fixed, the insulating collar contacts the holder of the adjacent contact prober when the contact prober is deformed. Therefore, it is possible to perform a reliable continuity test by preventing shot from occurring between the contact probers.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の導通試験装置の正面図、第2図
はこの装置使用時のシヨート発生説明図、第3図
は本考案に係る導通試験装置の実施例を示す正面
図、第4図は同コンタクトプローバ配置図、第5
図はその一部正面図で、図中、11は絶縁板、1
2,12′はコンタクトプローバ、13はホル
ダ、14はプローブ、15はフランジ、16は接
触部、17は絶縁材カラーである。
Fig. 1 is a front view of a conventional continuity test device, Fig. 2 is an explanatory diagram of shot occurrence when this device is used, Fig. 3 is a front view showing an embodiment of the continuity test device according to the present invention, and Fig. 4 is a front view of a conventional continuity test device. Contact prober layout diagram, No. 5
The figure is a partial front view of the same. In the figure, 11 is an insulating plate; 1
2 and 12' are contact probers, 13 is a holder, 14 is a probe, 15 is a flange, 16 is a contact portion, and 17 is an insulating material collar.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 試験器に接続されるホルダにプローブを退避可
能に突出させて支持してなる複数個のコンタクト
プローバの前記各ホルダを絶縁板に所定の配置で
平行に保持させて構成し、前記絶縁板を加圧する
ことにより前記プローブの先端を被試験物に押圧
して導通試験を行う導通試験装置において、隣接
するコンタクトプローバの少なくとも何れか一方
のホルダを前記絶縁板より所定量突出させるとと
もに、該ホルダの突出部に、該突出部の最大径よ
り大きな外径の絶縁材カラーを千鳥状に配置嵌
合、固定したことを特徴とする導通試験装置。
Each of the holders of a plurality of contact probers, each of which has a holder connected to a tester with a probe retractably projected and supported, is held in parallel to an insulating plate at a predetermined arrangement, and the insulating plate is applied. In a continuity test device that performs a continuity test by pressing the tip of the probe against a test object by pressing, the holder of at least one of the adjacent contact probers is made to protrude a predetermined amount from the insulating plate, and the protrusion of the holder is 1. A continuity testing device comprising: an insulating collar having an outer diameter larger than the maximum diameter of the protruding portion, which is arranged in a staggered manner and fitted and fixed to the protruding portion.
JP1980089030U 1980-06-25 1980-06-25 Expired JPS6244365Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1980089030U JPS6244365Y2 (en) 1980-06-25 1980-06-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1980089030U JPS6244365Y2 (en) 1980-06-25 1980-06-25

Publications (2)

Publication Number Publication Date
JPS5717447U JPS5717447U (en) 1982-01-29
JPS6244365Y2 true JPS6244365Y2 (en) 1987-11-21

Family

ID=29451081

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1980089030U Expired JPS6244365Y2 (en) 1980-06-25 1980-06-25

Country Status (1)

Country Link
JP (1) JPS6244365Y2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0641281Y2 (en) * 1990-07-26 1994-10-26 株式会社佐々木電機製作所 Drive mechanism for rocking illuminator

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5216425U (en) * 1975-07-25 1977-02-05

Also Published As

Publication number Publication date
JPS5717447U (en) 1982-01-29

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