JPS6243564A - Positioning apparatus for object in ultrasonic inspection - Google Patents

Positioning apparatus for object in ultrasonic inspection

Info

Publication number
JPS6243564A
JPS6243564A JP60181682A JP18168285A JPS6243564A JP S6243564 A JPS6243564 A JP S6243564A JP 60181682 A JP60181682 A JP 60181682A JP 18168285 A JP18168285 A JP 18168285A JP S6243564 A JPS6243564 A JP S6243564A
Authority
JP
Japan
Prior art keywords
probe
subject
guide member
probe holder
force
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60181682A
Other languages
Japanese (ja)
Other versions
JPH0513464B2 (en
Inventor
Makoto Kodama
誠 児玉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Construction Machinery Co Ltd
Original Assignee
Hitachi Construction Machinery Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Construction Machinery Co Ltd filed Critical Hitachi Construction Machinery Co Ltd
Priority to JP60181682A priority Critical patent/JPS6243564A/en
Publication of JPS6243564A publication Critical patent/JPS6243564A/en
Publication of JPH0513464B2 publication Critical patent/JPH0513464B2/ja
Granted legal-status Critical Current

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  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

PURPOSE:To enable an object to be inspected to be positioned facing a probe precisely vertical thereto, by generating a force on pinching press surfaces of probe holders in the direction of pinching an object to be inspected against a force of expanding the pinching press surfaces when the object being inspected is carried in. CONSTITUTION:In an apparatus so designed to position an object M to be inspected so that the beam axis of an ultrasonic wave emitted from probes 2 and 3 mounted on a pair of probe holders 1 set in a liquid tank may face the flaw detection surface of the object M being inspected, the probe holders 1 having pinching press surfaces 1a for grasping the object M being inspected is held slidably with a guide member 4 in the direction of opening or closing the space between the pinching press surfaces 1a. The space between the pinching press surfaces 1a facing the probe holders 1 is expanded or reduced along the guide member 4 depending on the object M being inspected being carried in, generating a force on the pinching press surfaces 1a of the probe holders 1 in the direction of pinching the object M being inspected with a spring 5 against a force of expanding it when the surfaces are expanded sliding along the guide member 4.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は探触子および被検体が水、油等の液体に浸漬さ
れた液浸法により、被検体の内部欠陥の探傷、厚さ、音
速等の測定を行う場合における被検体の位置決め装置に
関し、特に探触子より発射される超音波のビーム軸と被
検体の探傷面を、自動的に垂直に対向して位置決めする
のに好適な位置決め装置に関する。
[Detailed Description of the Invention] [Field of Application of the Invention] The present invention uses a liquid immersion method in which a probe and a specimen are immersed in a liquid such as water or oil to detect internal defects, thickness, and sound velocity of a specimen. Regarding a positioning device for a test object when performing measurements such as the above, this positioning system is particularly suitable for automatically positioning the beam axis of the ultrasonic waves emitted from the probe and the test surface of the test object so that they are perpendicularly opposed to each other. Regarding equipment.

〔発明の背景] 被検体の内部欠陥の探傷、被検体の厚さ、音速等の測定
が液浸法(水浸法が一般的であり、以下水浸法で説明す
る。)により多く行われている。
[Background of the Invention] Detection of internal defects in a test object, measurement of the test object's thickness, sound velocity, etc. are often performed using the liquid immersion method (the water immersion method is common and will be explained below as the water immersion method). ing.

これは探触子と被検体が直接接触しないため、接触媒質
の油膜の厚さや探傷面のあらさ等による影響をほとんど
受けることなく、超音波の送受が安定して行われる利点
を有するからであり、この利点から自動探傷の目的に広
く利用されている。しかし水浸法は探触子から放射され
た超音波を、ある程度長い距離の水中を伝搬させたのち
被検体に入射させる方法であるから、水と被検体との境
界面における超音波の反射および屈折が、水を介する分
(他の液体を介する場合もほぼ同じ)だけどうしても直
接探触法の場合と異なる。例えば縦波を用いて鋼材を探
傷する場合についてみると、水から鋼に超音波が入射す
る場合の入射角θiと屈折角θrの関係では、屈折角θ
rは入射角θiの約4倍であり、また斜角探傷において
は入射角14.5 ’〜27.3’の範囲内で33°〜
90°の屈折横波が得られることが知られており、有機
ガラスなどを用いた直接接触用の斜角探触子に比べて、
入射角範囲が少なくそれだけ微妙な角度調節が必要であ
る。このため垂直探傷の場合は探触子を被検体に対して
正しく垂直に向ける必要があることはもちろん、斜角探
傷の場合においても前記微妙な角度調節のために、探触
子を被検体に対して正しく垂直に向けるとともに、探触
子と探傷面までの距離を一定に保つことが必要である。
This is because there is no direct contact between the probe and the object to be tested, so it has the advantage that ultrasonic waves can be transmitted and received stably without being affected by the thickness of the couplant oil film or the roughness of the testing surface. Due to this advantage, it is widely used for automatic flaw detection purposes. However, the water immersion method is a method in which the ultrasonic waves emitted from the probe are propagated through water over a certain distance before being incident on the subject, so the ultrasonic waves are reflected at the interface between the water and the subject. The refraction is different from that of the direct probe method because it involves water (it is almost the same when other liquids are involved). For example, when examining steel materials using longitudinal waves, the relationship between the incident angle θi and the refraction angle θr when ultrasonic waves are incident on the steel from water is as follows:
r is about 4 times the incident angle θi, and in oblique angle flaw detection, the angle of incidence is 33° to 27.3' within the range of 14.5' to 27.3'.
It is known that a 90° refracted transverse wave can be obtained, and compared to direct contact angle probes using organic glass etc.
The range of incident angles is small, so delicate angle adjustment is required. For this reason, in the case of vertical flaw detection, it is necessary to point the probe correctly perpendicular to the test object, and in the case of angle flaw detection, it is necessary to orient the probe correctly to the test object in order to make the delicate angle adjustment. It is necessary to correctly orient the probe perpendicularly to the surface and to maintain a constant distance between the probe and the flaw detection surface.

上記必要性に対し従来行われてきた方法は、水槽内に設
置されている探触子を装着した探触子ホルダに対し、水
槽外に設置されているロボットなどの搬入手段につかま
れた被検体を、その搬入手段により対向する位置に搬入
し対置させていた。
Conventionally, the method used to address the above-mentioned needs is to move a probe holder installed inside a water tank with a probe attached to a probe holder that is installed inside a water tank, and to place a sample grabbed by a transport means such as a robot installed outside the water tank. were carried into opposing positions by the carrying means and placed in opposition.

探触子と被検体を垂直に対向させる一般的な方法は、搬
入手段が被検体をつかむ際、あらかじめ被検体の探傷面
が水槽内に搬入され対置されたとき、探触子と垂直に対
向するように調整して配置しておくことにより行われて
いた。この方法は多数の被検体を自動探傷する場合に用
いられているが、多数の被検体のセント位置を誤差なく
設定することは治具などを使用しても困難であり、仮り
にセット位置を誤差なく設定できたとしても、搬入手段
の各部の動作誤差、探触子ホルダの設置位置。
A common method of vertically opposing the probe and the test object is to place the test surface of the test object vertically opposite the probe when the carrying means grabs the test object. This was done by adjusting and arranging them so that the This method is used for automatic flaw detection on a large number of test objects, but it is difficult to set the center positions of a large number of test objects without error even when using a jig. Even if the settings can be made without errors, there may be errors in the operation of each part of the loading means and the installation position of the probe holder.

探触子の装着位置および水槽自体の位置などの相対的位
置の誤差が集積され、多数の被検体をその都度探触子に
対し正しく垂直に対向させることはむつかしく、しばし
ば測定誤差が発生しているのが実状である。そしてこの
測定誤差発生の検出も、通常被検体のセット位置が正し
いとの前提で測定が行われているためますます困難であ
り、その検出のために測定を2回以上行うことさえある
。またセット位置の調整は微妙な調整が要求されるなど
多くの問題点を有していた。
Errors in relative positions such as the mounting position of the probe and the position of the water tank itself are accumulated, and it is difficult to correctly orient a large number of subjects perpendicularly to the probe each time, and measurement errors often occur. The reality is that there are. Detecting the occurrence of this measurement error is also increasingly difficult because measurements are normally performed on the premise that the set position of the subject is correct, and measurements may even be performed two or more times to detect this error. Further, there were many problems such as the need for delicate adjustments in adjusting the set position.

〔発明の目的〕 本発明は前記従来技術の問題点を解消し、被検体が探触
子ホルダに搬入されるとき、該被検体の探傷面が探触子
に対して正しく垂直に対向しない状態であっても、搬入
が終り測定が開始されるときには自動的に正しく垂直に
対向した位置に位置決めができる、超音波検査における
被検体の位置決め装置を提供することを目的とする。
[Object of the Invention] The present invention solves the problems of the prior art described above, and eliminates the condition in which the test surface of the test object does not face the probe correctly perpendicularly when the test object is carried into the probe holder. An object of the present invention is to provide a positioning device for a subject in an ultrasonic examination, which can automatically position the subject in a vertically opposed position when loading is finished and measurement is started.

〔発明の概要〕[Summary of the invention]

本発明は被検体の位置決め装置において、被検体を挟持
する挟圧面を有する相対した一対で一組の探触子ホルダ
と、該探触子ホルダの挟圧面と垂直で、かつ探触子ホル
ダをその相対する挟圧面の間隔の開閉する方向に摺動自
在に支持する案内部材と、前記相対する挟圧面の間隔が
、該間隔に搬入される被検体により前記案内部材に沿っ
て摺動しながら拡大されるとき、その拡大される力と対
抗して探触子ホルダの挟圧面に、被検体を挟圧する方向
に作用する力を発生させ、かつ前記案内部材に沿って伸
縮するように設けられたばねとから構成することにより
、被検体の探傷面が探触子に対して正しく垂直に対向し
ない状態で搬入されても、測定時には自動的に正しく垂
直に対向した位置に位置決めされるようにした位置決め
装置である。
The present invention provides a positioning device for a subject, which includes a pair of opposing probe holders having clamping surfaces that clamp the subject, and a probe holder that is perpendicular to the clamping surface of the probe holder and that has a clamping surface that clamps the specimen. A guide member that supports the opposing clamping surfaces so as to be slidable in the opening/closing direction, and a guide member that supports the opposing clamping surfaces so as to be slidable in the opening/closing direction, and When the probe holder is expanded, it generates a force acting on the clamping surface of the probe holder in the direction of clamping the subject in opposition to the expanding force, and is provided to expand and contract along the guide member. By constructing the probe with a tabular spring, even if the test surface of the test object is not correctly perpendicularly opposed to the probe when it is brought in, it is automatically positioned in a position where it is correctly perpendicularly opposed to the probe during measurement. It is a positioning device.

〔発明の実施例〕[Embodiments of the invention]

本発明の実施例を第1図ないし第5図により説明する。 Embodiments of the present invention will be explained with reference to FIGS. 1 to 5.

第1図および第2図は第1の実施例の説明図で、本実施
例は液槽内において探傷面と底面が平行な平板の被検体
を、2探触子で音速、厚みなどの測定を行う場合を示す
。図において1は探触子ホルダで、被検体Mを挟持する
挟圧面1aを有し、相対した一対で一組を構成する。上
部には一対の送信用の探触子2と受信用の探触子3が装
着されており、下部には挟圧面1aと直角方向に2つの
貫通する六1bが並列に穿設されている。
Figures 1 and 2 are explanatory diagrams of the first embodiment. In this embodiment, a flat plate specimen whose flaw detection surface and bottom surface are parallel is measured in a liquid tank using two probes to measure sound velocity, thickness, etc. Indicates when to do this. In the figure, reference numeral 1 denotes a probe holder, which has a clamping surface 1a for clamping a subject M, and a pair of probe holders facing each other constitutes a set. A pair of transmitting probes 2 and receiving probes 3 are attached to the upper part, and two penetrating holes 1b are bored in parallel in the lower part in a direction perpendicular to the clamping surface 1a. .

挟圧面1aは探触子2,3が垂直探触子の場合その振動
子の面と平行になっている。また挟圧面laの上部は被
検体Mが挿入され易いように適宜Rまたは面取りをする
。4は棒状の案内部材で探触子ホルダlの穴1bにがた
の少ない状態で挿嵌されている。探触子ホルダ1は2本
の案内部材4上に相対する挟圧面1aの間隔が開閉する
方向に摺動自在に支承される。案内部材40両端にばね
座4aが固着され、ばね座4aと探触子ホルダ1の挟圧
面laと反対側の面1cとの間にばばね5が嵌装されて
いる。以上の構成は台6上にばね座4aを介して支承さ
れている。
When the probes 2 and 3 are vertical probes, the clamping surface 1a is parallel to the surface of the vibrator. Further, the upper part of the clamping surface la is appropriately rounded or chamfered so that the subject M can be easily inserted. Reference numeral 4 denotes a rod-shaped guide member that is inserted into the hole 1b of the probe holder l with little play. The probe holder 1 is supported on two guide members 4 so as to be slidable in the direction in which the gap between the opposing clamping surfaces 1a opens and closes. Spring seats 4a are fixed to both ends of the guide member 40, and a spring 5 is fitted between the spring seats 4a and the surface 1c of the probe holder 1 opposite to the clamping surface la. The above configuration is supported on a base 6 via a spring seat 4a.

被検体Mが図示していない搬入手段につかまれて液槽内
に搬入され、つづいてつかまれた被検体Mは通常上方か
ら探触子ホルダ1に挟持させるべく相対する挟圧面1a
間に挿入される。この場合相対する挟圧面1aの当初の
間隔は、被検体Mの厚さや重量により零の場合もあり任
意に決められている。被検体Mは所望の探傷面が探触子
2.3の装着されている位置まで挟圧面1aの間隔を拡
大して挿入されるが、その際探触子ホルダ1は案内部材
4上をばね5を押しながら摺動し、挟圧面1aの間隔が
拡大された分の力と対抗する力をばね5に発生させ、そ
のばねの圧縮力により挟圧面1aで被検体Mを挟持する
。この状態で測定が開始されるが、被検体Mの探傷面が
探触子2,3に対して正しく垂直に対向しているか否か
は、多数の被検体Mの測定の前にいくつかの被検体Mに
ついて試験をし、正しい状態および正しくない状態の波
形またはエコーパターンを目視またはモニタにより比較
判別できるようにしておく。波形またはエコーパターン
が正しくない状態、つまり被検体Mが傾斜した第1図の
状態で挟圧面1a間に挿入された場合には、搬入手段が
つかんでいる被検体Mを、ばね座4aが台6から僅かに
離れる程度持ち上げる。すると挟圧面1aはばね5によ
り被検体Mに押し付けられているので、自動的に傾斜し
た被検体Mの両面を挟圧し密着した状態になり安定する
。この密着した状態は被検体Mの両面と探触子2,3が
正しく垂直に対向して位置決めされている状態であり、
目視またはモニタにより正しくない対向状態の波形また
はエコーパターンの変形を判別したとき、被検体Mを僅
かに持ち上げるだけできわめて簡単にかつ自動的に正し
い対向状態を得ることができる。なお本実施例のように
被検体Mが平行な2面を有する平板である場合には、そ
の平行な2面と探触子2,3が垂直に対向するだけでな
く、常に自動的に等距離で測定できる効果も有する。ま
た挟圧面1aは被検体Mの平行な2面に密着する平面と
したが、例えば被検体Mの挟圧される面がテーバ面であ
る場合は、挟圧面1aもそのテーパ面に合致したテーパ
面とすればよく、被検体Mの挟圧される面に合わせた面
にすればよい。ばね5は面1cを押すように面1cとば
ね座4aとの間に圧縮ばねを設けたが、圧縮ばねに替え
て相対する探触子ホルダ1の間に引張りばねを設け、引
張りばねと探触子ホルダを係止して、挟圧面1aの間隔
が拡大されるときの力を抑止する力で被検体Mを挟持す
るようにしてもよい。ばね5の数は案内部材4一本につ
き2個設けたが、1個を排しいずれか1個にしてもよい
。つぎに案内部材4を設ける位1は、本実施例では探触
子ホルダ1の下部に挿嵌した場合を示したが、挟圧面1
aの高さの範囲内であれば他の位置にしてもよい。さら
に探触子ホルダ1にはそれぞれ探触子を装着したが、片
方の探触子を排し送受信兼用のI探触子の場合でも使用
可能である。測定が完了し被検体Mを持ち上げると探触
子ホルダ1および案内部材4ともばね5により一体的に
なっているから同時に持ち上げられる。しかしばね座4
aが台6に当たり持ち上げが抑止され、ばね5の圧縮力
に抗して被検体Mが挟圧面1aから離脱する。そして被
検体Mが離脱した位置決め装置は、次に測定される被検
体Mに対して前記した自動的に位置決めを行う状態に復
しており、前記動作を繰り返して正しい位置で測定が続
行される。
The subject M is carried into the liquid tank by being grabbed by a carrying means (not shown), and then the subject M is usually held by the probe holder 1 from above on the opposing clamping surface 1a.
inserted in between. In this case, the initial distance between the opposing clamping surfaces 1a may be zero depending on the thickness and weight of the subject M, and is arbitrarily determined. The object M is inserted with the gap between the clamping surfaces 1a expanded until the desired flaw detection surface is at the position where the probe 2.3 is attached. 5 while sliding, the spring 5 generates a force that opposes the force corresponding to the increased gap between the clamping surfaces 1a, and the compressive force of the spring clamps the subject M between the clamping surfaces 1a. Measurement starts in this state, but whether or not the test surface of the test object M is correctly perpendicularly opposed to the probes 2 and 3 must be checked before measuring a large number of test objects M. A test is performed on the subject M, and the waveforms or echo patterns in a correct state and an incorrect state can be compared and determined visually or on a monitor. If the waveform or echo pattern is incorrect, that is, if the subject M is inserted between the clamping surfaces 1a in the tilted state shown in FIG. Lift it slightly away from 6. Then, since the pinching surface 1a is pressed against the subject M by the spring 5, it automatically pinches both sides of the tilted subject M, and the two sides of the subject M are brought into close contact and stabilized. This close contact state is a state in which both surfaces of the subject M and the probes 2 and 3 are correctly positioned to face each other vertically.
When a deformation of the waveform or echo pattern of an incorrect facing state is determined visually or by a monitor, the correct facing state can be obtained very easily and automatically by simply lifting the subject M slightly. In addition, when the object M is a flat plate having two parallel surfaces as in this embodiment, the two parallel surfaces and the probes 2 and 3 are not only perpendicularly opposed to each other but also automatically and equally spaced. It also has an effect that can be measured by distance. In addition, the clamping surface 1a is a flat surface that comes into close contact with two parallel surfaces of the subject M, but if the clamping surface of the subject M is a tapered surface, the clamping surface 1a should also be a tapered surface that matches the tapered surface. It may be a surface, and it may be a surface that matches the surface of the subject M to be squeezed. For the spring 5, a compression spring was provided between the surface 1c and the spring seat 4a so as to press the surface 1c, but instead of the compression spring, a tension spring was provided between the opposing probe holders 1, and the tension spring and the probe were The probe holder may be locked to clamp the subject M with a force that suppresses the force when the interval between the clamping surfaces 1a is expanded. Although two springs 5 are provided for each guide member 4, one may be omitted and only one spring may be used. Next, regarding the provision of the guide member 4, in this embodiment, the case where the guide member 4 is inserted into the lower part of the probe holder 1 is shown, but the clamping surface 1
Any other position may be used as long as it is within the height range of a. Furthermore, although probes are attached to each probe holder 1, it is also possible to remove one probe and use an I probe for both transmitting and receiving purposes. When the measurement is completed and the subject M is lifted, the probe holder 1 and the guide member 4 are also lifted up at the same time since they are integrated by the spring 5. However, spring seat 4
a hits the table 6 and is prevented from being lifted, and the subject M separates from the clamping surface 1a against the compressive force of the spring 5. The positioning device from which the subject M has been removed returns to the state of automatically positioning the subject M to be measured next, and repeats the above operation to continue measurement at the correct position. .

つぎに第2の実施例を第3図ないし第5図により説明す
る。図において第1図および第2図と同じ符号のものは
同じものを示す。本実施例も第1の実施例と同様に液槽
内において探傷面と底面が平行な平板の被検体を、2探
触子で測定する場合を示す。図において14は案内部材
で、その中央には支点ピン7が設けられ、挿嵌された一
対の探触子ホルダlとともに支点ピン7の周りに自由に
揺動可能に台8上に支持されている。ばね座4aの外面
には長大を有するアイエンド9が固着され、その長穴は
台8に直立させて固着された棒材10に遊嵌している。
Next, a second embodiment will be explained with reference to FIGS. 3 to 5. In the figures, the same reference numerals as in FIGS. 1 and 2 indicate the same things. Similar to the first embodiment, this embodiment also shows a case where a flat plate specimen whose flaw detection surface and bottom surface are parallel to each other is measured in a liquid tank using two probes. In the figure, reference numeral 14 denotes a guide member, in the center of which a fulcrum pin 7 is provided, which is supported on a stand 8 so as to be able to freely swing around the fulcrum pin 7 together with a pair of inserted probe holders l. There is. An elongated eye end 9 is fixed to the outer surface of the spring seat 4a, and its elongated hole loosely fits into a bar 10 fixed upright to the stand 8.

棒材10にはアイエンド9と台8との間にばね11が嵌
装され、支点ピン7の左右に生じた負荷のアンバランス
を支持できるようになっている。12はアイエンド9の
はずれ止めである。
A spring 11 is fitted in the bar 10 between the eye end 9 and the stand 8, so that it can support the unbalanced load that occurs on the left and right sides of the fulcrum pin 7. 12 is a stopper for the eye end 9 to come off.

被検体Mが搬入手段につかまれて、液槽内の探触子に正
しく垂直に対向するように搬入された場合は、前記第1
の実施例における説明と同じである。ところが被検体M
が第1図のように傾斜した状態で挟圧面1a間に挿入さ
れる場合は、被検体Mをばね5の圧縮力に抗して挿入さ
れる力が、支点ピン7に偏心して作用することになる。
When the subject M is grabbed by the carrying means and carried so as to face the probe in the liquid tank correctly perpendicularly, the first
This is the same as the explanation in the embodiment. However, subject M
When the test object M is inserted between the clamping surfaces 1a in an inclined state as shown in FIG. become.

このとき案内部材14は探触子ホルダ1とともに支点ピ
ン7の周りに自由に揺動できるから、被検体Mの傾斜に
対応する角度まで揺動する。揺動時案内部材14は、両
端のアイエンド9の長穴が棒材10と係合し揺動方向を
案内される。被検体Mが挟圧面1aの所定の位置まで挿
入されると揺動は停止する。
At this time, since the guide member 14 can freely swing around the fulcrum pin 7 together with the probe holder 1, it swings to an angle corresponding to the inclination of the subject M. The swinging guide member 14 is guided in the swinging direction by the elongated holes of the eye ends 9 at both ends engaging with the bar 10. When the subject M is inserted to a predetermined position on the clamping surface 1a, the swinging stops.

揺動時における支点ピン7の左右に生じる前記偏心によ
る負荷のアンバランスには、片側のばね11が縮み他方
のばね11が伸びて対抗し、揺動停止時には被検体Mの
傾斜角度に対応した第5図に示す揺動姿勢がそのまま保
持される。この揺動姿勢は、前記第1の実施例において
傾斜状態で挟圧面1a間に被検体Mが挿入された場合に
、ばね座4aを台6から僅かに離れる程度に搬入手段に
より被検体Mを持ち上げた状態と同一で、被検体Mの両
面と探触子2.3が正しく垂直に対抗して位置決めされ
ている状態にほかならない。したがって本実施例におい
ては、目視またはモニタにより正しくない対向状態の波
形またはエコーパターンの変形を判別するまでもなく、
搬入するだけで常に自動的に正しい対向状態を得ること
ができる。第5図に示す揺動した姿勢で測定が完了した
場合は、搬入手段により被検体Mが探触子ホルダ1から
搬出されると同時に、短縮されているばね11が伸長さ
れ反対に伸長されていたばね11が圧縮されて水平状態
に復する。そして次に測定される被検体Mが前記正しく
ない対向状態で搬入されても、自動的に正しい対向状態
に位置決めが行われる。
The unbalanced load caused by the eccentricity on the left and right sides of the fulcrum pin 7 during rocking is counteracted by the spring 11 on one side being compressed and the spring 11 on the other side being extended, and when the rocking is stopped, the spring 11 is adjusted to correspond to the inclination angle of the subject M. The swinging posture shown in FIG. 5 is maintained as it is. In this swinging posture, when the subject M is inserted between the clamping surfaces 1a in an inclined state in the first embodiment, the subject M is moved by the carrying means to such an extent that the spring seat 4a is slightly separated from the table 6. This is the same as the lifted state, and is nothing but a state in which both surfaces of the subject M and the probe 2.3 are correctly positioned vertically opposing each other. Therefore, in this embodiment, there is no need to visually or monitor to determine whether there is an incorrect waveform or echo pattern deformation in the opposing state.
Just by transporting the parts, the correct opposing state can be automatically obtained. When the measurement is completed in the swung posture shown in FIG. 5, the subject M is carried out from the probe holder 1 by the carry-in means, and at the same time, the shortened spring 11 is extended and vice versa. The tabular spring 11 is compressed and returns to the horizontal state. Even if the next subject M to be measured is brought in in the incorrect facing state, it is automatically positioned in the correct facing state.

本実施例においても第1の実施例で説明した、被検体M
が平行な2面を有する平板の場合には常に自動的に等距
離で測定可能なこと、挟圧面1aの形状は被検体Mの挟
圧される面に合わせた面にすればよいこと、ばね5は引
張りばねに変更することができ、また数量を減らすこと
ができること、案内部材14(第1の実施例では4)を
設ける位置は変更可能なこと、1探触子法にも適用でき
ることなどはすべて同じであり、さらに第1.第2の実
施例とも垂直探触子だけでなく、斜角探触子を使用した
場合でも同様の位置決めをすることができるのはもちろ
んである。
In this example as well, the subject M explained in the first example
In the case of a flat plate with two parallel surfaces, it is possible to always measure equidistantly automatically, the shape of the clamping surface 1a only needs to be a surface that matches the surface of the subject M to be clamped, and the spring 5 can be changed to a tension spring, the number can be reduced, the position of the guide member 14 (4 in the first embodiment) can be changed, and it can also be applied to the one-probe method. are all the same, and the first . Of course, in the second embodiment, similar positioning can be performed not only when using a vertical probe but also when using an oblique probe.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、被検体の探傷面が探触子
に対し、たとえ正しく垂直に対向しない状態で搬入され
ても、探触子ホルダに挿入が終り測定する時には、自動
的に正しく垂直に対向した位置に位置決めされて行える
優れた効果を有する。
As explained above, in the present invention, even if the test surface of the test object is not correctly perpendicularly opposed to the probe when it is carried in, it will automatically be correctly corrected when it is inserted into the probe holder and measured. It has excellent effects when positioned in vertically opposed positions.

【図面の簡単な説明】[Brief explanation of drawings]

図面はすべて本発明の詳細な説明図で、第1図は第1の
実施例を説明する側面図、第2図は第1図のn−n矢視
図、第3図は第2の実施例を説明する側面図、第4図は
第3図のIV−IV矢視図、第5図は第3図の揺動した
状態を示す図である。 1・・・探触子ホルダ、1a・・・挟圧面、1b・・・
穴、2.3・・・探触子、4,14・・・案内部材、5
.11・・・ばね、6.8・・・台、7・・・支点ピン
、9・・・アイエンド、lO・・・棒材。 特許出願人  日立建機株式会社 代理人 弁理士  秋 本 正 実 第1vA 第2図 第3図 第4図 M 第5図
The drawings are all detailed explanatory views of the present invention, and FIG. 1 is a side view illustrating the first embodiment, FIG. 2 is a view taken along the nn arrow in FIG. FIG. 4 is a side view illustrating an example, FIG. 4 is a view taken along the line IV-IV in FIG. 3, and FIG. 5 is a diagram showing the swinging state of FIG. 3. 1... Probe holder, 1a... Squeezing surface, 1b...
Hole, 2.3... Probe, 4, 14... Guide member, 5
.. 11... Spring, 6.8... Stand, 7... Fulcrum pin, 9... Eye end, lO... Bar material. Patent Applicant Hitachi Construction Machinery Co., Ltd. Agent Patent Attorney Tadashi Akimoto Minoru No. 1vA Figure 2 Figure 3 Figure 4 M Figure 5

Claims (1)

【特許請求の範囲】 1、液槽内に設置されている探触子ホルダと、その探触
子ホルダに装着されている探触子と、該探触子より発射
される超音波のビーム軸が、被検体の探傷面と対向する
ように、該被検体を液槽内に搬入し、かつ前記探触子と
対置させる搬入手段とからなる超音波検査における被検
体の位置決め装置において、被検体を挟持する挟圧面を
有する相対した一対で一組の探触子ホルダと、該探触子
ホルダの挟圧面と垂直で、かつ探触子ホルダをその相対
する挟圧面の間隔の開閉する方向に摺動自在に支持する
案内部材と、前記探触子ホルダの相対する挟圧面の間隔
が、該間隔に搬入される被検体により前記案内部材に沿
って摺動しながら拡大されるとき、その拡大される力と
対抗して探触子ホルダの挟圧面に、被検体を挟圧する方
向に作用する力を発生させ、かつ前記案内部材に沿って
伸縮するように設けられたばねと、から構成されている
ことを特徴とする被検体の位置決め装置。 2、液槽内に設置されている探触子ホルダと、その探触
子ホルダに装着されている探触子と、該探触子より発射
される超音波のビーム軸が、被検体の探傷面と対向する
ように、該被検体を液槽内に搬入し、かつ前記探触子と
対置させる搬入手段とからなる超音波検査における被検
体の位置決め装置において、被検体を挟持する挟圧面を
有する相対した一対で一組の探触子ホルダと、該探触子
ホルダの挟圧面と垂直で、かつ探触子ホルダをその相対
する挟圧面の間隔が開閉する方向に摺動自在に支持する
案内部材と、前記探触子ホルダの相対する挟圧面の間隔
が、該間隔に搬入される被検体により前記案内部材に沿
って摺動しながら拡大されるとき、その拡大される力と
対抗して探触子ホルダの挟圧面に、被検体を挟圧する方
向に作用する力を発生させ、かつ前記案内部材に沿って
伸縮するように設けられたばねと、前記案内部材の中央
に設けられ、被検体が傾斜した状態で搬入されたとき前
記一対の探触子ホルダとともに、その傾斜に対応する左
右いずれかに揺動可能に支持する支点ピンと、前記案内
部材の両端部と係合し該案内部材の揺動方向を案内する
棒材と、揺動時の揺動方向の力と対抗して被検体の傾斜
角度に対応した揺動姿勢を保持し、かつ被検体が探触子
ホルダから搬出されたときは、前記揺動姿勢を解除する
力を発生する前記棒材に沿って伸縮するように設けられ
たばねと、から構成されていることを特徴とする被検体
の位置決め装置。
[Claims] 1. A probe holder installed in a liquid tank, a probe attached to the probe holder, and a beam axis of an ultrasonic wave emitted from the probe. In an apparatus for positioning a subject in an ultrasonic test, the apparatus includes a carrying means for carrying the subject into a liquid tank so as to face the flaw detection surface of the subject and facing the probe. a pair of opposing probe holders having pinching surfaces that sandwich the probe holders; When the distance between the slidably supported guide member and the opposing clamping surface of the probe holder is expanded by a subject carried into the distance while sliding along the guide member, the expansion a spring that generates a force that acts on the clamping surface of the probe holder in the direction of clamping the subject in opposition to the force applied to the probe holder, and is provided to expand and contract along the guide member. A positioning device for a subject, characterized in that: 2. The probe holder installed in the liquid tank, the probe attached to the probe holder, and the beam axis of the ultrasonic waves emitted from the probe In an apparatus for positioning a subject in an ultrasonic test, the device includes a carrying means for carrying the subject into a liquid tank so as to face the probe, and a clamping surface that clamps the subject. a pair of probe holders facing each other; the probe holder is perpendicular to the clamping surface of the probe holder and is slidably supported in a direction in which the gap between the opposing clamping surfaces opens and closes; When the distance between the guide member and the opposing clamping surfaces of the probe holder is expanded by the subject being carried into the distance while sliding along the guide member, the force of the object being expanded is resisted. A spring is provided in the center of the guide member to generate a force acting in the direction of pinching the subject on the clamping surface of the probe holder, and is provided to expand and contract along the guide member. When a specimen is carried in in an inclined state, a fulcrum pin that supports the pair of probe holders so as to be able to swing to either the left or right corresponding to the inclination, and a fulcrum pin that engages with both ends of the guide member to engage with both ends of the guide member. A rod that guides the swinging direction of the probe, and a bar that maintains a swinging posture corresponding to the inclination angle of the subject against the force in the swinging direction during swinging, and that the subject is carried out from the probe holder. 2. A positioning device for a subject, comprising: a spring that is provided to expand and contract along the bar and generate a force to release the swinging posture when the subject is moved.
JP60181682A 1985-08-21 1985-08-21 Positioning apparatus for object in ultrasonic inspection Granted JPS6243564A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60181682A JPS6243564A (en) 1985-08-21 1985-08-21 Positioning apparatus for object in ultrasonic inspection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60181682A JPS6243564A (en) 1985-08-21 1985-08-21 Positioning apparatus for object in ultrasonic inspection

Publications (2)

Publication Number Publication Date
JPS6243564A true JPS6243564A (en) 1987-02-25
JPH0513464B2 JPH0513464B2 (en) 1993-02-22

Family

ID=16105030

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60181682A Granted JPS6243564A (en) 1985-08-21 1985-08-21 Positioning apparatus for object in ultrasonic inspection

Country Status (1)

Country Link
JP (1) JPS6243564A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108020596A (en) * 2016-11-04 2018-05-11 Sonix公司 Adjustable clamp for scanning acoustic microscope

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10629966B2 (en) * 2016-11-02 2020-04-21 Feasible, Inc. Modular, adaptable holders for sensors and battery cells for physical analysis

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52126884U (en) * 1976-03-22 1977-09-27

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52126884U (en) * 1976-03-22 1977-09-27

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108020596A (en) * 2016-11-04 2018-05-11 Sonix公司 Adjustable clamp for scanning acoustic microscope
JP2018091834A (en) * 2016-11-04 2018-06-14 ソニックス・インコーポレイテッドSonix, Inc. Adjustment type fixture and method for using adjustment type fixture

Also Published As

Publication number Publication date
JPH0513464B2 (en) 1993-02-22

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