JPS6237786U - - Google Patents

Info

Publication number
JPS6237786U
JPS6237786U JP11596485U JP11596485U JPS6237786U JP S6237786 U JPS6237786 U JP S6237786U JP 11596485 U JP11596485 U JP 11596485U JP 11596485 U JP11596485 U JP 11596485U JP S6237786 U JPS6237786 U JP S6237786U
Authority
JP
Japan
Prior art keywords
noise
electronic circuit
waves
electromagnetic
malfunction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11596485U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11596485U priority Critical patent/JPS6237786U/ja
Publication of JPS6237786U publication Critical patent/JPS6237786U/ja
Pending legal-status Critical Current

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Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図は本考案による実施例の構成を示す側面
図、第２図は、第１図の実施例における試験台の
具体的な構造を示す斜視図、第３図は、第２図に
おける試験台の回路を示した図である。 図において、１は雑音発生器、２は試験台、３
は同軸ケーブル、５は被試験電子回路、２―１は
樹脂ケース、２―２，２―３はアンテナエレメン
ト、２―４は同軸コネクタ、２―５は終端抵抗で
ある。 FIG. 1 is a side view showing the configuration of the embodiment according to the present invention, FIG. 2 is a perspective view showing the specific structure of the test stand in the embodiment of FIG. 1, and FIG. 3 is the test in FIG. 2. It is a diagram showing the circuit of the stand. In the figure, 1 is a noise generator, 2 is a test stand, and 3 is a noise generator.
is a coaxial cable, 5 is an electronic circuit under test, 2-1 is a resin case, 2-2 and 2-3 are antenna elements, 2-4 is a coaxial connector, and 2-5 is a terminating resistor.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 雑音発生器と、該雑音発生器の雑音出力をうけ
るアンテナを組込んだ試験台とを備え、該試験台
上にセツトされた試験の対象となる電子回路に前
記アンテナから雑音電磁波を放射することにより
、該電子回路の誤動作の有無を調べるようにした
ことを特徴とする雑音電磁波による電子回路の誤
動作試験装置。 A test stand incorporating a noise generator and an antenna receiving the noise output of the noise generator, and radiating noise electromagnetic waves from the antenna to an electronic circuit to be tested set on the test stand. What is claimed is: 1. A malfunction test device for an electronic circuit caused by electromagnetic noise waves, characterized in that the electronic circuit is tested for malfunction by using electromagnetic noise waves.
JP11596485U 1985-07-30 1985-07-30 Pending JPS6237786U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11596485U JPS6237786U (en) 1985-07-30 1985-07-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11596485U JPS6237786U (en) 1985-07-30 1985-07-30

Publications (1)

Publication Number Publication Date
JPS6237786U true JPS6237786U (en) 1987-03-06

Family

ID=31000114

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11596485U Pending JPS6237786U (en) 1985-07-30 1985-07-30

Country Status (1)

Country Link
JP (1) JPS6237786U (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5686368A (en) * 1979-12-14 1981-07-14 Fujitsu Ltd Test method for noise-resistant value of print panel
JPS59133473A (en) * 1983-01-21 1984-07-31 Mitsubishi Electric Corp Antenna supporting device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5686368A (en) * 1979-12-14 1981-07-14 Fujitsu Ltd Test method for noise-resistant value of print panel
JPS59133473A (en) * 1983-01-21 1984-07-31 Mitsubishi Electric Corp Antenna supporting device

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