JPS6236962A - Contact type image sensor - Google Patents

Contact type image sensor

Info

Publication number
JPS6236962A
JPS6236962A JP60176616A JP17661685A JPS6236962A JP S6236962 A JPS6236962 A JP S6236962A JP 60176616 A JP60176616 A JP 60176616A JP 17661685 A JP17661685 A JP 17661685A JP S6236962 A JPS6236962 A JP S6236962A
Authority
JP
Japan
Prior art keywords
light
photoelectric conversion
layer
protective layer
transducer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60176616A
Other languages
Japanese (ja)
Other versions
JPH0795792B2 (en
Inventor
Takahiro Nishikura
西倉 孝弘
Kosuke Ikeda
光佑 池田
Noboru Yoshigami
由上 登
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP60176616A priority Critical patent/JPH0795792B2/en
Publication of JPS6236962A publication Critical patent/JPS6236962A/en
Publication of JPH0795792B2 publication Critical patent/JPH0795792B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To decrease the light response time without losing an optical current by lowering the transmissivity of a protection layer, forming the protection layer as a multi-layer film having different refractive index and making simultaneously a bias light and a reflected light from an original incident on a photoelectric transducer face. CONSTITUTION:A light shield layer 2 having a lighting window 3 is formed on a transparent insulation substrate 1 by a material such as Si and a transparent insulation layer 4 made of a material such as SiO2 is formed as a multi-layer film to keep insulation with a photoelectric transducer. The photoelectric transducers 5 arranged as the shape of islands in the main scanning direction on the light shield layer 2 are formed by photoconductive thin film made of such as CdS, CdSe or their solid solution. A protection layer 8 is provided on the transducer 5 in order to introduce the reflected light 10 from an original 9 into the photoelectric transducer 5 and to protect the transducer 5. The thickness of the protection layer 8 is thinner than the pitch of the transducer 5 to prevent the deterioration in the resolution. The transmissivity of the protection layer 8, let the maximum value of the reflected light 10 from the original 9 be 100, is selected so that the intensity of scattered light 11 in the protection layer 8 as the bias light to the transducer 5 is 10-100 on the transducer 5.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、ファクシミリやノーンドスキャナー等の読取
側に用いられる原稿幅と1:1に対応する大きさを有し
、原稿に密着して読み取る密着型イメージセンサに関す
るものである。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention has a size that corresponds 1:1 to the width of a document used on the reading side of a facsimile machine, a non-print scanner, etc. The present invention relates to type image sensors.

従来の技術 従来の密着型イメージセンサでは、例えば、特開昭58
−40856号公報に示されているように、第4図のよ
うな構造になっていた。
2. Description of the Related Art Conventional contact type image sensors include, for example, Japanese Patent Application Laid-Open No. 58
As shown in Japanese Patent No. 40856, the structure was as shown in FIG.

つまり第4図において、透光性絶縁基板1上に。That is, in FIG. 4, on the transparent insulating substrate 1.

照明窓3を有する遮光層2を形成し、光電変換素子6と
遮光層2の絶縁を保つために5i02 、 Si3N4
3ベー/ 等の絶縁層を形成しその上に、例えば、aaS 。
5i02, Si3N4 to form a light shielding layer 2 having an illumination window 3 and to maintain insulation between the photoelectric conversion element 6 and the light shielding layer 2.
Form an insulating layer such as 3B/m and on it, e.g. aaS.

0dSe −4たはその固溶体等の光電変換素子6を島
状に形成し、光電変換素子6を一定単位数ごとにまとめ
た共通電極6と各光電変換素子5に対応した個別電極子
とからなる対向電極を設けた後、その上部に、例えばマ
イクロシートガラス等の高透過率を有する透明保護層1
2を設けた密着型イメージセンサで、照明窓3から入射
する光が原稿9で反射し、その反射光1Qを光電変換素
子6で原稿9の情報として、電気信号に変換するように
なっていた。
Photoelectric conversion elements 6 made of 0dSe -4 or a solid solution thereof are formed in an island shape, and consist of a common electrode 6 in which the photoelectric conversion elements 6 are grouped into a certain number of units, and individual electrode elements corresponding to each photoelectric conversion element 5. After providing the counter electrode, a transparent protective layer 1 having high transmittance, such as micro sheet glass, is placed on top of the counter electrode.
2, the light incident through the illumination window 3 is reflected by the document 9, and the reflected light 1Q is converted into an electrical signal by a photoelectric conversion element 6 as information about the document 9. .

発明が解決しようとする問題点 しかし、このような構造の密着型イメージセンサでは光
電変換素子6に、l −VI族化合物の光導電体等を用
い非蓄積型とした場合、光電流は多く取れるが、光応答
時間が10数m5ecと遅くなる。
Problems to be Solved by the Invention However, in a contact type image sensor having such a structure, if the photoelectric conversion element 6 is a non-storage type using a photoconductor of an l-VI group compound, a large amount of photocurrent can be obtained. However, the photoresponse time is as slow as 10-odd m5ec.

寸た高速読取をする場合、光電流を犠牲にする構造、例
えば蓄積型としなければならず。このよう庁構造では出
力信号が微少のため信号処理回路が複雑となるなどの問
題があった。
For extremely high-speed reading, a structure that sacrifices photocurrent, such as an accumulation type, must be used. Such an office structure has problems such as a complicated signal processing circuit because the output signal is very small.

本発明は、この点を考慮して、簡単な構造で、光電流も
大きく、しかも原稿情報を高速度で読み取る事のできる
密着型イメージセンサを提供する事を目的とするもので
ある。
In consideration of this point, it is an object of the present invention to provide a contact type image sensor that has a simple structure, has a large photocurrent, and can read document information at high speed.

問題点を解決するだめの手段 本発明は上記問題点を解決するために、保護層の透過率
を下げたものであり、この構成により照明窓から入射す
る光を一部は原稿に照射され反射光となり、また一部は
保護層内部で散乱光と々る光をバイアス光として同時に
光電変換素子上に入射する事となる。
Means for Solving the Problems In order to solve the above problems, the present invention lowers the transmittance of the protective layer, and with this configuration, part of the light incident from the illumination window is irradiated onto the document and reflected. A portion of the light is scattered inside the protective layer and is simultaneously used as bias light to be incident on the photoelectric conversion element.

作用 本発明は上記構造により、原稿からの反射光と同時に付
加されるバイアス光によって、キャリアの実効的トラッ
プ濃度を減少させる事ができ、■−VI族化合物の光導
電体薄膜を用いた光電変換素子において、光応答時間を
容易にしかも大巾に短縮できるものである。
Effect of the present invention With the above structure, the effective trap concentration of carriers can be reduced by the bias light added at the same time as the reflected light from the original, and the photoelectric conversion using a photoconductor thin film of a -VI group compound can be achieved. In the device, the optical response time can be easily and drastically shortened.

実施例 以下、本発明の一実施例を添付図面にもとづい6ベーノ て説明する。Example Hereinafter, one embodiment of the present invention will be described based on the attached drawings. I will explain.

第1図の副走査方向の断面図において、例えばコーニン
グ社製の7059ガラスの様な透光性絶縁基板1上に照
明窓3を有する遮光層2を、Si。
In the cross-sectional view in the sub-scanning direction of FIG. 1, a light-shielding layer 2 having an illumination window 3 is formed on a light-transmitting insulating substrate 1, such as 7059 glass manufactured by Corning Corporation, using Si.

Or 、Ta 、W 、Ti等で形成し、光電変換素子
6との絶縁性を保つために、5i02 、5i5N4等
の透光性絶縁層4を単層又は多層膜で形成する。そして
遮光層2上部で主走査方向に島状に並んだ光電変換素子
6を例えばOdS、GdSeあるいはその固溶体等の光
導電体薄膜で形成し、一定単位数ごとの光電変換素子6
をまとめた共通電極6と各光電変換素子5に対応した個
別電極子からなる対向電極を設ける。さらにその上部に
光電変換素子6に原稿9からの反射光1oを導入するた
めと、光電変換素子6の保護のために保護層8を設ける
。このとき保護層8の厚みは、解像度の低下を防ぐため
に光電変換素子6のピッチよりも薄くしている。
The transparent insulating layer 4 is made of Or, Ta, W, Ti, etc., and is made of 5i02, 5i5N4, etc. in order to maintain insulation from the photoelectric conversion element 6 as a single layer or a multilayer film. Photoelectric conversion elements 6 arranged in an island shape in the main scanning direction above the light-shielding layer 2 are formed of a photoconductor thin film such as OdS, GdSe or a solid solution thereof, and photoelectric conversion elements 6 are arranged in a fixed number of units.
A common electrode 6 that brings together the photoelectric conversion elements 5 and a counter electrode consisting of individual electrode elements corresponding to each photoelectric conversion element 5 are provided. Furthermore, a protective layer 8 is provided on top of the photoelectric conversion element 6 in order to introduce the reflected light 1o from the original 9 into the photoelectric conversion element 6 and to protect the photoelectric conversion element 6. At this time, the thickness of the protective layer 8 is made thinner than the pitch of the photoelectric conversion elements 6 in order to prevent a decrease in resolution.

そしてその保護層8の透過率を、原稿9からの反射光1
oの最大値を100とした時に光電変換素子6のバイア
ス光となる保護層8内の散乱光116ペーノ の光の強度が光電変換素子6面上で5〜100、好まし
くは第3図に示すように相対バイアス光量と光応答時間
の関係かられかるように、10〜1o○となるように設
定する。このように保護層8の透過率を任意に変えるこ
とにより、光電変換素子5面上でのバイアス光量を調節
できる。ここで保護層8での散乱[11の増加は原稿9
面の照度を下げる事になるが、光応答時間に対する光量
の効果はバイアス光量効果に比較して少々く問題とはな
らない。
Then, the transmittance of the protective layer 8 is calculated as 1 for the reflected light from the original 9.
When the maximum value of o is set to 100, the intensity of the scattered light 116 peno in the protective layer 8 which becomes the bias light of the photoelectric conversion element 6 is 5 to 100 on the surface of the photoelectric conversion element 6, preferably as shown in FIG. As can be seen from the relationship between the relative bias light amount and the photoresponse time, it is set to 10 to 1o○. By arbitrarily changing the transmittance of the protective layer 8 in this manner, the amount of bias light on the surface of the photoelectric conversion element 5 can be adjusted. Here, the increase in scattering [11] in the protective layer 8 is due to the increase in the original 9
Although the illuminance of the surface will be lowered, the effect of the light amount on the photoresponse time is much less of a problem than the bias light amount effect.

その結果、光電変換素子6面上に原稿9からの反射光1
0とバイアス光となる散乱光11を同時に入射する事に
より第3図に示すように光応答時間を容易にしかも簡単
な構造で、μ〜協以下にする事ができ高速の読み取りが
可能となる。その上光電流も減少しないので信号処理回
路構成も容易である。
As a result, reflected light 1 from the original 9 appears on the surface of the photoelectric conversion element 6.
By simultaneously injecting 0 and the scattered light 11 which becomes the bias light, the optical response time can be easily reduced to less than μ~K with a simple structure, as shown in Fig. 3, and high-speed reading is possible. . Furthermore, since the photocurrent does not decrease, the configuration of the signal processing circuit is also easy.

次に本発明の他の実施例について説明する。Next, other embodiments of the present invention will be described.

第2図は他の実施例における副走査方向の断面図を示し
ており、第2図の保護層12.13以外7ページ は第1図の構造と同様である。本実施例においては、第
2図に示すように第1の保護層12と第2の保護層13
の多層膜とし、しかも第1の保護層12と第2の保護層
13の屈折率を変え、第1の保護層12、例えば5i0
2等よりも第2の保護層13の屈折率が大きい透明材料
、例えばム(hos 。
FIG. 2 shows a cross-sectional view in the sub-scanning direction of another embodiment, and the structure of the seven pages other than the protective layers 12 and 13 in FIG. 2 is the same as that in FIG. 1. In this embodiment, as shown in FIG. 2, a first protective layer 12 and a second protective layer 13 are
In addition, the first protective layer 12 and the second protective layer 13 have different refractive indexes, and the first protective layer 12, for example, 5i0
A transparent material having a higher refractive index of the second protective layer 13 than the second protective layer 13, for example, HOS.

SiC、TiO2、ダイヤモンド等とする事により、第
1の保護層12と第2の保護層13との界面による散乱
光11をバイアス光とする事によって第一の実施例と同
様の効果を得る事ができると共に、第2の保護層13に
硬度の大きい材料例えばム(hos+SiC等を用いる
事により、原稿9との接触による保護層13面の傷がつ
きにくく耐久性の向上が得られる。
By using SiC, TiO2, diamond, etc., the same effect as the first embodiment can be obtained by using the scattered light 11 at the interface between the first protective layer 12 and the second protective layer 13 as bias light. In addition, by using a material with high hardness, such as Hos+SiC, for the second protective layer 13, the surface of the protective layer 13 is less likely to be scratched due to contact with the original 9, thereby improving durability.

なお、保護層は本実施例のように2層に限られるもので
はなく、3層以上形成することもできることはいうまで
もない。
Note that the protective layer is not limited to two layers as in this embodiment, but it goes without saying that three or more layers can be formed.

発明の効果 本発明によれば、保護層の透過率を下げる事や屈折率の
異なる多層膜とするというきわめて簡単な構造で光電変
換素子面上にバイアス光と原稿の情報を含む反射光を同
時に入射することができ、光応答時間を光電流を損うこ
となしに従来のIA〜協以下にでき、また信号処理回路
も容易で、さらに保護層の耐久性も向上できるという非
常に大きな効果を得る事ができ、実用上きわめて優れた
ものである。
Effects of the Invention According to the present invention, bias light and reflected light containing document information can be simultaneously transmitted onto the photoelectric conversion element surface using an extremely simple structure that reduces the transmittance of the protective layer and uses a multilayer film with different refractive indexes. The photoresponse time can be reduced to less than that of conventional IA without damaging the photocurrent, the signal processing circuit can be simplified, and the durability of the protective layer can also be improved. It is extremely excellent in practical use.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例における密着型イメージセン
サの副走査方向の断面図、第2図は本発明の他の実施例
の密着型イメージセンサの副走査ジセンサの副走査方向
の断面図である。 2・・・・・・遮光層、3・・・・・・照明窓、6・・
・・・・光電変換素子、8・・・・・・透過率の低い保
護層、9・・・・・・原稿、10・・・・・・反射光、
11・・・・・・散乱光、12・旧・・透明保護層、1
3・・・・・・屈折率の異なる保護層。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名第3
図 朴しけバイアス光量(7=9 第4図
FIG. 1 is a cross-sectional view in the sub-scanning direction of a contact type image sensor according to an embodiment of the present invention, and FIG. 2 is a cross-sectional view in the sub-scanning direction of a sub-scanning sensor of a contact type image sensor according to another embodiment of the present invention. It is. 2... Light shielding layer, 3... Lighting window, 6...
... Photoelectric conversion element, 8 ... Protective layer with low transmittance, 9 ... Original document, 10 ... Reflected light,
11...Scattered light, 12.Old...Transparent protective layer, 1
3... Protective layer with different refractive index. Name of agent: Patent attorney Toshio Nakao and 1 other person No. 3
Figure 4: Bias light intensity (7=9)

Claims (3)

【特許請求の範囲】[Claims] (1)絶縁性基板上に照明窓を有する遮光層と、透光性
絶縁層と、前記遮光層上で主走査方向に島状に並んだ複
数の光電変換素子と、前記光電変換素子の一定単位数ご
とに共通接続される共通電極と、前記各光電変換素子に
それぞれ接続される対向電極と、一定の透過率を有する
保護層とを備え、前記照明窓からの入射光を前記保護層
上部の原稿へ照射し、その反射光を信号光として、前記
保護層での散乱光をバイアス光として前記光電変換素子
に入射することを特徴とする密着型イメージセンサ。
(1) A light-shielding layer having an illumination window on an insulating substrate, a light-transmitting insulating layer, a plurality of photoelectric conversion elements arranged in an island shape in the main scanning direction on the light-shielding layer, and a constant number of the photoelectric conversion elements. A common electrode that is commonly connected for each unit, a counter electrode that is connected to each of the photoelectric conversion elements, and a protective layer having a certain transmittance, and the incident light from the illumination window is directed to the top of the protective layer. A contact type image sensor characterized in that the reflected light is used as signal light and the light scattered by the protective layer is used as bias light to enter the photoelectric conversion element.
(2)保護層の透過率において、原稿からの反射光の最
大値を100とした時に、散乱光の光強度が光電変換素
子面上で、5〜100であることを特徴とする特許請求
の範囲第1項記載の密着型イメージセンサ。
(2) Regarding the transmittance of the protective layer, when the maximum value of the reflected light from the original is 100, the light intensity of the scattered light on the surface of the photoelectric conversion element is 5 to 100. A contact image sensor according to scope 1.
(3)保護層が順次屈折率の大きくなる多層膜からなり
、屈折率の異なる膜界面からの散乱光をバイアス光とし
、原稿からの反射光の最大値を100とした時に散乱光
の光強度が光電変換素子面上で、5〜100であること
を特徴とする特許請求の範囲第1項記載の密着型イメー
ジセンサ。
(3) The protective layer is made of a multilayer film with a sequentially increasing refractive index, the scattered light from the film interface with different refractive index is used as bias light, and the light intensity of the scattered light is set when the maximum value of the reflected light from the original is 100. 2. The contact image sensor according to claim 1, wherein: 5 to 100 on the surface of the photoelectric conversion element.
JP60176616A 1985-08-09 1985-08-09 Contact image sensor Expired - Lifetime JPH0795792B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60176616A JPH0795792B2 (en) 1985-08-09 1985-08-09 Contact image sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60176616A JPH0795792B2 (en) 1985-08-09 1985-08-09 Contact image sensor

Publications (2)

Publication Number Publication Date
JPS6236962A true JPS6236962A (en) 1987-02-17
JPH0795792B2 JPH0795792B2 (en) 1995-10-11

Family

ID=16016682

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60176616A Expired - Lifetime JPH0795792B2 (en) 1985-08-09 1985-08-09 Contact image sensor

Country Status (1)

Country Link
JP (1) JPH0795792B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63288059A (en) * 1987-05-20 1988-11-25 Matsushita Electric Ind Co Ltd Image sensor
EP0298458A2 (en) * 1987-07-09 1989-01-11 Canon Kabushiki Kaisha Image reading apparatus
JPH05347396A (en) * 1991-03-25 1993-12-27 Semiconductor Energy Lab Co Ltd Image reader

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57201068A (en) * 1981-06-05 1982-12-09 Oki Electric Ind Co Ltd Contact type image sensor
JPS5846186A (en) * 1981-09-14 1983-03-17 住友化学工業株式会社 Dyeing of cellulosic fiber

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57201068A (en) * 1981-06-05 1982-12-09 Oki Electric Ind Co Ltd Contact type image sensor
JPS5846186A (en) * 1981-09-14 1983-03-17 住友化学工業株式会社 Dyeing of cellulosic fiber

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63288059A (en) * 1987-05-20 1988-11-25 Matsushita Electric Ind Co Ltd Image sensor
EP0298458A2 (en) * 1987-07-09 1989-01-11 Canon Kabushiki Kaisha Image reading apparatus
JPH05347396A (en) * 1991-03-25 1993-12-27 Semiconductor Energy Lab Co Ltd Image reader

Also Published As

Publication number Publication date
JPH0795792B2 (en) 1995-10-11

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