JPH0795792B2 - Contact image sensor - Google Patents

Contact image sensor

Info

Publication number
JPH0795792B2
JPH0795792B2 JP60176616A JP17661685A JPH0795792B2 JP H0795792 B2 JPH0795792 B2 JP H0795792B2 JP 60176616 A JP60176616 A JP 60176616A JP 17661685 A JP17661685 A JP 17661685A JP H0795792 B2 JPH0795792 B2 JP H0795792B2
Authority
JP
Japan
Prior art keywords
light
photoelectric conversion
protective layer
transparent protective
conversion element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60176616A
Other languages
Japanese (ja)
Other versions
JPS6236962A (en
Inventor
孝弘 西倉
光佑 池田
登 由上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP60176616A priority Critical patent/JPH0795792B2/en
Publication of JPS6236962A publication Critical patent/JPS6236962A/en
Publication of JPH0795792B2 publication Critical patent/JPH0795792B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、ファクシミリやハンドスキャナー等の読取側
に用いられる原稿幅と1:1に対応する大きさを有し、原
稿に密着して読み取る密着型イメージセンサに関するも
のである。
Description: TECHNICAL FIELD The present invention relates to a contact type having a size corresponding to 1: 1 with a document width used on a reading side of a facsimile, a hand scanner or the like and reading in close contact with a document. The present invention relates to an image sensor.

従来の技術 従来の密着型イメージセンサでは、例えば、特開昭58−
40856号公報に示されているように、第4図のような構
造になっていた。
2. Description of the Related Art In the conventional contact type image sensor, for example, Japanese Patent Laid-Open No.
As shown in Japanese Patent No. 40856, the structure was as shown in FIG.

つまり第4図において、透光性絶縁基板1上に、照明窓
3を有する遮光層2を形成し、光電変換素子5と遮光層
2の絶縁を保つためにSiO2,Si3N4等の絶縁層を形成し
その上に、例えば、CdS,CdSeまたはその固溶体等の光電
変換素子5を島状に形成し、光電変換素子5を一定単位
数ごとにまとめた共通電極6と各光電変換素子5に対応
した個別電極7とからなる対向電極を設けた後、その上
部に、例えばマイクロシートガラス等の高透過率を有す
る透明保護層12を設けた密着型イメージセンサで、照明
窓3から入射する光が原稿9で反射し、その反射光10を
光電変換素子5で原稿9の情報として、電気信号に変換
するようになっていた。
That is, in FIG. 4, the light shielding layer 2 having the illumination window 3 is formed on the light transmissive insulating substrate 1, and in order to maintain the insulation between the photoelectric conversion element 5 and the light shielding layer 2, SiO 2 , Si 3 N 4 or the like is used. An insulating layer is formed, and a photoelectric conversion element 5 such as CdS, CdSe or a solid solution thereof is formed on the insulating layer in an island shape, and the photoelectric conversion element 5 is grouped into a certain number of common electrodes 6 and each photoelectric conversion element. 5 is a contact type image sensor in which a counter electrode composed of the individual electrodes 7 corresponding to 5 is provided, and then a transparent protective layer 12 having a high transmittance such as microsheet glass is provided on the counter electrode. The reflected light is reflected by the original 9, and the reflected light 10 is converted into an electric signal by the photoelectric conversion element 5 as information of the original 9.

発明が解決しようとする問題点 しかし、このような構造の密着型イメージセンサでは光
電変換素子5に、II−VI族化合物の光導電体等を用い非
蓄積型とした場合、光電流は多く取れるが、光応答時間
が10数msecと遅くなる。また高速読取をする場合、光電
流を犠牲にする構造、例えば蓄積型としなければなら
ず。このような構造では出力信号が微少のため信号処理
回路が複雑となるなどの問題があった。
However, in the contact type image sensor having such a structure, when the photoelectric conversion element 5 is made of a non-accumulation type such as a photoconductor of II-VI group compound, a large amount of photocurrent can be obtained. However, the optical response time is as slow as 10's of msec. For high-speed reading, a structure that sacrifices photocurrent must be used, for example, a storage type. In such a structure, there is a problem that the signal processing circuit becomes complicated because the output signal is very small.

本発明は、この点を考慮して、簡単な構造で、光電流も
大きく、しかも原稿情報を高速度で読み取る事のできる
密着型イメージセンサを提供する事を目的とするもので
ある。
In view of this point, an object of the present invention is to provide a contact type image sensor having a simple structure, a large photocurrent, and capable of reading document information at high speed.

問題点を解決するための手段 本発明は上記問題点を解決するために、透明保護層の透
過率を下げたものであり、この構成により照明窓から入
射する光を一部は原稿に照射され反射光となり、また一
部は透明保護層内部で散乱光となる光をバイアス光とし
て同時に光電変換素子上に入射する事となる。
Means for Solving the Problems In order to solve the above problems, the present invention reduces the transmittance of a transparent protective layer. With this configuration, a part of the light incident from the illumination window is applied to the original. Light that becomes reflected light and partly becomes scattered light inside the transparent protective layer is simultaneously incident on the photoelectric conversion element as bias light.

作用 本発明は上記構造により、原稿からの反射光と同時に付
加されるバイアス光によって、キャリアの実効的トラッ
プ濃度を減少させる事ができ、II−VI族化合物の光導電
体薄膜を用いた光電変換素子において、光応答時間を容
易にしかも大巾に短縮できるものである。
The present invention has the above-described structure and can reduce the effective trap concentration of carriers by the bias light added at the same time as the reflected light from the original, and photoelectric conversion using the photoconductor thin film of II-VI group compound. In the device, the light response time can be easily and significantly shortened.

実施例 以下、本発明の一実施例を添付図面にもとづいて説明す
る。
Embodiment One embodiment of the present invention will be described below with reference to the accompanying drawings.

第1図の副走査方向の断面図において、例えばコーニン
グ社製の7059ガラスの様な透光性絶縁基板1上に照明窓
3を有する遮光層2を、Si,Cr,Ta,W,Ti等で形成し、光
電変換素子5との絶縁性を保つために、SiO2,Si3N4
の透光性絶縁層4を単層又は多層膜で形成する。そして
遮光層2上部で主走査方向に島状に並んだ光電変換素子
5を例えばCdS,CdSeあるいはその固溶体等の光導電体薄
膜で形成し、一定単位数ごとの光電変換素子5をまとめ
た共通電極6と各光電変換素子5に対応した個別電極7
からなる対向電極を設ける。さらにその上部に光電変換
素子5に原稿9からの反射光10を導入するためと、光電
変換素子5の保護のために透明保護層8を設ける。この
とき透明保護層8の厚みは、解像度の低下を防ぐために
光電変換素子5のピッチよりも薄くしている。そしてそ
の透明保護層8の透過率を、原稿9からの反射光10の最
大値を100とした時に光電変換素子5のバイアス光とな
る透明保護層8内の散乱光11の光の強度が光電変換素子
5面上で5〜100、好ましくは第3図に示すように相対
バイアス光量と光応答時間の関係からわかるように、10
〜100となるように設定する。このように透明保護層8
の透過率を任意に変えることにより、光電変換素子5面
上でのバイアス光量を調節できる。ここで透明保護層8
での散乱光11の増加は原稿9面の照度を下げる事になる
が、光応答時間に対する光量の効果はバイアス光量効果
に比較して少なく問題とはならない。
In the sectional view in the sub-scanning direction of FIG. 1, a light-shielding layer 2 having an illumination window 3 is formed on a transparent insulating substrate 1 such as 7059 glass manufactured by Corning Co., Ltd. by using Si, Cr, Ta, W, Ti, etc. In order to maintain insulation with the photoelectric conversion element 5, the light-transmissive insulating layer 4 made of SiO 2 , Si 3 N 4 or the like is formed of a single layer or a multilayer film. Then, the photoelectric conversion elements 5 arranged in an island shape in the main scanning direction above the light shielding layer 2 are formed of a photoconductive thin film of, for example, CdS, CdSe or a solid solution thereof, and the photoelectric conversion elements 5 are grouped into a common unit. Electrode 6 and individual electrode 7 corresponding to each photoelectric conversion element 5
Is provided with a counter electrode. Further, a transparent protective layer 8 is provided above the photoelectric conversion element 5 for introducing reflected light 10 from the original 9 and for protecting the photoelectric conversion element 5. At this time, the thickness of the transparent protective layer 8 is made thinner than the pitch of the photoelectric conversion elements 5 in order to prevent the deterioration of resolution. When the transmittance of the transparent protective layer 8 is set to 100 as the maximum value of the reflected light 10 from the original 9, the intensity of the scattered light 11 in the transparent protective layer 8 which becomes the bias light of the photoelectric conversion element 5 is photoelectric. 5 to 100 on the surface of the conversion element 5, preferably 10 as shown in the relationship between the relative bias light amount and the light response time as shown in FIG.
Set it to be ~ 100. Thus, the transparent protective layer 8
The amount of bias light on the surface of the photoelectric conversion element 5 can be adjusted by arbitrarily changing the transmittance of the. Here, the transparent protective layer 8
Although the increase of the scattered light 11 in FIG. 9 reduces the illuminance on the surface of the original 9, the effect of the light amount on the light response time is smaller than the bias light amount effect and is not a problem.

その結果、光電変換素子5面上に原稿9からの反射光10
とバイアス光となる散乱光11を同時に入射する事により
第3図に示すように光応答時間を容易にしかも簡単な構
造で、1/2〜1/10以下にする事ができ高速の読み取りが
可能となる。その上光電流も減少しないので信号処理回
路構成も容易である。
As a result, the reflected light 10 from the original 9 is reflected on the surface of the photoelectric conversion element 5.
As shown in Fig. 3, the light response time can be easily and simply set by simultaneously injecting the scattered light 11 which becomes the bias light and the light can be reduced to 1/2 to 1/10 or less and high-speed reading can be performed. It will be possible. Moreover, since the photocurrent does not decrease, the signal processing circuit configuration is easy.

次に本発明の他の実施例について説明する。Next, another embodiment of the present invention will be described.

第2図は他の実施例における副走査方向の断面図を示し
ており、第2図の透明保護層12,13以外は第1図の構造
と同様である。本実施例においては、第2図に示すよう
に第1の透明保護層12と第2の透明保護層13の多層膜と
し、しかも第1の透明保護層12と第2の透明保護層の屈
折率を変え、第1の透明保護層12、例えばSiO2等よりも
第2の透明保護層13の屈折率が大きい透明材料、例えば
Al2O3、SiC,TiO2,ダイアモンド等とする事により、第
1の透明保護層12と第2の透明保護層13との界面による
散乱光11をバイアス光とする事によって第一の実施例と
同様の効果を得る事ができると共に第2の透明保護層13
の硬度の大きい材料例えばAl2O3、SiC等を用いる事によ
り、原稿9との接触による透明保護層13面の傷がつきに
くく耐久性の向上が得られる。
FIG. 2 shows a sectional view in the sub-scanning direction in another embodiment, which is the same as the structure in FIG. 1 except for the transparent protective layers 12 and 13 in FIG. In the present embodiment, as shown in FIG. 2, a multilayer film of a first transparent protective layer 12 and a second transparent protective layer 13 is used, and the refraction of the first transparent protective layer 12 and the second transparent protective layer is made. By changing the refractive index, a transparent material in which the refractive index of the second transparent protective layer 13 is larger than that of the first transparent protective layer 12, such as SiO 2, is used.
By using Al 2 O 3 , SiC, TiO 2 , diamond, etc., the scattered light 11 by the interface between the first transparent protective layer 12 and the second transparent protective layer 13 is used as the bias light. The same effect as the example can be obtained, and the second transparent protective layer 13
By using a material having a high hardness such as Al 2 O 3 or SiC, the surface of the transparent protective layer 13 is less likely to be scratched by contact with the original 9, and the durability can be improved.

なお、透明保護層は本実施例のように2層に限られるも
のではなく、3層以上形成することもできることはいう
までもない。
It is needless to say that the transparent protective layer is not limited to two layers as in this embodiment, and three or more layers can be formed.

発明の効果 本発明によれば、透明保護層の透過率を下げる事や屈折
率の異なる多層膜とするというきわめて簡単な構造で光
電変換素子面上にバイアス光と原稿の情報を含む反射光
を同時に入射することができ、光応答時間を光電流を損
うことなしに従来の1/2〜1/10以下にでき、また信号処
理回路も容易で、さらに透明保護層の耐久性も向上でき
るという非常に大きな効果を得る事ができ、実用上きわ
めて優れたものである。
EFFECTS OF THE INVENTION According to the present invention, the bias light and the reflected light including the information of the original are reflected on the surface of the photoelectric conversion element with a very simple structure such that the transmittance of the transparent protective layer is reduced and a multilayer film having different refractive indexes is formed. It can be incident at the same time, the light response time can be reduced to 1/2 to 1/10 or less of the conventional one without damaging the photocurrent, the signal processing circuit is easy, and the durability of the transparent protective layer can be improved. That is, it is very excellent in practical use.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の一実施例における密着型イメージセン
サの副走査方向の断面図、第2図は本発明の他の実施例
の密着型イメージセンサの副走査方向の断面図、第3図
はバイアス光量と光応答時間の関係を示す特性図、第4
図は従来の密着型イメージセンサの副走査方向の断面図
である。 2……遮光層、3……照明窓、5……光電変換素子、8
……透過率の低い透明保護層、9……原稿、10……反射
光、11……散乱光、12……透明透明保護層、13……屈折
率の異なる透明保護層。
FIG. 1 is a sectional view in the sub-scanning direction of a contact image sensor according to an embodiment of the present invention. FIG. 2 is a sectional view in the sub-scanning direction of a contact image sensor according to another embodiment of the present invention. Is a characteristic diagram showing the relationship between the amount of bias light and the optical response time,
FIG. 1 is a sectional view of a conventional contact image sensor in the sub scanning direction. 2 ... Shading layer, 3 ... Illumination window, 5 ... Photoelectric conversion element, 8
...... Transparent protective layer with low transmittance, 9 …… Original, 10 …… Reflected light, 11 …… Scattered light, 12 …… Transparent transparent protective layer, 13 …… Transparent protective layer with different refractive index.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】透光性絶縁基板上に照明窓を有する遮光層
と、透光性絶縁層と、前記遮光層上で主走査方向に島状
に並んだ複数の光電変換素子と、前記光電変換素子の一
定単位数ごとに共通に接続される共通電極と、前記各光
電変換素子にそれぞれ接続される対向電極と、前記透光
性絶縁基板裏面から前記照明窓を通って入射する入射光
を前記透明保護層上部の原稿へ照射し、前記原稿からの
反射光量の最大値を100とした時に、散乱光の光量が光
電変換素子面上で5〜100となる一定の透過率を有する
前記透明保護層とを備え、前記反射光を信号光とし、前
記透明保護層での散乱光をバイアス光として前記光電変
換素子に入射することを特徴とする密着型イメージセン
サ。
1. A light-shielding layer having an illumination window on a light-transmissive insulating substrate, a light-transmissive insulating layer, a plurality of photoelectric conversion elements arranged in an island shape in the main scanning direction on the light-shielding layer, and the photoelectric converter. A common electrode that is commonly connected for every fixed unit number of conversion elements, a counter electrode that is connected to each of the photoelectric conversion elements, and incident light that enters through the illumination window from the back surface of the translucent insulating substrate. Irradiating the original on the transparent protective layer, when the maximum value of the amount of light reflected from the original is 100, the transparent having a constant transmittance such that the amount of scattered light is 5 to 100 on the photoelectric conversion element surface. A contact image sensor, comprising: a protective layer, wherein the reflected light is signal light, and the scattered light on the transparent protective layer is incident on the photoelectric conversion element as bias light.
【請求項2】透明保護層が、順次屈折率の大きくなる多
層膜からなり、屈折率の異なる前記多層膜界面からの散
乱光をバイアス光とし、原稿からの反射光の光量の最大
値を100とした時に、散乱光の光量が光電変換素子面上
で5〜100であることを特徴とする特許請求の範囲第1
項に記載の密着型イメージセンサ。
2. A transparent protective layer is composed of a multilayer film having a refractive index which is successively increased. Scattered light from the interface of the multilayer films having different refractive indexes is used as bias light, and the maximum value of the amount of reflected light from the original is 100. The amount of scattered light is 5 to 100 on the surface of the photoelectric conversion element at that time.
The contact image sensor according to the item.
JP60176616A 1985-08-09 1985-08-09 Contact image sensor Expired - Lifetime JPH0795792B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60176616A JPH0795792B2 (en) 1985-08-09 1985-08-09 Contact image sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60176616A JPH0795792B2 (en) 1985-08-09 1985-08-09 Contact image sensor

Publications (2)

Publication Number Publication Date
JPS6236962A JPS6236962A (en) 1987-02-17
JPH0795792B2 true JPH0795792B2 (en) 1995-10-11

Family

ID=16016682

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60176616A Expired - Lifetime JPH0795792B2 (en) 1985-08-09 1985-08-09 Contact image sensor

Country Status (1)

Country Link
JP (1) JPH0795792B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2563930B2 (en) * 1987-05-20 1996-12-18 松下電器産業株式会社 Image sensor
JPS6415970A (en) * 1987-07-09 1989-01-19 Canon Kk Image reading equipment
JP2979071B2 (en) * 1991-03-25 1999-11-15 株式会社半導体エネルギー研究所 Image reading device

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57201068A (en) * 1981-06-05 1982-12-09 Oki Electric Ind Co Ltd Contact type image sensor
JPS5846186A (en) * 1981-09-14 1983-03-17 住友化学工業株式会社 Dyeing of cellulosic fiber

Also Published As

Publication number Publication date
JPS6236962A (en) 1987-02-17

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