JPS6233545B2 - - Google Patents

Info

Publication number
JPS6233545B2
JPS6233545B2 JP52126082A JP12608277A JPS6233545B2 JP S6233545 B2 JPS6233545 B2 JP S6233545B2 JP 52126082 A JP52126082 A JP 52126082A JP 12608277 A JP12608277 A JP 12608277A JP S6233545 B2 JPS6233545 B2 JP S6233545B2
Authority
JP
Japan
Prior art keywords
rays
chlorine
ray
characteristic
sulfur
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52126082A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5459193A (en
Inventor
Shinji Umadono
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP12608277A priority Critical patent/JPS5459193A/ja
Publication of JPS5459193A publication Critical patent/JPS5459193A/ja
Publication of JPS6233545B2 publication Critical patent/JPS6233545B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP12608277A 1977-10-19 1977-10-19 Fluorescent x-ray sulfur analytical apparatus Granted JPS5459193A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12608277A JPS5459193A (en) 1977-10-19 1977-10-19 Fluorescent x-ray sulfur analytical apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12608277A JPS5459193A (en) 1977-10-19 1977-10-19 Fluorescent x-ray sulfur analytical apparatus

Publications (2)

Publication Number Publication Date
JPS5459193A JPS5459193A (en) 1979-05-12
JPS6233545B2 true JPS6233545B2 (pl) 1987-07-21

Family

ID=14926150

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12608277A Granted JPS5459193A (en) 1977-10-19 1977-10-19 Fluorescent x-ray sulfur analytical apparatus

Country Status (1)

Country Link
JP (1) JPS5459193A (pl)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4577338A (en) * 1982-11-01 1986-03-18 Xertex Corporation X-Ray fluorescence spectrometer and method of calibrating the same
JPS603458U (ja) * 1983-06-21 1985-01-11 日本電気株式会社 Ｅｘａｆｓ測定用螢光ｘ線強度計測系保持具
JPH1038825A (ja) * 1996-07-18 1998-02-13 Rigaku Ind Co 蛍光ｘ線分析装置
BRPI1005172B8 (pt) 2009-09-07 2020-09-08 Rigaku Denki Co Ltd método de analisar fluorescência de raio-x

Also Published As

Publication number Publication date
JPS5459193A (en) 1979-05-12

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