JPS6230694B2 - - Google Patents

Info

Publication number
JPS6230694B2
JPS6230694B2 JP57051994A JP5199482A JPS6230694B2 JP S6230694 B2 JPS6230694 B2 JP S6230694B2 JP 57051994 A JP57051994 A JP 57051994A JP 5199482 A JP5199482 A JP 5199482A JP S6230694 B2 JPS6230694 B2 JP S6230694B2
Authority
JP
Japan
Prior art keywords
chute
row
semiconductor devices
sorting
defective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57051994A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58168247A (ja
Inventor
Masatoshi Mishima
Naohiko Urasaki
Shigeki Takeo
Iwao Yamazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP57051994A priority Critical patent/JPS58168247A/ja
Publication of JPS58168247A publication Critical patent/JPS58168247A/ja
Publication of JPS6230694B2 publication Critical patent/JPS6230694B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Chutes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP57051994A 1982-03-30 1982-03-30 選別シュ−ト装置 Granted JPS58168247A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57051994A JPS58168247A (ja) 1982-03-30 1982-03-30 選別シュ−ト装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57051994A JPS58168247A (ja) 1982-03-30 1982-03-30 選別シュ−ト装置

Publications (2)

Publication Number Publication Date
JPS58168247A JPS58168247A (ja) 1983-10-04
JPS6230694B2 true JPS6230694B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1987-07-03

Family

ID=12902403

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57051994A Granted JPS58168247A (ja) 1982-03-30 1982-03-30 選別シュ−ト装置

Country Status (1)

Country Link
JP (1) JPS58168247A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58142548A (ja) * 1982-02-18 1983-08-24 Nec Corp Ｉｃハンドリング装置
JPS6076096U (ja) * 1983-10-28 1985-05-28 株式会社　東京精密 半導体素子の分類収容装置
JPS60148196A (ja) * 1984-01-13 1985-08-05 日本電気株式会社 半導体装置の製造装置
JPH0632428B2 (ja) * 1984-09-10 1994-04-27 シチズン時計株式会社 電子部品の搬送装置
JPS6196378U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1984-11-29 1986-06-20
CN105855191B (zh) * 2015-09-22 2018-10-23 苏州亿馨源光电科技有限公司 一种固定电感器自动分选生产线

Also Published As

Publication number Publication date
JPS58168247A (ja) 1983-10-04

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