JPS62285075A - Ic test system - Google Patents

Abstract

PURPOSE:To achieve individual tests without disturbance, by controlling a pressing mechanism so that ICs can be inserted simultaneously into more than one of a plurality of IC sockets commonly connected or selectively inserted thereinto one at a time for a function test or a DC test. CONSTITUTION:For a function test, as directed from a handler control section 30, a press driving section 29 advances all lanes of presses 26 (26a-26d) simultaneously to insert ICs 28 (28a-28d and 28e-28h) set on respective presses 26 into IC sockets 14 (14a-14d and 14e-14h) all at a time. In this manner, four ICs 28 are connected to respective drivers 16a and 16b simultaneously to execute a function test. Then, for a DC test, as directed from a control section 30, the control section 29 advances a press 26 alone, for instance, to insert ICs 28a and 28e into the sockets 14a and 14e only. One each of ICs is connected to the drivers 16a and 16b and voltage/current measuring circuits 18a and 18b to perform a DC test.

Description

Detailed Description of the Invention 3. Detailed Description of the Invention [Field of Industrial Application] The present invention relates to an IC test system for testing an IC such as a memory IC.

[Prior art] As a system for testing ICs such as memory ICs, I
An IC test system that combines an IC tester that includes electronic circuits such as a driver for C testing and a voltage and current measurement circuit, and an IC handler that handles operations such as inserting and removing ICs from the IC socket provided in this IC tester. There is.

Conventionally, in such an IC test system, the IC tester is provided with a driver for driving the IC for each IC socket. And multiple ICs of the IC tester
ICs are inserted into the socket all at once by a press mechanism of an IC handler, and a function test and a DC test are performed on the ICs.

[Problem to be solved] In such a conventional IC test system configuration, when the number of IC sockets is increased in order to test a large number of ICs at the same time, the same number of drivers for driving the ICs are also required. Therefore, there was a problem in that the cost of the system increased by 1.

Generally, drivers have sufficient driving capacity, and one driver can drive two or more ICs at the same time.

Therefore, by connecting two or three or more IC sockets to a driver within the range allowed by the drive capacity of the driver, the number of drivers can be reduced compared to the number of IC sockets, and the above problem can be solved. It is possible that

In this case, a plurality of ICs are connected to one driver and driven simultaneously.

Even with this, there is no particular problem with the function test. This is because a functional test system generally includes many comparators for checking IC responses, and by switching the connections, it is easy to separate the responses of multiple ICs driven by the same driver. be.

However, for DC testing, the voltage and current measurement circuit (PMU
) is connected to measure the voltage at a specific pin of an IC, the current flowing into a specific pin, etc. If multiple ICs are connected to a common driver, it will be difficult to isolate each IC. turn into.

[Object of the Invention] Therefore, an object of the present invention is to provide an IC test system in which the number of IC drive drivers is reduced compared to the number of IC sockets for the IC under test without causing such inconvenience in C testing. There is a particular thing.

[Means for Solving the Problems] In order to achieve this object, the present invention has the following advantages: ICs are inserted into and removed from a plurality of IC sockets of an IC tester by a press mechanism of an IC handler, and the ICs inserted into the IC sockets are In an IC test system in which a functional test and a DC test are performed by an IC tester, a plurality of IC sockets are commonly connected to the IC drive driver in the IC tester, and a common connection is made in the case of a function test. Controls the IC insertion/extraction operation of the press mechanism so that ICs are inserted into two or more of multiple IC sockets at the same time, and selects only one of the multiple commonly connected IC sockets in the case of DC testing. The present invention is characterized in that it is provided with means for controlling the IC insertion/extraction operation by the press mechanism so that the IC is inserted and inserted at the same time.

[Operation] Since a plurality of IC sockets are commonly connected to the driver in this way, the number of drivers is significantly smaller than the number of IC sockets.

Regarding test operation, in the case of a DC test, the ICs on the two sides are not connected to the driver at the same time, and there is no problem in measuring the voltage or inflow current of a specific pin of each IC. Tests can be run without any problems. Also,
In the case of a functional test, multiple ICs are connected to the driver at the same time, but as mentioned above, each
There is no problem in separating C.

In this way, not only a function test but also a DC test can be executed without any problem.

[Example] Hereinafter, an example of the present invention will be described with reference to the drawings.

FIG. 1 is a system configuration diagram showing a simplified configuration of main parts of an embodiment of an IC test system according to the present invention. In this figure, 1o is an IC tester, 12 is an I
It is a C handler.

In the IC tester 10, reference numerals 14a to 14h are IC sockets into which ICs under test are inserted and removed (each IC socket may be represented by the reference numeral 14). lea, 18
b is a driver for driving the IC under test (each driver may be represented by the reference numeral 12). In this embodiment, each driver 16 has the ability to drive four or more ICs simultaneously. 18a, 1
8b is a voltage and current measuring circuit (PMU).

One driver 16a connects the four IC sockets 14a to 14d of the first group via relay contacts 20a and 20b.
The other driver 18b connects to the second group of four IC sockets 14e-14h via relay contacts 20c and 20d.
is now connected. Each voltage and current measurement circuit 1
8 is an I connected directly by wiring as shown in the figure.
They are connected to the pairs of C sockets 14 via relay contacts 20e to 20h, respectively.

In this embodiment, a voltage and current measuring circuit 18 is prepared for each group of IC sockets 14, but one voltage and current measuring circuit is connected to each group of IC sockets 14 via a relay contact or the like. It's okay.

In the IC handler 12, 24 is a press mechanism for inserting and removing an IC into the IC socket 14.

The press mechanism 24 of this embodiment has a four-lane configuration, and the lane-compatible presses 2ea to 26d (sometimes represented by the reference numeral 26) have ICs 28a to 28 from one side in the figure.
h (sometimes represented by reference numeral 28) is set. Each press 26 is similar to a conventional one driven by an air cylinder, and can be independently driven forward and backward relative to the IC socket 14. Here, IC28a~
28d are the IC sockets 14a to 14 of the first group, respectively.
IC2 is an IC to be inserted into and removed from each of IC14d and
8e to 28h are IC sockets 1 of the second group, respectively.
4 e-14h.

29 is a press drive control section that controls the drive of the press mechanism 24.

In the IC tester 10 again, 30 is a handler control unit that controls the operation of the IC handler 12 in conjunction with the test operation. Control of the IC insertion/extraction operation of the press mechanism 24 as described below is also performed by the handler control section 30 via the press drive control section 29.

Note that ■C tester lO and IC handler 12 include electronic circuits, mechanisms, etc. in addition to the elements described above.
They may be the same as conventional ones, and since they are not directly related to the gist of the present invention, illustrations and descriptions thereof will be omitted.

In such an IC test system, in the case of a function test, the handler control section 30 issues an instruction to the press drive control section 29 to move the presses 26 of all lanes forward at the same time. In response to this instruction, the press drive control unit 28 moves the presses 26 of all lanes forward at the same time.
The ICs 28 set in each press 26 are inserted into the corresponding IC sockets 14 all at once.

In this way, four ICs are simultaneously connected to each driver 16 and driven, and a function test similar to the conventional one is executed.

When the function test of a total of eight ICs is completed, the handler control section 30 issues an instruction to the press drive control section 29 to remove them all at once. In response to this instruction, the press drive control section 29 causes the presses 26 in all lanes to retreat at once. As a result, the ICs are removed from all IC sockets 14 at the same time. Since the processing of the removed IC is the same as in the conventional case, its explanation will be omitted.

Next, the DC test operation will be explained. First, a case will be described in which -9 = all the IC sockets 14 of each group are connected to the corresponding driver 16 and voltage/current measuring circuit 18.

In this case, from the handler control unit 30 to the press drive control unit 2
9 is instructed to advance only the press 26a, and the press 28a is driven forward. This advancement causes the IC socket 14a.

IC28 is inserted only into 14e. In this way, only one IC is connected to each driver 16 and each voltage/current measurement circuit 18, and a DC test similar to the conventional one is performed on that IC.

After completing the DC test for the two ICs in this manner, the handler control unit 30 issues an instruction to remove the ICs. In response to this instruction, the press 28a is driven backward by the press drive control unit 29, and the IC socket 1
IC28 is removed from 4a+14e.

Next, an instruction is issued from the handler control unit 30 to move only the press 26b forward, and only the press 26b is moved forward, and the ICs 28 are inserted only into the IC sockets 14b and 14f. In this way, only those two ICs are connected to the corresponding driver 16 and voltage/current measurement circuit 18 and subjected to DC testing. After completing the DC test, its removal is performed.

Similarly, ICs set in other lanes 26c and 28d
2B is also inserted into the IC socket 14 in turn, and the DC
I take a test.

Here, by controlling the relay contacts 20, the press mechanism 2
It is also possible to perform a DC test by driving the press 26 of 4 at a medium speed of 2 lanes.

For example, the four IC sockets 14 in each group are paired, two each, and are directly connected by wiring, but one pair of the IC sockets 14 in each group,
For example, a pair of IC sockets 14a + 14b and I
Only the pair of C sockets 14 et 14 f is connected to the corresponding driver 16 and voltage/current measurement circuit 18 . Then, only the 2-lane press 26a*2E3c is advanced, and the IC socket 14at 14cm 1
Insert IC28 only into 4e+14g. In this way, only two ICs can be connected to each driver 16.
and the voltage/current measurement circuit 18 to perform a DC test.

After completing this DC test, each group's IC socket)
Relay contacts 20 are controlled to connect only the other pair of 14 to each driver 16 and voltage/current measurement circuit 18. In this way, the ICs inserted into the IC sockets 14c and 14g are connected to each driver 16 and the voltage/current measurement circuit 1.
8 and undergoes a DC test.

After completing this DC test, presses 2E3a and 26c are moved back and a total of 4 ICs that have completed the DC test are
is removed from the IC socket 14.

Next, press 26b, 2E for the remaining two lanes! d is advanced, and the IC sockets 14b, 14d.

IC28 is inserted only into 14f and 14h.

Among the IC sockets 14, the IC sockets 14d, 1
Only the IC 28 inserted into 4h is connected to the driver 16 and voltage/current measurement circuit 18 and subjected to a DC test.

When the DC test is finished, the relay contacts 20 are controlled so that the other pair of IC sockets 14 are connected to the driver 16 and the voltage/current measuring circuit v818, and the remaining 2b
A DC test of the IC is performed.

When the DC test is completed, the presses 26b and 26d are moved back, and a total of four ICs that have been tested are removed.

Note that in the case of a function test, the test can also be similarly performed for each pair of IC sockets that are directly connected by wiring.

Although one embodiment has been described below, the present invention is not limited thereto, and can be implemented with various modifications without departing from the gist thereof.

[Effects of the Invention] As explained above, the present invention is capable of inserting and removing ICs into and from a plurality of IC sockets of an IC tester using a press mechanism of an IC handler, and performing a function test of the ICs inserted into the IC sockets. In an IC test system in which a DC test is performed by an IC tester, a plurality of IC sockets are commonly connected to an IC drive driver in the IC tester, and in the case of a function test, a plurality of IC sockets are commonly connected to an IC drive driver in the IC tester. The IC insertion/removal operation of the press mechanism is controlled so that ICs are inserted into two or more sockets at the same time, and in the case of a DC test, the IC is selectively inserted into only one of a plurality of commonly connected IC sockets. Since the IC socket is characterized by being equipped with a means for controlling the IC insertion/removal operation by the press mechanism so that the It is possible to realize an IC test system with good cost performance that can be executed without any trouble.

[Brief explanation of the drawing]

FIG. 1 is a system configuration diagram schematically showing only the configuration of essential parts of an embodiment of an IC test system according to the present invention. 10...IC tester, 12...IC handler, 14
a ~ 14 h-I C socket, lea, 16b...
・Driver, 18 a, 18 b... Voltage and current measurement circuit, 24... Press 1! Horizontal, 26a-26d・
...Press, 28a-28h...IC, 29...Press drive control section, 30...Handler control section.

Claims (1)

[Claims] (1) ICs are inserted into and removed from multiple IC sockets of the IC tester by the press mechanism of the IC handler, and a function test of the ICs inserted into the IC sockets is performed.
An IC test system in which a C test is executed by the IC tester, wherein a plurality of the IC sockets are commonly connected to an IC driving driver in the IC tester, and in the case of a function test, a plurality of the common connections are connected. The IC insertion/extraction operation of the press mechanism is controlled so that an IC is inserted into two or more of the IC sockets at the same time, and in the case of a DC test, the IC is inserted into only one of the plurality of commonly connected IC sockets. An IC test system comprising means for controlling an IC insertion/extraction operation by the press mechanism so that ICs are selectively inserted.