JPS62273734A - Semiconductor manufacturing equipment - Google Patents

Semiconductor manufacturing equipment

Info

Publication number
JPS62273734A
JPS62273734A JP11699186A JP11699186A JPS62273734A JP S62273734 A JPS62273734 A JP S62273734A JP 11699186 A JP11699186 A JP 11699186A JP 11699186 A JP11699186 A JP 11699186A JP S62273734 A JPS62273734 A JP S62273734A
Authority
JP
Japan
Prior art keywords
hydrogen
oxygen
tube
heater
heated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11699186A
Other languages
Japanese (ja)
Inventor
Takanori Saeki
貴範 佐伯
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP11699186A priority Critical patent/JPS62273734A/en
Publication of JPS62273734A publication Critical patent/JPS62273734A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To effectively ignite hydrogen discharged into an oxygen atmosphere by piping at least an oxygen introduction tube along the wall in a core tube heated directly by a heater. CONSTITUTION:Oxygen is heated to a high temperature by means of radiation heat from the tube wall heated by a heater 16 when the oxygen flows along the inner wall of a core tube 11 heated by the heater 16 in a tube 14, and when the oxygen heated to the high temperature is discharged from an oxygen introduction tube opening 15, the temperature of the part of a hydrogen introduction tube opening 13 becomes higher than the igniting temperature of the hydrogen in the oxygen even when the heating temperature of the heater 16 is low. Thus, when the hydrogen introduced from a hydrogen introduction tube 12 is discharged from the opening 13, it is immediately ignited smoothly to generate a clean steam due to the combustion of the hydrogen and the oxygen. Thus, the combustion of the hydrogen can be smoothly and safely performed in a range of lower temperature of the furnace, and the formation of a thin oxide film due to the miniaturization of a semiconductor device and good controllability of steam process at lower temperature safely in manufacturing steps of the semiconductor device.

Description

【発明の詳細な説明】 3、発明の詳細な説明 〔産業上の利用分野〕 本発明は半導体製造装置に関し、特に水素と酸素との混
合燃焼により水蒸気を発生させ、その水蒸気により半導
体装置の酸化あるいは水蒸気処理を行う半導体製造装置
に関する。
Detailed Description of the Invention 3. Detailed Description of the Invention [Field of Industrial Application] The present invention relates to semiconductor manufacturing equipment, and in particular, the present invention relates to semiconductor manufacturing equipment, in particular, the generation of water vapor by mixed combustion of hydrogen and oxygen, and the oxidation of semiconductor devices by the water vapor. Or it relates to a semiconductor manufacturing device that performs water vapor treatment.

〔従来の技術〕[Conventional technology]

半導体装置の製造工程において、水蒸気雰囲気中での酸
化もしくは水蒸気処理を行う場合、清浄な水蒸気を得る
ために、炉芯管内で水素と酸素とを燃焼させる方法が用
いられている。
In the manufacturing process of semiconductor devices, when oxidation or steam treatment is performed in a steam atmosphere, a method of burning hydrogen and oxygen in a furnace tube is used to obtain clean steam.

この場合の炉は第2図に示すように、炉芯管21内に挿
入された水素導入管22を通して水素を導入しその水素
導入管22の開口部23から放出し、酸素導入管24か
ら酸素を導入し、その酸素導入管24の開口部25から
放出し、その水素と酸素とを炉芯管21内で混合燃焼さ
せる構造になっている。
As shown in FIG. 2, the furnace in this case introduces hydrogen through the hydrogen introduction tube 22 inserted into the furnace core tube 21, releases it from the opening 23 of the hydrogen introduction tube 22, and oxygen from the oxygen introduction tube 24. is introduced and released from the opening 25 of the oxygen introduction tube 24, and the hydrogen and oxygen are mixed and combusted within the furnace core tube 21.

まず酸素を酸素導入管開口部25から放出し、炉芯管2
1内を酸素雰囲気にした後、水素を水素導入管開口部2
3から放出すると、水素は、水素導入管開口部23が水
素の酸素中での発火点450℃を十分に超えるようにヒ
ータ26を十分に加熱しておけば、水素が放出されたと
きに、直ちにスムーズに着火し、水蒸気が発生し、炉芯
管21内は清浄な水蒸気雰囲気になる。
First, oxygen is released from the oxygen introduction tube opening 25, and the furnace core tube 2
After creating an oxygen atmosphere inside 1, hydrogen is introduced into the hydrogen introduction pipe opening 2.
When hydrogen is released from 3, if the heater 26 is sufficiently heated so that the hydrogen introduction tube opening 23 sufficiently exceeds the ignition point of hydrogen in oxygen of 450°C, when hydrogen is released, The fire ignites immediately and smoothly, steam is generated, and the inside of the furnace core tube 21 becomes a clean steam atmosphere.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

ところが、上述の酸化炉は水素導入管開口部23がヒー
タ26から離れており、また酸素導入管開口部25より
室温の酸素を放出することによる冷却効果がある。この
ため、ヒータ26を加熱した場合は水素導入管開口部2
3との間に温度勾配を生じておリ、ヒータ26による加
熱温度が低い場合、水素導入管開口部23では酸素中の
水素ガスの発火温度450℃に達しなくなる。したがっ
て、水素を放出しても、水素は直ちに着火せず、炉芯管
21内をヒータ26方向に向かって広がってゆき、水素
の発火温度以上の温度の位置まで広がった時に着火する
が、着火の時に着火するまでに炉芯管21内に広がった
水素が一瞬に爆発的に燃え、時によっては炉芯管を吹き
とばす危険性があるという重大な欠点があった・ 本発明の目的は酸素雰囲気中に放出した水素の着火を確
実に行う半導体製造装置を提供することにある。
However, in the above-mentioned oxidation furnace, the hydrogen introduction tube opening 23 is located away from the heater 26, and there is a cooling effect by releasing room temperature oxygen from the oxygen introduction tube opening 25. Therefore, when the heater 26 is heated, the hydrogen introduction tube opening 2
If the heating temperature by the heater 26 is low, the ignition temperature of hydrogen gas in oxygen will not reach 450°C at the hydrogen introduction tube opening 23. Therefore, even when hydrogen is released, the hydrogen does not ignite immediately, but spreads inside the furnace core tube 21 toward the heater 26, and ignites when it spreads to a position where the temperature is higher than the ignition temperature of hydrogen, but ignites. There is a serious drawback in that the hydrogen that has spread inside the furnace core tube 21 before igniting at the time of ignition explodes in an instant, and there is a danger that the furnace core tube may be blown away in some cases. An object of the present invention is to provide a semiconductor manufacturing apparatus that reliably ignites hydrogen released into the atmosphere.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は炉芯管と、該炉芯管内に挿入された酸素導入管
及び水素導入管と、前記炉芯管を加熱させるヒータとを
有し、少なくとも前記酸素導入管を、ヒータにより直接
加熱される前記炉芯管内の管壁に沿って配管したことを
特徴とする半導体製造装置である。
The present invention includes a furnace core tube, an oxygen introduction tube and a hydrogen introduction tube inserted into the furnace core tube, and a heater that heats the furnace core tube, and at least the oxygen introduction tube is directly heated by the heater. The semiconductor manufacturing apparatus is characterized in that piping is arranged along a tube wall in the furnace core tube.

〔実施例〕〔Example〕

以下、本発明の一実施例を図により説明する。 Hereinafter, one embodiment of the present invention will be described with reference to the drawings.

第1図(a) 、 (b)において、炉芯管11の外周
にはヒータ16が設置され、炉芯管1内の管端には水素
を供給する水素導入管12と、酸素を供給する酸素導入
管14とが設けられている。本発明は炉芯管11内の長
手方向に酸素導入管14を延長し、外部ヒータ16にて
直接加熱される炉芯管11の内壁に沿ってこれを配管し
、さらに折反して酸素導入管14の開口部15を水素導
入管12の開口部13と向き合せに設けたものである。
In FIGS. 1(a) and 1(b), a heater 16 is installed on the outer periphery of the furnace core tube 11, and a hydrogen introduction tube 12 for supplying hydrogen and a hydrogen introduction tube 12 for supplying oxygen are installed at the tube ends within the furnace core tube 1. An oxygen introduction pipe 14 is provided. The present invention extends the oxygen introduction tube 14 in the longitudinal direction inside the furnace core tube 11, connects it along the inner wall of the furnace core tube 11 that is directly heated by an external heater 16, and then bends the oxygen introduction tube 14. The opening 15 of 14 is provided facing the opening 13 of the hydrogen introduction pipe 12.

本発明によれば、ヒータ16に加熱される炉芯管11の
内壁に沿って酸素は管14内を流れる際にヒータ16に
て加熱された管壁から輻射熱をうけて高温に加熱され、
その高温に加熱された酸素を酸素導入管開口部15より
放出することによりヒータ16の加熱温度が低い場合で
も水素導入管開口部13部分の温度が酸素中での水素の
発火温度より高くなり、水素導入管12から導入された
水素が水素導入管開口部13から放出された時に直ちに
スムーズに着火し、水素と酸素の燃焼による清浄な水蒸
気が発生する。
According to the present invention, while oxygen flows through the tube 14 along the inner wall of the furnace core tube 11 heated by the heater 16, it receives radiant heat from the tube wall heated by the heater 16 and is heated to a high temperature.
By discharging the heated oxygen from the oxygen introduction tube opening 15, even when the heating temperature of the heater 16 is low, the temperature at the hydrogen introduction tube opening 13 becomes higher than the ignition temperature of hydrogen in oxygen. When the hydrogen introduced from the hydrogen introduction pipe 12 is released from the hydrogen introduction pipe opening 13, it is immediately and smoothly ignited, and clean water vapor is generated by combustion of hydrogen and oxygen.

第1図(b)は本発明の一実施例のヒータによる加熱部
分の第1図(a)のA−A線断面図である。本実施例で
は、ヒータ16による加熱効果を高めるため、酸素導入
管14を酸素導入管開口部15の口径より太くし、さら
に、半導体基板の炉芯管内への出入りを妨げないために
炉芯管11の上内壁に取り付けたものである。
FIG. 1(b) is a sectional view taken along the line A--A in FIG. 1(a) of a portion heated by a heater according to an embodiment of the present invention. In this embodiment, in order to enhance the heating effect by the heater 16, the oxygen introduction tube 14 is made larger in diameter than the oxygen introduction tube opening 15, and furthermore, in order not to obstruct the entry and exit of the semiconductor substrate into the furnace core tube, the oxygen introduction tube 14 is made larger in diameter than the oxygen introduction tube opening 15. It is attached to the upper inner wall of No. 11.

本実施例では、酸素の導入管を炉芯管のヒータの加熱部
分を通したが、この他に、水素の導入管を炉芯管のヒー
タによる加熱部分を通すことによっても、酸素の導入管
と水素の導入管の両方を炉芯管のヒータによる加熱部分
を通すことによっても同等の効果が得られる。
In this example, the oxygen introduction tube was passed through the heated part of the heater of the furnace core tube, but it is also possible to pass the hydrogen introduction pipe through the heated part of the furnace core tube by the heater. The same effect can be obtained by passing both the hydrogen and hydrogen inlet tubes through the heated portion of the furnace core tube.

〔発明の効果) 以上詳細に説明したように本発明によれば、炉のより温
度の低い範囲でスムーズかつ安全な水素の燃焼が可能に
なり、半導体装置の微細化に伴う薄酸化膜の形成や、半
導体装置製造工程において、より低温で水蒸気処理を制
御性良く、安全に行うことができる効果がある。
[Effects of the Invention] As explained in detail above, according to the present invention, hydrogen can be burned smoothly and safely in the lower temperature range of the furnace, and the formation of thin oxide films accompanying miniaturization of semiconductor devices can be achieved. Also, in the semiconductor device manufacturing process, there is an effect that water vapor treatment can be performed safely and with good controllability at a lower temperature.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(a)は本発明の半導体装置製造装置の縦断面図
、(b)は第1図(a)のA−A線断面図、第2図は従
来装置を示す縦断面図である。 11・・・炉芯管、12・・・水素導入管、13・・・
水素導入管開口部、14・・・酸素導入管、15・・・
酸素導入管開口部、16・・・ヒータ
FIG. 1(a) is a longitudinal cross-sectional view of a semiconductor device manufacturing apparatus of the present invention, FIG. 1(b) is a cross-sectional view taken along line A-A in FIG. 1(a), and FIG. 2 is a longitudinal cross-sectional view showing a conventional apparatus. . 11... Furnace core tube, 12... Hydrogen introduction tube, 13...
Hydrogen introduction pipe opening, 14...Oxygen introduction pipe, 15...
Oxygen introduction pipe opening, 16... heater

Claims (1)

【特許請求の範囲】[Claims] (1)炉芯管と、該炉芯管内に挿入された酸素導入管及
び水素導入管と、前記炉芯管を加熱させるヒータとを有
し、少なくとも酸素導入管をヒータにより直接加熱され
る前記炉芯管内の管壁に沿って配管したことを特徴とす
る半導体製造装置。
(1) It has a furnace core tube, an oxygen introduction tube and a hydrogen introduction tube inserted into the furnace core tube, and a heater that heats the furnace core tube, and at least the oxygen introduction tube is directly heated by the heater. A semiconductor manufacturing device characterized by piping running along a tube wall within a furnace core tube.
JP11699186A 1986-05-21 1986-05-21 Semiconductor manufacturing equipment Pending JPS62273734A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11699186A JPS62273734A (en) 1986-05-21 1986-05-21 Semiconductor manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11699186A JPS62273734A (en) 1986-05-21 1986-05-21 Semiconductor manufacturing equipment

Publications (1)

Publication Number Publication Date
JPS62273734A true JPS62273734A (en) 1987-11-27

Family

ID=14700771

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11699186A Pending JPS62273734A (en) 1986-05-21 1986-05-21 Semiconductor manufacturing equipment

Country Status (1)

Country Link
JP (1) JPS62273734A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63201329U (en) * 1987-06-18 1988-12-26

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63201329U (en) * 1987-06-18 1988-12-26

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