JPS6226736B2 - - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION Technical Field of the Invention The present invention relates to a maintenance diagnosis method for an information processing system, and in particular to an optimal test program or diagnosis program (hereinafter collectively referred to as maintenance program) that minimizes system downtime when a failure occurs. This method relates to a method for automatically creating a system (called ``Diagnosis'') and performing maintenance diagnosis.

Background of the Technology Conventional maintenance diagnostic methods aim to improve maintenance performance of maintenance programs, that is, failure detection rate,
Improving the detection rate, precision rate, and shortening execution time are the main concerns during design, and there are almost no systemization techniques that take advantage of the maintenance performance of maintenance programs and utilize them effectively. It was never considered. For this reason, the order in which equipment is tested when a system goes down is based on relatively simple rules, and there are no rational standards that can minimize the average downtime of the information processing system being maintained. .

OBJECT AND CONFIGURATION OF THE INVENTION An object of the present invention is to provide a system for maximizing the performance of a maintenance program included in a test diagnosis system.
The object of the present invention is to provide a means for calculating inspection parameters of each subsystem, creating an execution sequence of test units most suitable for the configuration of a system to be maintained, and executing maintenance diagnosis.

The present invention achieves the above object by arranging and executing test units of a maintenance diagnosis system corresponding to subsystems (units) of a system to be maintained in descending order of failure rate/required inspection time. Its configuration consists of a group of test units created from a set of test units that target each subsystem, and inspection parameters in a system that performs test diagnosis by dividing the system to be maintained into multiple subsystems suitable for maintenance. Inspection parameter calculation that calculates, for each subsystem, an inspection parameter that represents the ratio between the basic data of the subsystem and the failure rate of the subsystem and the required inspection time required to execute the test unit of the subsystem based on the basic data. an inspection parameter sorting section that arranges the inspection parameters in order of size; and an editing execution section that orders the corresponding test units according to the arrangement of the inspection parameters and edits a group of test units according to the order. The present invention is characterized in that it comprises a group of edited test units, and diagnoses a system to be maintained in accordance with the order of the group of edited test units.

Embodiments of the Invention Before describing embodiments of the present invention, symbols and definitions of terms used therein are shown below.

Subsystem Si: Maintenance unit of the system to be maintained.
For example, a unit such as a card that can be replaced in the event of a failure.

Test unit Ti: A collection (subset) of tests that test the subsystem Si.

Failure rate Fi: Failure rate of subsystem Si.

Required inspection time Ci: Time required to inspect subsystem Si. In other words, whether Si is malfunctioning or
Or the time required to determine whether it is normal.

Inspection parameter Pi: Value of Fi/Ci.

FIG. 1 shows the relationship among Si, Ti, Fi, and Ci.

Next, embodiments of the present invention will be described with reference to FIGS. 2 to 4.

FIG. 2 is an overall configuration diagram of the embodiment system. In the figure, 1 is a test data set, which represents a set of test units Ti. 2 is the basic data for calculating the inspection parameter Pi,
Contains {Si, Fi, Ci}. 3 is a maintenance program editing processing device according to the present invention, and 4 is a test unit.
5 is an editing execution unit for test unit Ti; 6 is an edited execution maintenance program; 7
is the system to be maintained. Further, 8 is an inspection parameter calculation section, 9 is an inspection parameter list of the calculation results, 10 is an inspection parameter sorting section, 1
1 is an execution order list of sorted results, which gives the test order of the subsystem Si, that is, the execution order of the test unit Ti.

3a to 3e show the input data, work table, intermediate result list used in the system of FIG. 2, and the format of the output execution maintenance program.

FIG. 3a is a correspondence table of test number ti, failure rate Fi, and required inspection time Ci, which is the basis for calculating the inspection parameter Pi.

Figure b is a table in which the results of calculating the inspection parameters Pi are associated with the tests Ti.

Figure c is a correspondence table between execution order 1 and test number Ti'.

Figure d shows the format of a set of test units Ti (test data set) written in the maintenance program.

Figure e shows the format of the execution maintenance program that realizes downtime minimization, edited according to the embodiment. ti is the test number of the execution order i, Ti is the test execution part of the execution order i, and i=0 represents the control part.

Maintenance program editing processing device 3 in Fig. 2
The function of subsystem Si of system 7 to be maintained is
The maintenance program is divided into test units Ti corresponding to It is for editing. Therefore, the execution order execution unit 4 creates inspection parameters for each subsystem using the inspection parameter basic data 2, arranges them in order of magnitude, and creates selection order information for the test unit Ti. 5 performs editing processing to create one array for Ti of test data set 1 using the selection order information.

FIG. 4 is a flow diagram showing the processing procedure of the system of this embodiment. In the same figure, Steps 1 to 3 are
The procedure for determining the order in which each test unit Ti is written into the maintenance program, that is, the arrangement of test numbers ti when all tests of the maintenance program are executed continuously, will be described.

Steps 4 to 13 follow the sequence of test number ti.
Each test number ti and the corresponding test part (unit) Ti,
The procedure for writing to maintenance program media is shown below.

Hereinafter, based on FIG. 4, a maintenance program editing process for realizing downtime minimization according to the present invention will be explained.

[Step 1] Read the collection 2 of records consisting of the basic data of inspection parameters, that is, the test number ti to be incorporated into the maintenance program, the failure rate Fi of the part to be tested, and the required inspection time Ci.

[Step 2] Calculate the inspection parameter Pi (=Fi/Ci) from each read Fi and Ci, and create a table in the format shown in Figure 3b.

[Step 3] Based on the table created in Step 2, test numbers ti are arranged in descending order of the value of the inspection parameter Pi (order when the maintenance program is executed). At this time, the execution order is also added and a table in the format shown in FIG. 3c is created.

[Step 4] As initial settings, set execution order (writing order) = 0 and ti' = 0. Here, “0”
is the value corresponding to the control section. Furthermore, ti′ is a test number when the inspection parameters are arranged in ascending order of their values.

[Steps 5 to 7] This is a procedure for writing the control unit into the maintenance program medium. Read the test data set 1 (format shown in FIG. 3d), find the test number to corresponding to the control section, and write the test number to and the control section to into the maintenance program.

[Step 8] Steps 8 to 13 show a procedure for writing tests (units) in the maintenance program medium in descending order of inspection parameter values.

That is, in Step 8, the execution order is increased by "1".

[Step9] Table created in Step3 (Figure 3c)
From there, a test number ti' having the same rank as the updated value is retrieved and set.

[Step10~11] Load the test data set,
Find the test with the same test number as ti′.

[Step 12] Write the test number found in Steps 10 to 11 and the corresponding test execution part (unit) to the maintenance program medium.

[Step 13] The processes of Steps 8 to 12 are repeated until =n (total number of test units: excluding the control unit) is completed.

By completing the above steps, the maintenance program (Fig. 3e) is completed.

Next, a method of applying the maintenance program created according to the present invention will be described below.

a Test method As for the test method for the maintenance program based on the present invention, a scan-in/scan-out method is more suitable than a functional test method that uses the normal functions of the target system, in which test signals are input to arbitrary locations and results are retrieved. There is. In the functional testing method, the order of test execution is often determined by the functions of the target system, so the degree of freedom in setting the order of test execution using this editing method is small, and the effect of reducing downtime is not small.

b Setting the subsystem/test input/result output location Set the subsystem to the device or its replacement unit.

That is, test units are also divided corresponding to subsystem units, so that input and output can also be performed in subsystem units. This directly provides the benefit of minimizing downtime.

c. Setting/updating inspection parameters or their basic data If inspection parameters or their basic data can be updated using the editing program itself, inspection parameters can be easily optimized.

Also, these parameters or data,
By configuring the settings for each individual user system, downtime for each individual system can be minimized.

d. Test Selection at Execution A test ranking table is incorporated into the maintenance program, and at execution, tests can be sequentially selected and executed in descending order of inspection parameter values.

In this case, it is assumed that the total test selection time is sufficiently smaller than the total inspection time (maintenance program execution time).

Effect of the invention a: If the maintenance program is edited using this formula,
The capabilities of the maintenance program are maximized, and downtime of the system being maintained can be minimized. Thereby, it is possible to improve the operating rate of the system to be maintained and the efficiency of its maintenance work.

b. Improvements to longer maintenance program execution times The maintenance program execution time tends to be longer due to the increase in the capacity of internal storage devices such as main storage and central processing units. time).

c Effective application conditions The maintenance program edited by this method can be used particularly effectively when the inspection time is longer than the repair time and the maintenance program execution time accounts for a large proportion of the inspection time.

[Brief explanation of the drawing]

Fig. 1 is an explanatory diagram of the relationship between subsystems and test units of the system to be maintained, Fig. 2 is a configuration diagram of an embodiment of the present invention, and Figs. 3 a to e are explanatory diagrams showing processing data of each part of this embodiment. , FIG. 4 is an explanatory diagram of the operating procedure of this embodiment. In Figure 2, 1 is a set of test units, 2 is basic data of inspection parameters, 3 is a maintenance program editing processing device, 4 is an execution order determining unit, 5 is an editing execution unit, 7 is a system to be maintained, and 8 is an inspection unit. The parameter calculation section 10 represents an inspection parameter sorting section.

Claims (1)

[Claims] 1. In a system in which a system to be maintained is divided into multiple subsystems suitable for maintenance and tested and diagnosed, a group of test units created by a collection of test units that target each subsystem and the basis of inspection parameters. an inspection parameter calculation unit that calculates for each subsystem an inspection parameter representing a ratio between the data and the failure rate of the subsystem and the required inspection time required to execute a test unit of the subsystem based on the basic data; , an inspection parameter sorting unit that arranges the inspection parameters in order of size; and an inspection parameter sorting unit that orders the corresponding test units according to the arrangement of the inspection parameters;
and an editing execution unit that edits a group of test units according to the order, and performs diagnosis of a system to be maintained according to the order using the edited group of test units. System maintenance diagnosis method.