JPS59748A - Maintenance diagnosis system in information processing system - Google Patents

Abstract

PURPOSE:To improve the operating rate of a system to be maintained and the efficiency of maintenance, by arranging the maintenance diagnostic system test unit corresponding to a subsystem to be maintained in the descending order from the maximum failure rate/required inspection time. CONSTITUTION:A maintenance program edit processor 3 edits a maintenance program in the descending order of failure rate/required inspection time for the test unit corresponding to a subsystem of the maintenance objective system 7, i.e., the order of the efficient test unit having high possiblity of failure detection to the time required for the failure detection. An excution order determining section 4 uses a basic data 2 of an inspection parameter for forming the inspection parameter at each subsystem, allowing to arrange it in the descending order and to form the selecting order information of the test unit. An editing executing section 5 performs the editing processing using the selecting order information and forming one arrangement as to a test data set 1.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a maintenance diagnosis method for an information processing system.
The present invention relates to a method for performing maintenance diagnosis by automatically creating an optimal test program or diagnosis program (hereinafter collectively referred to as a maintenance program) that minimizes system downtime when a failure occurs.

Background of the technology Conventional maintenance diagnosis methods focus on improving the maintenance performance of maintenance programs, that is, improving the failure detection rate.

Improving the detection rate, precision rate, and shortening execution time are the main concerns during design, and there are almost no systemization techniques that take advantage of the maintenance performance of maintenance programs and utilize them effectively. It was never considered. For this reason, the order in which equipment is tested when a system goes down has been based on relatively simple rules, and there has been no rational standard for minimizing the average downtime of the information processing system being maintained.

OBJECTS AND CONFIGURATION OF THE INVENTION An object of the present invention is to maximize the performance of a maintenance program included in a test diagnosis system.

The object of the present invention is to provide a means for calculating inspection parameters of each subsystem, creating an execution sequence of test units most suitable for the configuration of a system to be maintained, and executing maintenance diagnosis.

The present invention achieves the above object by arranging and executing test units of a maintenance diagnostic system corresponding to subsystems (units) of a system to be maintained in descending order of failure rate/required inspection time. Yes, its composition is as follows:
In a system in which a system to be maintained is divided into multiple subsystems suitable for maintenance and testing and diagnosis is performed, a set of test units that test each subsystem.The group of test units created and the basis of one inspection parameter. Data Description An inspection parameter calculation unit that calculates, for each subsystem, an inspection parameter that represents the ratio between the failure rate of the subsystem and the required inspection time required to execute a test unit of the subsystem; An inspection parameter sorting section that arranges the inspection parameters in order of size, and orders the corresponding test units according to the arrangement of the inspection parameters.

The present invention is characterized in that it includes an editing execution unit that edits a group of test units according to the order, and executes diagnosis of a system to be maintained according to the order using the edited group of test units.

Prior to a detailed explanation of the present invention, symbols and definitions of terms used therein will be shown below.

Maintenance unit of subsystem Si + maintenance target system. For example, a unit such as a card that can be replaced in the event of a failure.

Test unit Ti: A collection (subset) of tests that test the subsystem Si.

Failure rate Fi + failure rate of subsystem Si. □
Required inspection time C The time required to inspect the mini subsystem Si. Namely.

Is the Si defective? before determining whether it is normal. It takes time.

Value of inspection parameter pi + Fi / Ci.

FIG. 1 shows the relationship among Si, Ti, Fi, and Ci.

Next, the present invention will be explained in detail with reference to FIGS. 2 to 4.

FIG. 2 is an overall configuration diagram of the embodiment system.

In the figure, 1 is a test data set.

Represents a set of test units Ti. 2 is the inspection parameter P
This is basic data for calculating i, and (Si.

Contains Fi, Ci J. 3 is a maintenance program editing processing device according to the present invention; 4 is a test unit Ti execution order determining unit; 5 is an editing execution unit for the test unit Ti; 6 is an edited execution maintenance program; and 7 is a maintenance target system. Further, 8 is an inspection parameter calculation unit, and 9 is an inspection parameter list of the calculation results.

Reference numeral 10 denotes an inspection parameter sorting unit, and 11 an execution order list of sorted results, which provides the test order of the subsystem Si, that is, the execution order of the test unit Ti.

3(d) to <11> show the formats of the input data 9 work table used in the system of FIG. 2, the intermediate result list, and the output execution maintenance program.

Figure 3 (σ) shows the test number ti, the failure rate Fi, and the required inspection time C, which are the basis for calculating the two inspection parameters Pi.
This is a correspondence table for i.

FIG. 4B is a table in which the results of calculating the nine inspection parameters Pi are associated with the tests Ti.

FIG. 4(C) is a correspondence table between execution order I and test number til.

In the same figure (F is the test unit T written in the maintenance program.
The format of the set of i (test data set) is shown.

Figure <e> shows the format of the execution maintenance program that realizes downtime minimization, edited by the embodiment. Ti
The test number of the execution order i, Ti is the test execution part of the execution order i, and 1=c) represents the control part.

Maintenance program editing processing device 30 m capacity u in Figure 2
, test corresponding to subsystem Si of maintenance target system 7) Unit Ti wo.

The maintenance program is edited in the order of [failure rate Fi/required inspection time Ci], that is, in the order of efficient test units that have a high possibility of detecting a failure with respect to the time required for failure detection. Therefore, using the basic data 2 of the 4-digit 9-inspection parameters of the execution order determining section, inspection parameters are created for each subsystem, arranged in order of magnitude, and processing is performed to create selection order information for the test units Ti.

The editing execution unit 5 uses the selection order information to perform editing processing to create one array for Ti of the test data set 1.

FIG. 4 is a flow diagram showing the processing procedure of the system of the second embodiment. In the figure, 5steps 1 to 3 are as follows.

The order in which each test unit Ti is written to the maintenance program.

That is, the procedure for determining the sequence of test numbers ti when all tests of the maintenance program are executed continuously will be shown.

5steps 4 to 13 follow the sequence of test number ti.

Each test number ti and the corresponding test part (unit) Ti.

The procedure for writing to maintenance program media is shown below.

Hereinafter, a maintenance program editing process for realizing downtime minimization according to the present invention will be explained based on FIG.

(5tep1) Read the collection 2 of records consisting of the basic data of inspection parameters, that is, the test number ti to be incorporated into the maintenance program, the failure rate Fi of the part to be tested, and the required inspection time Ci.

[5tep2] Calculate the 1-inspection parameter Pi (=Fi /Ci) from each read Fi and Ci, and
Create a table in the format shown in b).

(5tttp 3 ) 5tttp Based on the table created in step 2, the test numbers ti are arranged in descending order of the values of the 9 inspection parameters Pi (order when the maintenance program is executed). At this time, a table in the format shown in FIG. 3(C) is created, including the execution order l.

(St##4) As initial settings, set execution order (writing order) l=o, ti'=o. Here, “O
” is a value corresponding to the control unit. In addition, fi+ is a test number when the inspection parameters are arranged in descending order of value.

[5tep 5-7] This is a procedure for writing the control unit into the maintenance program medium. Test data set 1 (Figure 3 (a)
format), find the test number of to that corresponds to the control section, and use the test number to and the control section te as maintenance 7.
'Write to ψ-gram.

C5tttp8) 5tttp8 to 13 show the procedure for writing tests (units) into the maintenance program medium in descending order of the value of the 2-inspection parameter.

That is, in 5tep8, the execution order is increased by 1t-"1".

C5tep 9) From the table created in step 3 (FIG. 3(C)), take out and set the test number ti1 having the same rank as the updated I.

(5tttp 1o-11) Read test data set.

ti'1 Find a test with the same test number.

(5tep 12) Write the test number found in 5tep 10 to 11 and the corresponding test execution part (unit) to the maintenance program medium.

(5tep 13) 5tep 8-12 (7) Section 3
1. Repeat steps I=n (total number of test units: excluding the control section) until completed.

By completing the above 5 steps, the maintenance program (Fig. 3(e)) is completed.

Next, a method of applying the maintenance program created according to the present invention will be described below.

σ, Test method The maintenance program testing method based on the present invention is as follows.

The scan-in/scan-out method, which inputs test signals to arbitrary locations and extracts the results, is more suitable than the functional test method that uses the normal functions of the target system. In the functional testing method, the test execution order is often determined by the functions of the target system, so the degree of freedom in setting the test execution order using the 9-editing method is small, and the effect of reducing downtime is small.

b. Setting the subsystem/test input/result output location Set the subsystem to the device or its replacement unit.

That is, the test unit is divided corresponding to the subsystem unit, so that input and output can also be performed on a subsystem basis. This directly provides the benefit of minimizing downtime.

Setting/updating C0 inspection parameters or their basic data Inspection parameters I would like to make it possible to update the basic data using the 9 editing program itself.

Inspection parameters can be easily optimized.

Furthermore, if these parameters or data are set for each of the nine user systems, downtime for each individual system can be minimized.

d. Test selection at execution time A test ranking table can be incorporated into the maintenance program, and tests can be sequentially selected and executed in descending order of inspection parameter values at execution time.

In this case, the total test selection time is the total inspection time (
It is assumed that the execution time of the maintenance program is sufficiently short compared to K.

Effect of the invention Edit the maintenance program using the a1 formula.

The capabilities of the maintenance program are maximized.

It is possible to minimize the downtime of the system to be maintained. Thereby, it is possible to improve the operating rate of the system to be maintained and the efficiency of its maintenance work.

b. Improvements to the longer maintenance program execution time The maintenance program execution time tends to be longer due to the increase in the capacity of internal storage devices such as main storage and central processing units. (execution time) can be reduced.

C1 Effective Application Conditions When the inspection time is longer than the repair time and the maintenance program execution time accounts for a large proportion of the inspection time, the one-line method of editing and careful maintenance programs can be used particularly effectively.

[Brief explanation of the drawing]

Fig. 1 is an explanatory diagram of the relationship between subsystems and test units of the system to be maintained, Fig. 2 is a configuration diagram of an embodiment of the present invention, and Fig. 3 <a> to <it> are processing data of each part of this embodiment. FIG. 4 is an explanatory diagram of the operating procedure of this embodiment. In Figure 2, 1 is a set of test units, 2 is basic data of inspection parameters, 3 is a maintenance program editing processing device, and 4 is a set of test units.
5 is an execution order determining unit, and 5 is an editing execution unit. 7 is the system to be maintained, 8 is the inspection/(rammeter calculation section,
10 represents the inspection parameter sorting section O patent applicant
Fujitsu Ltd. Representative Patent Attorney Necessity Hiroshi Fumi (1 other person) Talented and brilliant? 121 Procedural amendment (method) % formula % 1゜Indication of case 1982 patent application No. 1x69rOf2
, Title of the invention Maintenance diagnosis method for information processing systems 3, Relationship with the amendment person case Patent applicant address 1015 Kamiodanaka, Nakahara-ku, Yozaki-shi, Kanagawa Name (522) Takuma Yamamoto, Representative of Fujitsu Limited 4. Date of dispatch by the agent: September 28, 1980. Written amendment to the procedure for procedure 4 (spontaneous): October 25, 1980. Commissioner of the Patent Office: Kazuo Wakasugi. 1. Indication of the case: Special Fraud Application No. 110970 of 1980. No. 2, Title of the invention Maintenance diagnosis method for information processing system 6
3. Relationship with the case of the person making the amendment Patent applicant address: 1015 Kamiodanaka, Nakahara-ku, Yozaki City, Kanagawa Prefecture Name (522) Fujitsu Limited Representative Taku Makoto Yamaki) Name (8714) Patent attorney required or not Fumihiro (
(1 other person) 5. Number of inventions increased by amendment None 6
, Subject of amendment "Claims and Detailed Description of the Invention Column" B Contents of Amendment Contents of Amendment (1) The Scope of Claims column is amended as follows. ``In a system in which a system to be maintained is divided into multiple subsystems suitable for maintenance and tested and diagnosed, a test unit created by a set of test units that targets each subsystem and a test unit of the subsystem. An inspection parameter calculation unit that calculates for each subsystem an inspection parameter representing the ratio of the inspection time required for execution, an inspection parameter sorting unit that arranges the inspection parameters in order of size, and an arrangement of the inspection parameters. and an editing execution unit that orders corresponding test units according to the order, and edits a group of test units according to the order. Diagnosis of the system to be maintained is performed according to the order using the edited group of test units. (2) In the bottom line of page 3 of the specification, ``Description of data and failure rate of the subsystem and the rate of failure'' is defined as [data]. Based on the basic data, the failure rate of the subsystem is corrected. that's all.

Claims (1)

[Claims] In a system in which a system to be maintained is divided into a plurality of subsystems suitable for maintenance and tested and diagnosed, a group of test units created by a set of test units in which each subsystem is a test target. and. Description regarding "basic data of inspection parameters" Inspection parameter calculation unit that calculates inspection parameters for each subsystem that represent the ratio between the failure rate of the subsystem and the required inspection time required to execute the test unit of the subsystem , an inspection parameter sorting unit that arranges the inspection parameters in order of size, and an editing execution unit that orders the corresponding test units according to the arrangement of #inspection parameters and edits the group of test units according to the order, ! ! *A maintenance diagnosis method for an information processing system characterized by executing diagnosis of a system to be maintained according to the order of a group of nine edited test units.