JPS62232157A - Image sensor - Google Patents

Image sensor

Info

Publication number
JPS62232157A
JPS62232157A JP61074153A JP7415386A JPS62232157A JP S62232157 A JPS62232157 A JP S62232157A JP 61074153 A JP61074153 A JP 61074153A JP 7415386 A JP7415386 A JP 7415386A JP S62232157 A JPS62232157 A JP S62232157A
Authority
JP
Japan
Prior art keywords
charge
signal
electrode
vertical transfer
signal charge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61074153A
Other languages
Japanese (ja)
Other versions
JPH0695572B2 (en
Inventor
Masatoshi Tabei
田部井 雅利
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Holdings Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Priority to JP61074153A priority Critical patent/JPH0695572B2/en
Priority to US07/033,376 priority patent/US4763198A/en
Publication of JPS62232157A publication Critical patent/JPS62232157A/en
Publication of JPH0695572B2 publication Critical patent/JPH0695572B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/71Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/713Transfer or readout registers; Split readout registers or multiple readout registers

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)

Abstract

PURPOSE:To improve sensitivity and resolution and to implement high density, by alternately arranging a plurality of light receiving elements and vertical transfer CCDs, which are aligned along the direction of a column, injecting signal charge in a substrate by pairs of MOS electrodes, which are scanned by a horizontal transfer control part, and reading the charge. CONSTITUTION:Signal charge, which is stored in a light receiving part 1, is simultaneously transferred to a vertical transfer CCD as the total picture elements during a part of a vertical blanking period. The signal charge, which is moved to the vertical transfer CCD, is sent to pairs of MOS electrodes 3 at the standard scanning speed of television. At this time, a signal for one scanning in the vertical direction is sequentially transferred downward in parallel with other signals. At the same time when a gate electrode 9 is cut OFF, only an electrode 31, in which the signal charge is stored, is set at an L level. The signal charge is moved to a part beneath another electrode 32. When the electrodes 32 are sequentially scanned by a horizontal shift register 5, the charge is injected in a substrate 6. The charge is taken out as a video signal in one horizontal direction through a circuit 8.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明はイメージセンサ−に関する。更に詳述すれば、
周知のCI D (Charge 1njection
 device )に於る欠点を補って高感度が得られ
、かつ高密度に集積できるイメージセンサ−に関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to an image sensor. To be more detailed,
The well-known CI D (Charge 1 injection
The present invention relates to an image sensor that can compensate for the shortcomings of conventional devices, provide high sensitivity, and can be integrated at high density.

(従来技術〉 従来より、エリア・イメージ・センサーとして、X−Y
アドレス方式のCI D−?I L T (1nter
 1inetransfer )方式 CCDやF’T
CCDが知られている。
(Conventional technology) Conventionally, as an area image sensor, X-Y
Addressing method CI D-? I L T (1nter
1inetransfer) method CCD or F'T
CCD is known.

CIDは、基本的に、各交点に近接するMO8tm 極
対がX−Yアドレスのマトリクスで構成されており、X
およびYの選択電極の下の反転層の中に入射光社に比例
した像電荷を蓄積し、XおよびYが同時に指定された時
のみこの電荷を基板内に注入してビデオ信号として外部
に取り出している。
CID basically consists of a matrix of X-Y addresses with MO8tm pole pairs close to each intersection, and
An image charge proportional to the incident light beam is accumulated in the inversion layer under the selection electrode of ing.

(発明が解決しようとする問題点) しかしながら、従来のCIDは受光部及び電荷注入部が
同じに形成されており、素子面がボIJSiで覆われて
いたため、光の透過率の関係で感度が悪く、特に青の感
度の低下が全体の感度を制限していた。また、光電荷が
基板内に注入される再結合過程には数10〜数100t
rsJ度かかり、従って連続して発生する電荷は隣りの
画素へ拡散してクロストークを多く生じた、 一方、ILT方式は、水平画素数を多くすると高周波駆
動に限界が出るため、例えばデュアル手ヤンネルCCD
により電荷を割り振って読み出す等の方法が工夫された
。しかしこの方法は電荷の割り振りが複雑になるという
欠点を有した。
(Problems to be solved by the invention) However, in the conventional CID, the light receiving part and the charge injection part are formed in the same way, and the element surface is covered with void IJSi, so the sensitivity is low due to the light transmittance. Poor sensitivity, especially for blue, limited overall sensitivity. In addition, the recombination process in which photocharges are injected into the substrate requires tens to hundreds of tons.
rsJ degrees, and therefore, the continuously generated charges diffused to adjacent pixels, causing a lot of crosstalk. On the other hand, in the ILT method, increasing the number of horizontal pixels puts a limit on high frequency drive, so for example, dual-hand channel CCD
Therefore, methods such as allocating charges and reading them were devised. However, this method has the disadvantage that charge allocation becomes complicated.

本発明の目的は、感度が向上できると共に水平解像力も
上昇できて高密度化が得られるイメージセンサ−を提供
することにある・ (問題点を解決するための手段及び作用)すなわち、本
発明の上記目的は、列方向に沿って配列された複@モリ
の受光素子及び垂直転送CCDが交互に配置されており
、前記垂直転送CCDの出力側にはゲート電極を介しか
つ水平転送制御部により走査されるMO8電極対が各素
子列に対応して水平方向に配置され、信号電荷が前記M
O8電極対により基板内に注入されて読み出されろイメ
ージセンサーにより達成される。
An object of the present invention is to provide an image sensor that can improve sensitivity, increase horizontal resolution, and achieve high density. The above purpose is to have multiple photodetectors arranged along the column direction and vertical transfer CCDs arranged alternately, and to the output side of the vertical transfer CCDs, a scanning MO8 electrode pairs are arranged horizontally corresponding to each element column, and signal charges are
A pair of O8 electrodes is injected into the substrate and read out by the image sensor.

(実施例) 以下、本発明によるイメージセンサ−の実施例を図面に
基づいて詳説する・ 第1図に示す1実施例は、受光部1及び垂直転送部2が
通常のインターラインCCり(ILCCD)と同一構成
からなっている。すなわち、列方向に沿って配列された
複数個の受光素子からなる受光部と垂直転送CCDとが
交互に配置された構成を有しており、前記垂直転送CC
Dは4相駆動されろO なお、図に於て、前記受光部1及び垂直転送部2は簡略
化したブロックにより示されCいる。
(Embodiment) An embodiment of the image sensor according to the present invention will be explained in detail below based on the drawings. In one embodiment shown in FIG. ) has the same structure. In other words, it has a structure in which a light receiving section consisting of a plurality of light receiving elements arranged along a column direction and a vertical transfer CCD are arranged alternately, and the vertical transfer CCD
D is driven in four phases. In the figure, the light receiving section 1 and the vertical transfer section 2 are shown as simplified blocks.

前記垂直CCDの出力端には水平方向に沿って延びたM
O8電極対3が配置されている。前記MO8電極対3は
各画素列に共通のポリ・シリコン電極31と、@l1r
ii素列毎に独立したポリ・シリコン電極32とからな
り、前記各画素列毎に独立した電極32は更にアルミ線
4を介して水平シフトレジスタ5と接続されている6 また、基板6には増幅器7を含む読み出し回路8が設け
られている。
At the output end of the vertical CCD, there is an M extending along the horizontal direction.
An O8 electrode pair 3 is arranged. The MO8 electrode pair 3 includes a polysilicon electrode 31 common to each pixel column and @l1r
ii Each pixel column is composed of an independent polysilicon electrode 32, and the independent electrode 32 for each pixel column is further connected to a horizontal shift register 5 via an aluminum wire 4. A readout circuit 8 including an amplifier 7 is provided.

第2図は、前述のMOS[極対3近傍が拡大して示され
ている倫すなわち、前記MO81JL極対3はゲート電
極9を介して垂直転送部2の出力側に配置されている。
FIG. 2 shows an enlarged view of the vicinity of the MOS pole pair 3, that is, the MO81JL pole pair 3 is arranged on the output side of the vertical transfer section 2 via the gate electrode 9.

また、図中符号lOで示す部分は前記垂直転送部2の転
送rItfi!jを示しており、各画素列はチャンネル
・ストン・ゼ11により互いに分離されているう このように構成されたイメージセンサ−は、露光される
と受光部1に被写体の像が結像され、被写体の輝麿に対
応した電荷が得られるう受光部1に蓄積された信号電荷
は垂直ブランキング期間の一部で全l1111紫がいっ
せいに@直転送CCDに転送されろ。
Further, the portion indicated by the symbol IO in the figure is the transfer rItfi! of the vertical transfer section 2! When the image sensor is configured like a rectangular shape and each pixel row is separated from each other by a channel stone 11, an image of the subject is formed on the light receiving part 1, In order to obtain a charge corresponding to the brightness of the subject, all signal charges accumulated in the light receiving section 1 should be transferred to the @direct transfer CCD all at once during a part of the vertical blanking period.

なお、垂直転送CCDは従来と同様に入射光に感じない
ように遮光され、垂直転送中に光が混ざり合わないよう
に構成されている。垂直転送CCDK移動された信号電
荷は、テレビジョンの標準走査の速度で、垂直方向に1
走査線分の信号が並列に順次下方に転送され、前記MO
81!極対3に送り込まれる。この際、前記ゲート電極
9は導通状態に設けられており、また、前記MO8m0
8電極対レベルKvけられて信号電荷が1つの電極31
の下のポテンシャル井戸に蓄積される。次いで、前記ゲ
ート電極9が遮断されると同時に信号電荷を蓄積した電
極31のみがLレベルに設けらねて、信号電荷は池の電
極32の下に移動されろ。このような状部下に於て、前
記m1Fi32が水平シフトレジスタ5により順次走査
されると、電荷は基板6内に注入され、これに対応して
検出される電流は前記読み出し回路8を介して1水平方
向のビデオ信号として取り出される、l水平走査が終了
すると、再び前記MO8″W1極対3はHレベルに設け
られて垂直転送CCDからの信号電荷が送り込まれる・
次いで信号電荷は前回同様に1方の電極下に移動された
後、基板内に注入され読み出されろ。
Note that the vertical transfer CCD is shielded from light so as not to be sensitive to incident light, as in the conventional case, and is configured to prevent light from mixing during vertical transfer. Vertical transfer CCDKThe signal charge moved is 1 vertically at the standard scanning speed of television.
The signals for the scanning lines are sequentially transferred downward in parallel, and the MO
81! Sent to pole pair 3. At this time, the gate electrode 9 is provided in a conductive state, and the MO8m0
8 electrode pairs, one electrode 31 with signal charge offset by level Kv
is accumulated in the potential well below. Then, when the gate electrode 9 is cut off, only the electrode 31 that has accumulated signal charges is set to the L level, and the signal charges are moved to the bottom of the electrode 32. Under such a state, when the m1Fi32 is sequentially scanned by the horizontal shift register 5, charges are injected into the substrate 6, and a corresponding current is detected via the readout circuit 8. When the horizontal scanning, which is taken out as a horizontal video signal, is completed, the MO8''W1 pole pair 3 is again set at H level and the signal charge from the vertical transfer CCD is sent.
Next, the signal charge is moved under one electrode as before, and then injected into the substrate and read out.

第3図は上述のステップを実現するための各電極の駆動
波形およびビデオ出力信号を示す図であり、l水平走査
期間の間に前記MO8電極対の1方の電極32が順次走
査信号により起動されて電荷が出力される様子を示して
いる。
FIG. 3 is a diagram showing drive waveforms and video output signals for each electrode for realizing the above steps, in which one electrode 32 of the MO8 electrode pair is sequentially activated by a scanning signal during a horizontal scanning period. The figure shows how the charge is output.

なお、前記実施例では、通常使用される連続的に走査さ
れる水平シフト・レジスタを用いているが、代わりKW
当なデコーダによりランダムな順番で読み出すことも当
然できろ・ (発明の効果) 以上記述したように、本発明のイメージセンサ−によれ
ば、従来のCIDと異なり、受光部を通常のILCCD
と同一に構成して受光部上に41JSlを配置しないた
め、青色感度の向上が得られると共に、カラー撮像デ・
々イス設計の自由度も大きい。
Note that although the above embodiment uses a normally used continuously scanned horizontal shift register, an alternative KW
Of course, it is also possible to read out data in a random order using a suitable decoder. (Effects of the Invention) As described above, according to the image sensor of the present invention, unlike the conventional CID, the light receiving part is used as a normal ILCCD.
Since it has the same configuration as the 41JSl and does not place 41JSl on the light receiving section, it is possible to improve the blue sensitivity and improve the color imaging device.
There is also a great deal of freedom in chair design.

また、同様にILCCD で構成され、各画素列はチャ
ンネル・ストンAにより分離されかつ電荷がゲート電極
31を介して32に転送された後基板に注入されている
ため、垂直クロストークは発生しない。更に水平転送C
CDを用いていないため、水平転送部による駆動周波数
や転送効率限界が緩和でき、水平方向に画素を高密度に
集積できて水平解偉力を上げられる。
Further, since it is similarly constructed of an ILCCD, each pixel column is separated by a channel stone A, and the charge is transferred to the gate electrode 32 via the gate electrode 32 and then injected into the substrate, vertical crosstalk does not occur. Furthermore, horizontal transfer C
Since a CD is not used, the drive frequency and transfer efficiency limits imposed by the horizontal transfer section can be relaxed, pixels can be integrated at high density in the horizontal direction, and horizontal resolution can be improved.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、本発明の1実施例によるイメージセンサ−を
概念的に示した図、第2図はs1図の要部を拡大した図
、第3図は動作を説明するための図である。 1・・・受光部、2・・・垂直転送部、3・・・MO8
!l極対、4・・・アルミ線、5・・・水平シフトレ・
ジスタ、6・・・基板、7・・・増幅器、8・・・読み
出し回路、9・・・ゲート電極、10・・・転送電極、
11・・・チャンネル・ストッパ (はρ12名J 第  1  図 第  2  図 第  3  図
FIG. 1 is a diagram conceptually showing an image sensor according to an embodiment of the present invention, FIG. 2 is an enlarged view of the main part of diagram s1, and FIG. 3 is a diagram for explaining the operation. . 1... Light receiving section, 2... Vertical transfer section, 3... MO8
! l Pole pair, 4... Aluminum wire, 5... Horizontal shift lever.
transistor, 6...substrate, 7...amplifier, 8...readout circuit, 9...gate electrode, 10...transfer electrode,
11...Channel stopper (ρ12 person J Figure 1 Figure 2 Figure 3

Claims (1)

【特許請求の範囲】[Claims] 列方向に沿つて配列された複数個の受光素子及び垂直転
送CCDが交互に配置されており、前記垂直転送CCD
の出力側にはゲート電極を介しかつ水平転送制御部によ
り走査されるMOS電極対が各素子列に対応して水平方
向に配置されたことを特徴とするイメージセンサー。
A plurality of light receiving elements arranged along the column direction and vertical transfer CCDs are arranged alternately, and the vertical transfer CCDs
An image sensor characterized in that a pair of MOS electrodes, which are scanned by a horizontal transfer control section through a gate electrode, are arranged in the horizontal direction on the output side of the sensor corresponding to each element column.
JP61074153A 1986-04-02 1986-04-02 Image sensor Expired - Fee Related JPH0695572B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP61074153A JPH0695572B2 (en) 1986-04-02 1986-04-02 Image sensor
US07/033,376 US4763198A (en) 1986-04-02 1987-04-02 Interline transfer CCD sensor with a CID readout stage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61074153A JPH0695572B2 (en) 1986-04-02 1986-04-02 Image sensor

Publications (2)

Publication Number Publication Date
JPS62232157A true JPS62232157A (en) 1987-10-12
JPH0695572B2 JPH0695572B2 (en) 1994-11-24

Family

ID=13538922

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61074153A Expired - Fee Related JPH0695572B2 (en) 1986-04-02 1986-04-02 Image sensor

Country Status (1)

Country Link
JP (1) JPH0695572B2 (en)

Also Published As

Publication number Publication date
JPH0695572B2 (en) 1994-11-24

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