JPS6221969Y2 - - Google Patents
Info
- Publication number
- JPS6221969Y2 JPS6221969Y2 JP11888978U JP11888978U JPS6221969Y2 JP S6221969 Y2 JPS6221969 Y2 JP S6221969Y2 JP 11888978 U JP11888978 U JP 11888978U JP 11888978 U JP11888978 U JP 11888978U JP S6221969 Y2 JPS6221969 Y2 JP S6221969Y2
- Authority
- JP
- Japan
- Prior art keywords
- radiation
- inspected
- rotary table
- frame
- radiation source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000005855 radiation Effects 0.000 claims description 27
- 238000001514 detection method Methods 0.000 claims description 5
- 238000007689 inspection Methods 0.000 claims description 5
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000010521 absorption reaction Methods 0.000 description 15
- 230000005540 biological transmission Effects 0.000 description 9
- 238000000034 method Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 230000014509 gene expression Effects 0.000 description 2
- 238000009659 non-destructive testing Methods 0.000 description 2
- 230000002238 attenuated effect Effects 0.000 description 1
- 238000004040 coloring Methods 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11888978U JPS6221969Y2 (ru) | 1978-08-30 | 1978-08-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11888978U JPS6221969Y2 (ru) | 1978-08-30 | 1978-08-30 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5536335U JPS5536335U (ru) | 1980-03-08 |
| JPS6221969Y2 true JPS6221969Y2 (ru) | 1987-06-04 |
Family
ID=29073660
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11888978U Expired JPS6221969Y2 (ru) | 1978-08-30 | 1978-08-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6221969Y2 (ru) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015161508A (ja) * | 2014-02-26 | 2015-09-07 | 日本装置開発株式会社 | Ｘ線検査装置およびｘ線検査装置の制御方法 |
| JP2018091825A (ja) * | 2016-11-30 | 2018-06-14 | 住友化学株式会社 | 欠陥検査装置、欠陥検査方法、セパレータ捲回体の製造方法、及びセパレータ捲回体 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58115350A (ja) * | 1981-12-29 | 1983-07-09 | Nippon Atom Ind Group Co Ltd | 放射性固化体の均一性非破壊測定方法 |
| CN101951837B (zh) * | 2008-02-22 | 2013-02-13 | 皇家飞利浦电子股份有限公司 | 用于采用分布式源进行x射线成像的高分辨率准静态设置 |
-
1978
- 1978-08-30 JP JP11888978U patent/JPS6221969Y2/ja not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015161508A (ja) * | 2014-02-26 | 2015-09-07 | 日本装置開発株式会社 | Ｘ線検査装置およびｘ線検査装置の制御方法 |
| JP2018091825A (ja) * | 2016-11-30 | 2018-06-14 | 住友化学株式会社 | 欠陥検査装置、欠陥検査方法、セパレータ捲回体の製造方法、及びセパレータ捲回体 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5536335U (ru) | 1980-03-08 |
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