JPS622173A - Icハンドラの測定部 - Google Patents

Icハンドラの測定部

Info

Publication number
JPS622173A
JPS622173A JP60142066A JP14206685A JPS622173A JP S622173 A JPS622173 A JP S622173A JP 60142066 A JP60142066 A JP 60142066A JP 14206685 A JP14206685 A JP 14206685A JP S622173 A JPS622173 A JP S622173A
Authority
JP
Japan
Prior art keywords
dead center
elevating
top dead
roof guide
elevating roof
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60142066A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0569190B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Isao Yokomizo
横溝 勲
Yasuhiro Harada
原田 康博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kokusai Denki Electric Inc
Original Assignee
Kokusai Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kokusai Electric Co Ltd filed Critical Kokusai Electric Co Ltd
Priority to JP60142066A priority Critical patent/JPS622173A/ja
Publication of JPS622173A publication Critical patent/JPS622173A/ja
Publication of JPH0569190B2 publication Critical patent/JPH0569190B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Relating To Insulation (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP60142066A 1985-06-28 1985-06-28 Icハンドラの測定部 Granted JPS622173A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60142066A JPS622173A (ja) 1985-06-28 1985-06-28 Icハンドラの測定部

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60142066A JPS622173A (ja) 1985-06-28 1985-06-28 Icハンドラの測定部

Publications (2)

Publication Number Publication Date
JPS622173A true JPS622173A (ja) 1987-01-08
JPH0569190B2 JPH0569190B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1993-09-30

Family

ID=15306634

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60142066A Granted JPS622173A (ja) 1985-06-28 1985-06-28 Icハンドラの測定部

Country Status (1)

Country Link
JP (1) JPS622173A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Also Published As

Publication number Publication date
JPH0569190B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1993-09-30

Similar Documents

Publication Publication Date Title
US6628128B1 (en) CSP BGA test socket with insert and method
US4940935A (en) Automatic SMD tester
JP2854276B2 (ja) 半導体素子テスト用のトレーユニット
JPS60114777A (ja) 印刷配線基板検査用装置及びその使用方法
KR102096905B1 (ko) 번인보드 자동 검사장치
JPS62501310A (ja) 集積回路パッケ−ジをテストする装置のための接点セット
US6152755A (en) Device for loading/unloading modular IC to/from socket in modular IC handler
JPS622173A (ja) Icハンドラの測定部
JPH0569189B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
KR102788961B1 (ko) 반도체 패키지 테스트 장치
CN213715331U (zh) 一种天线驻波测试装置
JP2652711B2 (ja) 半導体検査装置及び検査方法
CN220020271U (zh) 用于ic在线烧录的工装结构
JP2533881Y2 (ja) 回路基板検査装置におけるピンボード構造
CN112363048B (zh) 一种集成电路测试针床
JPH0120702Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CN112858797B (zh) 一种天线驻波测试装置及方法
JPS6143239Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPS59192483A (ja) 部品挾持装置
JPH05113466A (ja) Icデバイスの試験測定装置
JPH03190200A (ja) 基板支持装置
US4780956A (en) Floating crown for insertion-extraction head
JPH0345914B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPH04174600A (ja) 電子部品実装機のバックアップピン自動交換装置
JPH0824230B2 (ja) 部品組立装置