JPS6221236A - 半導体ボ−ドのダイナミツクバ−イン試験方法 - Google Patents
半導体ボ−ドのダイナミツクバ−イン試験方法Info
- Publication number
- JPS6221236A JPS6221236A JP15990285A JP15990285A JPS6221236A JP S6221236 A JPS6221236 A JP S6221236A JP 15990285 A JP15990285 A JP 15990285A JP 15990285 A JP15990285 A JP 15990285A JP S6221236 A JPS6221236 A JP S6221236A
- Authority
- JP
- Japan
- Prior art keywords
- test
- burn
- block
- temperature environment
- tested
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 153
- 239000004065 semiconductor Substances 0.000 title claims abstract description 43
- 238000010998 test method Methods 0.000 claims description 9
- 238000005111 flow chemistry technique Methods 0.000 claims description 4
- 238000000034 method Methods 0.000 abstract description 12
- 230000006866 deterioration Effects 0.000 abstract description 2
- 230000008569 process Effects 0.000 description 5
- 238000009423 ventilation Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005192 partition Methods 0.000 description 2
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 239000012526 feed medium Substances 0.000 description 1
- 230000004044 response Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15990285A JPS6221236A (ja) | 1985-07-19 | 1985-07-19 | 半導体ボ−ドのダイナミツクバ−イン試験方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15990285A JPS6221236A (ja) | 1985-07-19 | 1985-07-19 | 半導体ボ−ドのダイナミツクバ−イン試験方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6221236A true JPS6221236A (ja) | 1987-01-29 |
| JPH0262949B2 JPH0262949B2 (enExample) | 1990-12-27 |
Family
ID=15703666
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15990285A Granted JPS6221236A (ja) | 1985-07-19 | 1985-07-19 | 半導体ボ−ドのダイナミツクバ−イン試験方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6221236A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008249347A (ja) * | 2007-03-29 | 2008-10-16 | Nec Lcd Technologies Ltd | エージング装置 |
-
1985
- 1985-07-19 JP JP15990285A patent/JPS6221236A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008249347A (ja) * | 2007-03-29 | 2008-10-16 | Nec Lcd Technologies Ltd | エージング装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0262949B2 (enExample) | 1990-12-27 |
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