JPS62207970A - Matrix display device - Google Patents

Abstract

PURPOSE:To execute simultaneous and quick continuity and short-circuit testing in X- and Y directions by providing pads for making the continuity and non- continuity tests to respective terminals of both of the X-direction wirings and Y-direction wirings. CONSTITUTION:The X-direction wirings 1 and the Y-direction wirings 2 are constituted similarly to the conventional matrix display device in a display region 3 but both terminals of the wirings 1, 2 are extended up to the inside of a scribed region 4 and are provided with the pads P and P' for the continuity test. The continuity test is carried out by moving probe needles N and N' over the scribing region 4 having a certain parallel positional relation with the pads P and P' in contact therewith. On the other hand, the non-continuity test is executed by moving the probe needles in such a manner that the probe needle N' contacts the pad P' next to or before the corresponding pad when the probe needle N contacts the pad P. The grazed scribing region 4 is removed after the test.

Description

DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a wiring structure for speeding up the conduction test of wiring of a matrix display device using a liquid crystal or the like and the non-continuity test between adjacent wirings.

(Summary of the Invention) The present invention provides a matrix display device using a liquid crystal or the like, in which pads are provided at both ends of each of the X-direction wiring J3 and the Y-direction wiring for conducting a continuity test and a non-continuity test.
By doing this, the continuity test and the short circuit test 1~ of the X-direction wiring J3J and the Y-direction wiring can be performed simultaneously and quickly.

(Prior Art) Methods of matrix display devices using liquid crystals or the like include a simple matrix method and an active matrix method.

Matrix display devices are used in a variety of applications, such as pocket televisions, wall-mounted televisions, and displays for word processors and hand-belt computers, which are required to have high display quality and be thin and lightweight. In addition, the market demand is primarily toward higher definition, and the increase in test time for continuity tests of wiring in matrix display devices and non-continuity tests between adjacent wirings has become a problem. .

FIG. 2 is a schematic diagram of the wiring of a conventional matrix display device. The X-direction wiring 11A1 and the Y-direction wiring 2 are orthogonal to each other at -3 within the display area 3, and display pixels are formed at their intersections. Each of the X-direction wiring 1 and the Y-direction wiring 2 has a pad P at one end and a pad P' at the other end.

The continuity test between the X-direction wiring 1 and the Y-direction wiring 2 is to measure the resistance between the pad P and the pad 1]' on the same wiring. In addition, the non-continuity test of the adjacent X-direction wiring 1 of the X-direction rudder 15111 and the non-continuity test of the Y-direction wiring 2 with the adjacent Y-direction wiring 2 are performed between the pad P of the wiring to be measured and the pad of the wiring adjacent to the said wiring. The resistance measurement for 1J is to be carried out for 1J.

(Problems to be Solved by the Invention) Therefore, the examination test 1 of the conventional matrix display device
It is necessary to perform the non-continuity test as many times as the total number of X-direction rudder tfA1 and Y-direction wiring 2 while positioning the probe needle. As a result, the time required for the continuity test and non-continuity test was as long as 10 to 20 minutes, resulting in an increase in the rA soaking unit cost of the matrix display device.

(Means for Solving the Problems) In order to solve the above problems, the present invention extends each of the X-direction wiring and the Y-direction wiring into the scribe area, and provides continuity test wires at both ends of each. By providing the pad, it is possible to perform the continuity test J5 and non-continuity test in which positioning of the probe needle is simplified, thereby shortening the test time.

(Example) A first example of the present invention will be described below based on FIG. 1. The X-direction wiring 1 and the Y-direction wiring 2 are connected to the display area 3.
Internally, the structure is similar to that of the conventional 7-trix display device shown in FIG. However, the X direction arrangement i11 and the Y
Both ends of the directional wiring 2 extend into the scribe area 4 and are provided with η test pads P and P'.

The continuity test is carried out with the probe needles N and N' in contact with the scribe region 11!4 which is parallel to the scribe region 11!4 with the pad 1] and P'. The resistance of the X direction wire 1 and the G, i and Y direction wires 2 is sequentially measured while moving the wire in the length direction. On the other hand, in the non-continuity test, the probe needle N is bad P.
With the positional relationship of the probe needles N and N' such that when the probe SIN' contacts the pad P' of the X-direction wiring 1 or the Y-direction wiring 2, the probe SIN' contacts the pad P' of the X-direction wiring 1 or the Y-direction wiring 2. This is to perform a resistance measurement.

Continuity test and non-continuity test Since the probe needles N and N' are moved while touching the pads P and P', scratches may occur on the pads P and P'.
Part of it may peel off. However, this problem is solved as soon as the unnecessary pads 1] and 1]' are automatically removed after the continuity test and the non-continuity test when the scribe area 4 is illuminated.

Next, a second embodiment of the present invention will be described based on FIG. 3. The only difference from the embodiment shown in FIG. 1 is the pads P and P' used in the continuity test and non-continuity test.

As shown in FIG. 3, bad parts PL and PL' which are improved from bad parts P and P' are shown enlarged.

For continuity and non-continuity tests, contact the probes IN and N' to the scribe area 4. However, it can be performed at the same time by moving the scribe area 4 once in the cutting direction. That is, when the probe EIN reaches the position 11 and the probe if N' reaches the position [1', the continuity test 1~ becomes possible. After that, when probe public IN reaches position 12 and probe SIN' reaches position 12', the adjacent
A non-continuity test of the directional wiring 1 becomes possible. Y direction alignment FJ
Continuity tests and non-continuity tests can be carried out efficiently by employing pads 1) having the same shape as pads 1- and PL' for pads 12.

(Effects of the Invention) As explained above, the present invention provides continuity test and non-continuity test pads for X-direction wiring and Y-direction wiring within the scribe area and by changing the shape of the pads. The interrogation test 1~ and the non-continuity test 1~, which took several tens of minutes, can now be performed in a few tens of seconds.As a result, the cost of the continuity test and non-continuity test can be reduced, and the matrix display This has the effect of making it possible to lower the unit manufacturing cost of the device.

[Brief explanation of drawings]

FIG. 1 is a plan view of an embodiment of a matrix display device according to the present invention, FIG. 2 is a plan view of a conventional matrix display device, and FIG. 3 is a matrix display with an improved pad shape according to the present invention. FIG. 3 is an enlarged plan view of the device. 1...X direction wiring 2...Y direction wiring 4...Scribe area N, N'...Probe needle 1), P', PL, PL'...Pad applicant Seiko Electronics Co., Ltd. Figure 2: C￥＠L? ：Matosokusuogo Yuhoj [Nonenunu→Koma-taizu Figure 3]

Claims (2)

[Claims] (1) A substrate with a plurality of X-direction wirings and a plurality of Y-direction wirings perpendicular to the X-direction wirings, and a switch element array such as a thin film transistor formed at each intersection thereof, and an ITO
In a matrix display device having a structure in which a liquid crystal is sealed between opposing substrates having transparent electrodes such as A matrix display device characterized by having a structure in which each pad is provided. (2) If the wiring direction of each of the X-direction wiring and the Y-direction wiring is assumed to be a horizontal coordinate, the pads provided at both ends of each of the X-direction wiring and the Y-direction wiring are located at one end. , the other end extends upward, and the other end extends downward, and furthermore, a first
The vertical side of the other pad of the second X-direction wiring or Y-direction wiring that is parallel to the X-direction wiring or Y-direction wiring is one pad of the first X-direction wiring or Y-direction wiring. The matrix display device according to claim 1, wherein the vertical sides of the matrix correspond to each other.