JPS62191705A - Apparatus for inspecting appearance of electric/ electronic parts - Google Patents

Apparatus for inspecting appearance of electric/ electronic parts

Info

Publication number
JPS62191705A
JPS62191705A JP3280186A JP3280186A JPS62191705A JP S62191705 A JPS62191705 A JP S62191705A JP 3280186 A JP3280186 A JP 3280186A JP 3280186 A JP3280186 A JP 3280186A JP S62191705 A JPS62191705 A JP S62191705A
Authority
JP
Japan
Prior art keywords
circuit
light
inspected
signal
brightness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3280186A
Other languages
Japanese (ja)
Inventor
Takaaki Kishi
岸 高明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
EEJA Ltd
Original Assignee
Electroplating Engineers of Japan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electroplating Engineers of Japan Ltd filed Critical Electroplating Engineers of Japan Ltd
Priority to JP3280186A priority Critical patent/JPS62191705A/en
Publication of JPS62191705A publication Critical patent/JPS62191705A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Closed-Circuit Television Systems (AREA)

Abstract

PURPOSE:To enhance inspection accuracy and to make it possible to inspect the appearance of a surface state, by providing a light source control circuit, a TV signal processing circuit, an A/D converter circuit, a correction/memory circuit, a binarization circuit, a majority circuit, a counter circuit and a control circuit, etc. CONSTITUTION:A light source control circuit 20 controls a light source 1 to preliminarily irradiate blank paper and a model article 2 to be inspected with light 3 and a correction/ memory circuit 23 stores the light receiving characteristic of the light of a TV camera 4 at the time of the imaging of the blank paper and the characteristic of light irregularity reflected from the model article 2 to be inspected at the time of the irradiation of the model article 2 to be inspected and determines reference brightness to store the same. On and after, the signal of the brightness transmitted through an A/D converter circuit 22 is corrected on the basis of the reference brightness to be transmitted to a TV signal processing circuit 21 and a binarization circuit 24 binarizes this signal. A majority circuit 25 compares binarized data of the circuit 24 corresponding to an inspection place memory 27, for example, A, B, C with the preliminarily stored reference brightness to form and store the binarized data. A counter circuit 31 applies counting processing to the signal transmitted from the circuit 25. A control circuit 26 controls each circuit and the whole of the system.

Description

【発明の詳細な説明】 〈産業上の利用分野〉 この発明は、電気・電子部品の外観検査装置に関する。[Detailed description of the invention] <Industrial application field> The present invention relates to a visual inspection device for electrical/electronic components.

〈従来の技術〉 従来、電気、電子部品、特にI CIJ−ドフレームの
如き平坦形状でメッキ処理された部品は、仕上げ検査工
程で目視による外観検査によりシミ、光沢、傷、形状等
を検査し製品の品質向上を図っているが、かかる外観検
査は目視によるものが多いのでその分個人差が生じ、し
かも疲労の程度によりそれが助長される嫌いがある。そ
こでこの目視による検査を機械化した電気・電子部品の
外観検査装置として、例えば第3図に示されるようなも
のが知られている〔−オーム社発行「省力と自動化」昭
和60年7月号参照〕。この外観検査装置は光#1から
電気、電子部品等の被検査物2に対し光3を照射し、こ
の光3の反射によって被検査物2を映像化すべく、縦、
横、細分化したドツト単位の信号としてテレビカメラ4
を通してビデオモニタ5にそのままの状態、即ち明るい
或いは暗いという輝度の異なる状態、の信号で伝達する
ようにしている。ビデオモニタ5に伝達された前記信号
は、ビデオモニタ5に接続されるコンピュータ6によっ
て設定される基準の輝度と比較され、黒又は白の2値化
データに変換される。即ち、被検査物2にて反射されテ
レビカメラ4を通してビデオモニタ5及びコンピュータ
6に伝達される前記信号は、被検査物2の表面に傷7や
シミがついているような場合は黒味を帯びた輝度の低い
信号が、又傷もない正常状態の場合は白っぽい輝度の高
い信号が、各々コンピュータ6に伝達されるため、この
信号を黒又は白だけが残るように2値化した状態でビデ
オモニタ5上に映像8の信号として送るものである。こ
うして被検査物2の表面に傷7やシミが有るような場合
、ビデオモニタ5には白く写しだされる正常な箇所に、
傷7のある黒い部分の映像8が表現され、ビデオモニタ
5上の濃淡にて目視確認できることになるものである。
<Conventional technology> Conventionally, electrical and electronic components, especially flat plated parts such as ICJ-de frames, are inspected for spots, gloss, scratches, shape, etc. through visual appearance inspection in the finishing inspection process. Although efforts are being made to improve the quality of products, many of these visual inspections are performed visually, which results in individual differences, which are exacerbated by the degree of fatigue. Therefore, as an external appearance inspection device for electrical/electronic parts that mechanizes this visual inspection, for example, the one shown in Figure 3 is known [--Refer to "Labor Saving and Automation" published by Ohmsha, July 1985 issue. ]. This visual inspection device irradiates light 3 from light #1 onto an inspected object 2 such as electrical or electronic parts, and uses the reflection of this light 3 to visualize the inspected object 2, vertically, vertically, etc.
TV camera 4 as horizontal, subdivided dot-based signals
The signal is transmitted to the video monitor 5 in its original state, that is, in a state of different brightness such as bright or dark. The signal transmitted to the video monitor 5 is compared with a reference brightness set by a computer 6 connected to the video monitor 5, and converted into black or white binary data. That is, the signal reflected by the object 2 to be inspected and transmitted to the video monitor 5 and computer 6 through the television camera 4 will have a blackish tinge if the surface of the object 2 to be inspected has scratches 7 or stains. A signal with low brightness that has been removed, and a signal with high brightness that is whitish in normal conditions with no scratches, are transmitted to the computer 6. Therefore, this signal is binarized so that only black or white remains and is displayed on the video monitor. 5 as a video 8 signal. In this way, when there are scratches 7 or stains on the surface of the object 2 to be inspected, the normal areas appear white on the video monitor 5.
An image 8 of the black part with the scratch 7 is expressed and can be visually confirmed by the shading on the video monitor 5.

そして更に、映像8内で黒く残った点即ち、傷7の部分
のドツト数をコンピュータ6にてカウントしその大きさ
が設定値以上である場合、これを不具合とするようにし
ているものである。
Furthermore, the computer 6 counts the number of dots remaining black in the image 8, that is, the scratches 7, and if the size of the dots exceeds a set value, this is determined to be a defect. .

〈従来技術の問題点〉 しかしながらこのような従来の外観検査装置にあっては
、被検査物2にて反射された明るい或いは暗いという輝
度の異なる光3をそのまま信号として伝達し、その輝度
とコンピュータ6に設定される基準の輝度とを比較して
2値化していたため、テレビカメラ4の輝度の受光特性
や対象とする被検査物2の形状、状態によって検査精度
が悪いことがあった。即ち、テレビカメラ4によっては
全体的に実際の輝度より明るい状態或いは暗い状態に受
光したり、部分的に明るい状態或いは暗い状態に「むら
」を生じた受光を行うという特性があったり、又被検査
物2が■cリードフレームの如き「打ち抜き」で作成さ
れたものであると、リードフレームのリード部〔図示せ
ず〕の縁の所では打ち抜きによる凹凸があり、この凹凸
によって光源1からの光3の入射角と被検査物2から反
射される光3の反射角があってしまうとテレビカメラ4
には実際の反射光と異なった光3が入力されてしまい全
体が光った状態となったり、周囲部分と中心部分とで明
るさが異なった状態(明るさのむら、光むら)となるこ
とがあり、このためテレビカメラ4を通してビデオモニ
タ5に伝達される信号自体に不確定要素が多く、従って
この信号を2値化したデータも不確定要素が多いため、
この2値化したデータをもとにしたビデオモニタ5の映
像及び傷7のカウントの精度が不確実となり、以て外観
検査全体の精度が悪くなるものであった。
<Problems with the prior art> However, in such a conventional visual inspection device, the light 3 of different brightness (bright or dark) reflected by the inspected object 2 is directly transmitted as a signal, and the brightness and computer Since the brightness was compared with a standard brightness set to 6 and converted into a binary value, the test accuracy could be poor depending on the brightness reception characteristics of the television camera 4 and the shape and condition of the object 2 to be inspected. That is, depending on the television camera 4, the light may be received in a state where the overall brightness is brighter or darker than the actual brightness, or the light may be received in a partially bright or dark state with "unevenness"; If the test object 2 is made by "punching" such as the lead frame (c), there will be unevenness at the edge of the lead part (not shown) of the lead frame due to the punching, and this unevenness will cause the light source 1 to emit light. If there is an angle of incidence of the light 3 and a reflection angle of the light 3 reflected from the object 2 to be inspected, the television camera 4
The light 3 that differs from the actual reflected light may be input, causing the entire area to be illuminated, or the brightness to be different between the surrounding area and the center area (uneven brightness, uneven light). Therefore, there are many uncertainties in the signal itself transmitted to the video monitor 5 through the television camera 4, and therefore, the data obtained by converting this signal into binary data also has many uncertainties.
The accuracy of the image on the video monitor 5 and the count of scratches 7 based on this binarized data becomes uncertain, and the accuracy of the overall visual inspection deteriorates.

この発明は上記の点に鑑み開発されたもので、テレビカ
メラ4を通してビデオモニタ5に伝達される信号を、テ
レビカメラ4の受光特性及び被検査物2の光むらにあわ
せて予め記憶させた被検査物2の輝度の基準値により光
むらにあわせて補正し、その補正した信号にて2値化を
図ることによって光むらのある被検査物2であっても検
査精度を向上できるような外観検査装置を堤供せんこと
を目的としている。
This invention was developed in view of the above points, and the signal transmitted to the video monitor 5 through the television camera 4 is adjusted to the light receiving characteristics of the television camera 4 and the light unevenness of the object 2 to be inspected. An appearance that improves inspection accuracy even for the inspected object 2 with uneven light by correcting it according to the unevenness of light using the standard value of the brightness of the inspected object 2 and converting the corrected signal into a binary value. The purpose is to provide inspection equipment.

〈問題点を解決するための手段〉 上記の目的を達成するためのこの発明の構成を、実施例
に対応する第1図及び第2図を用いて説明する。この発
明の外観検査装置は主に、光源制御回路20、テレビカ
メラ4、テレビ信号処理回路21、アナログ−デジタル
変換回路22〔以下単にA−D変換回路と称する〕、補
正・記憶回路23.2値化回路24、多数決回路25、
計数回路31、制御回路26及び予め任意に設定された
検査場所を記憶する検査場所メモリ27及びから構成さ
れる。
<Means for Solving the Problems> The structure of the present invention for achieving the above object will be explained using FIGS. 1 and 2, which correspond to embodiments. The visual inspection apparatus of the present invention mainly includes a light source control circuit 20, a television camera 4, a television signal processing circuit 21, an analog-to-digital conversion circuit 22 (hereinafter simply referred to as an AD conversion circuit), and a correction/storage circuit 23.2. Value conversion circuit 24, majority decision circuit 25,
It is comprised of a counting circuit 31, a control circuit 26, and an inspection location memory 27 that stores an arbitrary preset inspection location.

光源制御回路20は、被検査物2に光3を均一に照射す
べく光源1を制御するための回路である。
The light source control circuit 20 is a circuit for controlling the light source 1 so as to uniformly irradiate the inspection object 2 with the light 3.

テレビ信号処理回路21は、テレビカメラ4を介して伝
達された被検査物2からの反射された光3の輝度の信号
を処理する回路である。
The television signal processing circuit 21 is a circuit that processes a signal of the brightness of the reflected light 3 from the object to be inspected 2 transmitted via the television camera 4 .

A−D変換回路22は、テレビ信号処理回路21を介し
て伝達されるテレビカメラ4からの信号をA−D変換す
る回路である。
The AD conversion circuit 22 is a circuit that converts the signal from the television camera 4 transmitted via the television signal processing circuit 21 from analog to digital.

補正・記憶回路23は、予め白紙及びモデル被検査物〔
図示せず〕に各々前記光源制御回路20の光3を照射し
てその光3をテレビカメラ4にて映像化するもので、白
紙映像化時にはテレビカメラ4の光3の受光特性を、そ
してモデル被検査物の照射時にはモデル被検査物から反
射される光むらの特性を、各々記憶すると共に、前記モ
デル被検査物の特性とテレビカメラ4の光3の受光特性
とによって補正して予め基準輝度を決定し記憶する。そ
して以後A−D変換回路22を介して伝達される輝度の
信号を前記基準輝度にて補正し、前記テレビ信号処理回
路21に伝達するための回路である。
The correction/storage circuit 23 stores a blank sheet and a model inspected object in advance.
(not shown) are irradiated with the light 3 from the light source control circuit 20, and the light 3 is visualized by the television camera 4. When creating a blank image, the light receiving characteristics of the light 3 of the television camera 4 and the model When the object to be inspected is irradiated, the characteristics of the light unevenness reflected from the model object to be inspected are memorized and corrected based on the characteristics of the model object to be inspected and the light receiving characteristics of the light 3 from the television camera 4 to set the standard brightness in advance. Determine and memorize. This is a circuit for correcting a luminance signal transmitted thereafter via the A-D conversion circuit 22 using the reference luminance, and transmitting the corrected luminance signal to the television signal processing circuit 21.

2値化回路24は、前記テレビ信号処理回路21から伝
達される複数の補正された輝度の信号を黒又は白に2値
化する回路であり、予め任意に設定される検査場所メモ
リ27〔図示の例ではW。
The binarization circuit 24 is a circuit that binarizes a plurality of corrected luminance signals transmitted from the television signal processing circuit 21 into black or white, and is a circuit that binarizes a plurality of corrected luminance signals transmitted from the television signal processing circuit 21 into black or white. In the example, W.

x、y、zの4箇所〕に対応して(24W、24x、 
 24 V、  24 z)設けられるものである。
(24W, 24x,
24 V, 24 z).

多数決回路25は、前記検査場所メモリ27に対応した
2値化回路24w、24x、24y、24zの、各々の
2値化されたデータA、B、Cと、予め記憶された基準
輝度とを比較し多数決によって2値化データを作成して
記憶する回路である。
The majority circuit 25 compares each of the binarized data A, B, and C of the binarization circuits 24w, 24x, 24y, and 24z corresponding to the inspection location memory 27 with a pre-stored reference brightness. This is a circuit that creates and stores binarized data based on a majority vote.

計数回路31は、多数決回路25から伝達される信号、
即ち画面のドツト毎に良否が示される2値化データ、を
各々計数処理する回路であって、2値化されたデータA
、B、Cに対応する数〔31a、  3 l b、  
31 c)設けられる。
The counting circuit 31 receives a signal transmitted from the majority circuit 25,
In other words, it is a circuit that counts and processes binary data that indicates pass/fail for each dot on the screen.
, B, C [31a, 3 l b,
31 c) Provided.

制御回路26は、前記各回路及びシステム全体を制御す
る回路である。
The control circuit 26 is a circuit that controls each of the circuits and the entire system.

〈作  用〉 この発明の詳細な説明する。<For production> This invention will be explained in detail.

基準輝度の設定; 先ず白紙に対し光3を照射しその反射光をテレビカメラ
4にて撮影する。この白紙映像化時にテレビカメラ4の
輝度の特性、即ち部分的に明るさが異なって受光される
といった光むらの状態、を補正・記憶回路23に記憶さ
せる。
Setting the reference brightness: First, a blank sheet of paper is irradiated with light 3 and the reflected light is photographed with a television camera 4. When creating a blank image, the brightness characteristics of the television camera 4, that is, the state of uneven light such that light is received with partially different brightness, is stored in the correction/storage circuit 23.

次ぎに無傷で光沢、メッキエリア等が正確な状態のモデ
ル被検査物に対し光3を照射しその反射される光の特性
、即ち、モデル被検査物のどの部分が明るく或いは暗く
なるという光むらの反射光に応じた状態、を記憶する。
Next, light 3 is irradiated onto the model test object, which is intact and has accurate gloss, plating areas, etc., and the characteristics of the reflected light are determined, i.e., which parts of the model test object are bright or dark. The state corresponding to the reflected light is memorized.

そしてこのモデル被検査物の反射光・の特性と前記テレ
ビカメラ4の光むらの特性とによって補正し、予め基準
輝度を決定して補正・記憶回路23に記憶させる。
Then, correction is made based on the characteristics of the reflected light of the model object to be inspected and the characteristics of the light unevenness of the television camera 4, and a reference brightness is determined in advance and stored in the correction/storage circuit 23.

被検査物2の検査; 基準輝度の設定以降送られてくる被検査物2に光3を照
射して被検査物2の反射光を信号に変えてテレビ信号処
理回路2l−A−D変換回路22−補正・記憶回路23
へと伝達し、ここで前記基準輝度によって信号が補正さ
れ、光むらの状態にある被検査物2の信号やテレビカメ
ラ4の光の受光特性が前記補正によって恰も光むらのな
い状態でテレビ信号処理回路21に伝達されることにな
る。
Inspection of the object 2 to be inspected; irradiates the object 2 sent after setting the reference brightness with light 3, converts the reflected light from the object 2 into a signal, and sends the signal to the television signal processing circuit 21-A-D conversion circuit. 22-Correction/memory circuit 23
Here, the signal is corrected by the reference brightness, and the signal of the object 2 to be inspected, which is in a state of uneven light, and the light reception characteristics of the television camera 4 are changed to a TV signal in a state without uneven light. It will be transmitted to the processing circuit 21.

信号の2値化; テレビ信号処理回路21から伝達された信号を、2値化
回路24にて黒又は白に2値化する。ここで2値化され
る信号は光むらが補正された複数の信号である。   
・ 被検査物2の良否判定; 検査場所メモリ27に記憶される各箇所W、  X。
Binarization of signal; The signal transmitted from the television signal processing circuit 21 is binarized into black or white in the binarization circuit 24. The signals to be binarized here are a plurality of signals whose light unevenness has been corrected.
- Judgment of quality of the inspected object 2; each location W, X stored in the inspection location memory 27.

Y、Zに対応した2値化回路24w、24x、24y、
24z毎に2値化データA、B、Cを多数決回路25に
て比較し多数決により2値化データを作成して記憶する
。ここで作成される2値化データA、B、Cは光むらが
補正された信号であるから被検査物2の光3の反射状態
が均一でなくても適性な2値化が行えることになるもの
である。
Binarization circuits 24w, 24x, 24y, corresponding to Y and Z,
Binarized data A, B, and C are compared every 24z in a majority decision circuit 25, and binarized data is created and stored by majority decision. Since the binarized data A, B, and C created here are signals with light unevenness corrected, appropriate binarization can be performed even if the state of reflection of the light 3 on the inspected object 2 is not uniform. It is what it is.

しかも、検査場所メモリ27を輝度の異なる任意位置に
設定すれば、光って正常な検査がしにくかった部分や輝
度が異なって判定ができなかった部分が補正され、均一
化された信号によって2値化されるため、「面」状態の
検査も容易である。そして、多数決回路25にて比較し
たときの不良状態の箇所の個数を検査場所メモリ27毎
に、対応する計数回路31a、31b、31cにてカウ
ントし最終的にこの不良状態の箇所が基準値より上回っ
ている場合には対象の被検査物2を不良とするものであ
る。
Furthermore, by setting the inspection location memory 27 to any position with different brightness, areas that are shiny and difficult to perform a normal inspection or areas that cannot be judged due to different brightness are corrected, and the equalized signal becomes a binary value. Since it is possible to inspect the "surface" condition easily. Then, the number of defective locations compared by the majority circuit 25 is counted for each inspection location memory 27 by the corresponding counting circuits 31a, 31b, and 31c, and finally, the number of defective locations is greater than the reference value. If it exceeds the value, the object to be inspected 2 is determined to be defective.

〈実 施 例〉 以下この発明の一実施例を第1図及び第2図に基づいて
説明する。尚、従来と同一乃至共通する部分は図中同一
符号を以て示すこととし、重複する説明は省略する。こ
の検査装置は主に、光源制御回路20、テレビカメラ4
、テレビ信号処理回路21、アナログ−デジタル変換回
路22〔以下単にA−D変換回路と称する〕、補正・記
憶回路23.2値化回路24、多数決回路25、計数回
路31、制御回路26及び予め任意に設定された検査場
所を記憶する検査場所メモリ27から構成される。
<Embodiment> An embodiment of the present invention will be described below with reference to FIGS. 1 and 2. Incidentally, parts that are the same as or common to the conventional ones are indicated by the same reference numerals in the drawings, and redundant explanations will be omitted. This inspection device mainly includes a light source control circuit 20, a television camera 4
, a television signal processing circuit 21, an analog-digital conversion circuit 22 (hereinafter simply referred to as an A-D conversion circuit), a correction/storage circuit 23, a binarization circuit 24, a majority circuit 25, a counting circuit 31, a control circuit 26, and a It is composed of an inspection location memory 27 that stores arbitrarily set inspection locations.

光源制御回路20は、被検査物2に光3を均一に照射す
べく光源1を制御するための回路である。
The light source control circuit 20 is a circuit for controlling the light source 1 so as to uniformly irradiate the inspection object 2 with the light 3.

テレビ信号処理回路21は、テレビカメラ4を介して伝
達された被検査物2からの反射された光3の状態、即ち
明るい或いは暗いという輝度の異なる状態、を信号に変
換してA−D変換回路22に伝達するものである。又、
後述する補正・記憶回路23からの信号を2値化回路2
4へ伝達する役割ももつ回路である。
The television signal processing circuit 21 converts the state of the reflected light 3 from the inspected object 2 transmitted via the television camera 4, that is, the state of different brightness such as bright or dark, into a signal and performs A-D conversion. The signal is transmitted to the circuit 22. or,
A signal from a correction/storage circuit 23, which will be described later, is converted to a binarization circuit 2.
This circuit also has the role of transmitting information to 4.

A−D変換回路22は、テレビ信号処理回路21を介し
て伝達されるテレビカメラ4からの信号をA−D変換し
て接続される補正・記憶回路23に伝達するための回路
である。
The AD conversion circuit 22 is a circuit for AD converting the signal from the television camera 4 transmitted via the television signal processing circuit 21 and transmitting the converted signal to the connected correction/storage circuit 23.

補正・記憶回路23は、予め白紙及びモデル被検査物〔
図示せず〕に各々前記光源制御回路20の光3を照射し
てその光3をテレビカメラ4にて映像化するもので、白
紙映像化時にはテレビカメラ4の光3の受光特性を、そ
してモデル被検査物の照射時にはモデル被検査物から反
射される光むらの特性を、各々記憶すると共に、前記モ
デル被検査物の特性とテレビカメラ4の光3の受光特性
とによって補正して予め基準輝度を決定し記憶する。そ
して以後A−D変換回路22を介して伝達される輝度の
信号を前記基準輝度にて補正し、前記テレビ信号処理回
路21に伝達するための回路である。具体的には、先ず
白紙に対し光3を照射しその反射光をテレビカメラ4に
て映像化して邊影し、この白紙映像化時にテレビカメラ
4の輝度の特性、即ち部分的に明るさが異なって受光さ
れるといった光むらの状態、を補正・記憶回路23に記
憶させ、次ぎに無傷で光沢、メッキエリア等が正確な状
態のモデル被検査物に対し光3を照射しその反射される
光の特性、即ち、モデル被検査物のどの部分が明るく或
いは暗(なるという光むらの反射光に応じた状態、を記
憶する。そしてこのモデル被検査物の反射光の特性と前
記テレビカメラ4の光むらの特性とによって補正し、予
め基準輝度を決定して補正・記憶回路23に記憶しよう
とするものであって、被検査物2がICリードフレーム
のリード部〔図示せず〕の端部の如く幅サイズが数1或
いはコンマ数龍のためリード部の先端の隙間に照射され
た光3の反射によって端部全体が光った状態となっても
、更には周囲部分と中心部分とで明るさが異なった状態
となっても、以後補正・記憶回路23に伝達される輝度
の信号を前記基準輝度によって補正して2値化するもの
である。そして光むらの状態にある被検査物2の信号が
前記補正によって恰も光むらのない状態でテレビ信号処
理回路21に伝達されることになるものであり、この補
正・記憶回路23を設けたことがこの発明の大きな特徴
の一つである。尚この補正・記憶回路23では、前記補
正を、1箇所に対して複数回〔図示の例ではA、B、C
の3回〕繰り返しその信号をテレビ信号処理回路21を
介して2値化回路24へ伝達するものである。又この補
正・記憶回路23には、テレビ信号処理回路21を介し
て伝達されるテレビカメラ4からの信号のノイズを修正
する図示せぬフィルタも備えられている。
The correction/storage circuit 23 stores a blank sheet and a model inspected object in advance.
(not shown) are irradiated with the light 3 from the light source control circuit 20, and the light 3 is visualized by the television camera 4. When creating a blank image, the light receiving characteristics of the light 3 of the television camera 4 and the model When the object to be inspected is irradiated, the characteristics of the light unevenness reflected from the model object to be inspected are memorized and corrected based on the characteristics of the model object to be inspected and the light receiving characteristics of the light 3 from the television camera 4 to set the standard brightness in advance. Determine and memorize. This is a circuit for correcting a luminance signal transmitted thereafter via the A-D conversion circuit 22 using the reference luminance, and transmitting the corrected luminance signal to the television signal processing circuit 21. Specifically, first, light 3 is irradiated onto a blank sheet of paper, and the reflected light is visualized using a television camera 4 to create a close-up image. The state of light unevenness, such as the light being received differently, is stored in the correction/storage circuit 23, and then the light 3 is irradiated onto the model test object, which is intact and has accurate gloss, plating areas, etc., and the light is reflected. The characteristics of the light, that is, which parts of the model to be inspected are bright or dark (that is, the state depending on the reflected light of uneven light) are memorized.The characteristics of the reflected light of this model to be inspected and the television camera 4 The standard brightness is determined in advance and stored in the correction/storage circuit 23, and the test object 2 is the edge of the lead part (not shown) of the IC lead frame. Since the width size is a number 1 or a comma number, as in the case of the lead part, even if the entire end part is illuminated due to the reflection of the light 3 irradiated into the gap at the tip of the reed part, the peripheral part and the center part are even different. Even if the brightness is different, the brightness signal subsequently transmitted to the correction/storage circuit 23 is corrected and binarized using the reference brightness. The signal No. 2 is transmitted to the television signal processing circuit 21 in a state with no unevenness of light due to the correction described above, and the provision of this correction/storage circuit 23 is one of the major features of the present invention. Note that this correction/storage circuit 23 performs the correction multiple times for one location [in the illustrated example, A, B, and C
3 times] and the signal is repeatedly transmitted to the binarization circuit 24 via the television signal processing circuit 21. The correction/storage circuit 23 is also equipped with a filter (not shown) that corrects noise in the signal from the television camera 4 transmitted via the television signal processing circuit 21.

2値化回路24は、前記テレビ信号処理回路21から伝
達される補正された輝度の信号を黒又は白に2値化する
回路であり、ここで2値化される信号は光むらが補正さ
れた信号であるから例えば全体が光った状態の部分であ
っても適性な2値化が行えることになるものである。し
かも2値化回路24は、任意に設定される検査場所メモ
リ27〔図示の例ではW、X、Y、Zの4箇所〕に対応
して[24w、24x、24y、24z)設けられるも
のである。
The binarization circuit 24 is a circuit that binarizes the corrected luminance signal transmitted from the television signal processing circuit 21 into black or white, and the signal to be binarized here has light unevenness corrected. For example, even if the entire portion is illuminated, appropriate binarization can be performed. Moreover, the binarization circuit 24 is provided [24w, 24x, 24y, 24z] corresponding to the arbitrarily set inspection location memory 27 [in the illustrated example, four locations W, X, Y, and Z]. be.

多数決回路25は、前記検査場所メモリ27に対応した
2値化回路24W、24x、24y、24zの、各々の
複数の2値化データA、B、Cを比較して多数決により
2値化データを作成する回路である。
The majority decision circuit 25 compares the respective plurality of binarized data A, B, and C of the binarized circuits 24W, 24x, 24y, and 24z corresponding to the inspection location memory 27, and determines the binarized data by majority decision. This is the circuit to create.

計数回路31は、多数決回路25から伝達される信号、
即ち画面のドツト毎に良否が示される2値化データ、を
各々計数処理する回路であって、2値化されたデータA
、B、Cに対応する数〔31a、  3 l b、  
31 C)設けられ、不良状態の箇所の個数をカウント
して最終的にこの不良状態の箇所が基準値より上回って
いる場合には対象の被検査物2を不良とするものである
The counting circuit 31 receives a signal transmitted from the majority circuit 25,
In other words, it is a circuit that counts and processes binary data that indicates pass/fail for each dot on the screen.
, B, C [31a, 3 l b,
31C) is provided, the number of defective locations is counted, and if the number of defective locations exceeds the reference value, the object to be inspected 2 is determined to be defective.

制御回路26は、前記各回路及びシステム全体を制御す
る回路である。
The control circuit 26 is a circuit that controls each of the circuits and the entire system.

尚、28は被検査物2を所定間隔で送り出すホルダー、
29は検査済良品のホルダー、30は検査済不良品のホ
ルダーを各々表し、ホルダー28からの送り出し、或い
は良否判定後の被検査物2の各ホルダー29.30への
振り分けも前記制御回路26で行うものである。
In addition, 28 is a holder that sends out the object 2 to be inspected at predetermined intervals;
Reference numeral 29 represents a holder for inspected non-defective products, and 30 represents a holder for inspected defective products, and the control circuit 26 also controls the delivery from the holder 28 or the distribution of the inspected objects 2 to the respective holders 29 and 30 after the quality determination. It is something to do.

次に外観検査装置の使用状態を説明する。Next, the usage condition of the visual inspection device will be explained.

基準輝度の設定; テレビカメラ4の特性チェック; 先ず白紙に対し光3を照射しその反射光をテレビカメラ
4にて撮影し、この白紙映像化時にテレビカメラ4の輝
度の特性、即ち部分的に明るさが異なって受光されると
いった光むらの状態、を補正・記憶回路23に記憶させ
る。
Setting the reference brightness; Checking the characteristics of the television camera 4; First, the light 3 is irradiated onto a blank sheet of paper, the reflected light is photographed by the television camera 4, and when this blank sheet is visualized, the characteristics of the brightness of the television camera 4, that is, partially The state of light unevenness such that light is received with different brightnesses is stored in the correction/storage circuit 23.

モデル被検査物での光むらチェック; 次ぎに無傷で光沢、メッキエリア等が正確な状態のモデ
ル被検査物に対し光3を照射しその反射される光の特性
、即ち、モデル被検査物のどの部分が明るく或いは暗く
なるという光むらの反射光に応した状態、を記憶する。
Check for light unevenness on the model test object; Next, light 3 is irradiated on the model test object that is intact and has accurate gloss, plating areas, etc., and the characteristics of the reflected light are checked. The state corresponding to the reflected light of uneven light is memorized, such as which part becomes brighter or darker.

そしてこのモデル被検査物の反射光の特性と前記テレビ
カメラ4の光むらの特性とによって補正し、予め基準輝
度を決定して補正・記憶回路23に記憶させる。こうし
て光むら、即ちICリードフレームのリード部の如く光
った状態、又周囲部分に比し中心部分が少し暗いといっ
た状態及びテレビカメラ4の受光特性が補正された基準
輝度が、以降伝達される被検査物2の輝度の基準値とじ
て記憶されることになるものである。
Then, correction is made based on the characteristics of the reflected light of the model object to be inspected and the characteristics of the light unevenness of the television camera 4, and a reference brightness is determined in advance and stored in the correction/storage circuit 23. In this way, the reference brightness that has been corrected for the light unevenness, that is, the state where the lead part of the IC lead frame shines, the state where the center part is a little darker than the surrounding part, and the light receiving characteristics of the television camera 4 is corrected. This value will be stored as the reference value of the brightness of the inspection object 2.

被検査物2の検査; ホルダー27より所定間隔で送り出される被検査物2に
光3を照射させて被検査物2の反射光を信号に変えてテ
レビ信号処理回路2l−A−D変換回路22−補正・記
憶回路23へと伝達し、ここで前記基準輝度によって信
号が補正され、光むらの状態にある被検査物2の信号が
前記補正によって恰も光むらのない状態でテレビ信号処
理回路21に伝達されることになる。
Inspection of the inspected object 2; The inspected object 2 sent out from the holder 27 at predetermined intervals is irradiated with the light 3, and the reflected light from the inspected object 2 is converted into a signal to be sent to the television signal processing circuit 21-A-D conversion circuit 22. - The signal is transmitted to the correction/storage circuit 23, where the signal is corrected by the reference luminance, and the signal of the object 2 to be inspected, which is in a state of light unevenness, is changed to the TV signal processing circuit 23 in a state where there is no light unevenness due to the correction. It will be transmitted to

信号の2値化; テレビ信号処理回路21から伝達された信号を、2値化
回路24にて黒又は白に2値化する。ここで2値化され
る信号は光むらが補正されたA、B。
Binarization of signal; The signal transmitted from the television signal processing circuit 21 is binarized into black or white in the binarization circuit 24. The signals to be binarized here are A and B with light unevenness corrected.

Cの3回の信号である。This is the signal of C three times.

被検査物2の良否判定; 検査場所メモリ27に記憶される各箇所W、X。Judgment of quality of inspected object 2; Each location W and X stored in the inspection location memory 27.

y、  zに対応した2値化回路24w、24x、24
y、24z毎に2値化データA、B、Cを多数決回路2
5にて比較し多数決により2値化データを作成する。そ
して計数回路31a、31b、31cにて、多数決回路
25から伝達されるドツト毎の2値化データを各々計数
処理し、最終的に不良状態の箇所が基準値より上回って
いる場合には対象の被検査物2を不良とするものである
Binarization circuits 24w, 24x, 24 corresponding to y and z
Binarized data A, B, C for every y, 24z is passed to the majority decision circuit 2.
5 and create binarized data by majority vote. Then, the counting circuits 31a, 31b, and 31c respectively count and process the binarized data for each dot transmitted from the majority circuit 25, and finally, if the defective location exceeds the reference value, the target This indicates that the object to be inspected 2 is defective.

この良否判定に用いる2値化データA、B、Cは光むら
が補正された信号であるから例えばリード部の端部の如
く全体が光った状態の部分であっても適性な2値化が行
えることになるものである。
Since the binarized data A, B, and C used for this quality judgment are signals with light unevenness corrected, appropriate binarization is possible even for parts that are completely illuminated, such as the end of a lead. This is something that can be done.

しかも、検査場所メモリ27を例えばアイランド部の端
部、リード部の周囲及び中心部分と輝度の異なる任意位
置に設定すれば、光って正常な検査がしにくかった端部
や中心部分と周囲部分の輝度が異なって判定ができなか
った部分が均一化された信号で2値化できるので、面状
のアイランド部でも容易且つ精度の高い検査でき、この
「面」の検査が可能となったことにより全体形状不良や
メッキ対象部分に対するメッキの位置ずれをも検査でき
ることになるものである。又光った状態のリード部が補
正されて恰も光らない状態の信号で2値化が行えるため
、その部分が光の照射垂直方向に対し折れ曲がっている
ような場合の検査もできることになるものである。
Moreover, if the inspection location memory 27 is set to an arbitrary position that has a different brightness from, for example, the edge of the island, the periphery and center of the lead, it is possible to separate Areas that could not be judged due to differences in brightness can be binarized using a uniform signal, so even planar island areas can be inspected easily and with high precision. This means that defects in overall shape and misalignment of plating relative to the part to be plated can also be inspected. In addition, since the lead part in the illuminated state is corrected and the signal in the non-lit state can be binarized, it is also possible to inspect cases where the lead part is bent in the direction perpendicular to the light irradiation. .

そして更に、計数回路31にて計数処理し、不良状態の
箇所の個数をカウントして複数箇所の2値化データを多
数決により恰も1枚の被検査物2の如く扱い、最終的に
この不良状態の箇所が基準値より上回っている場合には
対象の被検査物2を不良として、この被検査物2は既知
の手段によりホルダー30へと振り分けられるものであ
る。
Further, the counting circuit 31 performs a counting process to count the number of defective locations, and the binary data of the multiple locations are treated as if they were one inspected object 2 by majority vote, and finally the defective locations are counted. If the value exceeds the reference value, the object to be inspected 2 is determined to be defective, and the object to be inspected 2 is distributed to the holder 30 by known means.

〈効  果〉 この発明に係る電気・電子部品の外観検査装置は以上説
明してきた如き内容のものなので、被検査物から輝度が
異なる光むらのある信号が伝達されてきても、補正・記
憶回路にて記憶した基準輝度によって複数回補正し恰も
明るい部分或いは暗い部分の光むらのない状態で2値化
回路に伝達されるため、適性な2値化が行えると共に、
被検査物の任意箇所を検査しても基準輝度によって補正
された信号が取り出せることになるため、面状態の外観
検査が可能となり、更に複数箇所の2値化データを多数
決により1枚の被検査物の如く扱うため精度が向上する
と共に、面状態の外観検査が可能となったことにより全
体の形状不良やメッキの位置ずれ等の検査もできるとい
う優れた効果がある。
<Effects> Since the appearance inspection apparatus for electric/electronic parts according to the present invention has the content as described above, even if a signal with uneven light with different brightness is transmitted from the object to be inspected, the correction/memory circuit can It is corrected multiple times using the reference brightness stored in , and is transmitted to the binarization circuit without unevenness in bright or dark areas, allowing for proper binarization.
Even if any part of the object to be inspected is inspected, a signal corrected by the reference brightness can be extracted, making it possible to inspect the appearance of the surface. Since it is treated like an object, accuracy is improved, and since it is now possible to visually inspect the surface condition, it has the excellent effect of being able to inspect for defects in the overall shape, misalignment of plating, etc.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、この発明に係る電気・電子部品の外観検査装
置の全体概略斜視図、 第2図は、この発明の構成を示す機能ブロック説明図、
そして、 第3図は、従来例を示す機能ブロック説明図である。 1− 光源 2− 被検査物(電気・電子部品) 3−光 4− テレビカメラ 5−・ ビデオモニタ 6− コンピュータ 7・−・傷 8− 映像 20−・ 光源制御回路 21− テレビ信号処理回路 22− アナログ−デジタル変換回路 23− 補正・記憶回路 24 − 2値化回路 25− 多数決回路 26 ・−制御回路 27−・ 検査場所メモリ
FIG. 1 is an overall schematic perspective view of an appearance inspection apparatus for electric/electronic components according to the present invention, FIG. 2 is a functional block explanatory diagram showing the configuration of the present invention,
FIG. 3 is a functional block explanatory diagram showing a conventional example. 1- Light source 2- Object to be inspected (electrical/electronic parts) 3- Light 4- Television camera 5-/Video monitor 6- Computer 7... Scratch 8- Image 20-/ Light source control circuit 21- Television signal processing circuit 22 - Analog-digital conversion circuit 23 - Correction/memory circuit 24 - Binarization circuit 25 - Majority circuit 26 - Control circuit 27 - Inspection location memory

Claims (1)

【特許請求の範囲】 電気・電子部品等の被検査物に均一に光を照射すべく光
源を制御する光源制御回路と、 前記被検査物から照射された光を映像化して撮影するテ
レビカメラと、 該テレビカメラからの光の輝度の信号を処理するテレビ
信号処理回路と、 該テレビ信号処理回路からの信号をアナログ−デジタル
変換するアナログ−デジタル変換回路と、予め白紙及び
モデル被検査物に光を照射した状態を撮影し、白紙撮影
時にはテレビカメラの光の受光特性を、又モデル被検査
物に光を照射時には被モデル被検査物から反射される光
の特性を、各々記憶すると共に、前記モデル被検査物の
光の特性及びテレビカメラの受光特性により補正して予
め基準輝度を決定・記憶し、以後アナログ−デジタル変
換回路を介して伝達される光の信号を前記基準輝度にて
補正して前記テレビ信号処理回路に伝達する補正・記憶
回路と、 前記テレビ信号処理回路から伝達される複数の補正され
た輝度の信号及び予め記憶された基準輝度により2値化
して記憶し、且つ予め設定された検査場所を記憶する検
査場所メモリに対応して設けられる2値化回路と、 検査場所メモリに対応した前記2値化回路の各々の前記
2値化されたデータを比較し、多数決により2値化デー
タを作成する多数決回路と、該多数決回路により処理さ
れたデータを検査場所メモリ毎に計数処理する計数回路
と、 前記各回路を含むシステム全体を制御する制御回路と、 から成る電気・電子部品の外観検査装置。
[Scope of Claims] A light source control circuit that controls a light source to uniformly irradiate light onto an object to be inspected such as electrical/electronic parts, and a television camera that images and photographs the light irradiated from the object to be inspected. , a television signal processing circuit that processes the light brightness signal from the television camera; an analog-to-digital conversion circuit that converts the signal from the television signal processing circuit from analog to digital; When photographing a blank sheet, the light receiving characteristics of the TV camera are stored, and when the model object is irradiated with light, the characteristics of the light reflected from the model object are stored. The reference brightness is determined and stored in advance by correcting it based on the light characteristics of the model test object and the light receiving characteristics of the television camera, and thereafter the light signal transmitted via the analog-to-digital conversion circuit is corrected using the reference brightness. a correction/storage circuit that transmits the signals to the television signal processing circuit; and a correction/storage circuit that binarizes and stores the plurality of corrected luminance signals transmitted from the television signal processing circuit and a pre-stored reference luminance, and The binarized data of each of the binarized circuits provided corresponding to the inspection location memory that stores the inspected location memory and the binarized data of the binarized circuits corresponding to the inspection location memory are compared, and the binary data is determined by a majority vote. An electrical/electronic device comprising: a majority circuit that creates digitized data; a counting circuit that counts the data processed by the majority circuit for each inspection location memory; and a control circuit that controls the entire system including each of the circuits. Appearance inspection equipment for parts.
JP3280186A 1986-02-19 1986-02-19 Apparatus for inspecting appearance of electric/ electronic parts Pending JPS62191705A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3280186A JPS62191705A (en) 1986-02-19 1986-02-19 Apparatus for inspecting appearance of electric/ electronic parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3280186A JPS62191705A (en) 1986-02-19 1986-02-19 Apparatus for inspecting appearance of electric/ electronic parts

Publications (1)

Publication Number Publication Date
JPS62191705A true JPS62191705A (en) 1987-08-22

Family

ID=12368945

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3280186A Pending JPS62191705A (en) 1986-02-19 1986-02-19 Apparatus for inspecting appearance of electric/ electronic parts

Country Status (1)

Country Link
JP (1) JPS62191705A (en)

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