JPS62189650U - - Google Patents

Info

Publication number
JPS62189650U
JPS62189650U JP5756486U JP5756486U JPS62189650U JP S62189650 U JPS62189650 U JP S62189650U JP 5756486 U JP5756486 U JP 5756486U JP 5756486 U JP5756486 U JP 5756486U JP S62189650 U JPS62189650 U JP S62189650U
Authority
JP
Japan
Prior art keywords
sheet
measured
defect
optical inspection
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5756486U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5756486U priority Critical patent/JPS62189650U/ja
Publication of JPS62189650U publication Critical patent/JPS62189650U/ja
Pending legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Sampling And Sample Adjustment (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例の概略構成図、第2
図は本考案の他の実施例の概略構成図、第3図は
本考案のさらに他の実施例の概略構成図、第4図
は本考案のさらに他の実施例の概略構成図、第5
図は層状フイルムにおける検査用基準シートの使
用状態図、第6図はこの種の光学的検査装置の概
略構成図である。 1:層状フイルム、6,8,10,12:検査
用基準シート、7ないし7D,9ないし9E,1
1ないし11D,13ないし13E:基準欠点。
Figure 1 is a schematic diagram of an embodiment of the present invention;
3 is a schematic diagram of still another embodiment of the present invention; FIG. 4 is a schematic diagram of still another embodiment of the present invention; FIG.
The figure shows how a reference sheet for inspection is used in a layered film, and FIG. 6 is a schematic diagram of the structure of this type of optical inspection apparatus. 1: Layered film, 6, 8, 10, 12: Inspection reference sheet, 7 to 7D, 9 to 9E, 1
1 to 11D, 13 to 13E: Standard defects.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 被測定物の表面に発生した欠点を検査する光学
的検査装置において、シート状に形成され前記シ
ート状の表面に前記欠点の検査基準となる基準欠
点が設けられ前記被測定物の表面に貼付して前記
被測定物を光学的に検査することを特徴とする光
学検査用基準シート。
An optical inspection device for inspecting defects occurring on the surface of an object to be measured, wherein the sheet is formed into a sheet, a reference defect is provided on the surface of the sheet to serve as an inspection reference for the defect, and the device is attached to the surface of the object to be measured. 1. A reference sheet for optical inspection, characterized in that the object to be measured is optically inspected.
JP5756486U 1986-04-18 1986-04-18 Pending JPS62189650U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5756486U JPS62189650U (en) 1986-04-18 1986-04-18

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5756486U JPS62189650U (en) 1986-04-18 1986-04-18

Publications (1)

Publication Number Publication Date
JPS62189650U true JPS62189650U (en) 1987-12-02

Family

ID=30887385

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5756486U Pending JPS62189650U (en) 1986-04-18 1986-04-18

Country Status (1)

Country Link
JP (1) JPS62189650U (en)

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