JPS58136770U - Ultrasonic probe device - Google Patents
Ultrasonic probe deviceInfo
- Publication number
- JPS58136770U JPS58136770U JP3290782U JP3290782U JPS58136770U JP S58136770 U JPS58136770 U JP S58136770U JP 3290782 U JP3290782 U JP 3290782U JP 3290782 U JP3290782 U JP 3290782U JP S58136770 U JPS58136770 U JP S58136770U
- Authority
- JP
- Japan
- Prior art keywords
- ultrasonic probe
- probe device
- angle
- test material
- ultrasonic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Transducers For Ultrasonic Waves (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図a従来の超音波探触子の正面から見た断面図、第
1図すは従来の超音波探触子の側面から見た断面図、第
2図aは従来の超音波探触子を被検材の長軸に対して傾
けて配置した上面図、第2図す、 c、 dは第2図a
のA−A’面、B−B’面、c−c’面のそれぞれの超
音波入射点と屈折角を示す断面図、第3図aはこの考案
によ“る超音波探触子の正面から見た断面図、第3図す
はこの考案による超音波探触子の側面から見た断面図で
ある。
図において1は送受信用振動子、2,2a・・・楔、3
は被検材、4,5は欠陥、6は欠陥からの反射波である
。尚、図中同一あるいは相当部分には同一符号を付して
示しである。Figure 1a is a cross-sectional view of a conventional ultrasonic probe seen from the front, Figure 1 is a cross-sectional view of a conventional ultrasonic probe seen from the side, and Figure 2a is a conventional ultrasonic probe. Figure 2 is a top view of the specimen placed at an angle with respect to the long axis of the test material; c and d are Figure 2 a.
Figure 3a is a cross-sectional view showing the ultrasonic incident points and refraction angles of the A-A', B-B', and c-c' planes of the ultrasonic probe according to this invention. Figure 3 is a cross-sectional view of the ultrasonic probe according to the invention as seen from the front.
is the material to be inspected, 4 and 5 are defects, and 6 is a reflected wave from the defect. In the drawings, the same or corresponding parts are denoted by the same reference numerals.
Claims (1)
検材中で所定の屈折角が得られる第1の角度を有する面
と、上記第1の角度を有する面に直交する方向で、傾い
た欠陥に略垂直に超音波が入射する様な第2の角度を有
する面とを設けた事を特徴とする超音波探触子装置。In an ultrasonic probe device, a surface having a first angle that allows a predetermined refraction angle to be obtained in the test material with respect to the flaw detection surface of the test material, and a direction perpendicular to the surface having the first angle. An ultrasonic probe device comprising: a surface having a second angle such that ultrasonic waves are incident approximately perpendicularly to the inclined defect;
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3290782U JPS58136770U (en) | 1982-03-09 | 1982-03-09 | Ultrasonic probe device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3290782U JPS58136770U (en) | 1982-03-09 | 1982-03-09 | Ultrasonic probe device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58136770U true JPS58136770U (en) | 1983-09-14 |
Family
ID=30044481
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3290782U Pending JPS58136770U (en) | 1982-03-09 | 1982-03-09 | Ultrasonic probe device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58136770U (en) |
-
1982
- 1982-03-09 JP JP3290782U patent/JPS58136770U/en active Pending
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